Prosecution Insights
Last updated: April 19, 2026
Application No. 18/063,867

SEMICONDUCTOR DEVICE AND MANUFACTURING METHOD THEREOF

Non-Final OA §103
Filed
Dec 09, 2022
Examiner
MCCALL SHEPARD, SONYA D
Art Unit
2898
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Enkris Semiconductor Inc.
OA Round
3 (Non-Final)
93%
Grant Probability
Favorable
3-4
OA Rounds
2y 3m
To Grant
97%
With Interview

Examiner Intelligence

Grants 93% — above average
93%
Career Allow Rate
1082 granted / 1164 resolved
+25.0% vs TC avg
Minimal +4% lift
Without
With
+3.6%
Interview Lift
resolved cases with interview
Typical timeline
2y 3m
Avg Prosecution
24 currently pending
Career history
1188
Total Applications
across all art units

Statute-Specific Performance

§101
0.3%
-39.7% vs TC avg
§103
47.3%
+7.3% vs TC avg
§102
36.1%
-3.9% vs TC avg
§112
13.0%
-27.0% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1164 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Continued Examination Under 37 CFR 1.114 A request for continued examination under 37 CFR 1.114, including the fee set forth in 37 CFR 1.17(e), was filed in this application after final rejection. Since this application is eligible for continued examination under 37 CFR 1.114, and the fee set forth in 37 CFR 1.17(e) has been timely paid, the finality of the previous Office action has been withdrawn pursuant to 37 CFR 1.114. Applicant's submission filed on 02/10/2026 has been entered. Response to Arguments Applicant’s arguments with respect to claim(s) 1 have been considered but are moot because the new ground of rejection does not rely on any reference applied in the prior rejection of record for any teaching or matter specifically challenged in the argument. Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 1-2 and 5-7 is/are rejected under 35 U.S.C. 103 as being unpatentable over Xiao et al. US 9,640,615 in view of Tang et al. US 2022/0131013. PNG media_image1.png 327 588 media_image1.png Greyscale Xiao et al. US 9,640,615 Regarding claim 1, Xiao al. in Fig. 1 (annotated above) and col. 3, line 64-col. 4, line 65 discloses a semiconductor device, comprising: a first region, and a second region and a third region located on respective sides of the first region; a first nanowire heterojunction 210 (211, 212, 220), the first nanowire heterojunction comprising a first gate section corresponding to the first region, a first source section corresponding to the second region, and a first drain section corresponding to the third region; the first source section and the first drain section being located on an upper surface of the first support structure 300; and a source 241 located on an upper surface of the first source section, a drain 242 located on an upper surface of the first drain section, and a ring-shaped gate 230 wrapping the first gate section. Xiao et al. discloses a first nanowire 210( 211, 212) that is a continuous structural layer that extends at least through the source 241, the ring-shaped gate 230 and the drain 242, and the first nanowire heterojunction comprises, from bottom to top, a first channel layer 210 and a first barrier layer 220. Xiao et al. does not expressly disclose a first support structure located at least on the second region and the third region; wherein the first nanowire heterojunction is a continuous structural layer that extends at least through the source, the ring-shaped gate and the drain, and the first nanowire heterojunction comprises, from bottom to top, a first channel layer and a first barrier layer that are continuously extending along a length direction of the first nanowire heterojunction. PNG media_image2.png 391 538 media_image2.png Greyscale Tang et al. US 2022/0131013 However, in analogous art, Tang et al. in Figs. 1A-3C and [0018]-[0033] teaches a semiconductor device 300 that provides improved current density and improved electrical coupling for channels of GAA HEMTs including a support structure (i.e. sacrificial layer, 114A), a nanowire, comprising, from bottom to top, a channel layer 110 and a barrier layer 112B. Therefore, it would have been obvious to one having ordinary skill in the art before the effective filing date of the claimed invention to incorporate the teachings of Tang et al. in the semiconductor device of Xiao et al. for the purpose of improving the device performance. Regarding claim 2, Xiao et al. in view of Tang et al. teaches the semiconductor device according to claim 1. Tang et al. teaches in [0020] a support structure 114A located only on a source region 302 and drain region 304 of the multichannel GAA HEMT. Regarding claim 5, Xiao et al. in view of Tang et al. teaches the semiconductor device according to claim 5. Tang et al. teaches wherein the semiconductor device comprises two or more first nanowire heterojunctions 112A, 110A, 112B, 112C, 110B, 112D. Regarding claim 6, Xiao et al. in view of Tang et al. teaches the semiconductor device according to claim 5. Tang et al. teaches wherein the two or more first nanowire heterojunctions 112A, 110A, 112B, 112C, 110B, 112D share a source section 302 and/or a first drain section 304. Regarding claim 7, Xiao et al. in view of Tang et al. teaches the semiconductor device according to claim 5. Tang et al. teaches wherein a ring-shaped gate wrapping each of the two or more first nanowire heterojunctions 112A, 110A, 112B, 112C, 110B, 112D are separated from each other, or connected together. Allowable Subject Matter Claim 4 is objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. The following is a statement of reasons for the indication of allowable subject matter: the prior art neither anticipates nor renders obvious, in the context of the claims: the first nanowire heterojunction is wrapped by a first anti-scattering layer. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to SONYA D MCCALL-SHEPARD whose telephone number is (571)272-9801. The examiner can normally be reached M-F: 8:30 AM-5:00 PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Julio J. Maldonado can be reached at (571)272-1864. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /Sonya McCall-Shepard/ Primary Examiner, Art Unit 2898
Read full office action

Prosecution Timeline

Dec 09, 2022
Application Filed
Jul 23, 2025
Non-Final Rejection — §103
Oct 22, 2025
Response Filed
Nov 06, 2025
Final Rejection — §103
Feb 10, 2026
Request for Continued Examination
Feb 23, 2026
Response after Non-Final Action
Mar 03, 2026
Non-Final Rejection — §103 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

3-4
Expected OA Rounds
93%
Grant Probability
97%
With Interview (+3.6%)
2y 3m
Median Time to Grant
High
PTA Risk
Based on 1164 resolved cases by this examiner. Grant probability derived from career allow rate.

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