Prosecution Insights
Last updated: July 17, 2026
Application No. 18/604,939

SEMICONDUCTOR DEVICE

Non-Final OA §102
Filed
Mar 14, 2024
Priority
Sep 30, 2021 — JP 2021-160665 +1 more
Examiner
LEE, KYOUNG
Art Unit
2817
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Rohm Co., Ltd.
OA Round
1 (Non-Final)
93%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
98%
With Interview

Examiner Intelligence

Grants 93% — above average
93%
Career Allowance Rate
921 granted / 988 resolved
+25.2% vs TC avg
Minimal +5% lift
Without
With
+5.0%
Interview Lift
resolved cases with interview
Fast prosecutor
1y 10m
Avg Prosecution
13 currently pending
Career history
1009
Total Applications
across all art units

Statute-Specific Performance

§101
3.5%
-36.5% vs TC avg
§103
49.4%
+9.4% vs TC avg
§102
33.5%
-6.5% vs TC avg
§112
5.6%
-34.4% vs TC avg
Black line = Tech Center average estimate • Based on career data from 988 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Information Disclosure Statement The information disclosure statement (IDS) submitted on 3/14/2024 is in compliance with the provisions of 37 CFR 1.97. Accordingly, the information disclosure statement is being considered by the examiner. Specification The title of the invention is not descriptive. A new title is required that is clearly indicative of the invention to which the claims are directed. Claim Rejections - 35 USC § 102 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. Claim(s) 1-5, 7 and 16-17 is/are rejected under 35 U.S.C. 102(a)(2) as being anticipated by TAJIRI (US Patent Appl. Pub. No. 2024/0071875 A1). The applied reference has a common assignee with the instant application. Based upon the earlier effectively filed date of the reference, it constitutes prior art under 35 U.S.C. 102(a)(2). This rejection under 35 U.S.C. 102(a)(2) might be overcome by: (1) a showing under 37 CFR 1.130(a) that the subject matter disclosed in the reference was obtained directly or indirectly from the inventor or a joint inventor of this application and is thus not prior art in accordance with 35 U.S.C. 102(b)(2)(A); (2) a showing under 37 CFR 1.130(b) of a prior public disclosure under 35 U.S.C. 102(b)(2)(B) if the same invention is not being claimed; or (3) a statement pursuant to 35 U.S.C. 102(b)(2)(C) establishing that, not later than the effective filing date of the claimed invention, the subject matter disclosed in the reference and the claimed invention were either owned by the same person or subject to an obligation of assignment to the same person or subject to a joint research agreement. [Re claim 1] TAJIRI discloses the semiconductor device comprising: a substrate (11) including an obverse surface (11A) facing in a thickness direction; a lead (23 and 24) including a die pad portion (211) bonded to the substrate and a terminal portion (212 and 222) connected to the die pad portion; a semiconductor element (31 and 32) bonded to the die pad portion; and a bonding layer (13) interposed between the obverse surface (11A) and the die pad portion (211), wherein the obverse surface (11A) includes a first edge (D1) extending in a first direction orthogonal to the thickness direction and a second edge (D2) extending in a second direction orthogonal to the thickness direction and the first direction, as viewed in the thickness direction, the terminal portion (212 and 222) protrudes outward from the obverse surface relative to the first edge, and a distance from the first edge (D1) to an outer edge of the bonding layer (13) in the second direction is shorter than a distance from the second edge (D1) to an outer edge of the bonding layer (13) in the first direction (see figure 3, 7-8 and paragraph [0037]-[0047]). [Re claim 2] TAJIRI discloses the semiconductor device wherein the die pad portion (211) extends across the first edge (see figure 3). [Re claim 3] TAJIRI discloses the semiconductor device wherein the bonding layer extends across the first edge (see figure 3 and 7). [Re claim 4] TAJIRI discloses the semiconductor device wherein the terminal portion (212) overlaps with the first edge as viewed in the thickness direction (see figure 3 and 7-8). [Re claim 5] TAJIRI discloses the semiconductor device wherein the bonding layer (13) is in contact with the first edge (see figure 7-8). [Re claim 7] TAJIRI discloses the semiconductor device wherein the first edge (D1) is longer than the second edge (D2) (see figure 3). [Re claim 16] TAJIRI discloses the semiconductor device further comprising a sealing resin (50) covering a portion of the lead and the semiconductor element, wherein the sealing resin is in contact with the first edge and the second edge (see figure 3 and 7). [Re claim 17] TAJIRI discloses the semiconductor device wherein the substrate includes a reverse surface (11B) facing away from the obverse surface (11A) in the thickness direction, and the reverse surface is exposed from the sealing resin (see figure 7). Allowable Subject Matter Claims 6 and 8-15 objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to KYOUNG LEE whose telephone number is (571)272-1982. The examiner can normally be reached M to F, 10am to 6pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Eliseo Ramos-Feliciano can be reached at (571)272-7925. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /KYOUNG LEE/Primary Examiner, Art Unit 2817
Read full office action

Prosecution Timeline

Mar 14, 2024
Application Filed
Jun 12, 2026
Non-Final Rejection mailed — §102 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
93%
Grant Probability
98%
With Interview (+5.0%)
1y 10m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 988 resolved cases by this examiner. Grant probability derived from career allowance rate.

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