Prosecution Insights
Last updated: August 16, 2026
Application No. 18/620,211

LAMINATE CAVITY PACKAGE

Non-Final OA §102§103
Filed
Mar 28, 2024
Priority
Apr 04, 2023 — provisional 63/456,817
Examiner
KOLAHDOUZAN, HAJAR
Art Unit
Tech Center
Assignee
Qorvo US Inc.
OA Round
1 (Non-Final)
74%
Grant Probability
Favorable
1-2
OA Rounds
4m
Est. Remaining
97%
With Interview

Examiner Intelligence

Grants 74% — above average
74%
Career Allowance Rate
275 granted / 369 resolved
+14.5% vs TC avg
Strong +22% interview lift
Without
With
+22.4%
Interview Lift
resolved cases with interview
Typical timeline
2y 8m
Avg Prosecution
15 currently pending
Career history
384
Total Applications
across all art units

Statute-Specific Performance

§103
59.9%
+19.9% vs TC avg
§102
30.5%
-9.5% vs TC avg
§112
8.5%
-31.5% vs TC avg
Black line = Tech Center average estimate • Based on career data from 369 resolved cases

Office Action

§102 §103
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 11, 13-14, 16, and 18-20are rejected under 35 U.S.C. 102(a)(1) as being unpatentable by Zhao et al. (US 2022/0037464 A1; hereinafter Zhao). Regarding Claim 11. Zhao (Fig.1A) discloses a method of manufacturing an integrated circuit (IC) package, comprising: providing a laminate (176) having a surface and defining a cavity ([0084]), wherein the cavity has an opening at the surface of the laminate; mounting a semiconductor die (110) in the cavity; electrically connecting the semiconductor die (110) to the laminate (176); and closing the opening with a lid (178). Regarding Claim 13. The method of claim 11, Zhao (Fig.1A) discloses wherein the laminate (176) comprises a laminate body and a conductive structure integrated into the laminate body ([0076]), wherein the opening is formed through the laminate body and the conductive structure and wherein electrically connecting the semiconductor die (110) to the laminate (176) comprises wirebonding (182/183) the semiconductor die (110) to the conductive structure of the laminate (176). Regarding Claim 14. The method of claim 13, wherein: Zhao (Fig.1A) discloses the semiconductor die (110) is electrically connected to the conductive structure of the laminate ([0076]). Regarding Claim 16. The method of claim 11, wherein: Zhao (Fig.1A; [0076]) discloses a heat sink is provided at a bottom of the cavity while the opening is at a top of the cavity; and the semiconductor die is mounted on the heat sink ([0076] discloses that 176 includes a heat sink since 176 is below die 110). Regarding Claim 18. The method of claim 11, Zhao (Fig.1A; [0079]) discloses wherein the cavity is filled with air after the cavity is closed with the lid. Regarding Claim 19. Zhao (Fig.1A; [0076]) discloses an integrated circuit (IC) package, comprising: a laminate (176) having a surface and defining a cavity, wherein the cavity has an opening at the surface of the laminate (176); a semiconductor die (110) mounted in the cavity and being electrically connected to the laminate (176); and a lid (178) that closes the opening at the surface of the laminate (176). Regarding Claim 20. The IC package of claim 19, wherein: Zhao (Fig.1A; [0076]) discloses the laminate (176) comprises a laminate body and a conductive structure integrated into the laminate body; the opening is formed through the laminate body and the conductive structure; and the semiconductor die (110) is electrically connected to the conductive structure of the laminate (176). Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 1-7, and 9-10 are rejected under 35 U.S.C. 103 as being unpatentable over Zhao et al. (US 2022/0037464 A1; hereinafter Zhao) in view of Dresser (US 2019/0311962 A1; Hereinafter Dresser). Regarding Claim 1. Zhao (Fig.1A) discloses an integrated circuit (IC) package, comprising: a laminate (176, [0076]) having a surface and defining a cavity ([0084]), wherein the cavity has an opening at the surface of the laminate (176; see Fig.1D); a semiconductor die (110; [0085]) mounted in the cavity and being electrically connected to the laminate (176); a lid (178, [0076]) that closes the opening at the surface of the laminate (176). Zhao does not particularly disclose an overmold formed over the lid. Dresser (Fig.3; [0042]) in a related art discloses a packaging including forming an overmold (360; [0042]) over the lid (310; [0039]). Therefore, it would have been obvious in the art before the effective filling date of the application to use overmold on the lid since it provides robust environmental protection without having to accommodate critical RF fields Regarding Claim 2. The IC package of claim 1, wherein: Zhao (Fig.1A) discloses the laminate (176) comprises a laminate body and a conductive structure integrated into the laminate body ([0076]); the opening is formed through the laminate body and the conductive structure (Fig.1A); and the semiconductor die (110) is electrically connected to the conductive structure of the laminate (176). Regarding Claim 3. The IC package of claim 1, Zhao (Fig.1A; [0076]) discloses a heat sink, wherein: the heat sink is provided at a bottom of the cavity while the opening is at a top of the cavity; and the semiconductor die is mounted on the heat sink ([0076] discloses that 176 includes a heat sink since 176 is below die 110). Regarding Claim 4. The IC package of claim 1, Dresser (Fig.3; [0040]) wherein the lid (310; [0048]) is formed from Silicon or glass. Regarding Claim 5. The IC package of claim 1, Zhao (Fig.1A) discloses wherein the surface is a top surface of the laminate (176) and the opening is aligned with the top surface of the laminate. Regarding Claim 6. The IC package of claim 5, Zhao (Fig.1A) discloses wherein the top surface is provided by a solder mask (120; [0077]) formed as a top layer of the laminate. Regarding Claim 7. The IC package of claim 1, Zhao (Fig.1A) discloses wherein the laminate (176) comprises a laminate body, wherein the laminate body defines a bottom surface. Regarding Claim 9. The IC package of claim 1, Zhao (Fig.1A; [0075], [0076]) discloses wherein the cavity is filled with air. Regarding Claim 10. The IC package of claim 1, Zhao (Fig.1A) discloses wherein the semiconductor die (110) is wirebonded (182/183) to the laminate (176). Claim(s) 1-7, and 9-10 are rejected under 35 U.S.C. 103 as being unpatentable over Zhao in view of Dresser in view of Minervini (US 2007/0201715 A1; Hereinafter Minervini) Regarding Claim 8. The IC package of claim 7, Zhao does not particularly disclose wherein the bottom surface is formed by a solder mask formed from a bottom layer of the laminate. Minervini (Fig.10) discloses in a related art a package wherein the bottom surface is formed by a solder mask (70; [0062]) formed from a bottom layer of the laminate. Therefore, it would have been obvious in the art before the effective filling date of the application to have solder mask from a bottom layer of laminate in order to be able to electrically connect the device to an end user’s board. Claim(s) 12, 15, and 17 are rejected under 35 U.S.C. 103 as being unpatentable over Zhao in view of Dresser. Regarding Claim 12. The method of claim 11, Zhao does not particularly disclose forming an overmold over the lid. Dresser (Fig.3; [0042]) in a related art discloses a packaging including forming an overmold (360; [0042]) over the lid (310; [0039]). Therefore, it would have been obvious in the art before the effective filling date of the application to use overmold on the lid since it provides robust environmental protection without having to accommodate critical RF fields. Regarding Claim 15. The method of claim 11, Zhao does not particularly disclose an epoxy for mounting the semiconductor die in the cavity. Dresser (Fig.3; [0040]) in a related art discloses a packaging wherein an epoxy (315) is used for mounting the semiconductor die in the cavity (305). Therefore, it would have been obvious in the art before the effective filling date of the application to use an epoxy for mounting the die in the cavity since it gives the package high mechanical strength, excellent adaptability for mismatched materials, and cost-effective, and high-throughput manufacturing. Regarding Claim 17. The method of claim 11, Zhao does not particularly disclose wherein the lid is formed from Silicon or glass. Dresser (Fig.3; [0040]) in a related art discloses a packaging wherein the lid (310; [0048]) is formed from Silicon or glass Therefore, it would have been obvious in the art before the effective filling date of the application to use lid made of glass or silicon since it provides optical transparency, hermetic sealing, and excellent radio frequency (RF) properties. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to HAJAR KOLAHDOUZAN whose telephone number is (571)270-5842. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Leonard Chang can be reached on (571)270-3691. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of an application may be obtained from the Patent Application Information Retrieval (PAIR) system. Status information for published applications may be obtained from either Private PAIR or Public PAIR. Status information for unpublished applications is available through Private PAIR only. For more information about the PAIR system, see http://pair-direct.uspto.gov. Should you have questions on access to the Private PAIR system, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative or access to the automated information system, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /HAJAR KOLAHDOUZAN/ Examiner, Art Unit 2898 /Leonard Chang/ Supervisory Patent Examiner, Art Unit 2898
Read full office action

Prosecution Timeline

Mar 28, 2024
Application Filed
Jul 23, 2026
Non-Final Rejection mailed — §102, §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
74%
Grant Probability
97%
With Interview (+22.4%)
2y 8m (~4m remaining)
Median Time to Grant
Low
PTA Risk
Based on 369 resolved cases by this examiner. Grant probability derived from career allowance rate.

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