DETAILED ACTION
Notice of Pre-AIA or AIA Status
Claim Rejections - 35 USC § 112
The following is a quotation of 35 U.S.C. 112(b):
(b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention.
The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph:
The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention.
Claims 1-15 rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention.
It is unclear what is the Applicant invention. Terms such as “test pattern generator” are not terms of the art and can be interpreted in many different ways and therefore mean different invention.
For example the limitation “A test pattern generator (8), which is set up to generate a chronological sequence of test events, so as to provide the latter to a test histogram channel (10) for generating time- correlated test histogram data for testing the distance determination during the optical runtime measurement” can mean laser pulser which generates pulses with some time pattern. But also it can mean Receiver electronics which creates time windows for the detection of the light. It also can mean both above together. Another meaning of the term is just TDC which fills up TDC channels or ADC. In some other interpretation it can be interpreted as receiver which activates different detectors to test specific detector. All listed above inventions represent completely different inventions and require different searches.
Examiner also needs clarification to term “test event”. What does Applicant mean by it. Can TDC clock be considered test event(for example) or test event is transmission of pulse , or reception of pulse? Specification does not provide clear term definition.
Also Applicant is advised to correct “intended use language” as for example in limitation
“A test pattern generator (8), which is set up to generate a chronological sequence of test events, so as to provide the latter to a test histogram channel (10) for generating time- correlated test histogram data for testing the distance determination during the optical runtime measurement” only “A test pattern generator (8), which is set up to generate a chronological sequence of test events” have patentable weight.
Claim 2 generally specifies that the time interval between successive test events is based on a temporal resolution of the optical time-of-flight measurement. It is not clear how exactly the time interval is supposed to be defined thereby. Ultimately, a relationship to a temporal resolution can be defined for any time interval.
Claim 3 defines the temporal sequence as being based on an input parameter. It is entirely unclear how this parameter is supposed to limit the sequence. Ultimately, a simple on/off switch of the system is one such parameter.
Claim 5 defines a frame counter, and claim 6 defines a row index of a receiving matrix as the input parameter.
It is entirely unclear what functions of the frame counter or the row index of a receiving matrix have to do with the device for generating test data. It is not clear from the definition in the claims why frame counters or a row index appear in the system at all, or what special, advantageous technical effect results from the use thereof.
[Claim 7 defines the generation of a bit vector and the use of a hash function to generate a binary sequence is entirely unclear why and for what purpose a binary sequence is intended to be generated.
Furthermore, it is not clear why a binary sequence is intended to be determined from a hash function. What advantageous characteristics result from using the hash function?
Claim 8 specifies that the temporal sequence of the test events is based on the binary sequence. It is entirely unclear how a temporal sequence is to be obtained from the binary sequence.
Claim 9 specifies "wherein the test events in the temporal sequence of test events are identical". It is not clear what exactly is intended to be defined here. Should successive test events be identical? This appears to be trivial.
Claim 10 defines a test histogram channel for generating time-correlated test histogram data. It is not clear with what exactly the temporal sequence of test events is intended to be correlated.
Claim 11 specifies that the test histogram data are provided to a peak detection unit in order to determine distances therefrom; this is unclear. Which peaks exactly are intended to be determined? Is there exactly one peak or are there multiple peaks? How are the peaks related to distances?
Claim 12 defines a test unit which receives the determined distances. The test unit additionally receives points in time of the temporal sequence of test events. It is not clear how nominal distances are intended to be determined from these points in time.
Conclusion
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/HOVHANNES BAGHDASARYAN/ Examiner, Art Unit 3645