Prosecution Insights
Last updated: May 29, 2026
Application No. 18/074,567

HYBRID ANALOG SYSTEM FOR TRANSFER LEARNING

Final Rejection §103
Filed
Dec 05, 2022
Examiner
HICKS, AUSTIN JAMES
Art Unit
2142
Tech Center
2100 — Computer Architecture & Software
Assignee
International Business Machines Corporation
OA Round
2 (Final)
75%
Grant Probability
Favorable
3-4
OA Rounds
0m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 75% — above average
75%
Career Allowance Rate
310 granted / 411 resolved
+20.4% vs TC avg
Strong +25% interview lift
Without
With
+24.7%
Interview Lift
resolved cases with interview
Typical timeline
3y 2m
Avg Prosecution
30 currently pending
Career history
462
Total Applications
across all art units

Statute-Specific Performance

§101
3.8%
-36.2% vs TC avg
§103
82.6%
+42.6% vs TC avg
§102
9.1%
-30.9% vs TC avg
§112
3.9%
-36.1% vs TC avg
Black line = Tech Center average estimate • Based on career data from 411 resolved cases

Office Action

§103
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Response to Arguments Applicant’s arguments with respect to claims 1-8 have been considered but are moot because the new ground of rejection does not rely on any reference applied in the prior rejection of record for any teaching or matter specifically challenged in the argument. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 1-7 are rejected under 35 U.S.C. 103 as being unpatentable over US20220366211A1 to Ma et al, AutoFreeze: Automatically Freezing Model Blocks to Accelerate Fine-tuning by Liu et al and US20210382693A1 to Song. Claim 8 is rejected under 35 U.S.C. 103 as being unpatentable over US20220366211A1 to Ma et al, AutoFreeze: Automatically Freezing Model Blocks to Accelerate Fine-tuning by Liu et al, US20210382693A1 to Song and A Survey on Multi-Task Learning by Zhang et al Ma teaches claim 1. A semiconductor device comprising: a first non-volatile memory (NVM) configured to store weights of a first set of layers of a machine learning model, wherein weights of the first set of layers and (Ma para 116 “a non-volatile memory device includes: a first array of non-volatile memory cells each storing a weight value of a first layer of a neural network…” Ma para 116 “non-volatile memory device includes: a first array of non-volatile memory cells each storing a weight value of a first layer of a neural network; a second array of non-volatile memory cells each comprising a programmable resistive element connected in series with a threshold switching selector, the programmable resistive element storing a weight value of a second layer of the neural network and the threshold switching selector configured to become conductive in response to application of a voltage level exceeding a threshold voltage…”) a second NVM configured to store weights of a second set of layers of the machine learning model, wherein weights of the second set of layers are adjustable, the second NVM is different from the first NVM, and the second NVM comprises a(Ma para 116 “a non-volatile memory device includes:… a second array of non-volatile memory cells each comprising a programmable resistive element connected in series with a threshold switching selector, the programmable resistive element storing a weight value of a second layer of the neural network…” Ma para 112 “the weights can be adjusted by reprogramming one or more memory cells…” Ma para 116 “non-volatile memory device includes: a first array of non-volatile memory cells each storing a weight value of a first layer of a neural network; a second array of non-volatile memory cells each comprising a programmable resistive element connected in series with a threshold switching selector, the programmable resistive element storing a weight value of a second layer of the neural network and the threshold switching selector configured to become conductive in response to application of a voltage level exceeding a threshold voltage…”) Ma doesn’t teach fixing weights. However, Liu teaches that weights of the first set of layers are fixed. (Liu fig. 1 p. 2 “We present a high level design of AutoFreeze. During fine-tuning, AutoFreeze adaptively determines layers which can be frozen. Once layers are frozen, the backward computation for those layers can be avoided. At later epochs, intermediate outputs are also cached leading to further gains.” See fig. 1 below.) PNG media_image1.png 204 578 media_image1.png Greyscale Liu, Ma and the claims all train neural networks. It would have been obvious to a person having ordinary skill in the art, at the time of filing, to “to choose which layers are trained and… this can accelerate model fine-tuning while preserving accuracy.” Liu abs. Ma doesn’t teach a dedicated MAC for each NVM bank. However, Song teaches the first NVM comprises a first multiply-accumulate unit… the second NVM comprises a second multiply-accumulate unit. (Song fig. 2 shows several memory banks “BK0” “BK2” with their own dedicated MACs “MAC0” “MAC1”.) Song, Ma and the claims all teach Processing in memory. It would have been obvious to a person having ordinary skill in the art, at the time of filing, to dedicate a MAC to each layer so that “a data processing speed in the neural network may be improved.” Song para 3. Ma teaches claim 2. The semiconductor device of claim 1, wherein the first NVM is at least one of: an analog NVM; and (Ma para 95 “Depending on the embodiment, the weights and input values can be analog values…”) a multi-level-cell (MLC) NVM. (Ma para 72 “ the memory cells can be binary valued, having either a low resistance state or a high resistance state, or multi-level cells (MLCs…”) Ma teaches claim 3. The semiconductor device of claim 2, wherein the first NVM is a monolithic three-dimensional (3D) NVM. (Ma fig. 7d see below. Ma para 41 “memory structure 502 comprises a three dimensional memory array of non-volatile memory cells in which multiple memory levels are formed above a single substrate, such as a wafer. “) PNG media_image2.png 356 616 media_image2.png Greyscale Ma fig. 7d Ma teaches claim 4. The semiconductor device of claim 1, wherein at least one of the NVMs is configured to perform compute-in-memory. (Ma para 26 “The following presents techniques for performing dropout when implementing a neural network through in-memory computation using a memory array in which the memory cells include a threshold switching selector in series with a programmable resistance element.”) Ma teaches claim 5. The semiconductor device of claim 1, wherein the second NVM is an analog NVM with bi-directional device conductance tunability. (Ma abs “storing weight values as conductance values in memory cells formed of a series combination of a threshold switching selector, such as an ovonic threshold switch, and a programmable resistive element, such as a ReRAM element.” ReRam is a bi-directional device with conductance tunability. Ma para 95 “Depending on the embodiment, the weights and input values can be analog values…”) Ma teaches claim 6. The semiconductor device of claim 1, wherein the first NVM and the second NVM constitute at least a portion of a neural network. (Ma para 116 “non-volatile memory device includes: a first array of non-volatile memory cells each storing a weight value of a first layer of a neural network; a second array of non-volatile memory cells each comprising a programmable resistive element connected in series with a threshold switching selector, the programmable resistive element storing a weight value of a second layer of the neural network and the threshold switching selector configured to become conductive in response to application of a voltage level exceeding a threshold voltage…”) Ma teaches claim 7. The semiconductor device of claim 1, wherein the first NVM and the second NVM are integrated on a same package. (Ma fig. 7d see below. Ma para 71 “FIG. 7D depicts an embodiment of a portion of a two level memory array that forms a cross-point architecture in an oblique view.”) PNG media_image2.png 356 616 media_image2.png Greyscale Ma fig. 7d Ma teaches claim 8. The semiconductor device of claim 1, wherein the second NVM and at least one additional copy of the second NVM are connected to the first NVM to implement (Ma fig. 7d top four rows of memory cells 701 are the first and second copy of the second NVM, see below. Learning is taught in Ma para 79 “training a neural network to generate a set of weights.”) PNG media_image3.png 356 618 media_image3.png Greyscale Ma fig. 7d, Examiner added pointers. Ma doesn’t teach multi-task learning. However, Zhang teaches multi-task learning. (Zhang title “A Survey on Multi-Task Learning” Zhang abs “Multi-Task Learning (MTL) is a learning paradigm in machine learning and its aim is to leverage useful information contained in multiple related tasks to help improve the generalization performance of all the tasks.”) Ma, Zhang and the claims are all neural networks. It would have been obvious to a person having ordinary skill in the art, at the time of filing, to do multi-task learning in Ma “to boost their performance…” Zhang abs. Conclusion THIS ACTION IS MADE FINAL. Applicant is reminded of the extension of time policy as set forth in 37 CFR 1.136(a). A shortened statutory period for reply to this final action is set to expire THREE MONTHS from the mailing date of this action. In the event a first reply is filed within TWO MONTHS of the mailing date of this final action and the advisory action is not mailed until after the end of the THREE-MONTH shortened statutory period, then the shortened statutory period will expire on the date the advisory action is mailed, and any nonprovisional extension fee (37 CFR 1.17(a)) pursuant to 37 CFR 1.136(a) will be calculated from the mailing date of the advisory action. In no event, however, will the statutory period for reply expire later than SIX MONTHS from the mailing date of this final action. Any inquiry concerning this communication or earlier communications from the examiner should be directed to Austin Hicks whose telephone number is (571)270-3377. The examiner can normally be reached Monday - Thursday 8-4 PST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Mariela Reyes can be reached at (571) 270-1006. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /AUSTIN HICKS/Primary Examiner, Art Unit 2142
Read full office action

Prosecution Timeline

Dec 05, 2022
Application Filed
Dec 03, 2025
Non-Final Rejection mailed — §103
Feb 18, 2026
Interview Requested
Feb 26, 2026
Examiner Interview Summary
Feb 26, 2026
Applicant Interview (Telephonic)
Mar 02, 2026
Response Filed
Mar 27, 2026
Final Rejection mailed — §103 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

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4y 1m to grant Granted Apr 21, 2026
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3y 9m to grant Granted Mar 31, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

3-4
Expected OA Rounds
75%
Grant Probability
99%
With Interview (+24.7%)
3y 2m (~0m remaining)
Median Time to Grant
Moderate
PTA Risk
Based on 411 resolved cases by this examiner. Grant probability derived from career allowance rate.

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