Prosecution Insights
Last updated: July 05, 2026
Application No. 18/545,785

DISPLAY DEVICE

Non-Final OA §102§112
Filed
Dec 19, 2023
Priority
Jan 27, 2023 — RE 10-2023-0011016
Examiner
SHOOK, DANIEL P
Art Unit
2896
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
LG Display Co., Ltd.
OA Round
1 (Non-Final)
87%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
96%
With Interview

Examiner Intelligence

Grants 87% — above average
87%
Career Allowance Rate
560 granted / 644 resolved
+19.0% vs TC avg
Moderate +8% lift
Without
With
+8.5%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 0m
Avg Prosecution
12 currently pending
Career history
657
Total Applications
across all art units

Statute-Specific Performance

§101
1.0%
-39.0% vs TC avg
§103
72.7%
+32.7% vs TC avg
§102
11.6%
-28.4% vs TC avg
§112
5.7%
-34.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 644 resolved cases

Office Action

§102 §112
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 112 The following is a quotation of 35 U.S.C. 112(b): (b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention. The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph: The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention. Claims 7-11 and 14-19 are rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention. For examining purposes the “first planarization layer” shall be read as referring to either the planarization layer of claim 1 or to an additional planarization layer. Claim 7 refers to “the first planarization layer”, however claim 1 only refers to “a planarization layer”, therefore it is unclear if the claims require any further planarization layers such that the planarization layer of claim 1 is the first of several planarization layers, or if the inclusion of “first” in “the first planarization layer” is mistaken and there is only claimed planarization layer. Claims 8-11 and 14-19 all depend upon claim 7 without correcting the unclear subject matter and are thus rejected for incorporating the unclear subject matter of claim 7. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. Claim(s) 1, 7, 8, 14 and 21-24 is/are rejected under 35 U.S.C. 102(a)(2) as being anticipated by Hwang et al. (US 2023/0098923 A1). Regarding claim 1, Hwang discloses a display device (Fig 20, a modification of Fig 1-8 per ¶201), comprising: a substrate (110) comprising a display area (10) and a non-display area (20 & 30); a bending area (20) within the non-display area; a first area disposed on a first side of the bending area; a second area disposed on a second side of the bending area; a plurality of pads (470) disposed on an upper portion of the substrate in the first area; a circuit element (101) configured to supply electric power to a first pad among the plurality of pads; a plurality of signal lines (180, the lines of the display are 215 & 235 which will be located underneath encapsulation 450, see ¶158) disposed on the upper portion of the substrate in the bending area, the plurality of signal lines being electrically connected to the plurality of pads, respectively; a planarization layer (490) configured to cover the plurality of signal lines; and a shield layer (630) disposed over the planarization layer and configured to at least cover a first signal line among the plurality of signal lines (¶133). Regarding claim 7, Hwang discloses a first conductive layer (that of source electrode 210 and drain electrode 230) disposed over the substrate in the display area; an organic insulation layer (731) disposed over the first conductive layer; and a second conductive layer (215 & 235) disposed between the organic insulation layer and the first planarization layer. Regarding claim 8, Hwang discloses that first signal line is disposed on the same layer as the second conductive layer and comprises the same material as the second conductive layer (¶158). Regarding claim 14, Hwang discloses a gate electrode (175) disposed between the substrate and the first conductive layer; and an inorganic insulation layer (195; ¶96) disposed between the gate electrode and the first conductive layer. Regarding claim 21, Hwang discloses a display device (Fig 20, a modification of Fig 1-8 per ¶201), comprising: a substrate (110) having a display area (10) and a non-display area (30); a bending area (20) between the display area and the non-display area; a plurality of pads (470) disposed on an upper portion of the substrate in the non-display area; a circuit element (101) configured to supply electric power to a first pad among the plurality of pads in the non-display area; a plurality of signal lines (180) disposed on the substrate in the bending area, the plurality of signal lines being electrically connected to the plurality of pads, respectively; an insulation layer (490) covering the plurality of signal lines; and a shield layer (630) positioned over the insulation layer, the shield layer covering at least a portion of the plurality of signal lines. Regarding claim 22, Hwang discloses that the portion covered by the shield layer is a portion of each signal line in the plurality of signal lines (Fig 1, 630 covers each signal line). Regarding claim 23, Hwang discloses that the portion covered by the shield layer is a portion of at least one signal line in the plurality of signal lines (Fig 1, 630 covers each signal line). Regarding claim 24, Hwang discloses that the shield layer includes a metal layer and is positioned to shield the plurality of signal lines from an electric field (¶133, the RF signal produces an electric field). Allowable Subject Matter Claims 2-6, 12, 13 and 20 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. The following is a statement of reasons for the indication of allowable subject matter: Hwang does not disclose, nor does other prior art suggest, the electrical connection of the shield layer to the first pad per claims 2 and 3, nor the bank and layer over the bank of claim 12. Additionally the prior art does not disclose or suggest the shield layer being connected to an electric current detection part as in claim 20. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to DANIEL P SHOOK whose telephone number is (571)270-7890. The examiner can normally be reached 9:00 am - 5:00 pm, Mon-Fri. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, WILLIAM KRAIG can be reached at (571)272-8660. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /DANIEL P SHOOK/Primary Examiner, Art Unit 2896
Read full office action

Prosecution Timeline

Dec 19, 2023
Application Filed
Mar 27, 2026
Non-Final Rejection mailed — §102, §112 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12672460
DISPLAY PANEL AND DISPLAY DEVICE
3y 1m to grant Granted Jun 30, 2026
Patent 12672425
LIGHT-EMITTING DEVICE AND METHOD FOR MANUFACTURING SAME, AND DISPLAY SUBSTRATE AND DISPLAY APPARATUS
2y 11m to grant Granted Jun 30, 2026
Patent 12672366
PHOTODETECTOR FOCAL PLANE ARRAYS WITH ENHANCED DETECTION CAPABILITY
2y 5m to grant Granted Jun 30, 2026
Patent 12666696
SEMICONDUCTOR DEVICE WITH INTEGRATED JUNCTION FIELD EFFECT TRANSISTOR AND ASSOCIATED MANUFACTURING METHOD
2y 10m to grant Granted Jun 23, 2026
Patent 12666697
SEMICONDUCTOR DEVICE WITH INTEGRATED JUNCTION FIELD EFFECT TRANSISTOR AND ASSOCIATED MANUFACTURING METHOD
2y 10m to grant Granted Jun 23, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
87%
Grant Probability
96%
With Interview (+8.5%)
2y 0m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 644 resolved cases by this examiner. Grant probability derived from career allowance rate.

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