Prosecution Insights
Last updated: April 19, 2026
Application No. 18/217,407

REFLECTOR STRUCTURE HAVING THREE-DIMENSIONAL CURVATURE

Non-Final OA §103§112
Filed
Jun 30, 2023
Examiner
WONG, TINA MEI SENG
Art Unit
2874
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Poet Technologies Inc.
OA Round
1 (Non-Final)
84%
Grant Probability
Favorable
1-2
OA Rounds
2y 5m
To Grant
98%
With Interview

Examiner Intelligence

Grants 84% — above average
84%
Career Allow Rate
909 granted / 1078 resolved
+16.3% vs TC avg
Moderate +14% lift
Without
With
+14.1%
Interview Lift
resolved cases with interview
Typical timeline
2y 5m
Avg Prosecution
45 currently pending
Career history
1123
Total Applications
across all art units

Statute-Specific Performance

§101
0.2%
-39.8% vs TC avg
§103
62.7%
+22.7% vs TC avg
§102
24.9%
-15.1% vs TC avg
§112
4.6%
-35.4% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1078 resolved cases

Office Action

§103 §112
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Objections Claim 4 is objected to because of the following informalities: Claim 4 recites 2 periods, one at the end of the claim and one at the end of line 2. Appropriate correction is required. Claim Rejections - 35 USC § 112 The following is a quotation of 35 U.S.C. 112(b): (b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention. The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph: The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention. Claim 2 is rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention. Claim 2 recites “wherein the second direction is perpendicular to the substrate.” However, claim 1, which claim 2 depends recites “a second direction forming an angle less than 60 degrees with a third direction perpendicular with the substrate.” It is unclear how the second direction can be perpendicular to the substrate as recited in claim 2 and also a second direction forming an angled less than 60 degrees with a third direction perpendicular with the substrate. Appropriate correction is required. Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 1, 3-13 and 18-20 is/are rejected under 35 U.S.C. 103 as being unpatentable over U.S. Patent Application Publication 2002/0096686 to Raj et al in view of U.S. Patent Application Publication 2012/0320586 to Yip In regards to claim 1, Raj teaches a reflector structure (102 / 300) disposed on a substrate (306), wherein the reflector structure is configured to transmit an optical signal between a first direction parallel to the substrate and a second direction forming an angle less than 60 degrees with a third direction perpendicular with the substrate, wherein the reflector structure has a curved surface (302), wherein the curved surface is configured to reflect an incoming optical signal to a reflected optical signal comprising a smaller cross section area (focusing of light/focused output). (Figures 1 & 3) But Raj fails to expressly teach wherein the reflector structure comprises a curved surface, with the curved surface comprising curved intersecting lines between the curved surface and planes parallel and perpendicular to the substrate. However, Yip teaches an improved curved reflector with a focused output and a curves surface (22). (Figure 2A) Yip further teaches the reflector having a parabolic shape, the parabolic shape having a three dimensional shape by definition. Yip teaches the improved curved reflector to increase the efficiency of the illumination source. [0010] Therefore, the reflector of Yip teaches the curved surface comprising curved intersecting lines between the curved surface and planes parallel and perpendicular to the substrate. Since both Raj and Yip teach a curved reflector structure with a focused output and further since Yip teaches an improved curved reflector having a parabolic shape, it would have been obvious before the effective filing date to a person having ordinary skill in the art to have provided the curved reflector of Yip in the device of Raj in order to improve the efficiency of the illumination source. In regards to claim 3, Raj teaches the reflector structure comprises a reflector layer [0024] disposed in a cavity [0024; within the substrate] of the substrate. In regards to claim 4, Raj teaches the reflector structure comprises a reflector layer [0024] disposed in a cavity [0024; within the substrate] of the substrate and Yip teaches the reflective layer comprises a variable thickness (see Figure 2A) across at least the curved intersecting lines. In regards to claim 5, Raj teaches the reflector structure is configured to transmit or receive the optical signal between a first device disposed on the substrate and a second device disposed on the reflector structure. In regards to claim 6, Raj teaches a substrate (306), a first optical element (304) disposed on the substrate, with the optical element configured to transmit an optical signal or to receive the optical signal, a reflector structure (102 / 300) disposed on the substrate and aligned with the optical element [0027], wherein the reflector structure is configured to transmit or receive the optical signal between the first element and a second optical element (106) disposed away from the reflector structure in a direction from the substrate to the reflector structure, wherein the reflector structure comprises a curved surface (302), wherein the curved surface is configured to reflect an incoming optical signal to a reflected optical signal comprising a smaller cross section area (focusing of light/focused output). (Figures 1 & 3) But Raj fails to expressly teach wherein the reflector structure comprises a curved surface, with the curved surface comprising curved intersecting lines between the curved surface and planes parallel and perpendicular to the substrate. However, Yip teaches an improved curved reflector with a focused output and a curves surface (22). (Figure 2A) Yip further teaches the reflector having a parabolic shape, the parabolic shape having a three dimensional shape by definition. Yip teaches the improved curved reflector to increase the efficiency of the illumination source. [0010] Therefore, the reflector of Yip teaches the curved surface comprising curved intersecting lines between the curved surface and planes parallel and perpendicular to the substrate. Since both Raj and Yip teach a curved reflector structure with a focused output and further since Yip teaches an improved curved reflector having a parabolic shape, it would have been obvious before the effective filing date to a person having ordinary skill in the art to have provided the curved reflector of Yip in the device of Raj in order to improve the efficiency of the illumination source. In regards to claim 7, Raj teaches the first optical element comprises a waveguide, the second optical element comprises an optical or an optoelectronic surface-mount device. In regards to claim 8, Raj teaches the second optical element comprises an optical or an optoelectronic surface-mount device disposed on the substrate and aligned with the first optical element. In regards to claims 9 and 10, although Raj does not expressly disclose an alignment aid elements disposed on the substrate, wherein the alignment aid element are is configured to align optical elements to be mounted on the substrate, it is advantageous to use alignment aid elements in order to ensure proper alignment and decrease the loss of light. The concept of alignment aid elements are well known and a commonly employed technique in the optical art. Therefore, it would have been obvious before the effective filing date to a person having ordinary skill in the art to have provided alignment aid elements on the substrate for the purpose of aligning optical elements on the substrate. Furthermore, the limitations regarding lithography is a method limitation in a device claim. Applicant is claiming a product, not a method of manufacturing the product. In regards to claim 11, Raj teaches the reflector structure comprises a reflective layer [0024] disposed in a cavity [0024; within the substrate] of the substrate, wherein the substrate comprises mounting pads (110) on top the layer to receive the second optical element. In regards to claim 12, Raj teaches the reflector structure comprises a reflective layer [0024] disposed in a cavity [0024; within the substrate] of the substrate, wherein the first optical element comprises an end facet facing the cavity, with the cavity configured to align the optical signal between the first optical element through the end facet and the cavity. In regards to claim 13, Raj teaches the reflector structure comprises a reflective layer [0024] disposed in a cavity [0024; within the substrate] of the substrate, wherein the reflector structure is configured to be aligned wo the first optical element. Regarding the recitation of lithography, lithography is a method limitation in a device claim. Applicant is claiming a product, not a method of manufacturing the product. In regards to claim 18, Raj teaches a substrate (306), a waveguide (304) on the substrate, with the waveguide configured to transmit an optical signal or to receive the optical signal, a reflector structure (102 / 300) disposed on the substrate and aligned with the waveguide, wherein the reflector structure comprises a curved surface (302), wherein the curved surface is configured to reflect an incoming optical signal to a reflected optical signal comprising a smaller cross section area (focusing of light/focused output) (Figures 1 & 3), a second device (106) disposed on the layer above the reflector structure, wherein the second device is configured to receive or transmit the optical signal from or to the first device reflected by the reflector structure. But Raj fails to expressly teach wherein the reflector structure comprises a curved surface, with the curved surface comprising curved intersecting lines between the curved surface and planes parallel and perpendicular to the substrate. However, Yip teaches an improved curved reflector with a focused output and a curves surface (22). (Figure 2A) Yip further teaches the reflector having a parabolic shape, the parabolic shape having a three dimensional shape by definition. Yip teaches the improved curved reflector to increase the efficiency of the illumination source. [0010] Therefore, the reflector of Yip teaches the curved surface comprising curved intersecting lines between the curved surface and planes parallel and perpendicular to the substrate. Since both Raj and Yip teach a curved reflector structure with a focused output and further since Yip teaches an improved curved reflector having a parabolic shape, it would have been obvious before the effective filing date to a person having ordinary skill in the art to have provided the curved reflector of Yip in the device of Raj in order to improve the efficiency of the illumination source. Raj further fails to teach a first device coupled to the waveguide on the substrate, with the first device configured to transmit an optical signal to the waveguide or to receive the optical signal from the waveguide. However, Raj teaches the waveguide to receive an input signal and an example of a light emitting device is a light emitting diode or laser and an example of a light detecting device is a diode or detector. [0018] Since Raj teaches the device to be a bidirectional device and further since Raj teaches the waveguide to receive an input or output from examples of light emitting and detecting devices, it would have been obvious before the effective filing date to a person having ordinary skill in the art to have provided a first device coupled to the waveguide on the substrate, with the first device configured to transmit an optical signal to the waveguide or to receive the optical signal from the waveguide. In regards to claims 19 and 20, Raj teaches a bidirectional device. Raj further teaches the first device to comprises an optical emitter device/optical receiver device, the second device to comprise an optical receiver device/optical emitter device, wherein the first/second device is configured to transmit the optical signal to the reflector, with the optical signal received by the second/first device after being reflected by the reflector structure. Claim(s) 14-17 is/are rejected under 35 U.S.C. 103 as being unpatentable over U.S. Patent Application Publication 2002/0096686 to Raj et al in view of U.S. Patent Application Publication 2012/0320586 to Yip as applied to claim 6 above and in further view of U.S. Patent Application Publication 2003/0142896 to Kikuchi et al. In regards to claims 14-17, Raj teaches the reflector structure comprises a reflective layer [0024] disposed in a cavity [0024; within the substrate] of the substrate. But Raj in view of Yip fails to expressly teach the substrate comprises an interconnection layer under the first optical element, wherein the interconnection layer comprises one or more interconnection lines disposed in one or more levels and connected by one or more vias, wherein the structure further comprises an optical or optoelectrical device disposed on the substrate and aligned with the first optical element, wherein the optical or optoelectrical device is coupled to an interconnect line in the interconnection layer, wherein the substrate comprises an alignment aid element configured to align the first optical element with an optical or optoelectrical device to be mounted on the substrate, wherein the substrate comprises one or more bond pads connected to interconnect lines in the interconnection layer, with the bond pads configured to be coupled to terminal pads of the optical or optoelectronic device, and wherein the reflective layer is connected to an interconnect line of the interconnect layer, wherein the second optical element comprises an optoelectronic device comprising a terminal pad connected to the reflective layer. However, Kikuchi teaches an optical structure having a waveguide and a spherical surface for focusing the output light. [0065] Kikuchi further teaches wiring patterns within an interconnect layer capable of being configured for various structural arrangements (see Figures 1, 3, 7, 9, 12,15, 17, and 18, each embodiment having a different configuration of components) for the purpose of connecting the various components of the device. Since Raj, Yip and Kikuchi are all from the same field of endeavor, it would have been obvious before the effective filing date to a person having ordinary skill in the art to have provided the substrate comprises an interconnection layer under the first optical element, wherein the interconnection layer comprises one or more interconnection lines disposed in one or more levels and connected by one or more vias, wherein the structure further comprises an optical or optoelectrical device disposed on the substrate and aligned with the first optical element, wherein the optical or optoelectrical device is coupled to an interconnect line in the interconnection layer, wherein the substrate comprises an alignment aid element configured to align the first optical element with an optical or optoelectrical device to be mounted on the substrate, wherein the substrate comprises one or more bond pads connected to interconnect lines in the interconnection layer, with the bond pads configured to be coupled to terminal pads of the optical or optoelectronic device, and wherein the reflective layer is connected to an interconnect line of the interconnect layer, wherein the second optical element comprises an optoelectronic device comprising a terminal pad connected to the reflective layer. References Cited The references cited made of record and not relied upon is considered pertinent to applicant’s disclosure. Inventorship This application currently names joint inventors. In considering patentability of the claims the examiner presumes that the subject matter of the various claims was commonly owned as of the effective filing date of the claimed invention(s) absent any evidence to the contrary. Applicant is advised of the obligation under 37 CFR 1.56 to point out the inventor and effective filing dates of each claim that was not commonly owned as of the effective filing date of the later invention in order for the examiner to consider the applicability of 35 U.S.C. 102(b)(2)(C) for any potential 35 U.S.C. 102(a)(2) prior art against the later invention. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to TINA M WONG whose telephone number is (571)272-2352. The examiner can normally be reached M-F 8:30-5:30. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Uyen-Chau Le can be reached at (571) 272-2397. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /TINA WONG/Primary Examiner, Art Unit 2874
Read full office action

Prosecution Timeline

Jun 30, 2023
Application Filed
May 14, 2025
Non-Final Rejection — §103, §112
Aug 19, 2025
Response Filed
Aug 19, 2025
Response after Non-Final Action

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
84%
Grant Probability
98%
With Interview (+14.1%)
2y 5m
Median Time to Grant
Low
PTA Risk
Based on 1078 resolved cases by this examiner. Grant probability derived from career allow rate.

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