Prosecution Insights
Last updated: April 19, 2026
Application No. 18/278,391

Methods of Manufacturing Electromagnetic Radiation Altering Articles, Articles Made by the Methods, Apparatuses, and Methods of Altering Electromagnetic Radiation

Non-Final OA §103
Filed
Aug 22, 2023
Examiner
CHIDIAC, NICHOLAS J
Art Unit
1744
Tech Center
1700 — Chemical & Materials Engineering
Assignee
3M Company
OA Round
3 (Non-Final)
53%
Grant Probability
Moderate
3-4
OA Rounds
2y 12m
To Grant
88%
With Interview

Examiner Intelligence

Grants 53% of resolved cases
53%
Career Allow Rate
104 granted / 196 resolved
-11.9% vs TC avg
Strong +35% interview lift
Without
With
+35.2%
Interview Lift
resolved cases with interview
Typical timeline
2y 12m
Avg Prosecution
44 currently pending
Career history
240
Total Applications
across all art units

Statute-Specific Performance

§101
3.9%
-36.1% vs TC avg
§103
46.6%
+6.6% vs TC avg
§102
21.4%
-18.6% vs TC avg
§112
22.9%
-17.1% vs TC avg
Black line = Tech Center average estimate • Based on career data from 196 resolved cases

Office Action

§103
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Continued Examination Under 37 CFR 1.114 A request for continued examination under 37 CFR 1.114, including the fee set forth in 37 CFR 1.17(e), was filed in this application after final rejection. Since this application is eligible for continued examination under 37 CFR 1.114, and the fee set forth in 37 CFR 1.17(e) has been timely paid, the finality of the previous Office action has been withdrawn pursuant to 37 CFR 1.114. Applicant's submission filed on February 10, 2026 has been entered. Response to Amendment Claims 1-7, 10-11, 13-19, and 21 are pending. Claim 1 has been amended. Claims 17-19 and 21 have been withdrawn. The prior art rejections are revised in view of the amendment. Claim Objections Claim 1 objected to because of the following informalities: The claim status of claim 1 is marked as “Previously Presented.” Given the amendment that Applicant made to claim 1, the status should have been “Currently Amended” and the claim is examined on that basis. Appropriate correction is required to the status in future prosecution. Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. The factual inquiries for establishing a background for determining obviousness under 35 U.S.C. 103 are summarized as follows: 1. Determining the scope and contents of the prior art. 2. Ascertaining the differences between the prior art and the claims at issue. 3. Resolving the level of ordinary skill in the pertinent art. 4. Considering objective evidence present in the application indicating obviousness or nonobviousness. This application currently names joint inventors. In considering patentability of the claims the examiner presumes that the subject matter of the various claims was commonly owned as of the effective filing date of the claimed invention(s) absent any evidence to the contrary. Applicant is advised of the obligation under 37 CFR 1.56 to point out the inventor and effective filing dates of each claim that was not commonly owned as of the effective filing date of the later invention in order for the examiner to consider the applicability of 35 U.S.C. 102(b)(2)(C) for any potential 35 U.S.C. 102(a)(2) prior art against the later invention. Claim(s) 1-7, 10-11, and 13-16 is/are rejected under 35 U.S.C. 103 as being unpatentable over Isakov ("3D printed anisotropic dielectric composite with meta-material features", MATERIALS & DESIGN, ELSEVIER, AMSTERDAM, NL, vol. 93, 5 January 2016 (2016-01-05), pages 423-430, XP029394866, ISSN: 0264-1275) as applied to claim 1 above, and further in view of Bhatt (US 2021/02373642) and optionally Hoyt (US 2015/0048209). Regarding claim 1, Isakov teaches a method for manufacturing an electromagnetic radiation altering article (“The focus of this paper is to consider the application of AM for the fabrication new electromagnetic materials, that after further development, could be used to realize various artificial phenomena such as cloaking [25–27], photonic bandgap crystals [28], left-handed metamaterials [29,30], and novel microwave circuits and antennas [31]”, section 1), which comprises the steps of: a) forming an electromagnetic radiation altering material by providing a polymer matrix and optionally embedding a plurality of dielectric particles in the polymer matrix (“Our printed structures comprise a thin coupon (d b λ, where d is the coupon thickness and λ is the wavelength of incident microwave radiation, in the range from 12 to 18 GHz) within which there alternating layers, or ‘stripes’, of relatively low (polymer only) and high (polymer plus inorganic particles) dielectric constant materials.”; “Our implementation of FDM used two continuous thermoplastic based filaments as feedstock, one comprising polymer only, and the other the same polymer but with a high fraction of high permittivity inorganic microparticles. The filaments were melted in the print head and then extruded onto the forming coupon by the print head moving in the xy-plane according to the CAD file”), the dielectric particles being barium titanates particles (Table 1, section 3.1); b) obtaining initial dielectric properties of the electromagnetic radiation altering material (“Using the dielectric properties of each type of printed material”, section 2), comprising the initial relative dielectric permittivity (εr 1) and the initial dielectric loss tangent (tan delta 1) when measured at a frequency F1 (“The dielectric properties of as-printed materials, with no layering or anisotropic design, was carefully characterized before resonating structures were designed, using a split-post dielectric resonator (SPDR, QWED) technique [39] and a Rohde&Schwarz ZNB20 vector network analyser. The resonator is designed for a nominal 15 GHz frequency and the actual measurements were taken at a frequency close to the nominal. The SPDR technique allows the determination of complex permittivity with greater sensitivity than transmission-reflection methods, albeit at a single frequency, and provides more reliable measurements in low loss (tan δ<0.05) materials.”, section 2); c) modeling electromagnetic radiation altering features of the electromagnetic radiation altering material suitable for the electromagnetic radiation altering article obtained from the electromagnetic radiation altering material to have target electromagnetic radiation altering properties, thereby obtaining a simulation of the electromagnetic radiation altering article (“Using the dielectric properties of each type of printed material, the commercial Comsol Multiphysics RF module, which is a flexible implementation of the finite element method, was used to model the wave propagation in layered or striped coupons and to suggest the relative dimensions of each stripe to achieve the desired performance. A 3D model of the coupons, with predefined material properties (for each type of material) observed experimentally, was constructed and the electromagnetic field distribution together with complex scattering parameters were computed. Guided by the model-based design, 16 × 8 × 2 mm coupons were printed suitable for insertion following edge polishing into a Ku-band waveguide for characterization of dielectric properties using the VNA and the transmission/reflection line (TRL) technique. The TRL technique involved measuring the two port complex scattering reflected (S11) and transmitted (S21) parameters in the frequency range from 12 to 18 GHz so that the relative complex permittivity ϵr and permeability μr could then be obtained using the widely employed Nicholson–Ross–Weir (NRW) extraction method [40].”, section 2); d) additive manufacturing the electromagnetic radiation altering article based on the simulation of the electromagnetic radiation altering article by performing an additive manufacturing method selected from the group consisting of stereolithography (SLA), selective laser sintering (SLS), digital light processing (DLP) material jetting, and any combinations thereof, wherein the electromagnetic radiation altering material is provided as a fluid photopolymerizable composition or a powder composition during the additive manufacturing (SLA and SLS are taught as alternative known methods of additive manufacturing with dielectric particles for these technologies, section 1, first paragraph; this is as an alternative to a FDM method, disclosed in section 1; in SLS, the electromagnetic altering material is provided in the powder); and e) optionally, measuring the electromagnetic radiation altering properties of the electromagnetic radiation altering article obtained from additive manufacturing, and comparing the measured electromagnetic radiation altering properties of the electromagnetic radiation altering article with the target electromagnetic radiation altering properties (“The measured dielectric permittivities and loss for composites with BaTiO3, Ba0.64Sr0.36TiO3 and CaTiO3 are in good agreement with data published for polymer-ceramic composites of 0–3 connectivity [42–44]”; good agreement entails measurement and comparison with target/theoretical properties, section 3.1). Isakov teaches a method substantially as claimed. Isakov does not disclose wherein the polymer matrix is selected from the group consisting of polyamides, polymeric materials based on (meth)acrylate, vinyl ether, and epoxide containing monomers; thermoplastic polyurethanes (TPU); perfluoroalkoxy alkanes (PFA), and any combinations or mixtures thereof. However, in the same field of endeavor of additively manufactured materials with thermoplastic and dielectric components (abstract, [0138] [0141]), Bhatt teaches wherein the polymer matrix is selected from the group consisting of polyamides, vinyl ether, and epoxide containing monomers; and any combinations or mixtures thereof (polyamide, epoxy, vinyl, [0138]). It would have been prima facie obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to have modified the method of Isakov to use polyamide instead of ABS because [0138] of Bhatt teaches that polyamide is an art recognized equivalent to ABS in this technical context. Assuming, arguendo, that Isakov’s teachings of SLS and SLA as alternative additive manufacturing technologies to FDM on page 1, section 1, are insufficient to establish performing an additive manufacturing method selected from the group consisting of stereolithography (SLA), selective laser sintering (SLS), digital light processing (DLP) material jetting, and any combinations thereof, wherein the electromagnetic radiation altering material is provided as a fluid photopolymerizable composition or a powder composition during the additive manufacturing, then Isakov would be deficient as to this limitation. However, in the same field of endeavor of additively manufacturing tuned variable composition for radiation shielding in various contexts ([0007-11] [0103]), Hoyt teaches performing an additive manufacturing method selected from the group consisting of stereolithography (SLA), selective laser sintering (SLS), digital light processing (DLP) material jetting, and any combinations thereof, wherein the electromagnetic radiation altering material is provided as a fluid photopolymerizable composition or a powder composition during the additive manufacturing (“Fused Filament Fabrication (FFF), and Selective Laser Sintering (SLS) to fabricate structural components that have internal microstructure and/or controlled internal variation of material composition in order to provide multi-functional capabilities such as radiation shielding, thermal isolation, Electromagnetic Interference (EMI) shielding,” [0103]; of note, SLS production is with powder that has the controlled internal variation of material composition). It would have been prima facie obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to have modified any alleged deficiencies in Isakov regarding performing a SLS manufacturing method because [0103] of Hoyt teaches that SLS is an art recognized alternative to FFF (or FDM as taught in [0115] of Hoyt) to produce structure components with controlled internal variation of material composition for radiation shielding and EMI shielding. Accordingly, the prior art (including [0103] of Hoyt) establishes that SLS can be used to produce 3D printed objects with controlled internal variation of material composition to achieve the same technical focus of Isakov. Regarding claim 2, Isakov as modified teaches wherein the plurality of dielectric particles is present and is randomly distributed and embedded in the polymer matrix (“polymer with a high fraction of high permittivity inorganic microparticles”, section 1). Regarding claim 3, Isakov as modified teaches wherein the method further comprises the step of obtaining initial magnetic properties of the electromagnetic radiation altering material, comprising the initial relative magnetic permeability (εr 1), the initial magnetic loss tangent (tan delta 3), or both, when measured at a frequency F1 (sections 2, 3.3). Regarding claim 4, Isakov as modified teaches wherein the step of modeling electromagnetic radiation altering features of the electromagnetic radiation altering material comprises the step of optimizing the electromagnetic radiation altering features of the electromagnetic radiation altering material for it to have target electromagnetic radiation altering properties (tuned permittivity, section 3.3), simulating the electromagnetic radiation altering properties of the simulation of the electromagnetic radiation altering article by conducting electromagnetic radiation altering calculations on the simulation of the electromagnetic radiation altering article, or both (simulation, section 3.3). Regarding claim 5, Isakov as modified teaches wherein the step of forming an electromagnetic radiation altering material comprises the steps of selecting an initial polymer matrix and selecting a plurality of initial dielectric particles for embedding therein, and further comprising the step of replacing the initial polymer matrix and/or the plurality of initial dielectric particles by a different polymer matrix and/or a different plurality of dielectric particles (tuning with different permittivity and other differences, Fig. 3, section 3.3), and reiterating the process after the step of modeling electromagnetic radiation altering features of the electromagnetic radiation altering material (experimentation and simulation constitutes reiteration as claimed, section 4). Regarding claim 6, Isakov as modified teaches the step of re-modeling electromagnetic radiation altering features of the electromagnetic radiation altering material and reiterating the process after the step of measuring the electromagnetic radiation altering properties of the electromagnetic radiation altering article obtained from additive manufacturing (experimentation and simulation constitutes reiteration as claimed, section 4). Regarding claim 7, Isakov as modified teaches wherein the target electromagnetic radiation altering properties comprise dielectric properties of the electromagnetic radiation altering article comprising a target relative dielectric permittivity (εr2) and a target dielectric loss tangent (tan delta 2) (“This resonance frequency could be controlled by making use of the degrees of design freedom facilitated by 3D printing, such as the periodicity of the different units, their relative permittivities and dielectric losses.”, summary section 4; tuned permittivity, estimated permittivity, sections 3.1, 3.3), magnetic properties of the electromagnetic radiation altering material comprising a target relative magnetic permeability (μr 2), magnetic properties of the electromagnetic radiation altering material comprising a target magnetic loss tangent (tan delta 4), or any combination thereof, when measured at a frequency F2 (experimentation with different desired magnetic loss tangent and magnetic permeability, section 3.3). Regarding claim 10, Isakov as modified teaches wherein the step of obtaining initial dielectric properties of the electromagnetic radiation altering material is performed using a measurement method selected from the group consisting of transmission method, reflection method, dielectric resonance (SPDR) method, capacitance method, LC resonance (U/I) method, perturbation method, open resonator method, and any combinations thereof (SPDR, section 2). Regarding claim 11, Isakov as modified teaches wherein the electromagnetic radiation altering features of the electromagnetic radiation altering material are selected from the group consisting of electromagnetic lenses, diffractive gratings, frequency selective surfaces or materials, electromagnetic energy absorbers, metamaterials, and any combinations thereof (left-handed metamaterials [29,30], section 1). Regarding claim 13, Isakov as modified teaches wherein the electromagnetic radiation altering material has an initial relative dielectric permittivity (εr 1) in the range from 1 to 3.0, from 1 to 2.8, from 1.0 to 2.5, from 1.2 to 2.3, from 1.5 to 2.0, from 4 to 11, from 4.5 to 11, from 5 to 10, from 5 to 9, from 5 to 8, or even from 12 to 15, when measured at 5.2 GHz according to the Dielectric Resonance (SPDR) Measurement Method (Table 1 shows a range of εr at 15 Ghz, with all other limitations met, these materials are likely within the range at the recited frequency). Regarding claim 14, Isakov as modified teaches wherein the electromagnetic radiation altering material has an initial dielectric loss tangent (tan delta 1) in the range from 0.01 to 0.04, from 0.01 to 0.03, from 0.01 to 0.02, from 0.05 to 0.15, from 0.06 to 0.12, from 0.08 to0.12, from 0.2 to 0.5, from 0.2 to 0.45 or even from 0.2 to 0.4, when measured at 5.2 GHz according to the Dielectric Resonance (SPDR) Measurement Method (Table 1 shows a range of tan delta at 15 Ghz, with all other limitations met, these materials are likely within the range at the recited frequency). Regarding claim 15, Isakov as modified teaches wherein the electromagnetic radiation altering material has an initial relative magnetic permeability (μr 1) in the range from 1 to 1.5, from 1 to 1.3 or even from 1 to 1.2, when measured at 1.0 GHz according to the LC Resonance (U/I) Measurement Method (“Using the dielectric properties of each type of printed material, the commercial Comsol Multiphysics RF module, which is a flexible implementation of the finite element method, was used to model the wave propagation in layered or striped coupons and to suggest the relative dimensions of each stripe to achieve the desired performance. A 3D model of the coupons, with predefined material properties (for each type of material) observed experimentally, was constructed and the electromagnetic field distribution together with complex scattering parameters were computed. Guided by the model-based design, 16 × 8 × 2 mm coupons were printed suitable for insertion following edge polishing into a Ku-band waveguide for characterization of dielectric properties using the VNA and the transmission/reflection line (TRL) technique. The TRL technique involved measuring the two port complex scattering reflected (S11) and transmitted (S21) parameters in the frequency range from 12 to 18 GHz so that the relative complex permittivity ϵr and permeability μr could then be obtained using the widely employed Nicholson–Ross–Weir (NRW) extraction method [40].”, section 2, with all other limitations met, these materials are likely within the range at the recited frequency). Regarding claim 16, Isakov as modified teaches wherein the frequency F1 or F2 is in a range from 300 MHz to 300 GHz, from 300 MHz to 3 GHz, 3 GHz to 30 GHz or even from 30 GHz to 300 GHz (15 Ghz, Table 1). Response to Arguments Applicant's arguments filed February 10, 2026 have been fully considered but they are not persuasive. Applicant argues that Isakov’s teaching of SLA and SLA as alternative additive manufacturing techniques are not applicable to the simulation techniques because one of the embodiments follows a different method and there would be technical challenges in following one of the other disclosed embodiments. This is to argue that it would not have been obvious to a person of ordinary skill in the art to use these additive manufacturing techniques to produce objects with varied internal composition for the electromagnetic materials taught in Isakov. This is not persuasive in view of Isakov’s teachings of these alternative additive manufacturing techniques to achieve varied internal composition. In any event, for the sake of compact prosecution, further reference is made to Hoyt, [0103] of which teaches using SLS to fabricate structural components that have controlled internal variation of material composition for functions like radiation shielding and electromagnetic interference shielding. Applicant argues this a different machine architecture than what Hoyt describes, but does not explain what this difference is. Of additional note, Applicant seems to be arguing for a comparison of the prior art to production of a much more complicated electromagnetic radiation altering article than what is presently recited in the claims. Applicant’s arguments regarding “millimeter precision” does not have a basis in the claims. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to NICHOLAS J CHIDIAC whose telephone number is (571)272-6131. The examiner can normally be reached 8:30 AM - 6:00 PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Sam Xiao Zhao can be reached at 571-270-5343. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /NICHOLAS J CHIDIAC/ Examiner, Art Unit 1744 /XIAO S ZHAO/ Supervisory Patent Examiner, Art Unit 1744
Read full office action

Prosecution Timeline

Aug 22, 2023
Application Filed
May 15, 2025
Non-Final Rejection — §103
Sep 22, 2025
Response Filed
Oct 15, 2025
Final Rejection — §103
Jan 21, 2026
Request for Continued Examination
Feb 15, 2026
Response after Non-Final Action
Feb 25, 2026
Non-Final Rejection — §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

3-4
Expected OA Rounds
53%
Grant Probability
88%
With Interview (+35.2%)
2y 12m
Median Time to Grant
High
PTA Risk
Based on 196 resolved cases by this examiner. Grant probability derived from career allow rate.

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