Prosecution Insights
Last updated: July 05, 2026
Application No. 18/545,546

DEVICE UNDER TEST, FAULT INJECTION TESTING SYSTEM AND METHOD FOR FAULT INJECTION TESTING USING AN ON-CHIP FAULT TESTING MODULE

Non-Final OA
Filed
Dec 19, 2023
Examiner
SINGLETARY, MICHAEL J
Art Unit
2857
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
NXP Semiconductors N.V.
OA Round
1 (Non-Final)
83%
Grant Probability
Favorable
1-2
OA Rounds
3m
Est. Remaining
91%
With Interview

Examiner Intelligence

Grants 83% — above average
83%
Career Allowance Rate
88 granted / 106 resolved
+15.0% vs TC avg
Moderate +8% lift
Without
With
+7.9%
Interview Lift
resolved cases with interview
Typical timeline
2y 10m
Avg Prosecution
15 currently pending
Career history
139
Total Applications
across all art units

Statute-Specific Performance

§101
31.9%
-8.1% vs TC avg
§103
52.2%
+12.2% vs TC avg
§102
10.3%
-29.7% vs TC avg
§112
1.7%
-38.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 106 resolved cases

Prosecution Timeline

Dec 19, 2023
Application Filed
Apr 08, 2026
Non-Final Rejection mailed (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12669052
SYSTEMS AND METHODS FOR DETECTING ABNORMAL FLOWBACK
3y 0m to grant Granted Jun 30, 2026
Patent 12669360
INTEGRATED MAINTENANCE SYSTEM FOR MULTIPHASE METERING SYSTEM
2y 10m to grant Granted Jun 30, 2026
Patent 12631689
METHOD AND SYSTEM FOR EVALUATING POWER BATTERY AGING STATE AND SCREENING RETIREMENT
2y 12m to grant Granted May 19, 2026
Patent 12612855
SYSTEM AND METHOD FOR DETERMINING WELL CORRELATION
2y 11m to grant Granted Apr 28, 2026
Patent 12591013
Vehicle Battery Monitoring
4y 9m to grant Granted Mar 31, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
83%
Grant Probability
91%
With Interview (+7.9%)
2y 10m (~3m remaining)
Median Time to Grant
Low
PTA Risk
Based on 106 resolved cases by this examiner. Grant probability derived from career allowance rate.

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