CTNF 18/011,394 CTNF 81033 Notice of Pre-AIA or AIA Status 07-03-aia AIA 15-10-aia The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA. Claim Rejections - 35 USC § 112 07-30-02 AIA The following is a quotation of 35 U.S.C. 112(b): (b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention. The following is a quotation of 35 U.S.C. 112 (pre-AIA), second paragraph: The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention. 07-34-01 Claims 1-8 are rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention. The recitation in claim 1, line 1 of “A design for reducing a dark count rate…” renders the claims indefinite. It appears that the claims are drawn to a method or process. It is requested that applicant amend the claims to clearly recite a process or method. Claim 1 recites the limitation "an SNSPD" in line 3. There is insufficient antecedent basis for this limitation in the claim. It appears that this recitation refers back to the SNSPD of line 2. The recitation in claim 1, lines 4-5 of “regulating and controlling behaviors of the other nanowire by using one nanowire” renders the claims indefinite. First, it is unclear whether the nanowires referenced in this limitation refer back to the nanowires in the SNSPD. Second, it is unclear what is encompassed/required by regulating and controlling behaviors of the other nanowire. The recitation in claim 2, lines 3-5 of “from left to right, a length is 10-20 micrometers, a width is 50-80 nm, and a thickness is designed to be 5-8 nm” renders the claim indefinite. it is unclear if these dimensions are meant to refer to the individual nanowires or the intertwining step. The recitation in claim 3, lines 4-5 of “a single wire has a width of 80 nm” renders the claim indefinite. It is unclear if this refers back to each of the wires of the two wire structure. Allowable Subject Matter 07-43-01 AIA Claim s 1-8 would be allowable if rewritten or amended to overcome the rejection(s) under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA), 2nd paragraph, set forth in this Office action. 13-03-01 AIA The following is a statement of reasons for the indication of allowable subject matter: the prior art of record fails to teach or suggest a method for reducing a dark count rate of a superconducting nanowire single photon detector based on a two-wire structure, the nanowires are not crossed to form the SNSPD of a two-wire structure, adjusting bias current to be close to superconducting current, outputting two channels of signals respectively through the two nanowires to make the dark count of the two nanowires mutually excited; and through a voltage comparator and an exclusive-OR gate, reducing the dark count rate signals in combination with the limitations of claim 1 . Specifically, US 2021/0135084 teaches that reducing dark counts in SNPDs is beneficial but fails to teach outputting two channels of signals respectively through the two nanowires to make the dark count of the two nanowires mutually excited; and through a voltage comparator and an exclusive-OR gate, reducing the dark count rate signals [0064, 0030, 0044]. Additionally, US 2017/0092834 teaches a voltage comparator coupled to a photon detector [0024] wherein the threshold voltage of the pulse detector is adjusted to adjust the dark count [0062]. ‘834, however, does not teach outputting two channels of signals respectively through the two nanowires to make the dark count of the two nanowires mutually excited; and through a voltage comparator and an exclusive-OR gate. Therefore, the prior art of record fails to teach or suggest the above limitations in combination with the limitations of claim 1. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to PAUL A WARTALOWICZ whose telephone number is (571)272-5957. The examiner can normally be reached Monday-Friday 9 am - 5 pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Keith Walker can be reached at 571-272-3458. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /PAUL A WARTALOWICZ/Primary Examiner, Art Unit 1735 Application/Control Number: 18/011,394 Page 2 Art Unit: 1735 Application/Control Number: 18/011,394 Page 3 Art Unit: 1735 Application/Control Number: 18/011,394 Page 4 Art Unit: 1735 Application/Control Number: 18/011,394 Page 5 Art Unit: 1735