Office Action Predictor
Last updated: April 16, 2026
Application No. 18/512,598

X-RAY IMAGING APPARATUS

Non-Final OA §102
Filed
Nov 17, 2023
Examiner
FOX, DANIELLE A
Art Unit
2884
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Vatech Ewoo Holdings Co., LTD.
OA Round
1 (Non-Final)
83%
Grant Probability
Favorable
1-2
OA Rounds
2y 7m
To Grant
96%
With Interview

Examiner Intelligence

Grants 83% — above average
83%
Career Allow Rate
590 granted / 711 resolved
+15.0% vs TC avg
Moderate +14% lift
Without
With
+13.5%
Interview Lift
resolved cases with interview
Typical timeline
2y 7m
Avg Prosecution
29 currently pending
Career history
740
Total Applications
across all art units

Statute-Specific Performance

§101
2.9%
-37.1% vs TC avg
§103
39.5%
-0.5% vs TC avg
§102
41.4%
+1.4% vs TC avg
§112
10.4%
-29.6% vs TC avg
Black line = Tech Center average estimate • Based on career data from 711 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1-6 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by US 2017/0245812 (CHOI). Regarding claim 1, CHOI disclose an X-ray imaging apparatus comprising: an imaging part comprising a generator part (32) comprising an X-ray generator for emitting X-rays to an imaging target area (321) and a sensor part (31) comprising an X-ray sensor for receiving the X-rays transmitted through the imaging target area (311); a first driving part (25) for rotating the generator part and sensor part about a rotation axis therebetween (25C); and a second driving part (312) for moving the X-ray sensor (311) in a direction of rotation about the rotation axis with respect to the sensor part or a direction tangential to the rotation (Fig. 2), wherein, during X-ray imaging, the first driving part rotates the imaging part reciprocally between first and second positions, and the second driving part moves the X-ray sensor either from the first position or from the second position (Fig. 2). Regarding claim 2, CHOI disclose the X-ray imaging apparatus of claim 1, wherein an angle between the first and second positions is less than 360 degrees (Fig. 1 and 2). Regarding claim 3, CHOI disclose the X-ray imaging apparatus of claim 1, wherein the generator part further comprises a collimator (322) for controlling the X-rays emitted from the X-ray generator to be directed toward the X-ray sensor (Fig. 3). Regarding claim 4, CHOI disclose the X-ray imaging apparatus of claim 1, wherein the second driving part moves the X-ray sensor in a length less than or equal to a width of the X-ray sensor from at least one of the first and second positions (Fig. 2). Regarding claim 5, CHOI disclose the X-ray imaging apparatus of claim 1, wherein the imaging part emits and receives the X-rays while rotating in at least one direction (Fig. 3). Regarding claim 6, CHOI disclose the X-ray imaging apparatus of claim 1, wherein a CT image of the imaging target area is provided as a result of receiving the X-rays through the X-ray sensor [0039]. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to DANI FOX whose telephone number is (571)272-3513. The examiner can normally be reached M-F: 9-5. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, David Makiya can be reached at 571-272-2273. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /DANI FOX/Primary Examiner, Art Unit 2884
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Prosecution Timeline

Nov 17, 2023
Application Filed
Sep 27, 2025
Non-Final Rejection — §102 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12603243
X-RAY EMITTER AND MOBILE X-RAY DEVICE
2y 5m to grant Granted Apr 14, 2026
Patent 12588880
PORTABLE RADIOGRAPHIC IMAGING APPARATUS AND RADIOGRAPHIC IMAGING SYSTEM
2y 5m to grant Granted Mar 31, 2026
Patent 12590909
X-RAY INSPECTION APPARATUS AND SENSITIVITY CORRECTION METHOD FOR X-RAY INSPECTION APPARATUS
2y 5m to grant Granted Mar 31, 2026
Patent 12585033
X-RAY DETECTOR
2y 5m to grant Granted Mar 24, 2026
Patent 12578257
Device and Method for Detecting Reactive Luminescent Particles in Carbon-Based Nanomaterials
2y 5m to grant Granted Mar 17, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
83%
Grant Probability
96%
With Interview (+13.5%)
2y 7m
Median Time to Grant
Low
PTA Risk
Based on 711 resolved cases by this examiner. Grant probability derived from career allow rate.

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