Prosecution Insights
Last updated: July 17, 2026
Application No. 18/003,720

IMAGE PROCESSING APPARATUS AND DISTANCE-MEASUREMENT APPARATUS

Final Rejection §103
Filed
Dec 29, 2022
Priority
Jul 01, 2020 — JP 2020-114483 +1 more
Examiner
VASQUEZ JR, ROBERT WILLIAM
Art Unit
3645
Tech Center
3600 — Transportation & Electronic Commerce
Assignee
Kyocera Corporation
OA Round
3 (Final)
11%
Grant Probability
At Risk
4-5
OA Rounds
8m
Est. Remaining
19%
With Interview

Examiner Intelligence

Grants only 11% of cases
11%
Career Allowance Rate
2 granted / 18 resolved
-40.9% vs TC avg
Moderate +8% lift
Without
With
+8.3%
Interview Lift
resolved cases with interview
Typical timeline
4y 2m
Avg Prosecution
28 currently pending
Career history
66
Total Applications
across all art units

Statute-Specific Performance

§103
92.0%
+52.0% vs TC avg
§102
8.0%
-32.0% vs TC avg
Black line = Tech Center average estimate • Based on career data from 18 resolved cases

Office Action

§103
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Response to Amendment The Amendment filed February 25th, 2026 has been entered. Claims 1-18 remain pending in the application. Applicant's amendments to the Claims and Specification have overcome each and every objection previously set forth in the Non-Final office Action mailed November 25th, 2025. Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 1-4, and 6-10, 13, and 16 are rejected under 35 U.S.C. 103 as being unpatentable over Sato et al. (United States Patent Application Publication 20210142496 A1), hereinafter Sato, in view of Steinberg et al. (United States Patent Application Publication 20190227175 A1), hereinafter Steinberg. Regarding claim 1, Sato teaches an image processing apparatus (Fig. 1, Title) comprising: a reflection-intensity-information acquisition unit configured to acquire reflection-intensity information of a radiation wave at a position of an object (Fig. 1; [0077] Solid-state imaging element 20 has a pixel array in which a first pixel that performs imaging with reflected light, which is irradiation light reflected by a subject, and a second pixel that images the subject are disposed in an array.), the radiation wave being an electromagnetic wave radiated in multiple directions in a space in which the object is present, based on a reflected wave that is the radiation wave reflected by the object ([0074] Light source 10 is configured to include, for example, a capacitor, a driving circuit, and a light emitting element, and emits light by driving the light emitting element with electric energy accumulated in the capacitor; [0102] Diffusion plate 50 adjusts the intensity distribution and the angle of irradiation light.) and generate a reflection-intensity image representing a reflection intensity of the radiation wave in the space based on the reflection-intensity information ([0080] As shown in FIG. 2, pixel array 2 is configured to be disposed in an array pattern such that first pixel 21 (IR pixel) that performs imaging with reflected light, which is irradiation light reflected by a subject, and second pixel 22 (BW pixel) that images the subject are alternately aligned in columns.); an image-information acquisition unit configured to acquire a luminance image of the space ([0085] Therefore, a pixel of black and white that indicates the luminance of visible light, in other words, a monochrome image is represented by an imaging signal outputted from a plurality of second pixels 22 included in pixel array 2. This monochrome image is hereinafter referred to as a BW image.); and a correspondence-information calculation unit configured to calculate, based on a position of the object in the reflection-intensity image and a position of the object in the luminance image, correspondence information that makes the reflection-intensity image and the luminance image correspond to each other ([0130] Next, BW camera 103 acquires a BW image. That is, BW camera 103 acquires a BW image corresponding to the IR image acquired in step S12, that is, a BW image of the same scene, the same viewpoint, and the same imaging time as those of the IR image.; [0242] In step S45 b, dust detector 112 calculates a correlation coefficient of luminance between the higher luminance region of the IR image and the region in the BW image corresponding to the higher luminance region (that is, the corresponding region) for each of at least one higher luminance region obtained by the regional segmentation in step S43). Sato fails to teach an apparatus comprising a movable deflector that includes a micro-electromechanical system (MEMS) However, Steinberg teaches an apparatus comprising a movable deflector that includes a micro-electromechanical system (MEMS) ([0072] Specifically, FIG. 3A is a diagram illustrating scanning unit 104 with a MEMS mirror (e.g., square shaped), FIG. 3B is a diagram illustrating another scanning unit 104 with a MEMS mirror (e.g., round shaped)) It would have been obvious to one of ordinary skill in the art prior to the effective filing date of this invention to modify the invention of Sato to comprise the mems mirror similar to Steinberg, with a reasonable expectation of success. This would have the predictable result of using a device known in the art to control the emitted and returned light and direct it to specific detectors and scan points. Regarding claim 2, Sato teaches the image processing apparatus according to claim 1, wherein the correspondence information includes at least one selected from the group consisting of rotation, scaling, and translation for making the reflection-intensity image and the luminance image correspond to each other ([0188] It is noted that when the distortion of lens is large, dust detector 112 may perform distortion correction processing for the BW image and the IR image, which have been imaged. For example, dust detector 112 may perform distortion correction processing by using a camera calibration method such as Non Patent Literature (R. Tsai, “A versatile camera calibration technique for high-accuracy 3D machine vision metrology using off-the-shelf TV cameras and lenses”, IEEE Journal on Robotics and Automation, Vol. 3, Iss. 4, pp. 323-344, 1987).). Regarding claim 3, Sato teaches the image processing apparatus according to claim 1, wherein a predetermined position in the luminance image and an optical axis of the reflected wave from the predetermined position match each other ([0163] Accordingly, when IR camera 102 images the same scene as the scene shown in FIG. 9B from the same viewpoint and at the same time as those of BW camera 103, the IR image shown in FIG. 9A is acquired.). Regarding claim 4, Sato teaches the image processing apparatus according to claim 3, wherein the reflection-intensity-information acquisition unit acquires the reflection-intensity information from a first detection unit configured to detect the reflected wave ([0111] Such IR camera 102 acquires an IR image by performing imaging of a scene including the subject with infrared light according to timing at which light source 101 irradiates infrared light to the subject.), wherein the image-information acquisition unit acquires an image information from a second detection unit configured to detect a light ([0112] Such BW camera 103 acquires a visible light image (specifically, a BW image) by imaging of a substantially same scene as that of the infrared image, the imaging being performed with visible light at a substantially same viewpoint and imaging time as those of the infrared image.), wherein the first detection unit detects the reflected wave separated from electromagnetic waves including the reflected wave in accordance with a wavelength ([0111] Such IR camera 102 acquires an IR image by performing imaging of a scene including the subject with infrared light according to timing at which light source 101 irradiates infrared light to the subject.), and wherein the second detection unit detects the light separated from the electromagnetic waves including the reflected wave in accordance with a wavelength ([0112] Such BW camera 103 acquires a visible light image (specifically, a BW image) by imaging of a substantially same scene as that of the infrared image, the imaging being performed with visible light at a substantially same viewpoint and imaging time as those of the infrared image.). Regarding claim 6, Sato teaches the image processing apparatus according to claim 1, further comprising: a control unit configured to correct the luminance image based on the correspondence information ([0188] It is noted that when the distortion of lens is large, dust detector 112 may perform distortion correction processing for the BW image and the IR image, which have been imaged; [0192] Second depth estimator 111 b corrects the inappropriate depth in the dust region. Then, as shown in (e) of FIG. 20, outputter 118 generates third depth information which indicates the corrected depth of the dust region and the depth of the non-dust region.). Regarding claim 7, Sato teaches an image processing apparatus comprising: an image-information acquisition unit configured to acquire a luminance image of a space in which an object is present ([0085] Therefore, a pixel of black and white that indicates the luminance of visible light, in other words, a monochrome image is represented by an imaging signal outputted from a plurality of second pixels 22 included in pixel array 2. This monochrome image is hereinafter referred to as a BW image.); a reflection-intensity-information acquisition unit configured to acquire a reflection-intensity image representing a reflection intensity of a radiation wave at a position in the space, the radiation wave being an electromagnetic wave radiated into the space, and the reflection-intensity image being generated based on a reflected wave that is the radiation wave reflected by the object (Fig. 1; [0074] Light source 10 is configured to include, for example, a capacitor, a driving circuit, and a light emitting element, and emits light by driving the light emitting element with electric energy accumulated in the capacitor; [0077] Solid-state imaging element 20 has a pixel array in which a first pixel that performs imaging with reflected light, which is irradiation light reflected by a subject, and a second pixel that images the subject are disposed in an array.); and a correspondence-information calculation unit configured to calculate correspondence information that makes a position included in the reflection-intensity image and a position included in the luminance image correspond to each other, each of the positions corresponding to a predetermined position in the space ([0130] Next, BW camera 103 acquires a BW image. That is, BW camera 103 acquires a BW image corresponding to the IR image acquired in step S12, that is, a BW image of the same scene, the same viewpoint, and the same imaging time as those of the IR image.; [0242] In step S45 b, dust detector 112 calculates a correlation coefficient of luminance between the higher luminance region of the IR image and the region in the BW image corresponding to the higher luminance region (that is, the corresponding region) for each of at least one higher luminance region obtained by the regional segmentation in step S43). Sato fails to teach an apparatus comprising a movable deflector that includes a micro-electromechanical system (MEMS) However, Steinberg teaches an apparatus comprising a movable deflector that includes a micro-electromechanical system (MEMS) ([0072] Specifically, FIG. 3A is a diagram illustrating scanning unit 104 with a MEMS mirror (e.g., square shaped), FIG. 3B is a diagram illustrating another scanning unit 104 with a MEMS mirror (e.g., round shaped)) It would have been obvious to one of ordinary skill in the art prior to the effective filing date of this invention to modify the invention of Sato to comprise the mems mirror similar to Steinberg, with a reasonable expectation of success. This would have the predictable result of using a device known in the art to control the emitted and returned light and direct it to specific detectors and scan points. Regarding claim 8, Sato teaches the image processing apparatus according to claim 7, wherein the correspondence information is a transformation formula applied to the reflection-intensity image or the luminance image for making the position included in the reflection-intensity image match or approximate the position included in the luminance image ([0188] It is noted that when the distortion of lens is large, dust detector 112 may perform distortion correction processing for the BW image and the IR image, which have been imaged. For example, dust detector 112 may perform distortion correction processing by using a camera calibration method such as Non Patent Literature (R. Tsai, “A versatile camera calibration technique for high-accuracy 3D machine vision metrology using off-the-shelf TV cameras and lenses”, IEEE Journal on Robotics and Automation, Vol. 3, Iss. 4, pp. 323-344, 1987).). Regarding claim 9, Sato teaches a distance-measurement apparatus comprising: a reflection-intensity-information acquisition unit configured to acquire reflection-intensity information of a radiation wave at a position of an object, the radiation wave being an electromagnetic wave radiated in multiple directions in a space in which the object is present, based on a reflected wave that is the radiation wave reflected by the object and generate a reflection-intensity image representing a reflection intensity of the radiation wave in the space based on the reflection-intensity information (Fig. 1; [0074] Light source 10 is configured to include, for example, a capacitor, a driving circuit, and a light emitting element, and emits light by driving the light emitting element with electric energy accumulated in the capacitor; [0077] Solid-state imaging element 20 has a pixel array in which a first pixel that performs imaging with reflected light, which is irradiation light reflected by a subject, and a second pixel that images the subject are disposed in an array.; [0080] As shown in FIG. 2, pixel array 2 is configured to be disposed in an array pattern such that first pixel 21 (IR pixel) that performs imaging with reflected light, which is irradiation light reflected by a subject, and second pixel 22 (BW pixel) that images the subject are alternately aligned in columns.); an image-information acquisition unit configured to acquire a luminance image of the space ([0188] It is noted that when the distortion of lens is large, dust detector 112 may perform distortion correction processing for the BW image and the IR image, which have been imaged; [0192] Second depth estimator 111 b corrects the inappropriate depth in the dust region. Then, as shown in (e) of FIG. 20, outputter 118 generates third depth information which indicates the corrected depth of the dust region and the depth of the non-dust region.); a correspondence-information calculation unit configured to calculate, based on a position of the object in the reflection-intensity image and a position of the object in the luminance image, correspondence information that makes the reflection-intensity image and the luminance image correspond to each other ([0130] Next, BW camera 103 acquires a BW image. That is, BW camera 103 acquires a BW image corresponding to the IR image acquired in step S12, that is, a BW image of the same scene, the same viewpoint, and the same imaging time as those of the IR image.; [0242] In step S45 b, dust detector 112 calculates a correlation coefficient of luminance between the higher luminance region of the IR image and the region in the BW image corresponding to the higher luminance region (that is, the corresponding region) for each of at least one higher luminance region obtained by the regional segmentation in step S43); and a calculation unit configured to calculate a distance to the object based on detection information of the reflected wave acquired with the reflection-intensity information ([0145] As a result of this, depth information which at least indicates a depth of the dust region is calculated. It should be noted that at this moment, depth estimator 111 may estimate depth of not only the dust region but also the entire IR image, and calculate depth information indicating the estimation result.). Regarding claim 10, Sato teaches the image processing apparatus according to claim 1, Sato fails to teach the apparatus wherein the correspondence-information calculation unit is configured to receive detection information from a first detection unit and image information from a second detection unit physically separate from the first detection unit, the first detection unit positioned perpendicular to a first optical axis, the second detection unit positioned perpendicular to a second optical axis, and the second optical axis is oriented at a non-zero angle with respect to the first optical axis. However, Steinberg teaches the apparatus wherein the correspondence-information calculation unit is configured to receive detection information from a first detection unit and image information from a second detection unit physically separate from the first detection unit, the first detection unit positioned perpendicular to a first optical axis, the second detection unit positioned perpendicular to a second optical axis, and the second optical axis is oriented at a non-zero angle with respect to the first optical axis ([Fig. 2B]; [Fig. 4D]; [0058] Consistent with the present disclosure, a monostatic configuration of LIDAR system 100 may include an asymmetrical deflector to prevent reflected light from hitting light source 112, and to direct all the reflected light toward sensor 116, thereby increasing detection sensitivity. [0059] In the embodiment of FIG. 2B, LIDAR system 100 includes three projecting units 102 each with a single of light source 112 aimed at a common light deflector 114. [0086] Sensor 116 includes a plurality of detection elements 402 for detecting photons of a photonic pulse reflected back from field of view 120.). It would have been obvious to one of ordinary skill in the art prior to the effective filing date of this invention to modify the invention of Sato to comprise the physically separate detectors with the given orientation similar to Steinberg, with a reasonable expectation of success. This would have the predictable result of compartmentalizing the components of the apparatus and control the beam direction relative to each other. Regarding claim 13, Sato teaches the image processing apparatus according to claim 7, Sato fails to teach the apparatus wherein the correspondence-information calculation unit is configured to receive detection information from a first detection unit an image information from a second detection unit physically separate from the first detection unit, the first detection unit positioned perpendicular to a first optical axis, the second detection unit positioned perpendicular to a second optical axis, and the second optical axis is oriented at a non-zero angle with respect to the first optical axis. However, Steinberg teaches the apparatus wherein the correspondence-information calculation unit is configured to receive detection information from a first detection unit an image information from a second detection unit physically separate from the first detection unit, the first detection unit positioned perpendicular to a first optical axis, the second detection unit positioned perpendicular to a second optical axis, and the second optical axis is oriented at a non-zero angle with respect to the first optical axis ([Fig. 2B]; [Fig. 4D]; [0058] Consistent with the present disclosure, a monostatic configuration of LIDAR system 100 may include an asymmetrical deflector to prevent reflected light from hitting light source 112, and to direct all the reflected light toward sensor 116, thereby increasing detection sensitivity. [0059] In the embodiment of FIG. 2B, LIDAR system 100 includes three projecting units 102 each with a single of light source 112 aimed at a common light deflector 114. [0086] Sensor 116 includes a plurality of detection elements 402 for detecting photons of a photonic pulse reflected back from field of view 120.). It would have been obvious to one of ordinary skill in the art prior to the effective filing date of this invention to modify the invention of Sato to comprise the physically separate detectors with the given orientation similar to Steinberg, with a reasonable expectation of success. This would have the predictable result of compartmentalizing the components of the apparatus and control the beam direction relative to each other. Regarding claim 16, Sato teaches the distance-measurement apparatus according to claim 9, Sato fails to teach the apparatus wherein the correspondence-information calculation unit is configured to receive the detection information from a first detection unit and image information from a second detection unit physically separate from the first detection unit, the first detection unit positioned perpendicular to a first optical axis, the second detection unit positioned perpendicular to a second optical axis, and the second optical axis is oriented at a non-zero angle with respect to the first optical axis. However, Steinberg teaches the apparatus wherein the correspondence-information calculation unit is configured to receive the detection information from a first detection unit and image information from a second detection unit physically separate from the first detection unit, the first detection unit positioned perpendicular to a first optical axis, the second detection unit positioned perpendicular to a second optical axis, and the second optical axis is oriented at a non-zero angle with respect to the first optical axis ([Fig. 2B]; [Fig. 4D]; [0058] Consistent with the present disclosure, a monostatic configuration of LIDAR system 100 may include an asymmetrical deflector to prevent reflected light from hitting light source 112, and to direct all the reflected light toward sensor 116, thereby increasing detection sensitivity. [0059] In the embodiment of FIG. 2B, LIDAR system 100 includes three projecting units 102 each with a single of light source 112 aimed at a common light deflector 114. [0086] Sensor 116 includes a plurality of detection elements 402 for detecting photons of a photonic pulse reflected back from field of view 120.). It would have been obvious to one of ordinary skill in the art prior to the effective filing date of this invention to modify the invention of Sato to comprise the physically separate detectors with the given orientation similar to Steinberg, with a reasonable expectation of success. This would have the predictable result of compartmentalizing the components of the apparatus and control the beam direction relative to each other. Claims 5 are rejected under 35 U.S.C. 103 as being unpatentable over Sato in view of Steinberg, further in view of Shim et al. (United States Patent Application Publication 20110310376 A1) hereinafter Shim. Regarding claim 5, Sato teaches the image processing apparatus according to claim 1, Sato fails to teach the apparatus wherein the luminance image has a resolution higher than a resolution of the reflection-intensity image, and wherein the correspondence-information calculation unit calculates the correspondence information by using the luminance image whose resolution has been reduced and the reflection-intensity image or calculates the correspondence information by using the luminance image and the reflection-intensity image whose resolution has been increased. However, Shim teaches the apparatus wherein the luminance image has a resolution higher than a resolution of the reflection-intensity image ([0072] First, an operation of calculating first information used to calibrate the relative location and direction between the depth cameras is described below. Depending on an example embodiment, the depth cameras typically may provide a low-resolution image, and thus a calibration scheme based on a three-dimensional (3D) point may be used to more accurately perform calibration.; [0079] Color cameras typically provide high-resolution images, without a significant optical distortion. Accordingly, the second information may be calculated using a well-known algorithm.), and wherein the correspondence-information calculation unit calculates the correspondence information by using the luminance image whose resolution has been reduced and the reflection-intensity image or calculates the correspondence information by using the luminance image and the reflection-intensity image whose resolution has been increased ([0072] First, an operation of calculating first information used to calibrate the relative location and direction between the depth cameras is described below. Depending on an example embodiment, the depth cameras typically may provide a low-resolution image, and thus a calibration scheme based on a three-dimensional (3D) point may be used to more accurately perform calibration.;). It would have been obvious to one of ordinary skill in the art prior to the effective filing date of this invention to modify the invention of Sato to comprise the varying resolution images utilized in the correspondence-information calculation unit similar to Shim, with a reasonable expectation of success. This would have the predictable result of generating better correlation data between two images based on environmental and calibration requirements. Claims 11-12, 14-15, and 17-18 are rejected under 35 U.S.C. 103 as being unpatentable over Sato in view of Steinberg, further in view of Go et al. (United States Patent No. 9417059 B2), hereinafter Go. Regarding claim 11, Sato teaches the image processing apparatus according to claim 1, Sato fails to teach the apparatus wherein the correspondence-information calculation unit is configured to receive detection information from a first detection unit and image information from a second detection unit, the first detection unit positioned to receive reflected light from an optical element and the second detection unit positioned to receive light transmitted through the optical element. However, Go teaches the apparatus wherein the correspondence-information calculation unit is configured to receive detection information from a first detection unit and image information from a second detection unit, the first detection unit positioned to receive reflected light from an optical element and the second detection unit positioned to receive light transmitted through the optical element ([Fig. 6]; [Col. 11, line 27-31] Beams scattered or reflected by the external target are received through a light receiving unit 292, not the scanner 240. The received beams are transmitted to corresponding detecting units PD1, PD2, . . . , and PDn via n light wavelength splitting units DMa, DMb, . . . , and DMn.). It would have been obvious to one of ordinary skill in the art prior to the effective filing date of this invention to modify the invention of Sato to comprise the beam splitting director to detector configuration similar to Go, with a reasonable expectation of success. This would have the predictable result of using a known device in the art to configure the detectors to a desirable configuration for compact design. Regarding claim 12, Sato teaches the image processing apparatus according to claim 11, Sato fails to teach the apparatus wherein the optical element includes at least one of a half mirror, a beam splitter, a dichroic mirror, a cold mirror, a hot mirror, a metasurface, a deflection element, and a prism. However, Go teaches the apparatus wherein the optical element includes at least one of a half mirror, a beam splitter, a dichroic mirror, a cold mirror, a hot mirror, a metasurface, a deflection element, and a prism ([Col. 10, line 49-52] Meanwhile, the second light wavelength splitting unit 284 may reflect or transmit light on a per wavelength basis. For example, the second light wavelength splitting unit 284 may be realized by a dichroic mirror.). It would have been obvious to one of ordinary skill in the art prior to the effective filing date of this invention to modify the invention of Sato to comprise the beam splitting optical element and dichroic mirror similar to , with a reasonable expectation of success. This would have the predictable result of using a device known in the art to successfully split a reflected and transmitted beam to two detectors. Regarding claim 14, Sato teaches the image processing apparatus according to claim 7, Sato fails to teach the apparatus wherein the correspondence-information calculation unit is configured to receive detection information from a first detection unit and image information from a second detection unit, the first detection unit positioned to receive reflected light from an optical element and the second detection unit positioned to receive light transmitted through the optical element. HosdfsdfHowever, Go teaches the apparatus wherein the correspondence-information calculation unit is configured to receive detection information from a first detection unit and image information from a second detection unit, the first detection unit positioned to receive reflected light from an optical element and the second detection unit positioned to receive light transmitted through the optical element ([Fig. 6]; [Col. 11, line 27-31] Beams scattered or reflected by the external target are received through a light receiving unit 292, not the scanner 240. The received beams are transmitted to corresponding detecting units PD1, PD2, . . . , and PDn via n light wavelength splitting units DMa, DMb, . . . , and DMn.). It would have been obvious to one of ordinary skill in the art prior to the effective filing date of this invention to modify the invention of Sato to comprise the beam splitting director to detector configuration similar to Go, with a reasonable expectation of success. This would have the predictable result of using a known device in the art to configure the detectors to a desirable configuration for compact design. Regarding claim 15, Sato teaches the image processing apparatus according to claim 14, Sato fails to teach the apparatus wherein the optical element includes at least one of a half mirror, a beam splitter, a dichroic mirror, a cold mirror, a hot mirror, a metasurface, a deflection element, and a prism. However, Go teaches the apparatus wherein the optical element includes at least one of a half mirror, a beam splitter, a dichroic mirror, a cold mirror, a hot mirror, a metasurface, a deflection element, and a prism ([Col. 10, line 49-52] Meanwhile, the second light wavelength splitting unit 284 may reflect or transmit light on a per wavelength basis. For example, the second light wavelength splitting unit 284 may be realized by a dichroic mirror.). It would have been obvious to one of ordinary skill in the art prior to the effective filing date of this invention to modify the invention of Sato to comprise the beam splitting optical element and dichroic mirror similar to , with a reasonable expectation of success. This would have the predictable result of using a device known in the art to successfully split a reflected and transmitted beam to two detectors. Regarding claim 17, Sato teaches the distance-measurement apparatus according to claim 9, Sato fails to teach the apparatus wherein the correspondence-information calculation unit is configured to receive the detection information from a first detection unit and image information from a second detection unit, the first detection unit positioned to receive reflected light from an optical element and the second detection unit positioned to receive light transmitted through the optical element. However Go teaches the apparatus wherein the correspondence-information calculation unit is configured to receive the detection information from a first detection unit and image information from a second detection unit, the first detection unit positioned to receive reflected light from an optical element and the second detection unit positioned to receive light transmitted through the optical element ([Fig. 6]; [Col. 11, line 27-31] Beams scattered or reflected by the external target are received through a light receiving unit 292, not the scanner 240. The received beams are transmitted to corresponding detecting units PD1, PD2, . . . , and PDn via n light wavelength splitting units DMa, DMb, . . . , and DMn.). It would have been obvious to one of ordinary skill in the art prior to the effective filing date of this invention to modify the invention of Sato to comprise the beam splitting director to detector configuration similar to Go, with a reasonable expectation of success. This would have the predictable result of using a known device in the art to configure the detectors to a desirable configuration for compact design. Regarding claim 18, Sato teaches the distance-measurement apparatus according to claim 17, Sato fails to teach the apparatus wherein the optical element includes at least one of a half-mirror, a beam splitter, a dichroic mirror, a cold mirror, a hot mirror, a metasurface, a deflection element, and a prism. However, Go teaches the apparatus wherein the optical element includes at least one of a half-mirror, a beam splitter, a dichroic mirror, a cold mirror, a hot mirror, a metasurface, a deflection element, and a prism ([Col. 10, line 49-52] Meanwhile, the second light wavelength splitting unit 284 may reflect or transmit light on a per wavelength basis. For example, the second light wavelength splitting unit 284 may be realized by a dichroic mirror.). It would have been obvious to one of ordinary skill in the art prior to the effective filing date of this invention to modify the invention of Sato to comprise the beam splitting optical element and dichroic mirror similar to , with a reasonable expectation of success. This would have the predictable result of using a device known in the art to successfully split a reflected and transmitted beam to two detectors. Response to Arguments Applicant's arguments filed February 25th, 2026 have been fully considered but they are not persuasive. Regarding the applicant’s argument that the prior art of Sato fails to teach the calculation corresponding the intensity and image data, the examiner notes that the claims, as written, are examined under the broadest reasonable interpretation to one of reasonable skill in the art. As written, the claim language of the independent claim refers to a correspondence calculation between the two capturing devices but fails to go into more specific detail as to how this calculation is carried out, thus the correspondence calculation taught in Sato teaches this claim as it does teach a correlation calculation between the detectors cited in the previous and above rejection. Regarding the newly made amendments, while the prior art of record previously stated does not seem to teach this configuration of the apparatus described in the immediate application, new prior art of Steinberg and Go has been discovered in an updated search that does teach a multi-detector intensity and image processing apparatus that teaches the amendments to the immediate application. Proper citations can be found above as well as statements for obviousness to combine, given that the added limitations deal mostly with configurations and devices known in the art. As such the rejection is maintained in this Final Office Action. Conclusion Applicant's amendment necessitated the new ground(s) of rejection presented in this Office action. Accordingly, THIS ACTION IS MADE FINAL. See MPEP § 706.07(a). Applicant is reminded of the extension of time policy as set forth in 37 CFR 1.136(a). A shortened statutory period for reply to this final action is set to expire THREE MONTHS from the mailing date of this action. In the event a first reply is filed within TWO MONTHS of the mailing date of this final action and the advisory action is not mailed until after the end of the THREE-MONTH shortened statutory period, then the shortened statutory period will expire on the date the advisory action is mailed, and any nonprovisional extension fee (37 CFR 1.17(a)) pursuant to 37 CFR 1.136(a) will be calculated from the mailing date of the advisory action. In no event, however, will the statutory period for reply expire later than SIX MONTHS from the mailing date of this final action. Any inquiry concerning this communication or earlier communications from the examiner should be directed to ROBERT WILLIAM VASQUEZ JR whose telephone number is (571)272-3745. The examiner can normally be reached Monday thru Thursday, Flex Friday, 8:00-5:00 PST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, HELAL ALGAHAIM can be reached at (571)270-5227. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /ROBERT W VASQUEZ/Examiner, Art Unit 3645 /HELAL A ALGAHAIM/SPE , Art Unit 3645
Read full office action

Prosecution Timeline

Dec 29, 2022
Application Filed
Nov 25, 2025
Non-Final Rejection mailed — §103
Feb 10, 2026
Examiner Interview Summary
Feb 25, 2026
Response Filed
May 11, 2026
Final Rejection mailed — §103
Jun 16, 2026
Response after Non-Final Action
Jul 13, 2026
Final Rejection mailed — §103 (current)

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DISTANCE MEASURING DEVICE
4y 1m to grant Granted Oct 07, 2025
Study what changed to get past this examiner. Based on 2 most recent grants.

Strategy Recommendation AI-generated — please review before filing

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Prosecution Projections

4-5
Expected OA Rounds
11%
Grant Probability
19%
With Interview (+8.3%)
4y 2m (~8m remaining)
Median Time to Grant
High
PTA Risk
Based on 18 resolved cases by this examiner. Grant probability derived from career allowance rate.

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