Prosecution Insights
Last updated: October 02, 2026
Application No. 18/523,989

PIEZOELECTRIC BULK WAVE DEVICE AND METHOD FOR MANUFACTURING THE SAME

Non-Final OA §102
Filed
Nov 30, 2023
Priority
Jun 01, 2021 — provisional 63/195,312 +1 more
Examiner
TRA, ANH QUAN
Art Unit
2843
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Murata Manufacturing Co., Ltd.
OA Round
3 (Non-Final)
73%
Grant Probability
Favorable
3-4
OA Rounds
0m
Est. Remaining
78%
With Interview

Examiner Intelligence

Grants 73% — above average
73%
Career Allowance Rate
823 granted / 1129 resolved
+4.9% vs TC avg
Moderate +5% lift
Without
With
+5.3%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
37 currently pending
Career history
1167
Total Applications
across all art units

Statute-Specific Performance

§101
0.2%
-39.8% vs TC avg
§103
59.1%
+19.1% vs TC avg
§102
23.9%
-16.1% vs TC avg
§112
8.3%
-31.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1129 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. Claim(s) 1, 2, 11, 12 and 19-20 is/are rejected under 35 U.S.C. 102(a)(2) as being anticipated by Sui et al. (US 20210281243). As to claim 1, Sui et al.’s figure 1 shows a piezoelectric bulk wave device comprising: a support (10 and/or 11) that includes a support substrate (10); a piezoelectric layer (14) including a first main surface on a support side and a second main surface opposite from the first main surface; and at least one functional electrode (13 and/or 15) at least a portion of which is on at least one of the first main surface and the second main surface of the piezoelectric layer; wherein the at least one functional electrode is supported by the support and includes a functional electrode including a portion on the first main surface of the piezoelectric layer; a cavity portion (11a) is provided in the support, the cavity portion is superposed on a portion of the functional electrode and an entirety or substantially an entirety of the piezoelectric layer in plan view; the piezoelectric layer is supported by the functional electrode supported by the support; and at least a portion (12b and/or 12b) of the functional electrode is not superposed on the piezoelectric layer in plan view. As to claim 2, Sui et al.’s figure 1 shows that the support includes an insulating layer (11) on the support substrate (12); and a portion of the functional electrode is on the insulating layer. As to claim 11, Sui et al.’s figure1 shows that the functional electrode includes a lower electrode (13) including a portion on the first main surface of the piezoelectric layer and another portion on the support, and an upper electrode (15) on the second main surface; and the upper electrode and the lower electrode are opposite to each other with the piezoelectric layer interposed therebetween. As to claim 12, Sui et al.’s figure 1 shows that the piezoelectric layer is supported only by the functional electrode. As to claim 19, Sui et al.’s figure 1 show that the functional electrode supported by the support includes a supported portion on the support, a support portion on the first main surface of the piezoelectric layer and supporting the piezoelectric layer, and a connection portion positioned between the support portion and the supported portion; and the connection portion does not include an irregularity in either of a thickness direction or a direction perpendicular or substantially perpendicular to the thickness direction. As to claim 20, Sui et al.’s figures show a frequency adjustment film (15) on the second main surface of the piezoelectric layer and superposed on the functional electrode (13) in plan view. Claim(s) 21 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Kimura et al. (US 20190068155). Kimura et al.’s figures 2A-4C show a method for manufacturing a piezoelectric bulk wave device, the method comprising: providing an interdigital transducer electrode (5 in figures 1B and 2A) and including a pair of busbars (see figure 1B) and a plurality of electrode fingers on a third main surface (lower surface) of a piezoelectric substrate (4) including the third main surface and a fourth main surface (4A) opposite from each other; forming a multilayer body (2 and 3 in figure 3A) including the piezoelectric substrate and a support (2 and 3) including a support substrate (3); forming a piezoelectric layer (4) including a first main surface corresponding to the third main surface and a second main surface opposite from the first main surface by grinding a fourth main surface side of the piezoelectric substrate so as to reduce a thickness of the piezoelectric substrate (figure 3B); and forming a cavity portion (9 in figure 4A) in the support; wherein in plan view, the piezoelectric substrate includes a first portion superposed on a portion of the support in which the cavity portion is provided and a second portion not superposed on the portion of the support in which the cavity portion is provided; and in the forming of the piezoelectric layer, at least an entirety or substantially an entirety of the second portion (in 11 and 12) of the piezoelectric substrate is removed. Allowable Subject Matter Claims 3-10, 13-18, 22 and 23 objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Response to Arguments Applicant's arguments have been fully considered but they are not persuasive. In response to the arguments regarding the rejection of claim 21, Kimura’s figures 2A-4C shows that in plan view, the piezoelectric substrate (4) includes a first portion (above 6 and 7) superposed on a portion of the support (2 and 3) in which the cavity portion (9) is provided and a second portion (directly above cavity 9) not superposed on the portion of the support in which the cavity portion is provided; and in the forming of the piezoelectric layer, at least an entirety or substantially an entirety of the second portion (parts of the second portion are removed by through holes 11 and 12, figures 3D) of the piezoelectric substrate is removed. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to ANH-QUAN TRA whose telephone number is (571)272-1755. The examiner can normally be reached Mon-Fri from 8:00 A.M.-5:00 P.M. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Andrea Lindgren Baltzell can be reached at 571-272-5918. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /QUAN TRA/ Primary Examiner Art Unit 2843
Read full office action

Prosecution Timeline

Nov 30, 2023
Application Filed
Jul 31, 2025
Non-Final Rejection mailed — §102
Oct 28, 2025
Response Filed
Mar 25, 2026
Final Rejection mailed — §102
Jun 23, 2026
Response after Non-Final Action
Jul 15, 2026
Request for Continued Examination
Jul 22, 2026
Response after Non-Final Action
Sep 09, 2026
Non-Final Rejection mailed — §102 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12750260
OPTIMIZING TRANSMITTER SETTINGS FOR IN-BAND ELECTRICAL INTERFACE BETWEEN HOST DEVICE AND OPTICAL MODULE USING OUT-OF-BAND ELECTRICAL INTERFACE
2y 3m to grant Granted Sep 29, 2026
Patent 12744146
LC FILTER, MULTIPLEXER, HIGH FREQUENCY MODULE, AND COMMUNICATION DEVICE
2y 2m to grant Granted Sep 22, 2026
Patent 12732166
Match-Slave Latch with Skewed Clock
4y 1m to grant Granted Sep 08, 2026
Patent 12732154
ACOUSTIC WAVE DEVICE
2y 7m to grant Granted Sep 08, 2026
Patent 12719450
ACOUSTIC WAVE DEVICES AND MODULES WITH ACOUSTIC WAVE DEVICES
2y 4m to grant Granted Aug 25, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

Strategy Recommendation AI-generated — please review before filing

Get a prosecution strategy drawn from examiner precedents, rejection analysis, and claim mapping.
Typically takes 5-10 seconds — AI-generated, attorney review required before filing

Prosecution Projections

3-4
Expected OA Rounds
73%
Grant Probability
78%
With Interview (+5.3%)
2y 4m (~0m remaining)
Median Time to Grant
High
PTA Risk
Based on 1129 resolved cases by this examiner. Grant probability derived from career allowance rate.

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month