Prosecution Insights
Last updated: April 19, 2026
Application No. 18/564,530

TEST SHEET AND MEASUREMENT METHOD

Non-Final OA §102
Filed
Nov 27, 2023
Examiner
DAVIS-HOLLINGTON, OCTAVIA L
Art Unit
2855
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Shimadzu Corporation
OA Round
1 (Non-Final)
85%
Grant Probability
Favorable
1-2
OA Rounds
2y 7m
To Grant
91%
With Interview

Examiner Intelligence

Grants 85% — above average
85%
Career Allow Rate
955 granted / 1121 resolved
+17.2% vs TC avg
Moderate +5% lift
Without
With
+5.4%
Interview Lift
resolved cases with interview
Typical timeline
2y 7m
Avg Prosecution
44 currently pending
Career history
1165
Total Applications
across all art units

Statute-Specific Performance

§101
0.5%
-39.5% vs TC avg
§103
46.8%
+6.8% vs TC avg
§102
40.2%
+0.2% vs TC avg
§112
8.8%
-31.2% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1121 resolved cases

Office Action

§102
DETAILED ACTION1. Acknowledgment is made of applicant’s preliminary amendments filed 11/27/23 and 6/21/24. Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. 4. The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1 and 14 – 29 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Aoyama et al. (JPWO2016186203, hereinafter Aoyama). Regarding claim 1, Aoyama discloses an apparatus comprising a test sheet 10, a substrate layer (base) 1 containing a polymeric material; and a stress luminescent layer 3 formed on the substrate layer, the stress luminescent layer containing a stress luminescent material, wherein the substrate layer is thicker than the stress luminescent layer (See Fig. 1, See Pg. 2, Para. 9). Regarding claim 14, an adhesive layer 6 is provided for adhering the test sheet to the target object, wherein the substrate layer 1 is formed on the adhesive layer (See Fig. 10, See Pg. 18, Para. 6). Regarding claim 15, an antistatic layer (brittle layer) 8 is formed between the adhesive layer 6 and the substrate layer 1 via a second substrate 1b (See Fig. 11, See Pg. 19, Para. 11). Regarding claim 16, the adhesive layer is made of a removable adhesive (See Pg. 18, Paras. 6 – 9). Regarding claim 17, the stress luminescent layer has a thickness of 10 um or less (See Pg. 10, Para. 5). Regarding claim 18, the antistatic layer 8 is provided, the substrate layer 1 is formed on the antistatic layer, the substrate layer contains a polymeric material; and the stress luminescent layer 3 is formed on the substrate layer, the stress luminescent layer containing a stress luminescent material (See Fig. 1, See Pg. 2, Para. 9). Regarding claim 19, the adhesive layer 6 adheres the test sheet to a target object, wherein the substrate layer is formed on the antistatic layer (See Fig. 10). Regarding claim 20, the antistatic layer 8 is formed between the adhesive layer and the substrate layer via the second substrate 1b (See Fig. 11). Regarding claim 21, the adhesive layer is made of a removable adhesive (See Pg. 18, Paras. 6 – 9). Regarding claim 22, the stress luminescent layer has a thickness of 10 um or less (See Pg. 10, Para. 5). Regarding claim 23, the test sheet is irradiated and adhered to the target object with excitation light, the test sheet comprises a substrate layer 1 containing a polymeric material, and a stress luminescent layer 3 formed on the substrate layer, the stress luminescent layer containing a stress luminescent material; a captured image of the test sheet is acquired and a luminous intensity of the test sheet is identified from the captured image (See Pg. 2, Para. 16, Pg. 5, Para. 5, Pg. 7, Para. 6 and Pg. 54, Para. 9). Regarding claim 24, the substrate layer 1 is thicker than the stress luminescent layer 3 (See Fig. 1). Regarding claim 25, the test sheet comprises an antistatic layer 8 disposed on an opposite side of the substrate layer 1 opposite to a side on which the stress luminescent layer 3 is formed (See Fig. 11). Regarding claim 26, the test sheet comprises an adhesive layer 6 disposed on an opposite side of the substrate layer 1 opposite to a side on which the stress luminescent layer 3 is formed (See Fig. 10). Regarding claim 27, the adhesive layer is made of a removable adhesive (See Pg. 18, Paras. 6 – 9). Regarding claim 28, the stress luminescent layer has a thickness of 10 um or less (See Pg. 10, Para. 5). Regarding claim 29, a plurality of test sheets is cut out from the same sheet, and the plurality of test sheets is adhered to a respective plurality of locations on the target object (See Figs. 44 and 46, See Pg. 18, Para. 9 and Pg. 54, Paras. 10 – 12).6. Claims 1, 14, 16 and 17 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Naito et al. (JP6006066, hereinafter Naito). Regarding claim 1, Naito discloses an apparatus comprising a test sheet 1, a substrate layer 2 containing a polymeric material; and a stress luminescent layer 3 formed on the substrate layer, the stress luminescent layer containing a stress luminescent material, wherein the substrate layer is thicker than the stress luminescent layer (See Fig. 1, See Pg. 2, Para. 5). Regarding claim 14, an adhesive layer is provided for adhering the test sheet to a target object, wherein the substrate layer is formed on the adhesive layer (See Pg. 29, Para. 2). Regarding claim 16, the adhesive layer is made of a removable adhesive (See Pg. 29, Para. 2). Regarding claim 17, the stress luminescent layer has a thickness of 10 um or less (See Pg. 7, Para. 2). Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. 8. Kanamaru (12,442,737) discloses a stress measuring method, stress measuring apparatus, and computer readable non-transitory storage medium. Yokoi (11,704,786) discloses a stress luminescent measurement method and stress luminescence measurement device. Yokoi et al. (2021/0356400) disclose a stress luminescence measurement device and stress luminescence measurement method. Raghavan et al. (2013/0082191) disclose a stress sensitive material and methods for using same. Hubner et al. (6,943,869) disclose a method and apparatus for measuring strain using a luminescent photoelastic coating. Ifju et al. (6,327,030) disclose a system, method, and coating for strain analysis.9. Any inquiry concerning this communication or earlier communications from the examiner should be directed to OCTAVIA HOLLINGTON whose telephone number is (571)272-2176. The examiner can normally be reached Monday-Friday 9am-5pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, John Breene can be reached at 5712724107. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /OCTAVIA HOLLINGTON/Primary Examiner, Art Unit 2855 11/25/25
Read full office action

Prosecution Timeline

Nov 27, 2023
Application Filed
Jun 21, 2024
Response after Non-Final Action
Nov 25, 2025
Non-Final Rejection — §102 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
85%
Grant Probability
91%
With Interview (+5.4%)
2y 7m
Median Time to Grant
Low
PTA Risk
Based on 1121 resolved cases by this examiner. Grant probability derived from career allow rate.

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