Prosecution Insights
Last updated: July 15, 2026
Application No. 18/645,393

ELECTROOPTIC APPARATUS AND ELECTRONIC EQUIPMENT

Non-Final OA §102
Filed
Apr 25, 2024
Priority
Apr 28, 2023 — JP 2023-074269
Examiner
CHANG, CHARLES S
Art Unit
2871
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Seiko Epson Corporation
OA Round
1 (Non-Final)
78%
Grant Probability
Favorable
1-2
OA Rounds
5m
Est. Remaining
96%
With Interview

Examiner Intelligence

Grants 78% — above average
78%
Career Allowance Rate
800 granted / 1022 resolved
+10.3% vs TC avg
Strong +18% interview lift
Without
With
+17.8%
Interview Lift
resolved cases with interview
Typical timeline
2y 8m
Avg Prosecution
16 currently pending
Career history
1036
Total Applications
across all art units

Statute-Specific Performance

§101
0.3%
-39.7% vs TC avg
§103
83.7%
+43.7% vs TC avg
§102
14.1%
-25.9% vs TC avg
§112
0.6%
-39.4% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1022 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. Claims 1-5 and 10-11 are rejected under 35 U.S.C. 102(a)(2) as being anticipated by Ota (US 20100097538). Regarding claim 1, Ota discloses (Figs. 1-14) an electrooptic apparatus comprising: a substrate (AR, 11) having a display region (DA) in a plan view; a first conductive member (D; section 0065) disposed in the display region in the plan view; a first pixel electrode (20) electrically coupled to the first conductive member (coupled via 19); a second conductive member (D adjacent to 16; Figs. 2, 5, 14) disposed in a region between the display region (DA) and an edge of the substrate (AR) in the plan view (Figs. 1-2); and a second pixel electrode (dummy pixel electrode; 13, 67) electrically coupled to the second conductive member (coupled via 19’, 68), wherein the second pixel electrode includes: a first portion (13 adjacent to 30; Fig. 2) not electrically coupled to the second conductive member, and a second portion (13) electrically coupled to the second conductive member (D; Fig. 6) and disposed around and spaced apart from the first portion in the plan view. Regarding claim 2, Ota discloses (Figs. 1-14) a common potential is applied to the first portion (section 0082), and a video signal is applied to the second portion (via 16). Regarding claim 3, Ota discloses (Figs. 1-14) a potential is not applied to the first portion (after a electrostatic breakdown; section 0085), and a video signal is applied to the second portion (via 16). Regarding claim 4, Ota discloses (Figs. 1-14) a potential is not applied to the first portion (after a electrostatic breakdown; section 0085), and a common potential is applied to the second portion (section 0082). Regarding claim 5, Ota discloses (Figs. 1-14) a potential is not applied to the first portion and the second portion (after a electrostatic breakdown; section 0085). Regarding claim 10, Ota discloses (Figs. 1-14; in particular Figs. 4, 13-14) an insulating layer (14, 58) provided between the substrate (11) and the first pixel electrode (20), and between the substrate (11) and the second pixel electrode (67), wherein a portion of the second pixel electrode that does not overlap the second conductive member in the plan view and the insulating layer face each other through a gap (portion adjacent to 66) (Figs. 13-14). Regarding claim 11, Ota discloses (Figs. 1-14) an electronic equipment comprising the electrooptic apparatus (section 0005). Allowable Subject Matter Claims 6-9 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. The following is an examiner’s statement of reasons for allowance: the prior art does not disclose or suggest the electrooptic apparatus of claim 6, in particular the limitations of a third portion disposed around and spaced apart from the first portion, wherein a same potential is applied to the first portion and the second portion, and a potential is not applied to the third portion. The prior art does not disclose or suggest the electrooptic apparatus of claim 7, in particular the limitations of as a distance to the edge of the substrate decreases, a plan shape of the second pixel electrode changes or a potential distribution applied changes. The prior art does not disclose or suggest the electrooptic apparatus of claim 8, in particular the limitations of the first pixel electrode includes: a first pixel electrode layer electrically coupled to the first conductive member, and a second pixel electrode layer disposed overlapping the first pixel electrode layer and an opening region of a first pixel in the plan view, the second pixel electrode layer having a width in a thickness direction of the substrate smaller than that of the first pixel electrode layer. The prior art does not disclose or suggest the electrooptic apparatus of claim 9, in particular the limitations of the second pixel electrode includes: a third pixel electrode layer electrically coupled to the second conductive member, and a fourth pixel electrode layer disposed overlapping the third pixel electrode layer and an opening region of a second pixel in the plan view, the fourth pixel electrode layer having a width in a thickness direction of the substrate smaller than that of the third pixel electrode layer. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure: Jeong et al. (US 20180188616). Any inquiry concerning this communication or earlier communications from the examiner should be directed to CHARLES S CHANG whose telephone number is (571)270-5024. The examiner can normally be reached Monday - Friday, 9:00 AM - 5:00 PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Michael Caley can be reached at (571) 272-2286. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /CHARLES S CHANG/Primary Examiner, Art Unit 2871
Read full office action

Prosecution Timeline

Apr 25, 2024
Application Filed
May 26, 2026
Non-Final Rejection mailed — §102 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
78%
Grant Probability
96%
With Interview (+17.8%)
2y 8m (~5m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1022 resolved cases by this examiner. Grant probability derived from career allowance rate.

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