Prosecution Insights
Last updated: October 02, 2026
Application No. 18/593,985

CRYSTAL OSCILLATING WAFER, CRYSTAL OSCILLATOR, AND ELECTRONIC DEVICE

Non-Final OA §102§103
Filed
Mar 04, 2024
Priority
Sep 03, 2021 — continuation of PCTCN2021116464
Examiner
GANNON, LEVI
Art Unit
Tech Center
Assignee
Huawei Technologies Co., Ltd.
OA Round
1 (Non-Final)
83%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
90%
With Interview

Examiner Intelligence

Grants 83% — above average
83%
Career Allowance Rate
1251 granted / 1513 resolved
+22.7% vs TC avg
Moderate +7% lift
Without
With
+7.1%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 0m
Avg Prosecution
29 currently pending
Career history
1544
Total Applications
across all art units

Statute-Specific Performance

§101
2.3%
-37.7% vs TC avg
§103
43.1%
+3.1% vs TC avg
§102
36.5%
-3.5% vs TC avg
§112
12.3%
-27.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1513 resolved cases

Office Action

§102 §103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Objections Claims 1, 3, 6, 7, 9, and 10 are objected to because of the following informalities: Claim 1, line 5: It is the Examiner’s position that the term “the upper surface” should be changed to—an upper surface—to correct an antecedent basis issue. The word “and” should be deleted from the end of claim 3. Claim 6, line 2: It is the Examiner’s position that the term “the first endpoint” should be changed to—a first endpoint—to correct an antecedent basis issue. Claim 7, line 2: It is the Examiner’s position that the term “the first side” should be changed to—a first side—to correct an antecedent basis issue. Claim 9, line 9: It is the Examiner’s position that the term “the upper surface” should be changed to—an upper surface—to correct an antecedent basis issue. Claim 10, line 8: It is the Examiner’s position that the term “the upper surface” should be changed to—an upper surface—to correct an antecedent basis issue. Appropriate correction is required. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1 and 6-10 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Tanaka et al. (US 2014/0292437; “Tanaka”; Figure 16 is provided below for reference). Regarding claim 1, Tanaka teaches a crystal oscillating wafer (figure 16) having a shape (See shape in figure 16 below), comprising: a symmetric shape about an axis (A-A) that runs with a length of the wafer (Resonator 1 is symmetric about axis A-A in figure 16 below.); a width that is greater at a first end (See the width of first thick section 23) of the crystal oscillating wafer than at a second end (See the width of second thick section 24) of the crystal oscillating wafer; and an oscillation region (21) that comprises a first concave region located on an upper surface (See concave region of resonator 1 above the axis A-A) and a second concave region located on a lower surface (See concave region of resonator 1 below the axis A-A) of the crystal oscillating wafer. PNG media_image1.png 327 413 media_image1.png Greyscale Figure 16 of Tanaka As for claim 6, Tanaka teaches wherein a distance between the oscillation region (21) and a first endpoint (outside wall of second thick section 24) is less than a distance between the oscillation region (21) and a second endpoint (outside wall of first thick section 23) of the symmetry axis. Regarding claim 7, Tanaka teaches wherein a first glue dispensing point and a second glue dispensing point are provided on a first side of the crystal oscillating wafer (Glue dispensing points are interpreted as points on the wafer where glue can be dispensed. Accordingly, the first and second glue dispensing points of Tanaka are interpreted as two points on the first thick section 23.). As for claim 8, Tanaka teaches wherein a third glue dispensing point is provided on the symmetry axis (Glue dispensing points are interpreted as points on the wafer where glue can be dispensed. Accordingly, the third glue dispensing point of Tanaka is interpreted as a point along the axis A-A.). Regarding claim 9, Tanaka teaches a crystal oscillator (figure 18), comprising: a crystal oscillating wafer (1; details in figure 16), an oscillator circuit (110), a substrate (41), and wherein the crystal oscillating wafer has a shape (See shape in figure 16 below), comprising: a symmetric shape about an axis (A-A) that runs with a length of the wafer (Resonator 1 is symmetric about axis A-A in figure 16 below.); a width that is greater at a first end (See the width of first thick section 23) of the crystal oscillating wafer than at a second end (See the width of second thick section 24) of the crystal oscillating wafer (1); and an oscillation region (21) that comprises a first concave region located on an upper surface (See concave region of resonator 1 above the axis A-A) and a second concave region located on a lower surface (See concave region of resonator 1 below the axis A-A) of the crystal oscillating wafer (1); and the crystal oscillating wafer (1) and the oscillator circuit (110) are located on the substrate (41), and the crystal oscillating wafer (1) is electrically connected (para. [0124]) to the oscillator circuit (110). Regarding claim 10, Tanaka teaches an electronic device (figures 19-22), wherein the electronic device comprises a crystal oscillator (figure 18), wherein the crystal oscillator comprises a crystal oscillating wafer (1; details in figure 16), an oscillator circuit (110), and a substrate (41), wherein: the crystal oscillating wafer has a shape (See shape in figure 16 below), comprising: a symmetric shape about an axis (A-A) that runs with a length of the wafer (Resonator 1 is symmetric about axis A-A in figure 16 below.); a width that is greater at a first end (See the width of first thick section 23) of the crystal oscillating wafer than at a second end (See the width of second thick section 24) of the crystal oscillating wafer (1); and an oscillation region (21) that comprises a first concave region located on an upper surface (See concave region of resonator 1 above the axis A-A) and a second concave region located on a lower surface (See concave region of resonator 1 below the axis A-A) of the crystal oscillating wafer (1); and the crystal oscillating wafer (1) and the oscillator circuit (110) are located on the substrate (41), and the crystal oscillating wafer (1) is electrically connected (para. [0124]) to the oscillator circuit (110). Claims 1, 4, and 6-10 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Li (CN 111193491; reference of record; Figure 1 is provided below for reference). Regarding claim 1, Li teaches a crystal oscillating wafer (10) having a shape (see shape in figure 1), comprising: a symmetric shape about an axis (B-B) that runs with a length of the wafer (Resonator 10 is symmetric about axis B-B in figure 1 below.); a width that is greater at a first end of the crystal oscillating wafer than at a second end of the crystal oscillating wafer (A width at the far end of resonator 10 is greater than a width of the near end of resonator 10.); and an oscillation region (around boss 3) that comprises a first concave region (2) located on an upper surface and a second concave region (2) located on a lower surface of the crystal oscillating wafer (“the upper surface of the substrate 1 one end and the lower surface are symmetrically provided with a groove 2”). PNG media_image2.png 450 446 media_image2.png Greyscale Figure 1 of Li Regarding claim 4, Li teaches wherein the crystal oscillating wafer is substantially an octagonal sheet formed by a second square region and a third square region, a part of a third side of the second square region coincides with a fourth side of the third square region, a midpoint of the third side coincides with a midpoint of the fourth side, the third side is longer than the fourth side, and the third side is an opposite side of a first side that is of the crystal oscillating wafer (See the octagonal sheet configuration in figure 1 of Li above.). As for claim 6, Li teaches wherein a distance between the oscillation region (boss 3 in groove 2) and a first endpoint (far end of resonator 10) is less than a distance between the oscillation region (boss 3 in groove 2) and a second endpoint (near end of resonator 10) of the symmetry axis (B-B). Regarding claim 7, Li teaches wherein a first glue dispensing point and a second glue dispensing point are provided on a first side of the crystal oscillating wafer (Glue dispensing points are interpreted as points on the wafer where glue can be dispensed. Accordingly, the first and second glue dispensing points of Li are interpreted as two points on the substrate 1.). As for claim 8, Li teaches wherein a third glue dispensing point is provided on the symmetry axis (Glue dispensing points are interpreted as points on the wafer where glue can be dispensed. Accordingly, the third glue dispensing point of Li is interpreted as a point along the axis B-B.). Regarding claim 9, Li teaches a crystal oscillator (figure 1), comprising: a crystal oscillating wafer (10), an oscillator circuit (“the whole oscillator has very good low-frequency physical properties”), a substrate (upon which resonator 10 rests in the chip), and wherein the crystal oscillating wafer (10) has a shape (see shape in figure 1), comprising: a symmetric shape about an axis (B-B) that runs with a length of the wafer (Resonator 10 is symmetric about axis B-B in figure 1 below.); a width that is greater at a first end of the crystal oscillating wafer than at a second end of the crystal oscillating wafer (A width at the far end of resonator 10 is greater than a width of the near end of resonator 10.); and an oscillation region (around boss 3) that comprises a first concave region (2) located on an upper surface and a second concave region (2) located on a lower surface of the crystal oscillating wafer (“the upper surface of the substrate 1 one end and the lower surface are symmetrically provided with a groove 2”); and the crystal oscillating wafer and the oscillator circuit are located on the substrate, and the crystal oscillating wafer is electrically connected to the oscillator circuit (The resonator wafer and oscillator circuit are formed on a substrate within a chip. “the space of the chip supporting area to cause the chip number of each piece of quartz etching chemical wafer”). Regarding claim 10, Li teaches an electronic device (device utilizing the resonator based oscillator of Li), wherein the electronic device comprises a crystal oscillator (“the whole oscillator has very good low-frequency physical properties” (), wherein the crystal oscillator comprises a crystal oscillating wafer (10), an oscillator circuit (driving the wafer 10), and a substrate (upon which resonator 10 rests in the chip), wherein: the crystal oscillating wafer (10) has a shape (see shape in figure 1), comprising: a symmetric shape about an axis (B-B) that runs with a length of the wafer (Resonator 10 is symmetric about axis B-B in figure 1 below.); a width that is greater at a first end of the crystal oscillating wafer than at a second end of the crystal oscillating wafer (A width at the far end of resonator 10 is greater than a width of the near end of resonator 10.); and an oscillation region (around boss 3) that comprises a first concave region (2) located on an upper surface and a second concave region (2) located on a lower surface of the crystal oscillating wafer (“the upper surface of the substrate 1 one end and the lower surface are symmetrically provided with a groove 2”); and the crystal oscillating wafer and the oscillator circuit are located on the substrate, and the crystal oscillating wafer is electrically connected to the oscillator circuit (The resonator wafer and oscillator circuit are formed on a substrate within a chip. “the space of the chip supporting area to cause the chip number of each piece of quartz etching chemical wafer”). Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim 2 is rejected under 35 U.S.C. 103 as being unpatentable over Li in view of Johnson et al. (US 2009/0094985; “Johnson”). Regarding claim 2, Li teaches the crystal oscillating wafer according to claim 1, as detailed above, but fails to teach wherein the crystal oscillating wafer is substantially an isosceles trapezoidal sheet, and a first side that is of the crystal oscillating wafer and that passes the first endpoint is a lower base of the crystal oscillating wafer. However, it is well-known to those of ordinary skill in the art to embody a resonator with an isosceles trapezoidal sheet. For example, see para. [0047] and figure 4A of Johnson. It would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to utilize an isosceles trapezoidal sheet as the resonator shape of Li because such a modification would have been implementing a well-known resonator device shape. Allowable Subject Matter Claims 3 and 5 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. The following is a statement of reasons for the indication of allowable subject matter: The best prior art references of record, Tanaka and Li, fail to teach: “wherein a shape of the crystal oscillating wafer is substantially a hexagonal sheet formed by a first square region and an isosceles trapezoidal region, a second side of the first square region coincides with a lower base of the isosceles trapezoidal region, and the second side is an opposite side of a first side that is of the crystal oscillating wafer”, as set forth in claim 3; and “wherein a shape of the crystal oscillating wafer is substantially a pentagonal sheet formed by a fourth square region and an isosceles triangular region, a fifth side of the fourth square region coincides with a base of the isosceles triangular region, and the fifth side is an opposite side of a first side that is of the crystal oscillating wafer.”, as set for in claim 5. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Nguyen et al. (US 10,126,376; figure 1a) teaches a trapezoidal resonator shape. Kikushima et al. (US 2014/0292434; figure 13) teaches a resonator device with differing widths along its length. Any inquiry concerning this communication or earlier communications from the examiner should be directed to LEVI GANNON whose telephone number is (571)272-7971. The examiner can normally be reached 7:00AM-4:30PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Menatoallah Youssef can be reached at 571-270-3684. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /LEVI GANNON/Primary Examiner, Art Unit 2836 September 9, 2026
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Prosecution Timeline

Mar 04, 2024
Application Filed
Sep 14, 2026
Non-Final Rejection mailed — §102, §103 (current)

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Prosecution Projections

1-2
Expected OA Rounds
83%
Grant Probability
90%
With Interview (+7.1%)
2y 0m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1513 resolved cases by this examiner. Grant probability derived from career allowance rate.

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