Application No. 17/699,463

FIELD EFFECT TRANSISTOR, ELECTRONIC APPARATUS INCLUDING THE SAME, AND METHOD OF MANUFACTURING THE FIELD EFFECT TRANSISTOR

Final Rejection

Filed

Mar 21, 2022

Examiner

PAGE, DALE E

Art Unit

2899

Tech Center

2800 — Semiconductors & Electrical Systems

Assignee

Samsung Electronics Co., LTD.

OA Round

2 (Final)

Interview Optional

— -4.4% interview lift. This examiner has a relatively high allow rate; a written response may suffice.

Examiner Intelligence

PAGE, DALE E View full profile →

Career Allow Rate

214 granted / 330 resolved

Without

With

+-4.4%

Interview Lift

3y 5m

Avg Prosecution

6 pending

336

Total Applications

career history

Statute-Specific Performance

§101

0.3%

-39.7% vs TC avg

§103

56.7%

+16.7% vs TC avg

§102

25.1%

-14.9% vs TC avg

§112

17.5%

-22.5% vs TC avg

Black line = Tech Center average estimate • Based on career data

Prosecution Timeline

Mar 21, 2022

Application Filed

Nov 14, 2024

Non-Final Rejection

Feb 24, 2025

Response Filed

Feb 18, 2026

Final Rejection (current)

Precedent Cases

Applications granted by this same examiner with similar technology. Study what changed to get past this examiner.

17/850,052

Patent 12543511

QUANTUM DEVICE

2y 5m to grant Granted Feb 03, 2026

17/889,389

Patent 12532742

SEMICONDUCTOR STRUCTURE

2y 5m to grant Granted Jan 20, 2026

17/722,301

Patent 12505365

ANTI-FUSE AND FUSE STRUCTURES FOR IMPROVING THE FUNCTIONALITY OF QUBIT CIRCUITS

2y 5m to grant Granted Dec 23, 2025

18/013,365

Patent 12506040

PACKAGING SUBSTRATE, SEMICONDUCTOR PACKAGE, PACKAGING SUBSTRATE PREPARATION METHOD, AND SEMICONDUCTOR PACKAGE PREPARATION METHOD

2y 5m to grant Granted Dec 23, 2025

17/592,995

Patent 12154973

Fin Field-Effect Transistor Device and Method

2y 5m to grant Granted Nov 26, 2024

AI Strategy Recommendation

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Prosecution Projections

3-4

Expected OA Rounds

65%

Grant Probability

60%

With Interview (-4.4%)

3y 5m

Median Time to Grant

Moderate

PTA Risk

Based on 330 resolved cases by this examiner