Prosecution Insights
Last updated: May 29, 2026
Application No. 18/473,278

ULTRASONIC ENDOSCOPE

Non-Final OA §103
Filed
Sep 25, 2023
Priority
Sep 26, 2022 — JP 2022-152752
Examiner
MOHAMMED, SHAHDEEP
Art Unit
3797
Tech Center
3700 — Mechanical Engineering & Manufacturing
Assignee
Fujifilm Corporation
OA Round
3 (Non-Final)
51%
Grant Probability
Moderate
3-4
OA Rounds
1y 10m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 51% of resolved cases
51%
Career Allowance Rate
236 granted / 465 resolved
-19.2% vs TC avg
Strong +57% interview lift
Without
With
+57.1%
Interview Lift
resolved cases with interview
Typical timeline
4y 6m
Avg Prosecution
32 currently pending
Career history
528
Total Applications
across all art units

Statute-Specific Performance

§101
7.2%
-32.8% vs TC avg
§103
55.1%
+15.1% vs TC avg
§102
2.4%
-37.6% vs TC avg
§112
33.9%
-6.1% vs TC avg
Black line = Tech Center average estimate • Based on career data from 465 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Continued Examination Under 37 CFR 1.114 A request for continued examination under 37 CFR 1.114, including the fee set forth in 37 CFR 1.17(e), was filed in this application after final rejection. Since this application is eligible for continued examination under 37 CFR 1.114, and the fee set forth in 37 CFR 1.17(e) has been timely paid, the finality of the previous Office action has been withdrawn pursuant to 37 CFR 1.114. Applicant's submission filed on 01/06/2026has been entered. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 1-2, 4-11 and 13-16 rejected under 35 U.S.C. 103 as being unpatentable over Tanaka et al. (US2006/0009681; hereinafter Tanaka), in view of Morimoto et al. (US 2019/0133558; hereinafter Morimoto). Regarding claim 1, Tanaka discloses an ultrasonic endoscope. Tanaka shows an ultrasonic endoscope (see abstract; fig. 1) comprising: a radial type ultrasound transducer disposed in a distal end part of an elongated insertion part to be inserted into a subject (see par. [0053], [0057]; fig. 2A, 2B, and 4A), wherein a distal end surface of the distal end part includes, in a case of being viewed from a direction perpendicular to the distal end surface (fig. 3 and 4A), a center surface portion (see combination of elements 11, 11a, and 15 in fig. 4A) positioned on a center side of the distal end surface (see fig. 3 and 4A), and an annular outer peripheral surface portion positioned outside the center surface portion (see 19 in 4A; par. [0056]), an observation window (see 11 in fig. 3; par. [0054]), an illumination window (see 10 in fig. 3; par. [0054], a forceps port (see 15 in fig. 3; par. [0055]), and a nozzle are provided in the center surface portion (see 17 in fig. 3; par. [0055]), the outer peripheral surface portion is a dead space of the distal end surface caused by the ultrasound transducer (see fig. 2A, 2B and 4A), and wherein a longitudinal axis direction of the insertion part is defined as a height direction that is perpendicular to the distal end surface (see fig. 2A, 2B and 4A), a flat surface of the outer peripheral surface portion has a height in the height direction different from a height of a flat surface of the center surface portion in the height direction (4A shows a flat surface of the outer peripheral surface portion 19 has a height in height direction different from a height of a flat surface of the center surface portion, the examiner notes that the any flat surface of outer peripheral surface portion 19 has a height that is different from any flat surface between element 11 and 15). Furthermore, Tanaka shows wherein the outer peripheral surface includes a nozzle region adjacent to the nozzle (see fig. 3; the examiner notes that the region of outer peripheral right next to nozzle 17 is the at least part of region includes the nozzle adjacent region) and a height of a flat surface of the center surface portion in the height direction (see fig. 4A), but fails to explicitly state that flat surface of the nozzle adjacent region has a height in the height direction lower than the height of the flat surface of the center surface portion in the height direction. Morimoto discloses an ultrasonic endoscope. Morimoto teaches flat surface of the nozzle adjacent region (see nozzle adjacent region which is side in horizontal direction of nozzle 82) has a height in the height direction lower than the height of the flat surface of the center surface portion in the height direction (fig. 3 shows the side in horizontal direction of nozzle 82 has a height that is lower than height of the flat surface of the center surface portion in height direction). Therefore, it would have been obvious to one of ordinary skill in the art, before the effective filing of the claim invention, to have utilized the teaching of flat surface of the nozzle adjacent region has a height in the height direction lower than the height of the flat surface of the center surface portion in the height direction in the invention of Tanaka, as taught by Morimoto, to be able to provide a compact nozzle to supply jetted fluid without compromising the size of the distal end of the ultrasonic endoscope. Regarding claim 2, Tanaka shows wherein the at least part of region of the outer peripheral surface portion includes the nozzle adjacent region adjacent to the nozzle (see fig. 3; the examiner notes that the region of outer peripheral right next to nozzle 17 is the at least part of region includes the nozzle adjacent region). Regarding claim 4, Tanaka wherein the nozzle adjacent region includes a region from an extending position of a jetting port of the nozzle to a position of the nozzle on a side opposite to the observation window (see fig. 3, 4B and 5A; par. [0055]). Regarding claim 5, Tanaka shows wherein the at least part of region of the outer peripheral surface portion includes an observation window adjacent region adjacent to the observation window (see fig. 3; the examiner notes that the region of the outer peripheral right next to the observation window 11 is the at least part of region includes the observation window adjacent region). Regarding claim 6, Tanaka shows wherein the observation window adjacent region has a height lower than the center surface portion (see fig. 3). Regarding claim 7, Tanaka shows wherein the observation window adjacent region has a height higher than the center surface portion (see fig. 3). Regarding claim 8, Tanaka shows wherein the observation window adjacent region is positioned on a side opposite to the nozzle with respect to the observation window (see 3, 4a and 5A). Regarding claim 9, Tanaka shows wherein the observation window adjacent region is a region including a jetting range of a liquid jetted from the nozzle (see 3, 4a and 5A; par. [0055]). Regarding claim 10, Tanaka shows wherein the observation window adjacent region is a region including a range sandwiched between two virtual tangent lines in contact with an outer periphery of the observation window with a center of the jetting port of the nozzle as a starting point (see fig. 3 and 5A; the examiner notes that from the figures of Tanaka, adding two virtual tangent lines in contact with an outer periphery of the observation window 11 will provide the observation window adjacent region is a region including a range sandwiched between two virtual tangent lines in contact with an outer periphery of the observation window with a center of the jetting port of the nozzle as a starting point). Regarding claim 11, Tanaka shows wherein the at least part of region of the outer peripheral surface portion includes the nozzle adjacent region adjacent to the nozzle see fig. 3; the examiner notes that the region of outer peripheral right next to nozzle 17 is the at least part of region includes the nozzle adjacent region and an observation window adjacent region adjacent to the observation window (see fig. 3; the examiner notes that the region of the outer peripheral right next to the observation window 11 is the at least part of region includes the observation window adjacent region). Regarding claim 13, Tanaka shows wherein the outer peripheral surface portion has a chamfer structure in an outer peripheral end portion (see fig. 4A). Regarding claim 14, Tanaka shows wherein the outer peripheral surface portion is configured with a distal end cap that is a separate member from the center surface portion (see par. [0056]). Regarding claim 15, Tanaka shows wherein the at least part of region of the outer peripheral surface portion includes a nozzle adjacent region adjacent to the nozzle (see fig. 3; the examiner notes that the region of outer peripheral right next to nozzle 17 is the at least part of region includes the nozzle adjacent region), on the outer peripheral surface portion, a height of the nozzle adjacent region is different from a height of a region of the outer peripheral surface portion other than the nozzle adjacent region (see fig. 3 and 4A). Regarding claim 16, Tanaka shows wherein the at least part of region of the outer peripheral surface portion includes an observation window adjacent region adjacent to the observation window (see fig. 3; the examiner notes that the region of the outer peripheral right next to the observation window 11 is the at least part of region includes the observation window adjacent region), on the outer peripheral surface portion, a height of the observation window adjacent region is different from a height of a region of the outer peripheral surface portion other than the observation window adjacent region (see fig. 3 and 4A). Claim 12 is rejected under 35 U.S.C. 103 as being unpatentable over Tanaka et al. (US2006/0009681; hereinafter Tanaka), in view of Morimoto et al. (US 2019/0133558; hereinafter Morimoto) as applied to claim 1 above, and further in view of Yagami et al. (US 5,546,947; hereinafter Yagami). Regarding claim 12, Tanaka and Morimoto disclose the invention substantially as described in the 102 rejection above, but fails to explicitly state wherein the at least part of region is different in surface wettability from the center surface portion. Yagami discloses an ultrasonic endoprobe. Yagami teaches wherein the exterior surface of the endoscope has increased wettability (col. 4, lines 43-60). Therefore, it would have been obvious to one of ordinary skill in the art, before the effective filing of the claimed invention, to have utilized the teaching of having the exterior surface of the endoscope having increased wettability in the invention of Tanaka and Morimoto, as taught by Yagami, to reduce the sliding friction and makes it easier the insertion of the endoscope into the patient. The examiner notes that upon modification of prior art Tanaka to incorporate the teaching of Yagami would provide the at least part of region is different in surface wettability from the center surface portion. Response to Arguments Applicant’s arguments with respect to claim 1 have been considered but are moot because the new ground of rejection does not rely on any rejection applied in the prior office action of record for any teaching or matter specifically challenged in the argument. The examiner has provided new prior art Morimoto. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to SHAHDEEP MOHAMMED whose telephone number is (571)270-3134. The examiner can normally be reached Monday to Friday, 9am to 5pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Anne M Kozak can be reached at (571)270-0552. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /SHAHDEEP MOHAMMED/ Primary Examiner, Art Unit 3797
Read full office action

Prosecution Timeline

Show 2 earlier events
May 13, 2025
Interview Requested
May 23, 2025
Applicant Interview (Telephonic)
May 31, 2025
Examiner Interview Summary
Jun 26, 2025
Response Filed
Oct 07, 2025
Final Rejection mailed — §103
Jan 06, 2026
Request for Continued Examination
Feb 17, 2026
Response after Non-Final Action
May 05, 2026
Non-Final Rejection mailed — §103 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

3-4
Expected OA Rounds
51%
Grant Probability
99%
With Interview (+57.1%)
4y 6m (~1y 10m remaining)
Median Time to Grant
High
PTA Risk
Based on 465 resolved cases by this examiner. Grant probability derived from career allowance rate.

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