Prosecution Insights
Last updated: July 17, 2026
Application No. 18/272,678

Test Equipment for Microneedle Systems, and a Test System and a Method for Testing a Microneedle Application

Non-Final OA §103
Filed
Jul 17, 2023
Priority
Jan 18, 2021 — DE 10 2021 100 908.1 +1 more
Examiner
NGUYEN, LAM S
Art Unit
2853
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
LTS Lohmann Therapie-Systeme AG
OA Round
3 (Non-Final)
79%
Grant Probability
Favorable
3-4
OA Rounds
0m
Est. Remaining
80%
With Interview

Examiner Intelligence

Grants 79% — above average
79%
Career Allowance Rate
1112 granted / 1411 resolved
+10.8% vs TC avg
Minimal +1% lift
Without
With
+0.8%
Interview Lift
resolved cases with interview
Typical timeline
2y 8m
Avg Prosecution
48 currently pending
Career history
1468
Total Applications
across all art units

Statute-Specific Performance

§101
1.1%
-38.9% vs TC avg
§103
58.1%
+18.1% vs TC avg
§102
28.8%
-11.2% vs TC avg
§112
6.8%
-33.2% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1411 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 1, 9-16 is/are rejected under 35 U.S.C. 103 as being unpatentable over Joseph et al. (BR PI0415629) in view of Juan (CN 111649927) and Hendon et al. (US 2021/0239450). Regarding to claims 1 and 12: Joseph et al. discloses a test device for microneedle systems, comprising: a microneedle receptacle for receiving a microneedle system to be tested (FIG. 1: The microneedle 64 and the microneedle receptacle 60); an application system including a skin model or configured to receive a skin model (FIG. 1, element 5); and a movement device comprising a punch for the application movement of the microneedle system to be tested into the application device (FIG. 1: The punch (30, 32) moves along the direction A); and a variably adjustable spacer for defining a vertical distance between the punch and the application device or the skin model (FIGs. 1-6 show the variation of the distance between the punch (30, 32) and the skin model 5). Joseph et al. however does not teach a sensor device for detecting an application of the microsystem into the application device, the sensor device comprising a sensor, wherein the sensor is an OCT sensor. Yuan discloses a microneedle system comprising a sensor device for detecting an application of the microsystem into the application device, the sensor device comprising a sensor (FIGs. 3 and 7: The sensor 24 and the camera 42). Therefore, it would have been obvious for one having ordinary skill in the art before the effective filing date of the claimed invention to modify the sensor in Joshep’s system to include a sensor device as disclosed by Yuan for obtaining a detection image in order to be able to evaluate the mechanical property of the microneedle system (Abstract). In addition, Hendon et al. discloses a system for generating an image of a sample comprising an image arrangement that can be an optical coherence tomograph imaging (OCT) arrangement (Abstract). Therefore, it would have been obvious for one having ordinary skill in the art before the effective filing date of the claimed invention to modify the sensor in Joshep’s system, as modified in view of Yuan, to be an OCT sensor to be able to capture of three-dimensional images at micron resolution over a larger field of view than what is possible using traditional technique as taught by Hendon et al. (paragraph [0005]). Yuan further discloses the following claims: Regarding to claim 9: wherein the sensor device is configured to detect a penetration depth of the microneedle system into the application device or to detect a force between the microneedle system and the application system (FIG. 9 shows the image of the depth that the microneedle 5 penetrates into the skin simulacrum 6). Regarding to claim 10: wherein the sensor device comprises a piezoelectric sensor which is in particular connected to the application device; or a preferably magnetic force transducer which is in particular connected to the application device or the punch (FIG. 3: The sensor 24 is a mechanical sensor. It is a conventional structure of a mechanical sensor comprising a piezoelectric element. Please see Brederlow et al. (WO 02/075296), FIG. 3a, paragraph [0091]). Regarding to claim 11: further comprising a fixable guide device for guiding the movement device relative to the application device (FIG. 3: The sliding frame/housing 26-27). Regarding to claim 13: A method for testing a microneedle application with a test device, comprising the steps of accelerating a microneedle system comprising microneedle, applying the microneedle system into an application device which preferably includes a skin model, and detecting the application of the microneedle system by determining at least one of a penetration depth or an application force, by means of a sensor device comprising at least one sensor (FIGs. 3 and 7: The motor 21 drives the sliding table 231 to punch (accelerate) the microneedle 5 to the application system 32 having the skin model 6. The camera 42 captures the image of the depth that the microneedle 5 penetrates into the skin simulacrum 6 as shown in FIG. 9). Regarding to claim 14: A method for testing a microneedle application with a test system, comprising the steps of: accelerating a microneedle system comprising microneedles; applying the microneedle system into an application device which preferably includes the skin model; and detecting the application of the microneedle system by determining at least one of a penetration depth or an application force by means of a sensor device preferably comprising at least one sensor (FIGs. 3 and 7: The motor 21 drives the sliding table 231 to punch (accelerate) the microneedle 5 to the application system 32 having the skin model 6. The camera 42 captures the image of the depth that the microneedle 5 penetrates into the skin simulacrum 6 as shown in FIG. 9). Regarding to claims 15-16: wherein the vertical distance between the punch and the application device or the skin model provided by the variably adjustable spacer is altered using an adjusting nut, wherein the variably adjustable spacer provides an adjustable vertical distance of between 1 mm and 5 mm (Joseph et al: FIGs. 1-3 show the adjusting nut 20 varies the spacing along the arrow A. In addition, it would have been obvious to one having ordinary skill in the art at the time the invention was made to set such spacing in the range as claimed, since it has been held that discovering an optimum value of a result effective variable involves only routine skill in the art. In re Boesch, 617 F. 2d 272, 205 USPQ 215 (CCPA 1980)). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to LAM S NGUYEN whose telephone number is (571)272-2151. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, DOUGLAS RODRIGUEZ, can be reached on 571-431-0716. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of an application may be obtained from the Patent Application Information Retrieval (PAIR) system. Status information for published applications may be obtained from either Private PAIR or Public PAIR. Status information for unpublished applications is available through Private PAIR only. For more information about the PAIR system, see http://pair-direct.uspto.gov. Should you have questions on access to the Private PAIR system, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative or access to the automated information system, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /LAM S NGUYEN/ Primary Examiner, Art Unit 2853
Read full office action

Prosecution Timeline

Jul 17, 2023
Application Filed
Dec 22, 2025
Non-Final Rejection mailed — §103
Mar 19, 2026
Response Filed
Apr 08, 2026
Final Rejection mailed — §103
May 29, 2026
Response after Non-Final Action
Jun 18, 2026
Request for Continued Examination
Jun 22, 2026
Response after Non-Final Action
Jul 07, 2026
Non-Final Rejection mailed — §103 (current)

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Prosecution Projections

3-4
Expected OA Rounds
79%
Grant Probability
80%
With Interview (+0.8%)
2y 8m (~0m remaining)
Median Time to Grant
High
PTA Risk
Based on 1411 resolved cases by this examiner. Grant probability derived from career allowance rate.

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