Notice of Pre-AIA or AIA Status
The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA .
Drawings
The drawings filed on 4/14/24 are accepted by the examiner.
Information Disclosure Statement
The information disclosure statement (IDS) submitted on 6/4/24 is in compliance with the provisions of 37 CFR 1.97. Accordingly, the information disclosure statement is being considered by the examiner.
Double Patenting
The nonstatutory double patenting rejection is based on a judicially created doctrine grounded in public policy (a policy reflected in the statute) so as to prevent the unjustified or improper timewise extension of the “right to exclude” granted by a patent and to prevent possible harassment by multiple assignees. A nonstatutory double patenting rejection is appropriate where the claims at issue are not identical, but at least one examined application claim is not patentably distinct from the reference claim(s) because the examined application claim is either anticipated by, or would have been obvious over, the reference claim(s). See, e.g., In re Berg, 140 F.3d 1428, 46 USPQ2d 1226 (Fed. Cir. 1998); In re Goodman, 11 F.3d 1046, 29 USPQ2d 2010 (Fed. Cir. 1993); In re Longi, 759 F.2d 887, 225 USPQ 645 (Fed. Cir. 1985); In re Van Ornum, 686 F.2d 937, 214 USPQ 761 (CCPA 1982); In re Vogel, 422 F.2d 438, 164 USPQ 619 (CCPA 1970); and In re Thorington, 418 F.2d 528, 163 USPQ 644 (CCPA 1969).
A timely filed terminal disclaimer in compliance with 37 CFR 1.321(c) or 1.321(d) may be used to overcome an actual or provisional rejection based on a nonstatutory double patenting ground provided the reference application or patent either is shown to be commonly owned with this application, or claims an invention made as a result of activities undertaken within the scope of a joint research agreement. A terminal disclaimer must be signed in compliance with 37 CFR 1.321(b).
The USPTO internet Web site contains terminal disclaimer forms which may be used. Please visit http://www.uspto.gov/forms/. The filing date of the application will determine what form should be used. A web-based eTerminal Disclaimer may be filled out completely online using web-screens. An eTerminal Disclaimer that meets all requirements is auto-processed and approved immediately upon submission. For more information about eTerminal Disclaimers, refer to http://www.uspto.gov/patents/process/file/efs/guidance/eTD-info-I.jsp.
Claims 1-4, 14-17 and 20 are rejected on the ground of nonstatutory double patenting as being unpatentable over claims 1-5 of USPAT 11994844, in view of US 9818236 to Nakayama.
Claims of instant application
Claims of USPAT 11994844
1. A monitoring method for a production line based on
Industrial Internet of Things,
wherein the method is executed by a user platform, a service platform, a management platform, a sensor network platform, and an object platform that interact in turn, wherein the object platform includes a production line device configured to perform production and a defective product device configured to perform defective product testing in each process on the production line, the method comprising:
Step1, sending, by the object platform, perception information within a set time period to the management platform through the sensor network platform; wherein the perception information includes production line device operation information, defective product testing device operation information, and defective product testing information tested by the defective product testing device;
Step2, receiving, processing, and storing, by the management platform, the perception information, and sending the defective product testing information to the service platform;
Step3, receiving, by the service platform, the defective product testing information, obtaining a count of defective products of the each process corresponding to the set time period according to defective product testing information of the each process, and comparing the count of defective products of the each process with a first count threshold of defective products set by the each process; determining that a count of defective products of a process exceeds the first count threshold of defective products set by the process, in response to determining that the count of defective products of a process exceeds the first count threshold of defective products set by the process, generating an instruction for retrieving process information of the process, and sending the instruction for retrieving process information to the management platform;
Step4, receiving, by the management platform, the instruction for retrieving process information, sending pre-stored production line device configuration information and defective product testing device configuration information of the process corresponding to the instruction for retrieving process information to the service platform, and sending latest-stored first production line device operation information and first defective product testing device operation information of the process corresponding to the instruction for retrieving process information to the service platform;
Step5, performing, by the service platform, a parameter comparison with a same parameter name between the first production line device operation information and the production line device configuration information, and a parameter comparison with a same parameter name between the first defective product testing device operation information and the defective product testing device configuration information; determining that the parameter data with the same parameter name between the production line device operation information and the production line device configuration information is inconsistent or the parameter data with the same parameter name between the defective product testing device operation information and the defective product testing device configuration information is inconsistent, in response to determining that the parameter data with the same parameter name between the production line device operation information and the production line device configuration information is inconsistent or the parameter data with the same parameter name between the defective product testing device operation information and the defective product testing device configuration information is inconsistent, generating a parameter configuration instruction corresponding to the process and sending the parameter configuration instruction to a corresponding object platform through the management platform and the sensor network platform in turn;
Step6, receiving, by the corresponding object platform, the parameter configuration instruction and performing configuration, and
sending the second production line device operation information and the second defective product testing device operation information to the service platform through the sensor network platform and the management platform in turn; and
Step7, performing, by the service platform,
a parameter comparison with a same parameter name between the second production line device operation information and the production line device configuration information, and a parameter comparison with a same parameter name between the second defective product testing device operation information and the
defective product testing device configuration information,
generating check comparison consistent information or check comparison inconsistent information according to a comparison result, and feeding the check comparison consistent information or the check comparison inconsistent information back to the user platform for display.
2. A regulation method for
an Industrial Internet of Things system for a production line when a defective product is produced,
wherein the method is executed based on a user platform, a service platform, a management platform, a sensor network platform, and at least one object platform that interact in turn, the object platform includes a production line device configured to perform production and a defective product testing device to perform defective product testing in each process on the production line, comprising:
step 1, sending, by the object platform, perception information within a set time period to the management platform through the sensor network platform; the perception information including production line device operation information, defective product testing device operation information, and defective product testing information tested by the defective product testing device;
step 2, receiving, processing, and storing, by the management platform, the perception information, and sending the defective product testing information to the service platform;
step 3, receiving, by the service platform, the defective product testing information, obtaining a count of defective products of the each process corresponding to the set time period according to defective product testing information of the each process, and comparing the count of defective products of the each process with a first count threshold of defective products set by the each process; determining that a count of defective products of a process exceeds the first count threshold of defective products set by the process, in response to determining that the count of defective products of a process exceeds the first count threshold of defective products set by the process, generating an instruction for retrieving process information of the process, and sending the instruction for retrieving process information to the management platform;
step 4, receiving, by the management platform, the instruction for retrieving process information, sending pre-stored production line device configuration information and defective product testing device configuration information of the process corresponding to the instruction for retrieving process information to the service platform, and sending latest-stored production line device operation information and defective product testing device operation information of the process corresponding to the instruction for retrieving process information to the service platform;
step 5, performing, by the service platform, a parameter comparison with a same parameter name between the production line device operation information and the production line device configuration information and a
parameter comparison with a same parameter name between the defective product testing device operation information and the defective product testing device configuration information; determining that the parameter data with the same parameter name between the production line device operation information and the production line device configuration information is inconsistent or the parameter data with the same parameter name between the defective product testing device operation information and the defective product testing device configuration information is inconsistent, in response to determining that the parameter data with the same parameter name between the production line device operation information and the production line device configuration information is inconsistent or the parameter data with the same parameter name between the defective product testing device operation information and the defective product testing device configuration information is inconsistent, generating a parameter configuration instruction corresponding to the process and sending the parameter configuration instruction to a corresponding object platform through the management platform and the sensor network platform in turn;
sending, by the corresponding object platform, production line device operation information and defective product testing device operation information to the service platform through the sensor network platform and the management platform in turn after receiving the parameter configuration instruction and performing configuration; and
performing, by the service platform,
a parameter comparison with a same parameter name between the production line device operation
information and the production line device configuration information, and a parameter comparison with a same parameter name between the defective product testing device operation information and the
defective product testing device configuration information again, generating check comparison consistent information or check comparison inconsistent information according to a comparison result, and feeding the check comparison consistent information or the check comparison inconsistent information back to the user platform for display;
after generating the check comparison inconsistent information, comparing, by the service platform, a count of defective products of a process whose the count of defective products exceeds the first count threshold of defective products set by the process with a second count threshold of defective products set by the process, wherein the second count threshold of defective products is larger than the first count threshold of defective products, determining the count of defective products of a process whose the count of defective products exceeds the first count threshold of defective products set by the process exceeds the second count threshold, in response to determining the count of defective products of a process whose the count of defective products exceeds the first count threshold of defective products set by the process exceeds the second count threshold; generating information on defective products exceeding a limit in the process and feeding the information on defective products exceeding the limit in the process back to the user platform for display; sending, by the user platform, a production line shutdown instruction input by a user to all object platforms associated with the production line through the service platform, the management platform, and the sensor network platform in turn; and
receiving, by the object platforms, the production line shutdown instruction and stopping an operation.
2. The method of claim 1,
wherein the service platform adopts a rear split platform arrangement, the rear split platform arrangement means that the service platform is provided with a general service platform and a plurality of service sub-platforms, each service sub-platform is in one-to-one correspondence to a corresponding object platform of the each process on the production line, control information and object platform parameter configuration information are transmitted from the service sub-platforms to the general service platform, and the perception information is transmitted from the general service platform to the service sub-platforms, the method further comprising:
receiving, by the general service platform, the defective product testing information of the each process on the production line sent by the management platform, and sending defective product testing information of a corresponding object platform of the each process to a corresponding service sub-platform of the process; independently comparing,
by the corresponding service sub-platform,
the count of defective products of the process with the first count threshold of defective products of the process, in response to determining that the count of defective products exceeds the first count threshold of defective products, independently generating the instruction for retrieving process information of the process, and
sending the instruction for retrieving process information to the management platform through the general service platform;
sending, by the management platform, the pre-stored production line device configuration information and defective product testing device configuration information, and latest-stored first production line device operation information and first defective product testing device operation information of the process to the corresponding service sub-platform through the general service platform; and performing, by the corresponding service sub-platform, a parameter comparison with a same parameter name between the production line device configuration information and the production line device operation information, and a parameter comparison with a same parameter name between the defective product testing device configuration information and the defective product testing device operation information;
wherein
the management platform adopts an independent arrangement, wherein the independent arrangement means that the management platform is provided with a plurality of management sub-platforms, and each management sub-platform corresponds to an object platform for data storage, data processing, or data transmission; and the each management sub-platform is configured to receive and process the perception information, the instruction for retrieving process information, and the parameter configuration instruction of the corresponding object platform; and
the sensor network platform adopts a centralized arrangement, wherein the centralized arrangement means that the sensor network platform receives data uniformly, processes data uniformly, and sends data uniformly; and information transmission between the management platform and object platforms corresponding to all processes on the production line is completed through the sensor network platform uniformly.
3. The regulation method according to claim 2,
wherein the service platform adopts a rear split platform arrangement, the rear split platform arrangement means that the service platform is provided with a general service platform and a plurality of service sub-platforms, each service sub-platform is in one-to-one correspondence to a corresponding object platform of the each process on the production line, control information and object platform parameter configuration information are transmitted from the service sub-platforms to the general service platform, and the perception information is transmitted from the general service platform to the service sub-platforms; including
receiving, by the general service platform, the defective product testing information of the each process on the production line sent by the management platform, and sending defective product testing information of a corresponding object platform of the each process to a corresponding service sub-platform of the process; independently comparing,
by each service sub-platform of the service platform,
the count of defective products of the process with the first count threshold of defective products of the process, and independently generating the instruction for retrieving process information of the process when the count of defective products exceeds the first count threshold of defective products, and
sending the instruction for retrieving process information to the management platform through the general service platform,
sending, by the management platform, the pre-stored production line device configuration information and defective product testing device configuration information, and latest-stored production line device operation information and defective product testing device operation information of the process corresponding to the instruction for retrieving process information to the corresponding service sub-platform through the general service platform; and performing, by the corresponding service sub-platform, a parameter comparison with a same parameter name between the production line device configuration information and the production line device operation information and a parameter comparison with a same parameter name between the defective product testing device configuration information and the defective product testing device operation information;
the management platform adopting an independent arrangement, wherein the independent arrangement means that the management platform is provided with a plurality of management sub-platforms, and each management sub-platform corresponds to an object platform for data storage, data processing, or data transmission; and the each management sub-platform configured to receive and process the perception information, the instruction for retrieving process information, and the parameter configuration instruction of the corresponding object platform; and
the sensor network platform adopting a centralized arrangement, wherein the centralized arrangement means that the sensor network platform receives data uniformly, processes data uniformly, and sends data uniformly; and information transmission between the management platform and object platforms corresponding to all processes on the production line being completed through the sensor network platform uniformly.
3. The method of claim 1,
wherein the parameter comparison with the same parameter name between the first production line device operation information and the production line device configuration information, and the parameter comparison with the same parameter name between the first defective product testing device operation information with the defective product testing device configuration information performed by the service platform are independent comparisons, the parameter comparison including:
comparing, by the service platform, all parameter data with the same parameter name between the first production line device operation information and the production line device configuration information, in response to determining that the parameter data with the same parameter name is consistent,
generating configuration data normal information of the production line device and feeding the configuration data normal information of the production line device back to the user platform for display; in response to determining that the parameter data with the same parameter name is inconsistent, generating a first parameter configuration instruction of the process of the production line device and sending the first parameter configuration instruction to the corresponding object platform through the management platform and the sensor network platform in turn; after receiving the first parameter configuration instruction and performing configuration on the production line device, obtaining, by the corresponding object platform, the second production line device operation information, and transmitting the second production line device operation information to the service platform through the sensor network and the management platform in turn; performing, by the service platform, the parameter comparison with the same parameter name between the second production line device operation information and the production line device configuration information again and generating the check comparison consistent information or the check comparison inconsistent information of the production line device according to the comparison result and feeding the check comparison consistent information or the check comparison inconsistent information of the production line device back to the user platform for display;
comparing, by the service platform, all parameter data with the same parameter name between the first defective product testing device operation information and the defective product testing device configuration information, in response to determining that the parameter data with the same parameter name is consistent, generating configuration data normal information of the defective product testing device and feeding the configuration data normal information of the defective product testing device back to the user platform for display; in response to determining that the parameter data with the same parameter name is inconsistent, generating a second parameter configuration instruction of the process of the defective product testing device and sending the second parameter configuration instruction to the corresponding object platform through the management platform and the sensor network platform in turn; after receiving the second parameter configuration instruction and performing configuration on the defective product testing device, obtaining, by the corresponding object platform, the second defective product testing device operation information, and transmitting the second defective product testing device operation information to the service platform through the sensor network platform and the management platform in turn; performing, by the service platform, the parameter comparison with the same parameter name between the second defective product testing device operation information and the defective product testing device configuration information again, generating the check comparison consistent information or the check comparison inconsistent information of the defective product testing device according to the comparison result and feeding the check comparison consistent information or the check comparison inconsistent information of the defective product testing device back to the user platform for display.
4. The regulation method according to claim 2,
wherein the parameter comparison with the same parameter name between the production line device operation information and the production line device configuration information, and the parameter comparison with the same parameter name between the defective product testing device operation information with the defective product testing device configuration information performed by the service platform in step 5 are independent comparisons, including:
comparing, by the service platform, all parameter data with the same parameter name between the production line device operation information and the production line device configuration information, if the parameter data with the same parameter name is consistent,
generating configuration data normal information of the production line device and feeding the configuration data normal information of the production line device back to the user platform for display; if the parameter data with the same parameter name is inconsistent, generating a parameter configuration instruction of a corresponding process of the production line device and sending the parameter configuration instruction to a corresponding object platform through the management platform and the sensor network platform in turn; after receiving the parameter configuration instruction and completing configuration on the production line device, transmitting, by the corresponding object platform, production line device operation information to the service platform through the sensor network and the management platform in turn; performing, by the service platform, a parameter comparison with a same parameter name between the production line device operation information and the production line device configuration information again and generating the check comparison consistent information or the check comparison inconsistent information of the production line device according to the comparison result and feeding the check comparison consistent information or the check comparison inconsistent information of the production line device back to the user platform for display; and
comparing, by the service platform, all parameter data with the same parameter name between the defective product testing device operation information and the defective product testing device configuration information, if the parameter data with the same parameter name is consistent, generating configuration data normal information of the defective product testing device and feeding the configuration data normal information of the defective product testing device back to the user platform for display; if the parameter data with the same parameter name is inconsistent, generating a parameter configuration instruction of a corresponding process of the defective product testing device and sending the parameter configuration instruction to the corresponding object platform through the management platform and the sensor network platform in turn; after receiving the parameter configuration instruction and completing configuration on the defective product testing device, transmitting, by the corresponding object platform, defective product testing device operation information to the service platform through the sensor network platform and the management platform in turn; performing, by the service platform, a parameter comparison with a same parameter name between the defective product testing device operation information and the defective product testing device configuration information again, generating the check comparison consistent information or the check comparison inconsistent information according to the comparison result and feeding the check comparison consistent information or the check comparison inconsistent information of the defective product testing device back to the user platform for display.
4. The method of claim 1, the method further comprising:
determining that the count of defective products of the process exceeds the first count threshold of defective products, in response to determining that the count of defective products of the process exceeds the first count threshold of defective products, comparing, by the service platform, the count of defective products of the process with a second count threshold of defective products preset by the process; determining that the count of defective products of the process exceeds the second count threshold of defective products, in response to determining that the count of defective products of the process exceeds the second count threshold of defective products, generating information on defective products exceeding a limit in the process and feeding the information on defective products exceeding a limit in the process back to the user platform for display, wherein the second count threshold of defective products is greater than the first count threshold of defective products;
sending, by the user platform, a production line shutdown instruction input by a user to all object platforms associated with the production line through the service platform, the management platform, and the sensor network platform in turn; and
receiving, by the object platforms, the production line shutdown instruction and stopping an operation.
Part of claim 2:
after generating the check comparison inconsistent information, comparing, by the service platform, a count of defective products of a process whose the count of defective products exceeds the first count threshold of defective products set by the process with a second count threshold of defective products set by the process, wherein the second count threshold of defective products is larger than the first count threshold of defective products, determining the count of defective products of a process whose the count of defective products exceeds the first count threshold of defective products set by the process exceeds the second count threshold, in response to determining the count of defective products of a process whose the count of defective products exceeds the first count threshold of defective products set by the process exceeds the second count threshold; generating information on defective products exceeding a limit in the process and feeding the information on defective products exceeding the limit in the process back to the user platform for display; sending, by the user platform, a production line shutdown instruction input by a user to all object platforms associated with the production line through the service platform, the management platform, and the sensor network platform in turn; and
receiving, by the object platforms, the production line shutdown instruction and stopping an operation
14. A monitoring system for a production line based on Industrial Internet of Things, wherein the Industrial Internet of Things includes a user platform, a service platform, a management platform, a sensor network platform, and an object platform that interact in turn, wherein the object platform includes the production line device configured to perform production and a defective product testing device to perform defective product testing in each process on the production line, wherein:
the object platform is configured to send perception information within a set time period to the management platform through the sensor network platform; the perception information includes production line device operation information, defective product testing device operation information, and defective product testing information tested by the defective product testing device, receive parameter configuration instruction and perform configuration, and send second production line device operation information and second defective product testing device operation information to the service platform through the sensor network platform and the management platform in turn;
the sensor network platform is configured as a communication network and a gateway for interaction between the management platform and the object platform;
the management platform is configured to receive, process, and store the perception information, and send the defective product testing information to the service platform; receive instruction for retrieving process information, send pre-stored production line device configuration information and defective product testing device configuration information of the process corresponding to the instruction for retrieving process information to the service platform, and send latest-stored first production line device operation information and first defective product testing device operation information of the process corresponding to the instruction for retrieving process information to the service platform;
the service platform is configured to:
receive the defective product testing information, obtain a count of defective products of the each process corresponding to the set time period according to defective product testing information of the each process, and compare the count of defective products of the each process with a first count threshold of defective products set by the each process; when the count of defective products exceeds the first count threshold of defective products set by a process, generate an instruction for retrieving process information of the process, and send the instruction for retrieving process information to the management platform;
perform a parameter comparison with a same parameter name between the first production line device operation information and the production line device configuration information, and a parameter comparison with a same parameter name between the first defective product testing device operation information and the defective product testing device configuration information; if all parameter data with the same parameter name is consistent, generate configuration data normal information and feed the configuration data normal information back to the user platform for display; and if the parameter data with the same parameter name between the production line device operation information and the production line device configuration information is inconsistent or the parameter data with the same parameter name between the defective product testing device operation information and the defective product testing device configuration information is inconsistent, generate a parameter configuration instruction corresponding to the process and send the parameter configuration instruction to a corresponding object platform through the management platform and the sensor network platform in turn;
after completing the parameter configuration by the object platform, perform a parameter comparison with a same parameter name between the second production line device operation information and the production line device configuration information, and a parameter comparison with a same parameter name between the second defective product testing device operation information and the defective product testing device configuration information, generate check comparison consistent information or check comparison inconsistent information according to a comparison result, and feed the check comparison consistent information or the check comparison inconsistent information back to the user platform for display.
1. An Industrial Internet of Things system for a production line when a defective product is produced, comprising: a user platform, a service platform, a management platform, a sensor network platform, and an object platform that interact in turn, wherein:
the object platform is configured to be a production line device to perform production and a defective product testing device configured to perform defective product testing in each process on the production line;
the object platform is further configured to send perception information within a set time period to the management platform through the sensor network platform; the perception information includes production line device operation information, defective product testing device operation information, and defective product testing information tested by the defective product testing device; and receive a parameter configuration instruction and complete configuration;
the sensor network platform is configured to be a communication network and gateway for an interaction between the management platform and object platform;
the management platform is configured to receive, process, and store the perception information, and send the defective product testing information to the service platform; receive an instruction for retrieving process information sent by the service platform, send pre-stored production line device configuration information and defective product testing device configuration information of a process corresponding to the instruction for retrieving process information to the service platform, and send latest-stored production line device operation information and defective product testing device operation information of the process corresponding to the instruction for retrieving process information to the service platform;
the service platform is configured to receive the defective product testing information, obtain a count of defective products of the each process corresponding to the set time period according to defective product testing information of the each process, and compare the count of defective products of the each process with a first count threshold of defective products set by the each process; when a count of defective products of a process exceeds the first count threshold of defective products set by the process, the service platform is configured to generate an instruction for retrieving process information of the process, and send the instruction for retrieving process information to the management platform; perform a parameter comparison with a same parameter name between the production line device operation information and the production line device configuration information and a parameter comparison with a same parameter name between the defective product testing device operation information and the defective product testing device configuration information; if all parameter data with the same parameter name is consistent, generate configuration data normal information and feed the configuration data normal information back to the user platform for display; and if the parameter data with the same parameter name between the production line device operation information and the production line device configuration information is inconsistent or the parameter data with the same parameter name between the defective product testing device operation information and the defective product testing device configuration information is inconsistent, generate a parameter configuration instruction corresponding to the process and send the parameter configuration instruction to a corresponding object platform through the management platform and the sensor network platform in turn; after the corresponding object platform completing configuration, receive production device operation information and defective product testing device operation information sent by the corresponding object platform through the sensor network platform and the management platform in turn, perform a parameter comparison with a same parameter name between the production line device operation information and the production line device configuration information, and a parameter comparison with a same parameter name between the defective product testing device operation information and the defective product testing device configuration information again; generate check comparison consistent information or check comparison inconsistent information according to a comparison result, and feed the check comparison consistent information or the check comparison inconsistent information back to the user platform for display;
the user platform is configured to be a terminal device interacted with a user, receive information input by the user and generate an instruction and send the instruction to the service platform, and display information sent by the service platform to the user;
the service platform is configured to compare a count of defective products of a process whose the count of defective products exceeds a first count threshold of defective products preset by the process with a second count threshold of defective products preset by the process, and the second count threshold of defective products exceeds the first count threshold of defective products, generate information on defective products exceeding a limit in the process and feed the information on defective products exceeding a limit in the process back to the user platform for display when the count of defective products of the process exceeds the second count threshold of defective products; then the user platform is configured to send a production line shutdown instruction input by a user to all object platforms associated with the production line through the service platform, the management platform, and the sensor network platform in turn; and then the object platforms are configured to receive the production line shutdown instruction and stop an operation; and
the service platform is configured to record a count of times when the count of defective products of the each process successively exceeds the first count threshold of defective products set by the process, and then compare the count of times with a count threshold of times of defective product processes preset by the process, perform no processing when the count of times is less than or equal to the count threshold of times of defective product processes, or generate information on a count of occurrence exceeding a limit when the count of times is greater than the count threshold of times of defective product processes and feed the information on a count of occurrence exceeding a limit back to the user platform for display; then the user platform is configured to send the production line shutdown instruction input by the user to all object platforms associated with the production line through the service platform, the management platform, and the sensor network platform in turn; and then the object platforms are configured to receive the production line shutdown instruction and stop the operation.
15. The system of claim 14, wherein the service platform adopts a rear split platform arrangement, the rear split platform arrangement means that the service platform is provided with a general service platform and a plurality of service sub-platforms, each service sub-platform is in one-to-one correspondence to a corresponding object platform of the each process on the production line, control information and object platform parameter configuration information are transmitted from the service sub-platforms to the general service platform, and the perception information is transmitted from the general service platform to the service sub-platforms; wherein:
the general service platform is configured to receive the defective product testing information of the each process on the production line sent by the management platform, and sending defective product testing information of a corresponding object platform of the each process to a corresponding service sub-platform of the process; the corresponding service sub-platform is configured to independently compare the count of defective products of the process with the first count threshold of defective products of the process, and independently generate the instruction for retrieving process information of the process when the count of defective products exceeds the first count threshold of defective products, and send the instruction for retrieving process information to the management platform through the general service platform;
the management platform is configured to send the pre-stored production line device configuration information and defective product testing device configuration information, and latest-stored production line device operation information and defective product testing device operation information of the process corresponding to the instruction for retrieving process information to the corresponding service sub-platform through the general service platform; and the corresponding service sub-platform is configured to perform a parameter comparison with a same parameter name between the production line device configuration information and the production line device operation information and a parameter comparison with a same parameter name between the defective product testing device configuration information and the defective product testing device operation information;
the management platform adopting an independent arrangement, wherein the independent arrangement means that the management platform is provided with a plurality of management sub-platforms, and each management sub-platform corresponds to an object platform for data storage, data processing, or data transmission; and the each management sub-platform configured to receive and process the perception information, the instruction for retrieving process information, and the parameter configuration instruction of the corresponding object platform; and
the sensor network platform adopting a centralized arrangement, wherein the centralized arrangement means that the sensor network platform receives data uniformly, processes data uniformly, and sends data uniformly; and information transmission between the management platform and object platforms corresponding to all processes on the production line being completed through the sensor network platform uniformly.
3. The regulation method according to claim 2, wherein the service platform adopts a rear split platform arrangement, the rear split platform arrangement means that the service platform is provided with a general service platform and a plurality of service sub-platforms, each service sub-platform is in one-to-one correspondence to a corresponding object platform of the each process on the production line, control information and object platform parameter configuration information are transmitted from the service sub-platforms to the general service platform, and the perception information is transmitted from the general service platform to the service sub-platforms; including
receiving, by the general service platform, the defective product testing information of the each process on the production line sent by the management platform, and sending defective product testing information of a corresponding object platform of the each process to a corresponding service sub-platform of the process; independently comparing, by each service sub-platform of the service platform, the count of defective products of the process with the first count threshold of defective products of the process, and independently generating the instruction for retrieving process information of the process when the count of defective products exceeds the first count threshold of defective products, and sending the instruction for retrieving process information to the management platform through the general service platform,
sending, by the management platform, the pre-stored production line device configuration information and defective product testing device configuration information, and latest-stored production line device operation information and defective product testing device operation information of the process corresponding to the instruction for retrieving process information to the corresponding service sub-platform through the general service platform; and performing, by the corresponding service sub-platform, a parameter comparison with a same parameter name between the production line device configuration information and the production line device operation information and a parameter comparison with a same parameter name between the defective product testing device configuration information and the defective product testing device operation information;
the management platform adopting an independent arrangement, wherein the independent arrangement means that the management platform is provided with a plurality of management sub-platforms, and each management sub-platform corresponds to an object platform for data storage, data processing, or data transmission; and the each management sub-platform configured to receive and process the perception information, the instruction for retrieving process information, and the parameter configuration instruction of the corresponding object platform; and
the sensor network platform adopting a centralized arrangement, wherein the centralized arrangement means that the sensor network platform receives data uniformly, processes data uniformly, and sends data uniformly; and information transmission between the management platform and object platforms corresponding to all processes on the production line being completed through the sensor network platform uniformly.
16. The system of claim 14, wherein
The service platform is further configured to compare the count of defective products of the process with a second count threshold of defective products preset by the process when the count of defective products of the process exceeds the first count threshold of defective products; generate information on defective products exceeding a limit in the process and feed the information on defective products exceeding a limit in the process back to the user platform for display when the count of defective products of the process exceeds the second count threshold of defective products, wherein the second count threshold of defective products is greater than the first count threshold of defective products;
the user platform is further configured to send a production line shutdown instruction input by a user to all object platforms associated with the production line through the service platform, the management platform, and the sensor network platform in turn; and
the object platforms are further configured to receive the production line shutdown instruction and stop an operation.
5. The regulation method according to claim 2, further comprising:
for the each process on the production line, comparing, by the service platform, the count of defective products of the each process with the first count threshold of defective products and the second count threshold of defective products of the each process, respectively, when the count of defective products of the all processes on the production line is not greater than the second count threshold of defective products of the corresponding processes, and the count of defective products of a plurality of processes is greater than the first count threshold of defective products of the corresponding plurality of processes, calculating a count of processes that the count of defective products exceeds the first count threshold of defective products in the all processes on the production line, and then comparing the count of the processes with a count threshold of defective product processes on the production line preset by the production line, performing no processing when the count of the processes is less than or equal to the count threshold of defective product processes, or generating the information on defective products exceeding a limit on the production line when the count of the processes is greater than the count threshold of defective product processes and feeding the information on defective product processes exceeding a limit on the production line back to the user platform for display; sending, by the user platform, the production line shutdown instruction input by the user to all the object platforms associated with the production line through the service platform, the management platform, and the sensor network platform in turn; and receiving, by the object platforms, the production line shutdown instruction and stopping the operation.
17. The system of claim 14, wherein
the service platform is further configured to record a count of times when the count of defective products of the each process successively exceeds the first count threshold of defective products set by the process, and then compare the count of times with a count threshold of times of defective product processes preset by the process, perform no processing when the count of times is less than or equal to the count threshold of times of defective product processes, or generate information on a count of occurrence exceeding a limit when the count of times is greater than the count threshold of times of defective product processes and feed the information on a count of occurrence exceeding a limit back to the user platform for display;
the user platform is further configured to send a production line shutdown instruction input by a user to all object platforms associated with the production line through the service platform, the management platform, and the sensor network platform in turn; and
the object platforms are further configured to receive the production line shutdown instruction and stop an operation.
Part of claim 1:
the service platform is configured to record a count of times when the count of defective products of the each process successively exceeds the first count threshold of defective products set by the process, and then compare the count of times with a count threshold of times of defective product processes preset by the process, perform no processing when the count of times is less than or equal to the count threshold of times of defective product processes, or generate information on a count of occurrence exceeding a limit when the count of times is greater than the count threshold of times of defective product processes and feed the information on a count of occurrence exceeding a limit back to the user platform for display; then the user platform is configured to send the production line shutdown instruction input by the user to all object platforms associated with the production line through the service platform, the management platform, and the sensor network platform in turn; and then the object platforms are configured to receive the production line shutdown instruction and stop the operation
20. A non-transitory computer-readable storage medium storing computer instructions, wherein when reading the computer instructions, a computer executes the monitoring method of claim 1.
Claim 1 of 11994844 as shown above
Although the claims at issue are not identical, they are not patentably distinct from each other because the scopes of both claim sets are extremely similar (for example, receiving, by the corresponding object platform, the parameter configuration instruction and performing configuration, and sending the production line device operation information and the defective product testing device operation information to the service platform through the sensor network platform and the management platform in turn is is merely paraphrasing of “sending, by the corresponding object platform, production line device operation information and defective product testing device operation information to the service platform through the sensor network platform and the management platform in turn after receiving the parameter configuration instruction and performing configuration”, the difference in the independent claim 1 of the instant application and the independent claim 2 of USPAT 11994844 is that the independent claim 1 of the instant application recites less limitation than the independent claim 1 of USPAT 11994844, for example, the independent claim 1 of the instant application does not recite “after generating the check comparison inconsistent information, comparing, by the service platform, a count of defective products of a process whose the count of defective products exceeds the first count threshold of defective products set by the process with a second count threshold of defective products set by the process, wherein the second count threshold of defective products is larger than the first count threshold of defective products, determining the count of defective products of a process whose the count of defective products exceeds the first count threshold of defective products set by the process exceeds the second count threshold, in response to determining the count of defective products of a process whose the count of defective products exceeds the first count threshold of defective products set by the process exceeds the second count threshold; generating information on defective products exceeding a limit in the process and feeding the information on defective products exceeding the limit in the process back to the user platform for display; sending, by the user platform, a production line shutdown instruction input by a user to all object platforms associated with the production line through the service platform, the management platform, and the sensor network platform in turn; and receiving, by the object platforms, the production line shutdown instruction and stopping an operation” that are recited in the independent claim 2 of USPAT 11994844. Omission of an element and its function in a combination is an obvious expedient if the remaining elements perform the same function as before. In re KARLSON (CCPA) 136 USPQ 184 (1963). Another difference is that claim 1 of the instant application further recites “the second production line device operation information and the second defective product testing device operation information”. Nakayama in an analogous art discloses the second production line device operation information and the second defective product testing device operation information (Nakayama, see col. 4 line 52-col. 5 line 2).
Therefore, it would have been obvious to a person of ordinary skill in the art at the time of invention was made to incorporate the teaching of Nakayama of into the system of USPAT 11994844. The modification would be obvious because one of the ordinary skill in the art would want to identify a cause of production defect within a production line with a high accuracy (Nakayama, see col. 1 lines 43-45).
For similar reasons, claims 2-4, 14-17 and 20 of the instant application are patentably indistinct from claims 1-5 of USPAT 11994844.
Claim Rejections - 35 USC § 112
The following is a quotation of 35 U.S.C. 112(b):
(b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention.
The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph:
The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention.
Claims 1-13 rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention.
Claim 1 recites the limitation "the second production line device operation information" in page 2 lines 14-15. There is insufficient antecedent basis for this limitation in the claim.
Claim 1 recites the limitation "the second defective product testing device operation information" in page 2 lines 15-16. There is insufficient antecedent basis for this limitation in the claim.
Claims 2-13, included in the statement of rejection but not specifically addressed in the body of the rejection have inherited the deficiency of their parent claim and have not resolved the deficiencies. Therefore, they are rejected based on the same rationale as applied to their parent claim above.
Claim Rejections - 35 USC § 101
35 U.S.C. 101 reads as follows:
Whoever invents or discovers any new and useful process, machine, manufacture, or composition of matter, or any new and useful improvement thereof, may obtain a patent therefor, subject to the conditions and requirements of this title.
Claims 1-3, 7-15 and 18-20 are rejected under 35 U.S.C. 101 because the claimed invention is directed to abstract idea without significantly more. The claim(s) recite(s) mental steps involving processing the perception information, obtaining a count of defective products of the each process corresponding to the set time period according to defective product testing information of the each process, and comparing the count of defective products of the each process with a first count threshold of defective products set by the each process; determining that a count of defective products of a process exceeds the first count threshold of defective products set by the process, in response to determining that the count of defective products of a process exceeds the first count threshold of defective products set by the process, generating an instruction for retrieving process information of the process, performing a parameter comparison with a same parameter name between the first production line device operation information and the production line device configuration information, and a parameter comparison with a same parameter name between the first defective product testing device operation information and the defective product testing device configuration information; determining that the parameter data with the same parameter name between the production line device operation information and the production line device configuration information is inconsistent or the parameter data with the same parameter name between the defective product testing device operation information and the defective product testing device configuration information is inconsistent, in response to determining that the parameter data with the same parameter name between the production line device operation information and the production line device configuration information is inconsistent or the parameter data with the same parameter name between the defective product testing device operation information and the defective product testing device configuration information is inconsistent, generating a parameter configuration instruction corresponding to the process, performing a parameter comparison with a same parameter name between the second production line device operation information and the production line device configuration information, and a parameter comparison with a same parameter name between the second defective product testing device operation information and the defective product testing device configuration information, generating check comparison consistent information or check comparison inconsistent information according to a comparison result, independently comparing, by the corresponding service sub-platform, the count of defective products of the process with the first count threshold of defective products of the process, in response to determining that the count of defective products exceeds the first count threshold of defective products, independently generating the instruction for retrieving process information of the process, performing a parameter comparison with a same parameter name between the production line device configuration information and the production line device operation information, and a parameter comparison with a same parameter name between the defective product testing device configuration information and the defective product testing device operation information; comparing, by the service platform, all parameter data with the same parameter name between the first production line device operation information and the production line device configuration information, in response to determining that the parameter data with the same parameter name is consistent, generating configuration data normal information of the production line device, in response to determining that the parameter data with the same parameter name is inconsistent, generating a first parameter configuration instruction of the process of the production line device and sending the first parameter configuration instruction to the corresponding object platform through the management platform and the sensor network platform in turn, performing the parameter comparison with the same parameter name between the second production line device operation information and the production line device configuration information again and generating the check comparison consistent information or the check comparison inconsistent information of the production line device according to the comparison result, comparing, by the service platform, all parameter data with the same parameter name between the first defective product testing device operation information and the defective product testing device configuration information, in response to determining that the parameter data with the same parameter name is consistent, generating configuration data normal information of the defective product testing device, in response to determining that the parameter data with the same parameter name is inconsistent, generating a second parameter configuration instruction of the process of the defective product testing device, performing the parameter comparison with the same parameter name between the second defective product testing device operation information and the defective product testing device configuration information again, generating the check comparison consistent information or the check comparison inconsistent information of the defective product testing device according to the comparison result, determining a carton defective product feature based on the carton defective product testing information, wherein the carton defective product feature includes whether a carton is a carton defective product and a defect feature of the carton defective product; in response to determining that a count of carton defective products exceeds a first count threshold of carton defective products of the process, determining a reason for a defective product based on at least one of the carton defective product feature, the carton production device operation information, or the sensor information; in response to the reason for a defective product being abnormal production parameters, determining at least a reference defective product-influencing factor and a confidence level of the at least one reference defective product-influencing factor based on the defect feature of the carton defective product, determining a defect compliance of the carton to different defect types, determining the carton defective product feature based on the defect compliance of the carton to different defect types, determining the reason for a defective product based on at least one of the location distribution information, the defect feature distribution information, the carton production device operation information, or the production line device configuration information, constructing a quality correlation diagram based on the defect types and the suspicious defective product-influencing factor; constructing a loss function based on outputs of the initial defect judgment model and the labels, iteratively updating parameters of the initial defect judgment model based on the loss function, periodically recording at least one of location distribution information or defect feature distribution information of the carton defective product based on the carton defective product feature; determining a suspicious defective product-influencing factor whose confidence level satisfies a preset requirement as the reference defective product-influencing factor, wherein nodes of the quality correlation diagram include class I nodes and class II nodes, the class I nodes correspond to the defect types that have occurred in the carton defective product, the class II nodes correspond to suspicious defective product-influencing factors corresponding to each defect type; attribute of the class I nodes includes an occurrence frequency of a defect type and a compliance rate of the defect type, attribute of the class II node includes an occurrence ratio of the suspicious defective product-influencing factor among historical defective product-influencing factors; edges of the quality correlation diagram include a class I edge, a class II edge, and a class III edge, the class I edge is an edge between the class I nodes, which corresponds to a correlation relationship between defect types; the class II edge is an edge between the class II nodes, which corresponds to a correlation relationship between the suspicious defective product-influencing factors; the class III edge is an edge between the class I node and the class II node, which corresponds to a correlation relationship between the defect types and the suspicious defective product-influencing factors; attribute of the class I edges, the class II edges, and the class III edges includes a correlation strength between corresponding correlation relationships, and the correlation strength reflects a probability of a correlation relationship, wherein an input of the evaluation model further includes a key component service fatigue level of a carton production device, the key component service fatigue level reflecting a level of fatigue damage of a key component during use (claims 1-3, 7-15 and 18-20), these limitations as described in [0070]-[0072] and [0098]-[0099] is recited in high level of generality constitutes as a mental process, such as an evaluation or judgement, that can be performed in the human mind.
This judicial exception is not integrated into a practical application because the additional limitations of sending, by the object platform, perception information within a set time period to the management platform through the sensor network platform; wherein the perception information includes production line device operation information, defective product testing device operation information, and defective product testing information tested by the defective product testing device; receiving, by the management platform, the perception information, and sending the defective product testing information to the service platform, receiving, by the service platform, the defective product testing information, sending the instruction for retrieving process information to the management platform; receiving, by the management platform, the instruction for retrieving process information, sending pre-stored production line device configuration information and defective product testing device configuration information of the process corresponding to the instruction for retrieving process information to the service platform, and sending latest-stored first production line device operation information and first defective product testing device operation information of the process corresponding to the instruction for retrieving process information to the service platform; sending the parameter configuration instruction to a corresponding object platform through the management platform and the sensor network platform in turn; receiving, by the corresponding object platform, the parameter configuration instruction and performing configuration, and sending the second production line device operation information and the second defective product testing device operation information to the service platform through the sensor network platform and the management platform in turn; feeding the check comparison consistent information or the check comparison inconsistent information back to the user platform; receiving, by the general service platform, the defective product testing information of the each process on the production line sent by the management platform, and sending defective product testing information of a corresponding object platform of the each process to a corresponding service sub-platform of the process; sending the instruction for retrieving process information to the management platform through the general service platform; sending, by the management platform, the pre-stored production line device configuration information and defective product testing device configuration information, and latest-stored first production line device operation information and first defective product testing device operation information of the process to the corresponding service sub-platform through the general service platform; control information and object platform parameter configuration information are transmitted from the service sub-platforms to the general service platform, and the perception information is transmitted from the general service platform to the service sub-platforms; feeding the configuration data normal information of the production line device back to the user platform for display; sending the first parameter configuration instruction to the corresponding object platform through the management platform and the sensor network platform in turn; after receiving the first parameter configuration instruction and performing configuration on the production line device, obtaining, by the corresponding object platform, the second production line device operation information, and transmitting the second production line device operation information to the service platform through the sensor network and the management platform in turn; feeding the check comparison consistent information or the check comparison inconsistent information of the production line device back to the user platform; feeding the configuration data normal information of the defective product testing device back to the user platform; after receiving the second parameter configuration instruction and performing configuration on the defective product testing device, obtaining, by the corresponding object platform, the second defective product testing device operation information, and transmitting the second defective product testing device operation information to the service platform through the sensor network platform and the management platform in turn; feeding the check comparison consistent information or the check comparison inconsistent information of the defective product testing device back to the user platform; obtaining carton defective product testing information during each carton packaging production process in real-time; obtaining training samples with labels, wherein the training samples include a set of carton defective product testing information of a plurality of types of sample cartons in a plurality of processes, the set of carton defective product testing information includes carton defective product testing information of two non-defective sample cartons respectively, carton defective product testing information of a defective sample carton and carton defective product testing information of a non-defective sample carton, carton defective product testing information of two defective sample cartons with different defect types, or carton defective product testing information of two defective sample cartons with same defect types, the defect compliance of the carton to different defect types is obtained by processing reference carton defective product testing information of a plurality of reference cartons through the defect judgment model; the carton defective product testing information including at least one of image testing information or ultrasonic testing information, the labels include whether defect types of the two sample cartons are the same; inputting the training samples with labels into an initial defect judgment model; obtaining a suspicious defective product-influencing factor for defect types that have occurred in the carton defective product; inputting the quality correlation diagram into an evaluation model (claims 1-3, 7-11 and 18-20) represent mere data transmission/gathering which is an insignificant extrasolution activity. The user platform, the service platform, the management platform, the sensor network platform, the object platform, the display, wherein the management platform adopts an independent arrangement, wherein the independent arrangement means that the management platform is provided with a plurality of management sub-platforms, and each management sub-platform corresponds to an object platform for data storage, data processing, or data transmission; and the each management sub-platform is configured to receive and process the perception information, the instruction for retrieving process information, and the parameter configuration instruction of the corresponding object platform; the sensor network platform adopts a centralized arrangement, wherein the centralized arrangement means that the sensor network platform receives data uniformly, processes data uniformly, and sends data uniformly; and information transmission between the management platform and object platforms corresponding to all processes on the production line is completed through the sensor network platform uniformly (claims 1-3, 7-11 and 18-20) are recited at a high level of generality and are recited as performing generic computer functions routinely used in computer applications that they represent no more than mere instructions to apply the judicial exception on a computer. These limitations can also be viewed as nothing more than an attempt to generally link the use of the judicial exception to the technological environment of a computer. It should be noted that because the courts have made it clear that mere physicality or tangibility of an additional element or elements is not a relevant consideration in the eligibility analysis, the physical nature of these computer components does not affect this analysis. See MPEP 2106.05(I) for more information on this point, including explanations from judicial decisions including Alice Corp. Pty. Ltd. v. CLS Bank Int'l, 573 U.S. 208, 224-26 (2014). Generic computer components recited as performing generic computer functions that are well-understood, routine and conventional activities amount to no more than implementing the abstract idea with a computerized system (Alice Corp. Pty. Ltd. v. CLS Bank Int’l 573 U.S. __, 134 S. Ct. 2347, 110 U.S.P.Q.2d 1976 (2014)). Accordingly, these additional element does not integrate the abstract idea into a practical application. The limitation of using a defect judgment model, wherein the defect judgment model is a machine learning model, an input of the defect judgment model includes the carton defective product testing information and reference carton defective product testing information of a reference carton, and an output of the defect judgment model includes a defect compliance between the carton and the reference carton, completing training until satisfying a preset condition and obtaining the defect judgment model provide nothing more than mere instructions to implement an abstract idea on a generic computer, see MPEP2106.05(f). The limitation of monitoring a production line based on Industrial Internet of Things, the Industrial Internet of Things is configured to manage production of a carton packaging production line generally links the abstract idea to a particular technological environment because it claims field of use.
The claim(s) does/do not include additional elements that are sufficient to amount to significantly more than the judicial exception because the insignificant extra-solution activity of data transmission/gathering is considered well-understood, routine, and conventional, see mpep 2106.05(d). The user platform, the service platform, the management platform, the sensor network platform, the object platform, the display, wherein the management platform adopts an independent arrangement, wherein the independent arrangement means that the management platform is provided with a plurality of management sub-platforms, and each management sub-platform corresponds to an object platform for data storage, data processing, or data transmission; and the each management sub-platform is configured to receive and process the perception information, the instruction for retrieving process information, and the parameter configuration instruction of the corresponding object platform; the sensor network platform adopts a centralized arrangement, wherein the centralized arrangement means that the sensor network platform receives data uniformly, processes data uniformly, and sends data uniformly; and information transmission between the management platform and object platforms corresponding to all processes on the production line is completed through the sensor network platform uniformly are recited at a high level of generality and are recited as performing generic computer functions routinely used in computer applications, which cannot provide an inventive concept. Generic computer components recited as performing generic computer functions that are well-understood, routine and conventional activities amount to no more than implementing the abstract idea with a computerized system (Alice Corp. Pty. Ltd. v. CLS Bank Int’l 573 U.S. __, 134 S. Ct. 2347, 110 U.S.P.Q.2d 1976 (2014)). The “field of use” limitation do not amount to significantly more than the judicial exception because they are well-understood, routine and conventional (See MPEP2106.05(d)). The additional elements of using a defect judgment model, wherein the defect judgment model is a machine learning model, an input of the defect judgment model includes the carton defective product testing information and reference carton defective product testing information of a reference carton, and an output of the defect judgment model includes a defect compliance between the carton and the reference carton, completing training until satisfying a preset condition and obtaining the defect judgment model are at best, mere instructions to “apply” the abstract ideas, which cannot provide an inventive concept, see MPEP2106.05(f).
Allowable Subject Matter
Claim 1 would be allowable if rewritten or amended to overcome the rejection(s) under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), 2nd paragraph, the nonstatutory double patenting rejection and the rejection(s) under 35 U.S.C. 101, set forth in this Office action.
Claim 14 would be allowable if rewritten or amended to overcome the rejection(s) under 35 U.S.C. 101 and the nonstatutory double patenting rejection, set forth in this Office action.
The following is an examiner’s statement of reasons for allowance:
Regarding claim 1:
US 11435726 discloses an industrial device supports device-level data modeling that pre-models data stored in the device with known relationships, correlations, key variable identifiers, and other such metadata to assist higher-level analytic systems to more quickly and accurately converge to actionable insights relative to a defined business or analytic objective. Data at the device level can be modeled according to modeling templates stored on the device that define relationships between items of device data for respective analytic goals (e.g., improvement of product quality, maximizing product throughput, optimizing energy consumption, etc.). This device-level modeling data can be provided to higher level systems together with their corresponding data tag values to high level analytic systems, which discovers insights into an industrial process or machine based on analysis of the data and its modeling data. US9513637 discloses an Internet of things (IoT) intelligent gas meter and its control system. It is a kind of intelligent gas meter consisting of a base meter, a CPU control module and a data transmission module. A gas source outlet and a gas source inlet are installed on the base meter, and an electromechanical valve is installed near the gas source inlet. The CPU control module is connected to the base meter and sends control signals to the base meter. The gas consumption criterion of the base meter can be adjusted via the CPU control module; The said CPU control module includes an EEPROM data storage device; the data transmission module is indirectly connected to the IoT and connected to a remote computer management system via the IoT; the data transmission module receives the control signal from the remote computer management system and feeds back gas consumption information of the gas meter sent by the CPU control module to the computer management system. This invention provides an IoT intelligent gas meter and relevant control system that could be applied to all the gas supply networks with wide scope of application and convenience for promotion. US 6874691 discloses a building automation system having: a plurality of wireless remote devices, each wireless remote device including a wireless transceiver for transmitting and receiving digital information and an interface for energy management which can read a sensor, such as a temperature sensor, a flow sensor, an electronically readable gas or electric meter, or provide an output, such as a relay driver; and a controller having a wireless transceiver for digital communication with the wireless remote devices and a computer interface. Each wireless remote device includes an identifier to identify the type of interface present in the remote device and a serial number to allow the controller to communicate exclusively with any individual remote device. The controller interface allows the controller to communicate with a computer, and ultimately with a server to allow monitoring and control of the system from virtually anywhere in the world. US11086298 discloses smart gateway platform leverages pre-defined industrial expertise to identify limited subsets of available industrial data deemed relevant to a desired business objective, and to collect and model this relevant data to apply useful constraints on subsequent artificial intelligence or machine learning analytics applied to the data. This approach can reduce the data space to which AI analytics are applied, and assist data analytic systems to more quickly derive valuable insights and business outcomes. In some embodiments, the smart gateway platform can operate within the context of a multi-level industrial analytic system, feeding pre-modeled data to one or more AI or machine learning systems executing on one or more different levels of an industrial enterprise.
the combination of the cited prior arts does not describe:
Step4, receiving, by the management platform, the instruction for retrieving process information, sending pre-stored production line device configuration information and defective product testing device configuration information of the process corresponding to the instruction for retrieving process information to the service platform, and sending latest-stored first production line device operation information and first defective product testing device operation information of the process corresponding to the instruction for retrieving process information to the service platform; Step5, performing, by the service platform, a parameter comparison with a same parameter name between the first production line device operation information and the production line device configuration information, and a parameter comparison with a same parameter name between the first defective product testing device operation information and the defective product testing device configuration information; determining that the parameter data with the same parameter name between the production line device operation information and the production line device configuration information is inconsistent or the parameter data with the same parameter name between the defective product testing device operation information and the defective product testing device configuration information is inconsistent, in response to determining that the parameter data with the same parameter name between the production line device operation information and the production line device configuration information is inconsistent or the parameter data with the same parameter name between the defective product testing device operation information and the defective product testing device configuration information is inconsistent, generating a parameter configuration instruction corresponding to the process and sending the parameter configuration instruction to a corresponding object platform through the management platform and the sensor network platform in turn; Step6, receiving, by the corresponding object platform, the parameter configuration instruction and performing configuration, and sending the second production line device operation information and the second defective product testing device operation information to the service platform through the sensor network platform and the management platform in turn
Regarding claim 14:
US 11435726 discloses an industrial device supports device-level data modeling that pre-models data stored in the device with known relationships, correlations, key variable identifiers, and other such metadata to assist higher-level analytic systems to more quickly and accurately converge to actionable insights relative to a defined business or analytic objective. Data at the device level can be modeled according to modeling templates stored on the device that define relationships between items of device data for respective analytic goals (e.g., improvement of product quality, maximizing product throughput, optimizing energy consumption, etc.). This device-level modeling data can be provided to higher level systems together with their corresponding data tag values to high level analytic systems, which discovers insights into an industrial process or machine based on analysis of the data and its modeling data. US9513637 discloses an Internet of things (IoT) intelligent gas meter and its control system. It is a kind of intelligent gas meter consisting of a base meter, a CPU control module and a data transmission module. A gas source outlet and a gas source inlet are installed on the base meter, and an electromechanical valve is installed near the gas source inlet. The CPU control module is connected to the base meter and sends control signals to the base meter. The gas consumption criterion of the base meter can be adjusted via the CPU control module; The said CPU control module includes an EEPROM data storage device; the data transmission module is indirectly connected to the IoT and connected to a remote computer management system via the IoT; the data transmission module receives the control signal from the remote computer management system and feeds back gas consumption information of the gas meter sent by the CPU control module to the computer management system. This invention provides an IoT intelligent gas meter and relevant control system that could be applied to all the gas supply networks with wide scope of application and convenience for promotion. US 6874691 discloses a building automation system having: a plurality of wireless remote devices, each wireless remote device including a wireless transceiver for transmitting and receiving digital information and an interface for energy management which can read a sensor, such as a temperature sensor, a flow sensor, an electronically readable gas or electric meter, or provide an output, such as a relay driver; and a controller having a wireless transceiver for digital communication with the wireless remote devices and a computer interface. Each wireless remote device includes an identifier to identify the type of interface present in the remote device and a serial number to allow the controller to communicate exclusively with any individual remote device. The controller interface allows the controller to communicate with a computer, and ultimately with a server to allow monitoring and control of the system from virtually anywhere in the world. US11086298 discloses smart gateway platform leverages pre-defined industrial expertise to identify limited subsets of available industrial data deemed relevant to a desired business objective, and to collect and model this relevant data to apply useful constraints on subsequent artificial intelligence or machine learning analytics applied to the data. This approach can reduce the data space to which AI analytics are applied, and assist data analytic systems to more quickly derive valuable insights and business outcomes. In some embodiments, the smart gateway platform can operate within the context of a multi-level industrial analytic system, feeding pre-modeled data to one or more AI or machine learning systems executing on one or more different levels of an industrial enterprise.
the combination of the cited prior arts does not describe:
the management platform is configured to receive, process, and store the perception information, and send the defective product testing information to the service platform; receive instruction for retrieving process information, send pre-stored production line device configuration information and defective product testing device configuration information of the process corresponding to the instruction for retrieving process information to the service platform, and send latest-stored first production line device operation information and first defective product testing device operation information of the process corresponding to the instruction for retrieving process information to the service platform; the service platform is configured to: receive the defective product testing information, obtain a count of defective products of the each process corresponding to the set time period according to defective product testing information of the each process, and compare the count of defective products of the each process with a first count threshold of defective products set by the each process; when the count of defective products exceeds the first count threshold of defective products set by a process, generate an instruction for retrieving process information of the process, and send the instruction for retrieving process information to the management platform; perform a parameter comparison with a same parameter name between the first production line device operation information and the production line device configuration information, and a parameter comparison with a same parameter name between the first defective product testing device operation information and the defective product testing device configuration information; if all parameter data with the same parameter name is consistent, generate configuration data normal information and feed the configuration data normal information back to the user platform for display; and if the parameter data with the same parameter name between the production line device operation information and the production line device configuration information is inconsistent or the parameter data with the same parameter name between the defective product testing device operation information and the defective product testing device configuration information is inconsistent, generate a parameter configuration instruction corresponding to the process and send the parameter configuration instruction to a corresponding object platform through the management platform and the sensor network platform in turn
Conclusion
The prior art made of record and not relied upon is considered pertinent to applicant’s disclosure.
US11256243 discloses systems for detection in an industrial Internet of Things (IoT) data collection environment with intelligent data collection and equipment package adjustment for oil and gas equipment are disclosed. An example monitoring system for data collection in an oil and gas production environment can include a data collector communicatively coupled to a plurality of input channels connected to data collection points operatively coupled to at least one piece of equipment of an equipment package of the oil and gas production environment. The system further includes a data acquisition circuit to interpret detection values from the plurality of input channels and a data analysis circuit to utilize an expert system diagnostic tool to identify an off-nominal process state based on the detection values. The system may further include a response circuit to adjust an equipment package parameter in response to the off-nominal process state.
US20120154149 discloses a process for determining a root cause problem for an out-of-tolerance component manufactured by a plurality of operations performed on the component. The process can include providing manufacturing data from at least a subset of plurality of operations performed on a plurality of components and discovering an out-of-tolerance measurement on at least a subset of the plurality of manufactured components downstream from the plurality of operations. An auto-regression analysis between the out-of-tolerance measurement and the plurality of upstream operations can also be performed using the manufacturing data. A correlation between at least one of the upstream operations and the out-of-tolerance measurement can be found and the correlation can result in the identification of at least one upstream operation that is the root cause of the out-of-tolerance measurement.
US20100188417 discloses monitoring operation for checking whether or not quality of a substrate deteriorates as well as operation for identifying a cause of deterioration in quality. Identification information of constituent elements related to measurement target sections (pads) on a component-mounted substrate is arranged into hierarchal structure data. A first axis is arranged with the measurement target sections associated with this arrangement. A second axis is arranged with information (identification information of lots and squeegees) representing production conditions of the substrates according to an order of the substrates being processed. A two-dimensional area defined by the first axis and the second axis is set. A color map is generated, in which measured data of the measurement target sections on the substrates are arranged in colors at corresponding positions within the two-dimensional area. Specifically, in the respective measured data, values in a preferable range is displayed in white, values larger than the preferable range is displayed in red-like color, and values smaller than the preferable range is displayed in blue-like color.
US20040030426 discloses methods for relating product (or process) attribute data associated with a composite product manufactured using a web converting manufacturing process such as that used for manufacturing disposable absorbent garments. Some of the disclosed embodiments include relating inspection data, such as product (or process) attribute data, to data from other manufacturing-related systems. Also disclosed are systems and methods for linking product (or process) attribute data obtained during the manufacturing process with one or more data sources including raw material data, process setting data, product quality data, and/or productivity data. Also disclosed are systems and methods for identifying manufacturing set point changes and automatically implementing such changes and automated web steering changes based on data from one or more inspection systems.
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/JASON LIN/
Primary Examiner, Art Unit 2117
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