Prosecution Insights
Last updated: May 29, 2026
Application No. 18/543,271

DEVICES AND METHODS FOR DETECTING FOREIGN MATTERS AND MANAGING RESIDUES IN CATHODE ACTIVE MATERIALS BASED ON SPECTRAL IMAGES

Non-Final OA §102§112
Filed
Dec 18, 2023
Priority
Dec 19, 2022 — RE 10-2022-0178757 +1 more
Examiner
DHILLON, PUNEET S
Art Unit
2488
Tech Center
2400 — Computer Networks
Assignee
SK Planet Co. Ltd.
OA Round
1 (Non-Final)
82%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 82% — above average
82%
Career Allowance Rate
234 granted / 285 resolved
+24.1% vs TC avg
Strong +19% interview lift
Without
With
+19.0%
Interview Lift
resolved cases with interview
Typical timeline
2y 3m
Avg Prosecution
42 currently pending
Career history
325
Total Applications
across all art units

Statute-Specific Performance

§101
1.6%
-38.4% vs TC avg
§103
80.7%
+40.7% vs TC avg
§102
5.0%
-35.0% vs TC avg
§112
10.5%
-29.5% vs TC avg
Black line = Tech Center average estimate • Based on career data from 285 resolved cases

Office Action

§102 §112
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restrictions Applicant’s election without traverse of claims 1-6 in the reply filed on 12/30/2025 is acknowledged. Claim Rejections - 35 USC § 112 The following is a quotation of 35 U.S.C. 112(b): (b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention. The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph: The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention. Claims 1-6 are rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor, or for pre-AIA the applicant regards as the invention. Claim 1 recites the limitation: "… the segment regions … the segment region …" (emphasis added to accentuate insufficient antecedent basis). The plurality (segment regions) is followed by singular (segment region), therefore, rendering a lack of clarity. For the purposes of examination, the limitation is interpreted as the following:“… the segment regions … the segment regions …”. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. Claims 1-4 are rejected under 35 U.S.C. 102(a)(2) as being anticipated by Gigler et al., hereinafter referred to as Gigler (US 2025/0297964 A1). As per claim 1, Gigler discloses a spectral image-based foreign matter detection device (Gigler: Para. [0011]; Abstract.) comprising: a spectroscopic camera that acquires a spectral image of a cathode active material (Gigler: Para. [0011] discloses a “spectroscopy unit (27) comprising a line scan camera (21) … capture hyperspectral images of the forward-moving electrode web”. Further, Gigler: Paras. [0008], [0032] disclose a slurry composed of NMC (Lithium Nickel Manganese Cobalt Oxide) or graphite [known cathode active materials] applied to the electrode web.); and a processor (23) functionally connected to the spectroscopic camera (22) and configured to (Gigler: Fig. 4 & Para. [0067] disclose the line scan camera 22 connected to the evaluation and computing unit 23.): control the spectroscopic camera to acquire a current spectral image of the cathode active material (Gigler: Para. [0015] discloses “manufacturing control system (24), to which the spectroscopy unit (27) is connected and which is configured to trigger the spectroscopy unit (27) for measurement”.), separate a foreground area where the cathode active material is distributed, and a background area other than the foreground area in the current spectral image (Gigler: Para. [0081] discloses “analyses can be supplemented by preprocessing steps, for example by freeing the coating foreground from the substrate foil”.), divide the separated foreground area into a predefined number of segment regions (Gigler: Paras. [0016], [0039] disclose compressing data of the spectroscopic imaging in a vector and assigning it to the local position, which is a measure of the lateral distribution of materials. Further, Gigler: Para. [0076] discloses a “640×1 vector,” indicating division of the image data into defined vector segments.), compare each of the segment regions with a pre-stored reference model to determine whether a foreign matter is contained (Gigler: Paras. [0011], [0033], [0078] disclose determining “inhomogeneities” (defined as deviation of chemical composition [0011], which encompasses foreign matter). It states “the inhomogeneity can be determined by a comparison with previously ascertained reference images (=target variables) [0033], or by “calibration of a model which … maps the spectra onto a target value” [0078].), and output information about the segment region containing the foreign matter (Gigler: Paras. [0011], [0012], [0035] disclose “ascertain and save the local position of the inhomogeneities” [0011]. This saving is effected by “marking on the electrode web” [0012] or storing spectral characteristics with spatial encoding [0014], which corresponds to outputting information about the segment regions containing the foreign matter/inhomogeneity.). As per claim 2, Gigler discloses the foreign matter detection device of claim 1, wherein the processor is configured to distinguish between a segment region containing the foreign matter and a segment region not containing the foreign matter, and to output distinguished information to a display (Gigler: Paras. [0011], [0016] disclose an evaluation unit (processor) configured to ascertain “inhomogeneities” (foreign matter) and their local positions from hyperspectral images. Further, Gigler: Para. [0077] discloses generating an image wherein “Inhomogeneities are represented here by different gray shades”). As per claim 3, Gigler discloses the foreign matter detection device of claim 2, wherein the processor is configured to separately classify the cathode active material of the segment region containing the foreign matter and the cathode active material of the segment region not containing the foreign matter (Gigler: Paras. [0011], [0016], [0039] disclose an “evaluation and computing unit” [processor] configured to “ascertain inhomogeneities” [foreign matter/deviations] in the slurry [active material]. Further, Gigler: Paras. [0011], [0031] disclose the processor is configured to ascertain and save the local position of the inhomogeneities [separately classify the segment region containing the foreign matter] and Para. [0077] discloses that “Inhomogeneities are represented here by different gray shades”, therefore distinguishing and classifying regions containing inhomogeneities from regions not containing them.). As per claim 4, Gigler discloses the foreign matter detection device of claim 1, wherein the processor is configured to separate the foreground area and the background area through unsupervised learning-based clustering by applying a nearest neighbor technique or an autoencoder to the current spectral image (Gigler: Paras. [0019], [0078]-[0081] disclose analyzing measured spectra using deep learning methods or autoencoders. The analysis involves “freeing the coating foreground from the substrate foil” as a step supplementing the analysis.). Allowable Subject Matter Claims 5-6 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim provided that the rejections pertinent to 35 U.S.C. 112(b) are overcome. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure and can be viewed in the list of references. Any inquiry concerning this communication or earlier communications from the examiner should be directed to PEET DHILLON whose telephone number is (571)270-5647. The examiner can normally be reached M-F: 5am-1:30pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Sath V. Perungavoor can be reached at 571-272-7455. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /PEET DHILLON/Primary Examiner Art Unit: 2488 Date: 01-21-2026
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Prosecution Timeline

Dec 18, 2023
Application Filed
Jan 30, 2026
Non-Final Rejection mailed — §102, §112 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
82%
Grant Probability
99%
With Interview (+19.0%)
2y 3m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 285 resolved cases by this examiner. Grant probability derived from career allowance rate.

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