Prosecution Insights
Last updated: July 17, 2026
Application No. 18/408,534

ADAPTIVE OVERSHOOT-VOLTAGE SUPPRESSION CIRCUIT, REFERENCE CIRCUIT, CHIP AND COMMUNICATION TERMINAL

Non-Final OA §112
Filed
Jan 09, 2024
Priority
Jul 29, 2021 — CN 202110862110.9 +1 more
Examiner
SUN, PINPING
Art Unit
2872
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
VANCHIP (TIANJIN) TECHNOLOGY CO., LTD.
OA Round
2 (Non-Final)
75%
Grant Probability
Favorable
2-3
OA Rounds
5m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 75% — above average
75%
Career Allowance Rate
347 granted / 464 resolved
+6.8% vs TC avg
Strong +38% interview lift
Without
With
+38.5%
Interview Lift
resolved cases with interview
Typical timeline
2y 11m
Avg Prosecution
14 currently pending
Career history
482
Total Applications
across all art units

Statute-Specific Performance

§101
0.6%
-39.4% vs TC avg
§103
89.5%
+49.5% vs TC avg
§102
3.7%
-36.3% vs TC avg
§112
3.7%
-36.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 464 resolved cases

Office Action

§112
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Drawings The modified drawings were received on 1/28/2026. These drawings are accepted. Specification The modified specification were received on 1/28/2026. The Specification is accepted. Claim Objections Claims 3, 4, 5 objected to because of the following informalities: Claim 3, line 10, “the regulating point” should be – the preset regulating point— Claim 4, line 5, “a preset regulating point” should be – the preset regulating point-- Claim 5, line 2, “the regulating point” should be – the preset regulating point on the starting module— Claim 6, line 2, “a gate of a first NMOS transistor” should be—the gate of the first NMOA transistor— Claim 6, line 2-3, “a sampling voltage—should be – the sampling voltage-- Appropriate correction is required. Response to Arguments Applicant’s arguments, see page 1 and page 2, filed 1/28/2026, with respect to the rejection(s) of claim(s) 1 under ( CN110703841) have been fully considered and are persuasive. Therefore, the 102 rejection has been withdrawn. However, upon further consideration, 112(b) rejection has been made with regarding to claims 1, 3-8. Claim Rejections - 35 USC § 112 The following is a quotation of 35 U.S.C. 112(b): (b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention. The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph: The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention. Claims 1, 3-8 rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention. The term “transient high-frequency” in claim 1, line 15 and line 17 is a relative term which renders the claim indefinite. The term “transient high-frequency” is not defined by the claim, the specification does not provide a standard for ascertaining the requisite degree, and one of ordinary skill in the art would not be reasonably apprised of the scope of the invention. For examination purpose, “transient high-frequency is interpreted as transient frequency. Claim 1 recites the limitation "the sampling point" in line 9. There is insufficient antecedent basis for this limitation in the claim. It is unclear “the sampling point” is refers to “preset sampling point “recited at claim 1, line 3 or not. For examination purpose, “the sampling point” is interpretated as “a sampling point,” Claims 3-8 are rejected because they depend on claim 1. Allowable Subject Matter Claims 1, 3-8 would be allowable pending the Applicant overcome the 112(b) rejection above. Regarding Claim 1, WU, SHI-MING et al. (CN110703841A). discloses an adaptive overshoot-voltage suppression circuit (e.g. and corresponding transistor MSN1 and capacitor C samples a voltage at node VSTN)(fig.2), comprising an overshoot-voltage suppression unit (e.g. and corresponding transistor MSN1 and capacitor C samples a voltage at node VSTN)(fig.2) and a voltage-to-current conversion unit (e.g. transistor MSN2 .with combined PMOS current mirror transistors MP3 and MP4)(fig.2), wherein an input end of the overshoot-voltage suppression unit (e.g. end of capacitor C)(fig.2) is connected to a preset sampling point on a to-be-measured reference circuit (e.g. figure 2 sampling point VSTN), an output end of the overshoot-voltage suppression unit (e.g. connection at the gate of transistor MSN2)(fig.2) is connected to an input end of the voltage-to-current conversion unit (e.g. connection at the gate of transistor MSN2)(fig.2), and an output end of the voltage-to-current conversion unit is connected to a preset regulating point on the to-be-measured reference circuit (e.g. drains of the MP3 and MP4 current mirror at nodes Vin or Vip)(fig.2); wherein the overshoot-voltage suppression unit comprises a capacitor (e.g. capacitor C1)(fig.2), a first NMOS transistor (e.g. transistor MSN1)(fig.2), and a second NMOS transistor (e.g. transistor MSN2)(fig.2). and in a starting process of the to-be-measured reference circuit (e.g. prior art title is “Starting circuit of band-gap reference source…and starting method”, thus the prior art relates to a starting process)(fig.2), the overshoot-voltage suppression unit generates a transient high-frequency inducted voltage based on a sampling voltage obtained from the to-be-measured reference circuit (e.g. transistor MSN1 and capacitor C respond to the quickly rising voltage at VSTN and generate a corresponding high-frequency voltage signal, such as voltage VSTB)(fig.2), the transient high-frequency inducted voltage is converted into a corresponding pull-up current through the voltage-to-current conversion unit (e.g. the voltage VSTB at the gate of MSN2 controls the current mirror MP3/MP4, and current I is the corresponding current related to VSTB)(fig.2), and the pull-up current is injected into the to-be-measured reference circuit, and is superposed with a pull-down starting current of the to-be-measured reference circuit, to reduce a nonlinear starting current at a starting moment of the to-be-measured reference circuit (e.g. Injected current such as current I counteracts the primary starting current. The prior art states in the third paragraph of the summary of the invention section “the starting band gap reference source current of the feedback output module is continuously increased, entering into the stable state of the large current, can be more stable and reliable”. This is functionally the same as the claimed “reducing a nonlinear starting current to prevent overshoot”). However, the prior art of record does not fairly disclose, teach or suggest “an end of the capacitor is connected to the sampling point and a gate of the first NMOS transistor, the other end of the capacitor is connected to a drain of the first NMOS transistor and a drain of the second NMOS transistor, a gate of the second NMOS transistor is connected to an external enable circuit, and a source of the first NMOS transistor and a source of the second NMOS transistor are connected to a common ground end voltage.” Regard to claims 3-8, they depend on claim 1 Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Lee (US9407149B2) teaches about A buck converting controller, adapted to control a DC-DC buck converting circuit to convert an input voltage into an output voltage, Any inquiry concerning this communication or earlier communications from the examiner should be directed to PINPING SUN whose telephone number is (571)270-1284. The examiner can normally be reached 9-5. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /PINPING SUN/Supervisory Patent Examiner, Art Unit 2872
Read full office action

Prosecution Timeline

Jan 09, 2024
Application Filed
Oct 31, 2025
Non-Final Rejection mailed — §112
Jan 28, 2026
Response Filed
Jun 12, 2026
Non-Final Rejection mailed — §112 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

2-3
Expected OA Rounds
75%
Grant Probability
99%
With Interview (+38.5%)
2y 11m (~5m remaining)
Median Time to Grant
Moderate
PTA Risk
Based on 464 resolved cases by this examiner. Grant probability derived from career allowance rate.

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