Prosecution Insights
Last updated: April 19, 2026
Application No. 18/304,320

SEMICONDUCTOR DEVICE AND CAPACITIVE SENSOR DEVICE

Non-Final OA §112
Filed
Apr 20, 2023
Examiner
PRETLOW, DEMETRIUS R
Art Unit
2858
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Lapis Technology Co., Ltd.
OA Round
1 (Non-Final)
87%
Grant Probability
Favorable
1-2
OA Rounds
2y 8m
To Grant
94%
With Interview

Examiner Intelligence

Grants 87% — above average
87%
Career Allow Rate
588 granted / 678 resolved
+18.7% vs TC avg
Moderate +8% lift
Without
With
+7.5%
Interview Lift
resolved cases with interview
Typical timeline
2y 8m
Avg Prosecution
49 currently pending
Career history
727
Total Applications
across all art units

Statute-Specific Performance

§101
5.1%
-34.9% vs TC avg
§103
44.5%
+4.5% vs TC avg
§102
19.2%
-20.8% vs TC avg
§112
26.7%
-13.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 678 resolved cases

Office Action

§112
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 112 The following is a quotation of 35 U.S.C. 112(b): (b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention. The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph: The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention. Claims 1-17 are rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention. Regarding, claim 1, the metes and bounds of an electrode pad connected between a capacitor that is a target of detection and a first node, which is capable of externally connecting the capacitor is unclear. As claimed it is unclear as to if the capable of externally connecting the capacitor is actually part of the semiconductor device and if the intended scope of the claims is of the pad. Examiner interprets the claims as the capacitor being part of the semiconductor device. Claims 2-8 are rejected for containing 112 limitations above and for depending on rejected base claim. Regarding claim 9, the claim is indefinite because the claim is drawn to an apparatus but the reference capacitive circuit, determination circuit and correction capacitive circuit are drawn to method steps. (MPEP 2173.05(p)(II) A single claim which claims both an apparatus and the method steps of using the apparatus is indefinite under 35 U.S.C. 112(b) or pre-AIA 35 U.S.C. 112, second paragraph. See In re Katz Interactive Call Processing Patent Litigation, 639 F.3d 1303, 1318, 97 USPQ2d 1737, 1748-49 (Fed. Cir. 2011).) Regarding claim 11, the claim is indefinite because the claim is drawn to an apparatus but the controller is drawn to method steps. (MPEP 2173.05(p)(II) A single claim which claims both an apparatus and the method steps of using the apparatus is indefinite under 35 U.S.C. 112(b) or pre-AIA 35 U.S.C. 112, second paragraph. See In re Katz Interactive Call Processing Patent Litigation, 639 F.3d 1303, 1318, 97 USPQ2d 1737, 1748-49 (Fed. Cir. 2011).) Regarding claim 12, the claim is indefinite because the claim is drawn to an apparatus but the controller is drawn to method steps. (MPEP 2173.05(p)(II) A single claim which claims both an apparatus and the method steps of using the apparatus is indefinite under 35 U.S.C. 112(b) or pre-AIA 35 U.S.C. 112, second paragraph. See In re Katz Interactive Call Processing Patent Litigation, 639 F.3d 1303, 1318, 97 USPQ2d 1737, 1748-49 (Fed. Cir. 2011).) Claims 13-17 are rejected for containing 112 rejections above and for depending on rejected base claim. Examiner’s Note: Claims 1-17 stand rejected under 35 USC 112(b) as outlined above. No prior art rejection has been applied to these claims because the prior art of record taken alone or in combination fails to teach the following features recited in these claims: Regarding claim 1, determination circuit that includes a first relay terminal and a second relay terminal, supplies a charging current from the first relay terminal to the electrode pad via the first node, supplies a charging current from the second relay terminal to the reference capacitive circuit via the second node, and subsequently detects electrostatic capacity of the capacitor and determines whether or not the electrostatic capacity of the capacitor has changed by comparing magnitudes of potentials at the first relay terminal and the second relay terminal; and a correction capacitive circuit that applies a designated electrostatic capacity to the first node and is capable of varying the electrostatic capacity as claimed in combination with all other limitations. Regarding claim 9, a determination circuit that includes a first relay terminal and a second relay terminal, supplies a charging current from the first relay terminal to the electrode of the sensor capacitor via the first node, supplies a charging current from the second relay terminal to the reference capacitive circuit via the second node, and subsequently determines whether or not the electrostatic capacity of the sensor capacitor has changed by comparing magnitudes of potentials at the first relay terminal and the second relay terminal; and a correction capacitive circuit that applies a designated electrostatic capacity to the first node and is capable of varying the electrostatic capacity as claimed in combination with all other limitations of claim 9. Prior Art: Otsuka (US 20200274498) disclose A capacitance sensor circuit is provided, including: a capacitance variable capacitor changing from a first capacitance to a second capacitance corresponding to environmental change; a reference capacitor; and an amplifier circuit charging the capacitance variable capacitor via a first node and the reference capacitor via a second node, and outputting a determination signal. Dauge et al. (US 4187460) disclose This invention relates to a capacitance measuring device for measuring the capacitance of a capacitor to be measured with respect to the calibrated reference capacitance of a capacitor by means of the comparison of the charge and discharge periods of said capacitors during two successive measuring and reference phases of a comparison cycle. Kim et al. (US 20220390259) disclose the read-out circuit 100 detects a change in capacitance of a capacitor 10 included in a capacitive sensor 1 and generates an output voltage V.sub.OUT corresponding thereto. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to DEMETRIUS R PRETLOW whose telephone number is (571)272-3441. The examiner can normally be reached M-F, 5:30-1:30. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Lee Rodak can be reached at 571-270-5628. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /DEMETRIUS R PRETLOW/ Examiner, Art Unit 2858 /LEE E RODAK/ Supervisory Patent Examiner, Art Unit 2858
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Prosecution Timeline

Apr 20, 2023
Application Filed
Oct 14, 2025
Non-Final Rejection — §112 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
87%
Grant Probability
94%
With Interview (+7.5%)
2y 8m
Median Time to Grant
Low
PTA Risk
Based on 678 resolved cases by this examiner. Grant probability derived from career allow rate.

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