Prosecution Insights
Last updated: July 17, 2026
Application No. 17/912,971

SEMICONDUCTOR ELEMENT COATING GLASS AND SEMICONDUCTOR ELEMENT COATING MATERIAL USING SAME

Non-Final OA §103
Filed
Sep 20, 2022
Priority
Mar 31, 2020 — JP 2020-061749 +1 more
Examiner
BOYD, JENNIFER A
Art Unit
1786
Tech Center
1700 — Chemical & Materials Engineering
Assignee
Nippon Electric Glass Co., Ltd.
OA Round
3 (Non-Final)
32%
Grant Probability
At Risk
3-4
OA Rounds
0m
Est. Remaining
77%
With Interview

Examiner Intelligence

Grants only 32% of cases
32%
Career Allowance Rate
73 granted / 228 resolved
-33.0% vs TC avg
Strong +45% interview lift
Without
With
+45.3%
Interview Lift
resolved cases with interview
Typical timeline
3y 8m
Avg Prosecution
9 currently pending
Career history
237
Total Applications
across all art units

Statute-Specific Performance

§103
81.9%
+41.9% vs TC avg
§102
8.1%
-31.9% vs TC avg
§112
3.2%
-36.8% vs TC avg
Black line = Tech Center average estimate • Based on career data from 228 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Response to Amendment A request for continued examination under 37 CFR 1.114, including the fee set forth in 37 CFR 1.17(e), was filed in this application after final rejection. Since this application is eligible for continued examination under 37 CFR 1.114, and the fee set forth in 37 CFR 1.17(e) has been timely paid, the finality of the previous Office action has been withdrawn pursuant to 37 CFR 1.114. Applicant's submission filed on April 28, 2026 has been entered. Claim 1 has been amended and claims 1 – 6 are pending. The invention as currently claimed is not found to be patentable for reasons herein below. Response to Arguments Regarding the limitation of “the glass has a surface charge density of 12x 1011/cm2 or less, when a surface of the semiconductor device is coated by the glass”, this is a conditional statement and is not actually requiring that the glass is coated on a semiconductor substrate. Note that the preamble only requires a glass which is intended for a semiconductor device coating. The use of the product is not germane to the issue of patentability of the product itself, unless Applicant presents evidence from which the examiner could reasonably conclude that the claimed product differs in kind from those of the prior art. See MPEP § 2113. Furthermore, there does not appear to be a difference between the prior art structure and the structure resulting from the claimed use because Nakamura et al. teaches a glass composition with the same percentage of components. Since Nakamura et al. teaches the same materials and structure as disclosed by the Applicant, then it would be capable of performing in the manner claimed. Claim Rejections - 35 USC § 103 Claims 1 – 6 are rejected under 35 U.S.C. 103 as being unpatentable over Nakamura et al. (WO2012133217A1). Nakamura et al. is directed to a glass composition for sealing that has thermal expansion characteristics for sealing of a ceramic member (Abstract). As to claim 1, Nakamura et al. teach glass compositions such as composition circled below from Table 2 (page 20 of Japanese language WO document). PNG media_image1.png 419 603 media_image1.png Greyscale ZnO + SiO2 = 41.6 + 14.0 = 55.6 % Al2O3 = 4.7 % (when rounded to 1 significant figure = 5%) B2O3 = 22.0 % MgO = 17.4% The glass composition does not contain lead as shown by the components listed in the chart and the disclosure as a whole does not suggest or teach the inclusion of lead. Additionally, the general disclosure of Nakamura et al. teach glass compositions with the following components and ranges (pages 2 – 5 of English translation): Instant claims Nakamura et al. ZnO + SiO2 = 40 – 65 mol % SiO2: 14 to 21 mass% + ZnO: 29 To 51% by mass = 43 – 72% by mass SiO2 = usually 14 to 21 mass%, preferably 14.5 to 20 mass%, more preferably 15 to 19 mass% Al2O3 = usually 0 to 12% by mass, more preferably 1 to 10% by mass SiO2/ZnO = 0.5 – 2.0 (14 to 21 mass%)/(29 To 51 mass%) = 0.27 - 1.38 B2O3 = 7 – 25 mol % 17 to 24 mass% Al2O3 = 5 – 15 mol % 0 to 12 mass% MgO = 17 – 22 mol % MgO: 7 to 16% by mass Regarding the limitation of “the glass has a surface charge density of 12x 1011/cm2 or less, when a surface of the semiconductor device is coated by the glass”, this is a conditional statement and is not actually requiring that the glass is coated on a semiconductor substrate. Note that the preamble only requires a glass which is intended for a semiconductor device coating. The use of the product is not germane to the issue of patentability of the product itself, unless Applicant presents evidence from which the examiner could reasonably conclude that the claimed product differs in kind from those of the prior art. See MPEP § 2113. Furthermore, there does not appear to be a difference between the prior art structure and the structure resulting from the claimed use because Nakamura et al. teaches a glass composition with the same percentage of components. Since Nakamura et al. teaches the same materials and structure as disclosed by the Applicant, then it would be capable of performing in the manner claimed. As to claim 3, Nakamura et al. teach Al2O3/( ZnO + SiO2) = (4.7)/(41.6 + 14.0) = 4.7/55.6 % = 0.08 As to claim 5, Nakamura et al. teach it is preferable that the sealing material of the present invention contains a ceramic powder. The ratio of the ceramic powder to the total amount of the glass powder and the ceramic powder is preferably more than 0% by mass and 5% by mass or less (English translation portion, page 3, 4th to last paragraph on page). It should be noted that the compositional components in Nakamura et al. are all disclosed as % by mass while the instant claims require all components by mol %. The Examiner submits that the prior art ranges substantially overlap with the claimed ranges. It has been held that obviousness exists where the claimed ranges overlap or lie inside ranges disclosed by the prior art. See MPEP 2144.05 (I). Therefore, it would have been obvious to one of ordinary skill in the art at the time of the invention to have selected from the overlapping portion of the range taught by Nakamura et al., because overlapping ranges have been held to establish prima facie obviousness. As to claims 4 and 6, Nakamura et al. teach that the glass composition of the present invention preferably has a thermal expansion coefficient of 60 to 80 × 10 -7 / ° C. at 30 to 550 ° C. of the glass ceramics formed by firing (page 3 of translation, 5th paragraph from bottom of page). It would have been obvious for one of ordinary skill in the art before the effective filing date of the claimed invention to optimize the thermal expansion coefficient of the glass composition to include the claimed range. Nakamura et al. note that in order to adjust the strength and thermal expansion coefficient of the fired body obtained by firing the sealing material, it is preferable that the sealing material of the present invention contains a ceramic powder together with the glass powder made of the glass composition In this case, the ratio of the ceramic powder to the total amount of the glass powder and the ceramic powder is preferably more than 0% by mass and 5% by mass or less. The inclusion of such a ceramic powder makes it easy to adjust the strength and the thermal expansion coefficient of the fired body (composite of glass ceramic and ceramic powder) after firing (page 3 of translation, 4th paragraph from bottom of page). It has been held that, where the general conditions of a claim are disclosed in the prior art, it is not inventive to discover the optimum or workable ranges by routine experimentation. See MPEP 2144.05(II). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to JENNIFER A BOYD whose telephone number is (571)272-7783. The examiner can normally be reached M-F 8 am - 5 pm with alternating Fridays off. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Sri Kumar can be reached at (571) 272-7769. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /JENNIFER A BOYD/Supervisory Patent Examiner, Art Unit 1786
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Prosecution Timeline

Sep 20, 2022
Application Filed
Jun 04, 2025
Non-Final Rejection mailed — §103
Oct 03, 2025
Response Filed
Jan 28, 2026
Final Rejection mailed — §103
Apr 28, 2026
Request for Continued Examination
Apr 29, 2026
Response after Non-Final Action
May 12, 2026
Non-Final Rejection mailed — §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

3-4
Expected OA Rounds
32%
Grant Probability
77%
With Interview (+45.3%)
3y 8m (~0m remaining)
Median Time to Grant
High
PTA Risk
Based on 228 resolved cases by this examiner. Grant probability derived from career allowance rate.

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