Prosecution Insights
Last updated: April 19, 2026
Application No. 17/129,846

NOVEL LGA ARCHITECTURE FOR IMPROVING RELIABILITY PERFORMANCE OF METAL DEFINED PADS

Final Rejection §103
Filed
Dec 21, 2020
Examiner
NELSON, JACOB THEODORE
Art Unit
2815
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Intel Corporation
OA Round
6 (Final)
85%
Grant Probability
Favorable
7-8
OA Rounds
3y 0m
To Grant
96%
With Interview

Examiner Intelligence

Grants 85% — above average
85%
Career Allow Rate
99 granted / 116 resolved
+17.3% vs TC avg
Moderate +10% lift
Without
With
+10.3%
Interview Lift
resolved cases with interview
Typical timeline
3y 0m
Avg Prosecution
42 currently pending
Career history
158
Total Applications
across all art units

Statute-Specific Performance

§103
54.8%
+14.8% vs TC avg
§102
27.7%
-12.3% vs TC avg
§112
15.3%
-24.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 116 resolved cases

Office Action

§103
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Response to Amendment Applicant’s cancellation of claims 3 – 4, 6, 16, 21, and 25 is acknowledged. Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 1 – 2, 7 – 13, 18 – 20, 22, and 24 is/are rejected under 35 U.S.C. 103 as being unpatentable over US 20190006264 A1 hereinafter Vaidya. For claim 1, Vaidya teaches an electronic package, comprising: a package substrate with a die side and a land side (fig. 7 showing a substrate 101 with two sides); a pad on the land side (fig. 7 numeral 103); a dielectric layer covering sidewalls of the pad, the dielectric layer having an uppermost surface at a same level as an uppermost surface of the pad, and the dielectric layer having a bottommost surface at a same level as a bottommost surface of the pad (fig. 7 numeral 115); and a surface finish on the uppermost surface of the pad and extending onto the uppermost surface of the dielectric layer (fig. 7 numeral 119). Vaidya also teaches embodiments wherein a solder resist over and in direct contact with the uppermost surface of the dielectric layer (fig. 6G shows solder resist 106 over and in contact with the dielectric layer 115). Vaidya does not explicitly teach an a surface finish on the uppermost surface of the pad and extending onto the uppermost surface of the dielectric layer, and a solder resist on and in direct contact with the uppermost surface of the dielectric layer in a singular embodiment. However, Vaidya also teaches that the various embodiments taught can be combined, and that various elements of each embodiment can be combine, removed, or mixed and that the embodiments are not mutually exclusive (Par. [0101 – 0103]). It would have been obvious to one of ordinary skill in the art before the effective filing date of the immediate invention to combine the surface finish embodiment and the solder resist embodiment in Vaidya together as Vaidya teaches combining the various embodiments and as such modification would involve a mere change in configuration. It has been held that a change in configuration of shape of a device is obvious, absent persuasive evidence that a particular configuration is significant. In re Dailey, 357 F.2d 669, 149 USPQ 47 (CCPA 1966). For claim 2, Vaidya teaches all of claim 1. Vaidya also teaches the dielectric layer is a different material than a layer of the package substrate (Par. [0028]; Par. [0053]). For claim 7, Vaidya teaches all of claim 1. Vaidya also teaches an opening through the solder resist that exposes a top surface of the pad is wider than the pad (fig. 6G numeral 116). For claim 8, Vaidya teaches all of claim 7. Vaidya does not explicitly state that the pad is a metal defined pad. Vaidya does teach that the pad is formed from a metallization, and is surrounded by a dielectric layer (Par. [0058 – 0059]) and is shown inside a dielectric layer (fig. 6E numeral 103). Vaidya also teaches a variety of deposition methods that can be used for the pads (Par. [0039]) and that the pads are free of dielectric materials (Par. [0041]). Given the broadest reasonable interpretation of the term metal defined pad, Vaidya appears to teach a metal defined pad as the pad is metal, lacks dielectric material, is defined by the metal itself and not by a solder mask (i.e. is not a solder mask defined pad), and is located within a dielectric layer. For claim 9, Vaidya teaches all of claim 1. Vaidya also teaches a die attached to the die side of the package substrate (fig. 11 numeral 929). For claim 10, Vaidya teaches all of claim 9. Vaidya also teaches the die being coupled to the pad by conductive routing through a thickness of the package substrate (fig. 11 shows conductive vias 910 running through the package). For claim 11, Vaidya teaches a method of forming an electronic package, comprising: forming a pad on a land side of a package substrate (fig. 6A numeral 103); disposing a dielectric layer over the pad (fig. 6B numeral 115); recessing the dielectric layer to expose an uppermost surface of the pad, wherein the dielectric remains over sidewall surfaces of the pad, the dielectric layer having an uppermost surface at a same level as the uppermost surface of the pad, and the dielectric layer having a bottommost surface at a same level as the uppermost surface of the pad, and the dielectric layer having a bottommost surface at a same level as a bottommost surface of the pad (fig. 6C numeral 116); and forming a surface finish on the uppermost surface of the pad and extending onto the uppermost surface of the dielectric layer (fig. 7 numeral 119; Par. [0064]). ). Vaidya also teaches embodiments wherein a solder resist is formed over and in direct contact with the uppermost surface of the dielectric layer (fig. 6G shows solder resist 106 over and in contact with the dielectric layer 115). Vaidya does not explicitly teach an a surface finish on the uppermost surface of the pad and extending onto the uppermost surface of the dielectric layer, and a solder resist on and in direct contact with the uppermost surface of the dielectric layer in a singular embodiment. However, Vaidya also teaches that the various embodiments taught can be combined, and that various elements of each embodiment can be combine, removed, or mixed and that the embodiments are not mutually exclusive (Par. [0101 – 0103]). It would have been obvious to one of ordinary skill in the art before the effective filing date of the immediate invention to combine the forming of the surface finish embodiment and the solder resist embodiment in Vaidya together as Vaidya teaches combining the various embodiments and as such modification would involve a mere change in configuration. It has been held that a change in configuration of shape of a device is obvious, absent persuasive evidence that a particular configuration is significant. In re Dailey, 357 F.2d 669, 149 USPQ 47 (CCPA 1966). For claim 12, Vaidya teaches all of claim 11. Vaidya also teaches forming an opening through the dielectric layer exposes the uppermost surface of the pad (fig. 6F numeral 115). For claim 13, Vaidya teaches all of claim 12. Vaidya also teaches a width of the opening through the dielectric layer is wider than a width of the pad (fig. 6E shows the pad 103 fully surrounded by the dielectric layer 115 and therefor the dielectric layer opening must be wider than the pad). For claim 18, Vaidya teaches all of claim 11. Vaidya also teaches a die side of the package substrate is covered by a protective film during the operation of recessing the dielectric layer (fig. 6B - 6I shows protective film 112 covering a die side of the substrate 101 during the recessing process of the dielectric layer 115). For claim 19, Vaidya teaches all of claim 11. Vaidya also teaches forming first level interconnects on a die side of the package substrate after exposing the surface of the pad (fig. 7 shows the formation of the first level interconnect by applying the surface finish 119 on top of the pad 103 after the recessing the dielectric 115). For claim 20, Vaidya teaches a land side interconnect of a package substrate, comprising: a pad over a land side the package substrate , wherein the pad has a first surface connected to a via (fig. 7 numeral 103 shows a pad connected to a via), a second surface opposite the first surface, and sidewall surfaces connecting the first surface to the second surface (the pad 103 is shown to be rectangular with sidewalls and a first and a second surface opposite each other); a dielectric layer over the land side of the package substrate and directly contacting the sidewall surface of the pad, wherein the dielectric layer does not contact the second surface of the pad, wherein the dielectric layer has an uppermost surface at a same level as the second surface of the pad, and the dielectric layer having a bottom surface at a same level as the bottommost surface of the pad (fig. 7 numeral 115); and a surface finish on the second surface of the pad and extending onto the uppermost surface of the dielectric layer (fig. 7 numeral 119). Vaidya also teaches embodiments wherein a solder resist is formed over and in direct contact with the uppermost surface of the dielectric layer (fig. 6G shows solder resist 106 over and in contact with the dielectric layer 115). Vaidya does not explicitly teach an a surface finish on the uppermost surface of the pad and extending onto the uppermost surface of the dielectric layer, and a solder resist on and in direct contact with the uppermost surface of the dielectric layer in a singular embodiment. However, Vaidya also teaches that the various embodiments taught can be combined, and that various elements of each embodiment can be combine, removed, or mixed and that the embodiments are not mutually exclusive (Par. [0101 – 0103]). It would have been obvious to one of ordinary skill in the art before the effective filing date of the immediate invention to combine the forming of the surface finish embodiment and the solder resist embodiment in Vaidya together as Vaidya teaches combining the various embodiments and as such modification would involve a mere change in configuration. It has been held that a change in configuration of shape of a device is obvious, absent persuasive evidence that a particular configuration is significant. In re Dailey, 357 F.2d 669, 149 USPQ 47 (CCPA 1966). For claim 22, Vaidya teaches all of claim 20. Vaidya also teaches an opening through the solder resist layer exposes the second surface of the pad, wherein the solder resist layer does not contact the second surface of the pad (fig. 6G numeral 116). For claim 24, Vaidya teaches An electronic system, comprising: a board (fig. 12 numeral 1210); a package substrate coupled to the board (fig. 12 Par. [0017]; fig. 7 numeral 101); land side interconnects on the package substrate (fig. 7 numeral 104), wherein individual ones of the land side interconnects comprise: a pad over a land side of the package substrate, wherein the pad has a first surface connected to a via, a second surface opposite from the first surface, and sidewall surfaces connecting the first surface to the second surface (fig. 7 numeral 103 shows a rectangular pad with sidewalls connecting two sides, one of the two sides connected to a via); a dielectric layer over the land side of the package substrate and directly contacting the sidewall surfaces of the pad, wherein the dielectric layer does not contact the second surface of the pad, wherein the dielectric layer has an uppermost surface at a same level as the second surface of the pad, and wherein the dielectric layer having a bottommost surface at a same level as the bottommost surface of the pad (fig. 7 numeral 115); and a surface finish on the second surface of the pad and extending onto the uppermost surface of the dielectric layer (fig. 7 numeral 119); and a die coupled to a die side of the package substrate (fig. 11 numeral 929; Par. [0080]). Vaidya also teaches embodiments wherein a solder resist over and in direct contact with the uppermost surface of the dielectric layer (fig. 6G shows solder resist 106 over and in contact with the dielectric layer 115). Vaidya does not explicitly teach an a surface finish on the uppermost surface of the pad and extending onto the uppermost surface of the dielectric layer, and a solder resist on and in direct contact with the uppermost surface of the dielectric layer in a singular embodiment. However, Vaidya also teaches that the various embodiments taught can be combined, and that various elements of each embodiment can be combine, removed, or mixed and that the embodiments are not mutually exclusive (Par. [0101 – 0103]). It would have been obvious to one of ordinary skill in the art before the effective filing date of the immediate invention to combine the surface finish embodiment and the solder resist embodiment in Vaidya together as Vaidya teaches combining the various embodiments and as such modification would involve a mere change in configuration. It has been held that a change in configuration of shape of a device is obvious, absent persuasive evidence that a particular configuration is significant. In re Dailey, 357 F.2d 669, 149 USPQ 47 (CCPA 1966). Response to Arguments Applicant's arguments filed 10/30/2025 have been fully considered but they are not persuasive. Applicant’s arguments directed to claims 1, 11, 20, and 24 is focused on the prior art of record does not teach a solder resist on and in direct contact with the uppermost surface of the dielectric layer. This argument is not persuasive as the prior art of record (Vaidya) teaches a solder resist on and in direct contact with the uppermost surface of the dielectric layer, and that the various embodiments taught can be combined, mixed, or that various parts can be removed or combined (see the rejection above; Vaidya, Par. [101 – 103]). Vaidya does not teach away from combining the elements and no teaching in Vaidya suggests that combining the elements would result in the dielectric layer and the solder resist not being in direct contact. The solder resist as taught in Vaidya is shown to be in direct contact with the dielectric layer when implemented. For these reasons the rejection is maintained. Conclusion Applicant's amendment necessitated the new ground(s) of rejection presented in this Office action. Accordingly, THIS ACTION IS MADE FINAL. See MPEP § 706.07(a). Applicant is reminded of the extension of time policy as set forth in 37 CFR 1.136(a). A shortened statutory period for reply to this final action is set to expire THREE MONTHS from the mailing date of this action. In the event a first reply is filed within TWO MONTHS of the mailing date of this final action and the advisory action is not mailed until after the end of the THREE-MONTH shortened statutory period, then the shortened statutory period will expire on the date the advisory action is mailed, and any nonprovisional extension fee (37 CFR 1.17(a)) pursuant to 37 CFR 1.136(a) will be calculated from the mailing date of the advisory action. In no event, however, will the statutory period for reply expire later than SIX MONTHS from the mailing date of this final action. Any inquiry concerning this communication or earlier communications from the examiner should be directed to JACOB T NELSON whose telephone number is (571)272-1031. The examiner can normally be reached Monday through Friday 9:00 AM to 5:00 PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Joshua Benitez can be reached at 571-270-1435. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /J.T.N./Examiner, Art Unit 2815 /MONICA D HARRISON/Primary Examiner, Art Unit 2815
Read full office action

Prosecution Timeline

Dec 21, 2020
Application Filed
Jul 13, 2021
Response after Non-Final Action
Jan 29, 2024
Non-Final Rejection — §103
Apr 23, 2024
Response Filed
May 06, 2024
Final Rejection — §103
Jul 10, 2024
Response after Non-Final Action
Aug 09, 2024
Notice of Allowance
Oct 09, 2024
Response after Non-Final Action
Nov 04, 2024
Response after Non-Final Action
Dec 19, 2024
Non-Final Rejection — §103
Mar 25, 2025
Response Filed
Apr 03, 2025
Final Rejection — §103
Jun 18, 2025
Response after Non-Final Action
Jul 21, 2025
Request for Continued Examination
Jul 23, 2025
Response after Non-Final Action
Jul 31, 2025
Non-Final Rejection — §103
Oct 30, 2025
Response Filed
Nov 21, 2025
Final Rejection — §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

7-8
Expected OA Rounds
85%
Grant Probability
96%
With Interview (+10.3%)
3y 0m
Median Time to Grant
High
PTA Risk
Based on 116 resolved cases by this examiner. Grant probability derived from career allow rate.

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