Prosecution Insights
Last updated: October 25, 2026
Application No. 18/339,699

Method and System for Inspecting an Insulation of a High Voltage Cable

Non-Final OA §103
Filed
Jun 22, 2023
Priority
Jun 22, 2022 — EU 22180574.0
Examiner
ANDREWS, BRENT J
Art Unit
2858
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Nkt Hv Cables AB
OA Round
5 (Non-Final)
78%
Grant Probability
Favorable
5-6
OA Rounds
0m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 78% — above average
78%
Career Allowance Rate
249 granted / 319 resolved
+10.1% vs TC avg
Strong +28% interview lift
Without
With
+28.5%
Interview Lift
resolved cases with interview
Typical timeline
3y 1m
Avg Prosecution
8 currently pending
Career history
340
Total Applications
across all art units

Statute-Specific Performance

§101
1.7%
-38.3% vs TC avg
§103
60.3%
+20.3% vs TC avg
§102
22.4%
-17.6% vs TC avg
§112
13.0%
-27.0% vs TC avg
Black line = Tech Center average estimate • Based on career data from 319 resolved cases

Office Action

§103
6DETAILED ACTION 1 The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Remarks/Arguments 2 Applicant’s arguments, see 7-12 filed 08/28/2026, with respect to the rejection(s) of claim(s) 1-3 and 5-17 under 35 U.S.C. 103(a) have been fully considered and are persuasive. Therefore, the rejection has been withdrawn. However, upon further consideration, a new ground(s) of rejection is made in view of DOEDENS et al. (US 20230411939 A1). Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of 35 U.S.C. 103(a) which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102 of this title, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. 3 Claims 1-3, 5-10 and 16-17 are rejected under 35 U.S.C. 103(a) as being unpatentable over HARJUHAHTO et al. (WO 2019197530 A1) in view of DOEDENS et al. (US 20230411939 A1). PNG media_image1.png 482 648 media_image1.png Greyscale 4 Regarding to claim 1, HARJUHAHTO discloses a method for inspecting an Insulation of a high voltage cable (Figs. 1-2 Item 2 discloses the extra high voltage cable 2 to be inspected position abstract), the method comprising: a data acquisition including: scanning a surface (Figs. 1-2 Item 8 discloses the sensors (6) such that beams (7) of the sensors are directable to the outer surface (8) of the cable (2) abstract Page 3 Lin 20-35) of a high voltage cable's insulation (Figs. 1-2 Item 2 discloses the cable 2 to be inspected conductor and wire position abstract), by at least one laser scanner (Figs. 1-2 Item 6 discloses the measurement sensors 6 comprise laser displacement sensors ln a laser displacement sensor, a laser beam emitted from a laser is applied to the outer surface 8 of the cable 2 abstract Page 3 Lin 20-35), wherein the scanning includes at least one laser scanner (Figs. 1-2 Item 6 discloses measurement sensors 6 comprise laser displacement sensors ln a laser displacement sensor, a laser beam emitted from a laser is applied to the outer surface 8 of the cable 2 Page 3 Lin 20-35) and relative to the high voltage cable ((Figs. 1-2 Item 2); and a data evaluation (Figs. 1-2 Item 4 & 10 discloses analysis part 4 comprises a receiver 9 for the measurement data and a processor 10 for processing the measurement data providing defect detection data abstract Page 3 Lin 20-35) including: generating a 3-dimensional model (c Figs. 1-2 Item 1 discloses creates thereof a continuous 3D topographic map of the outer surface (8) of the cable (2),) of the scanned surface based on the acquired data (Figs. 1-2 Item 1 & 12 discloses a continuous 3D topographic map and 12 stored 3D data of the outer surface of the cable, said 3D topographic map providing defect detection data from the cable Abstract Page 3 -4) of the surface of the high voltage cable's insulation (Figs. 1-2 Item 1 discloses a 3D surface scanner is also able to detect properties of the outer surface 22 of a cable Page3 -4); and However, HARJUHAHTO does not explicitly teach moving the at least one laser scanner and relative to the high voltage cable along a length direction of the high voltage cable. comparing the generated model with a reference 3-dimensional model of the surface of the high voltage cable's insulation. However, DOEDENS teaches moving the at least one laser scanner and relative to the high voltage cable along a length direction of the high voltage cable (Fig. 1-2 item 40 discloses non-contact surface scanner 40 is movable around the cable 1 such as scanner 40 may be mounted to a jig, e.g. mountable to the HV-cable, such that the non-contact surface scanner 40 may be moved up/down and around the surface 5 in Paragraph [0043]); comparing the generated model with a reference 3-dimensional model of the surface of the high voltage cable's insulation (Fig. 1-2 discloses comparing the 3D measurement model of the repaired cable with the basis 3D measurement n Paragraph [00121 & 0027]). It would have been obvious to one skilled in the art before the effective filing date of the invention to modify an invention which is employed for ice detection and measurement is unfolded in HARJUHAHTO to include creating a continuous 3D surface geometry measurement of the surface of the cable as taught by DOEDENS in order to determine the quality of the surface of the high voltage cable Paragraph [00121 & 0027]). 5 Regarding to claim 2 HARJUHAHTO discloses the method according to claim 1, wherein the scanned surface comprises a full circumference of the high voltage cable (Figure 2 the sensors 6 are arranged with substantially even intervals. By arranging the sample areas 22 are at a circumference of the cable 2). 6 Regarding to claim 3 HARJUHAHTO discloses the method according to claim 1, wherein generating the 3-dimensional model includes combining measurement data from at least two laser scanner (Figure 1-2 the 7 of non-contact distance measurement sensors 6 are directed to the outer surface which are shown top and bottom of cable 2). 7 Regarding to claim 5 HARJUHAHTO discloses the method according to claim 1, wherein the reference 3-dimensional model is a partly predefined model (c Figs. 1-2 Item 1 & 12 discloses creates thereof a continuous 3D topographic map of the outer surface (8) of the cable (2) the stored 3D processed data and/or the defect detection data) of a surface of a high voltage cable's insulation and wherein the partly predefined model (c Figs. 1-2 Item 1 & 12 shows continuous 3D model info stored and measured values are used to find defect) is adjusted based on the acquired data. (Compared to existing X-rays systems used in cable manufacturing the 3D surface scanner 1 provides an accurate monitoring of the geometry of the outer surface 8 of a cable 2. X-ray systems are adapted to measure the depth or diameter of different layers inside the cable as well as the eccentricity of the conductor inside the insulation). 8 Regarding to claim 6 HARJUHAHTO discloses the method according to claim 5, wherein a diameter of the partly predefined model (c Figs. 1-2 Item 1 & 12 shows continuous 3D model info stored and measured values are used to find defect) is adjusted based on the acquired data. (Compared to existing X-rays systems used in cable manufacturing the 3D surface scanner 1 provides an accurate monitoring of the geometry of the outer surface 8 of a cable 2. X-ray systems are adapted to measure the depth of different layers inside the cable as well as the eccentricity of the conductor inside the insulation). 9 Regarding to claim 7 HARJUHAHTO discloses the method according to claim 6, wherein the diameter is adjusted (Compared to existing X-rays systems used in cable manufacturing the 3D surface scanner 1 provides diameter an accurate monitoring of the geometry of the outer surface 8 of a cable 2. X-ray systems are adapted to measure the depth of different layers inside the cable as well as the eccentricity of the conductor inside the insulation). based on at least one of: a minimum diameter and a maximum diameter of the high voltage cable determined from the acquired data (Figs. 1-2 Item 4 & 10 discloses analysis part is detecting surface defects of the cable and outputs surface defect detection data of the cable such as insulation layer thickness abstract Page 3 and 4) 10 Regarding to claim 8 HARJUHAHTO discloses the method according to claim 1, wherein the data evaluation further includes determining a state (Figs. 1-2 Item 4 & 10 discloses analysis part is detecting surface defects of the cable) of the insulation (insulation layer thickness of cable 2) of the high voltage cable according to predefined criteria (Figs. 1-2 Item 4 & 10 discloses analysis part is detecting surface defects of the cable and outputs surface defect detection data of the cable such as insulation layer thickness abstract Page 3 and 4) 11 Regarding to claim 9 HARJUHAHTO discloses the method according to claim 8, wherein the determination of a state (Figs. 1-2 Item 4 & 10 discloses analysis part is detecting surface defects of the cable) of the insulation includes: calculating distance values (insulation layer thickness of cable 2) between points of the generated 3-dimensional model and the reference 3-dimensional model (Figs. 1-2 Item 1 discloses a continuous 3D topographic map of the outer surface of the cable, said 3D topographic map providing defect detection data from the cable Abstract Page 3 -4), 12 Regarding to claim 10 HARJUHAHTO discloses the method according to claim 1, wherein the data evaluation further includes an identification of irregularities (Figs. 1-2 Item 4 & 10 discloses analysis part is detecting surface defects of the cable) on the surface (Figs. 1-2 Item 8) of the insulation (insulation layer thickness of cable 2) of the high voltage cable (Figs. 1-2 Item 2) according to predefined criteria (Fig.1 discloses 3D topographic map providing defect detection data from the cable, and the trained neural network of the analysis part is detecting surface defects of the cable and outputs surface defect detection data of the cable). 13 Regarding to claim 16 HARJUHAHTO discloses the method according to claim 1, wherein the reference 3-dimensional model (c Figs. 1-2 Item 1 & 12 shows continuous 3D model and stored 3D model 12) is a partly predefined model (c Figs. 1-2 Item 1 & 12 shows continuous 3D model info stored and measured values are used to find defect) of a surface of a high voltage cable's (c Figs. 1-2 Item 2) insulation, wherein the partly predefined model is adjusted based on the acquired data Compared to existing X-rays systems used in cable manufacturing the 3D surface scanner 1 provides an accurate monitoring of the geometry of the outer surface 8 of a cable 2. X-ray systems are adapted to measure the depth or diameter of different layers inside the cable as well as the eccentricity of the conductor inside the insulation).. 14 Regarding to claim 17 HARJUHAHTO discloses the method according to claim 16, wherein a diameter (Figs. 1-2 Item 2 discloses the cable 2 a high voltage cable comprises a cable diameter to be inspected position abstract), of the partly predefined model (c Figs. 1-2 Item 1 & 12 shows continuous 3D model info stored and measured values are used to find defect) is adjusted based on the acquired data Compared to existing X-rays systems used in cable manufacturing the 3D surface scanner 1 provides an accurate monitoring of the geometry of the outer surface 8 of a cable 2. X-ray systems are adapted to measure the depth or diameter of different layers inside the cable as well as the eccentricity of the conductor inside the insulation). 15 Claim 11 are rejected under 35 U.S.C. 103(a) as being unpatentable over HARJUHAHTO et al. (WO 2019197530 A1) in view of DOEDENS et al. (US 20230411939 A1) in view of Ebisawa et al. (US 7199508 B2). 16 Regarding to claim 11 HARJUHAHTO discloses the method according to claim 1, However, HARJUHAHTO does not explicitly teach wherein the scanned surface area has a length of at least 0.2 m along a main direction of extension of the high voltage cable. However, Ebisawa teaches wherein the scanned surface area has a length of at least 0.2 m along a main direction of extension of the high voltage cable. (Fig. 1-3 Item 2 &4 discloses, defect inspecting apparatus including an electrode 4 and therefore, the coaxial flexible piezoelectric member 2 (normally having a length of several hundreds m or more) cannot be polarized. [0028]). It would have been obvious to one skilled in the art before the effective filing date of the invention to modify an invention which is employed for ice detection and measurement is unfoldedin HARJUHAHTO to include a provides a defect inspecting apparatus as taught by Ebisawa in order to provide a defect inspecting apparatus for longer lengths of cable. 17 Claim 12-13 is rejected under 35 U.S.C. 103(a) as being unpatentable over HARJUHAHTO et al. (WO 2019197530 A1) in view of DOEDENS et al. (US 20230411939 A1) in view of Mayumet al. (US 20170249727 A1 18 Regarding to claim 12 HARJUHAHTO discloses a system for inspecting an insulation of a high voltage cable (Figs. 1-2 Item 2 discloses the extra high voltage cable 2 to be inspected position abstract), the system comprising: an apparatus comprising: at least one scanning assembly (Figs. 1-2 Item 4) for scanning a surface (Figs. 1-2 Item 8) of the high voltage cable (Figs. 1-2 Item 2 discloses the extra high voltage cable 2 to be inspected position abstract), and an attachment assembly (Figs. 1-2 Item 4) configured for attaching the at least one scanning assembly (Figs. 1-2 Item 6) to the high voltage cable (Figs. 1-2 Item 2), wherein the at least one scanning assembly includes a laser scanner (Figs. 1-2 Item 6 discloses the measurement sensors 6 comprise laser displacement sensors ln a laser displacement sensor, a laser beam emitted from a laser is applied to the outer surface 8 of the cable 2 abstract Page 3 Lin 20-35), wherein for evaluating data acquired by the at least one scanning assembly: the apparatus has an electronic circuit (Figs. 1-2 Item 4 & 10 discloses analysis part 4 comprises a receiver 9 for the measurement data and a processor 10 for processing the measurement data providing defect detection data. abstract Page 3 Lin 20-35) configured to carry out a method including: a data acquisition (Figs. 1-2 Item 4, 10 & 12 discloses analysis part 4 comprises a receiver 9 for the measurement data and a processor 10 and 12 memory for processing the measurement data providing defect detection data abstract Page 3 Lin 20-35), including: scanning the surface (Figs. 1-2 Item 8) of the high voltage cable's insulation (Figs. 1-2 Item 2 includes insulation or cover layer) by at least one laser scanner (Figs. 1-2 Item 6 discloses the measurement sensors 6 comprise laser displacement sensors ln a laser displacement sensor, a laser beam emitted from a laser is applied to the outer surface 8 of the cable 2 abstract Page 3 Lin 20-35), wherein the scanning includes moving the at least one laser scanner (Figs. 1-2 Item 6) and relative to the high voltage cable (Figs. 1-2 Item 2) along a length direction of the high voltage cable (Figs. 1-2 Item 2)); and a data evaluation (Figs. 1-2 Item the analysis part 4 is receiving the measurement data and the processor10), including: generating a 3-dimensional model (Figs. 1-2 Item 1 discloses a continuous 3D topographic map of the outer surface of the cable, said 3D topographic map providing defect detection data from the cable Abstract Page 3 -4) of the surface of the high voltage cable's insulation (Figs. 1-2 Item 1 discloses a 3D surface scanner is also able to detect properties of the outer surface 22 of a cable 2 Page 3 -4) based on the acquired data, or the apparatus is connectable to a computer (Figs. 1-2 Item 4& 12 the analysis part 4 comprises a transmitter 11 for transmitting the processed data and/or the defect detection data to a cloud storage 12. Computerized maintenance) for transferring (Figs. 1-2 Item 11 the analysis part 4 comprises a transmitter 11 for transmitting the processed data and/or the defect detection data to a cloud storage 12), the acquired data to the computer and the system (Figs. 1-2 Item the analysis part 4 is receiving the measurement data and the processor10). However, HARJUHAHTO does not explicitly teach wherein the at least one scanning assembly includes a linear axis and a laser scanner attached to the linear axis, wherein the linear axis is configured to provide linear motion to the laser scanner, comparing the generated model with a reference 3-dimensional model of the surface of the high voltage cable's insulation. However, DOEDENS teaches wherein the at least one scanning assembly includes a linear axis and a laser scanner (Fig. 1-2 item 40 discloses non-contact surface scanner 40 may be moved up/down considered linear and around the surface 5 in Paragraph [0043]) attached to the linear axis, wherein the linear axis is configured to provide linear motion to the laser scanner (Fig. 1-2 item 40 discloses non-contact surface scanner 40 is movable around the cable1 such as scanner 40 may be mounted to a jig, e.g. mountable to the HV-cable, such that the non-contact surface scanner 40 may be moved up/down and around the surface 5 in Paragraph [0043]); comparing the generated model with a reference 3-dimensional model of the surface of the high voltage cable's insulation (Fig. 1-2 discloses comparing the 3D measurement model of the repaired cable with the basis 3D measurement n Paragraph [00121 & 0027]). It would have been obvious to one skilled in the art before the effective filing date of the invention to modify an invention which is employed for ice detection and measurement is unfolded in HARJUHAHTO to include creating a continuous 3D surface geometry measurement of the surface of the cable as taught by DOEDENS in order to determine the quality of the surface of the high voltage cable Paragraph [00121 & 0027]). However, HARJUHAHTO does not explicitly teach computer and the system further includes a computer program product comprising instructions which, when the computer program product is executed by the computer, cause the computer to carry out the data evaluation of the method. However, Mayumet teaches computer and the system further includes a computer program product comprising instructions which, when the computer program product is executed by the computer, cause the computer to carry out the data evaluation of the method. (Fig. 1-3 discloses, an image inspection program, and a computer-readable recording medium and recording equipment of the invention can be utilized for outer appearance inspection of a workpiece conveyed on a line.in paragraph 0158) It would have been obvious to one skilled in the art before the effective filing date of the invention to modify an invention which is employed for ice detection and measurement is unfoldedin HARJUHAHTO to include a computer software inspection program as taught by Mayumet in order to provide accurate and automated monitoring of the inspection cable. 19 Regarding to claim 13 HARJUHAHTO discloses the system according to claim 12, wherein the apparatus includes at least two laser scanners (Figure 1-2 the 7 of non-contact distance measurement sensors 6 are directed to the outer surface which are shown top and bottom of cable 2)., wherein the at least two laser scanners (Figs. 1-2 Item 6 discloses the measurement sensors 6 comprise laser displacement sensors ln a laser displacement sensor, a laser beam emitted from a laser is applied to the outer surface 8 of the cable 2 abstract Page 3 Lin 20-35), are configured to jointly scan a full circumference of the high voltage cable (Figure 2 the sensors 6 are arranged with substantially even intervals. By arranging the sample areas 22 are at a circumference of the cable 2). Allowable Subject Matter Claim 14 is objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims and overcome the double patenting rejection set forth above. Claim 15 is also objected to as they further limit claim 14. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to BRENT J ANDREWS whose telephone number is (571)272-6101. The examiner can normally be reached 10am-5pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Judy Nguyen can be reached at (571)272-2258. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /BRENT J ANDREWS/Examiner, Art Unit 2858 /FEBA POTHEN/Examiner, Art Unit 2858
Read full office action

Prosecution Timeline

Show 5 earlier events
Sep 17, 2025
Final Rejection mailed — §103
Dec 01, 2025
Request for Continued Examination
Dec 08, 2025
Response after Non-Final Action
Jan 26, 2026
Non-Final Rejection mailed — §103
Apr 17, 2026
Response Filed
Jun 29, 2026
Final Rejection mailed — §103
Aug 28, 2026
Response after Non-Final Action
Sep 30, 2026
Non-Final Rejection mailed — §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

5-6
Expected OA Rounds
78%
Grant Probability
99%
With Interview (+28.5%)
3y 1m (~0m remaining)
Median Time to Grant
High
PTA Risk
Based on 319 resolved cases by this examiner. Grant probability derived from career allowance rate.

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