Prosecution Insights
Last updated: July 17, 2026
Application No. 18/648,581

SOLDER ALLOY, SOLDER JOINT, AND SEMICONDUCTOR PACKAGE INCLUDING SOLDER JOINT

Non-Final OA §103
Filed
Apr 29, 2024
Priority
Jun 30, 2023 — RE 10-2023-0084742
Examiner
ROE, JESSEE RANDALL
Art Unit
Tech Center
Assignee
Duksan Hi-Metal Co. Ltd.
OA Round
1 (Non-Final)
76%
Grant Probability
Favorable
1-2
OA Rounds
10m
Est. Remaining
84%
With Interview

Examiner Intelligence

Grants 76% — above average
76%
Career Allowance Rate
989 granted / 1297 resolved
+16.3% vs TC avg
Moderate +8% lift
Without
With
+7.8%
Interview Lift
resolved cases with interview
Typical timeline
3y 1m
Avg Prosecution
53 currently pending
Career history
1339
Total Applications
across all art units

Statute-Specific Performance

§101
0.4%
-39.6% vs TC avg
§103
70.2%
+30.2% vs TC avg
§102
1.9%
-38.1% vs TC avg
§112
14.8%
-25.2% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1297 resolved cases

Office Action

§103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Status of the Claims Claims 1-8 are pending and are currently under examination. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 1-4 and 6 are rejected under 35 U.S.C. 103 as being unpatentable over Ingham et al. (US 2008/0292492). In regard to claims 1 and 3, Ingham et al. (‘492) discloses tin based solder alloys that would be used for ball grid array having compositions relative to that of the instant invention as set forth below (abstract, [0011-0030] and [0035]). Element Instant Claim (weight percent) Ingham et al. (‘492) (weight percent) Overlap Ag 0.8 – 1.3 0.1 – 1.5 0.8 – 1.3 Cu 0.50 – 0.75 0.6 – 0.8 0.60 – 0.75 Bi 1.5 – 2.5 0.08 – 3 1.5 – 2.5 Ni 0.03 – 0.10 0.02 – 0.3 0.03 – 0.1 Sn Balance Balance Balance The Examiner notes that the amounts of silver, copper, bismuth and nickel for the tin based alloys disclosed by Ingham et al. (‘492) overlap the amounts of the instant invention, which is prima facie evidence of obviousness. MPEP 2144.05 I. It would have been obvious to one having ordinary skill in the art prior to the filing of the instant invention to select the claimed amounts of silver, copper, bismuth and nickel from the amounts disclosed by Ingham et al. (‘492) because Ingham et al. (‘492) discloses the same utility throughout the disclosed ranges. In regard to claims 2 and 4, Ingham et al. (‘492) discloses 0 to 0.1 mass percent germanium, which encompasses the range of the instant invention [0016]. In regard to claim 6, Ingham et al. (‘492) discloses tin based solder alloys that would be used for ball grid array arranged between two substrates (upper and lower electronic components) having compositions relative to that of the instant invention as set forth below (abstract, [0003-0005], [0011-0030] and [0035]). Element Instant Claim (weight percent) Ingham et al. (‘492) (weight percent) Overlap Ag 0.8 – 1.3 0.1 – 1.5 0.8 – 1.3 Cu 0.50 – 0.75 0.6 – 0.8 0.60 – 0.75 Bi 1.5 – 2.5 0.08 – 3 1.5 – 2.5 Ni 0.03 – 0.10 0.02 – 0.3 0.03 – 0.1 Sn Balance Balance Balance The Examiner notes that the amounts of silver, copper, bismuth and nickel for the tin based alloys disclosed by Ingham et al. (‘492) overlap the amounts of the instant invention, which is prima facie evidence of obviousness. MPEP 2144.05 I. It would have been obvious to one having ordinary skill in the art prior to the filing of the instant invention to select the claimed amounts of silver, copper, bismuth and nickel from the amounts disclosed by Ingham et al. (‘492) because Ingham et al. (‘492) discloses the same utility throughout the disclosed ranges. Claim 5 is rejected under 35 U.S.C. 103 as being unpatentable over Ingham et al. (US 2008/0292492) as applied to claim 4, and further in view of Kim et al. (Thermal diffusivity of Sn-Ag-Cu-based, Pb-free, micro-and nano-sized solder balls). In regard to claim 5, Ingham et al. (‘492) discloses forming tin-based alloy solder balls as set forth above, but Ingham et al. (‘492) does not specify wherein the solder balls would have a particle diameter of 10 to 780 micrometers. Kim et al. teaches that as the solder ball diameter within the range of 170 nm to 140 µm increases so too does the thermal diffusivity of the solder ball (Table 1 and Conclusions). MPEP 2144.05 II. Therefore, it would have been obvious to one having ordinary skill in the art prior to the filing of the instant invention to modify the tin-based solder balls as disclosed by Ingham et al. (‘492), within a range of 170 nm to 140 µm, as disclosed by Kim et al., in order to achieve the desired thermal diffusivity, as disclosed by Kim et al. since solder ball size is a result-effective variable in achieving the desired thermal diffusivity (Table 1 and Conclusions). MPEP 2144.05 II. Claims 6-8 are rejected under 35 U.S.C. 103 as being unpatentable over Shimodaira (US 2017/0179012) or Nobori (US 6,864,574) in view of Ingham et al. (US 2008/0292492). In regard to claims 6-7, Shimodaira (‘012) discloses a semiconductor device with a wiring substrate including an electrode (pad), a solder resist, and an opening that exposes the electrode [0003]. Shimodaira (‘012) further discloses forming bumps on the wiring substrate and mounting a semiconductor element, which would inherently have an electrode, on the bumps [0019]. The wiring substrate also includes a lower surface on which bumps are formed to connect to another substrate such as a motherboard with an external connection [0020]. However, Shimodaira (‘017) does not specify the composition of the solder alloy bumps. Nobori (‘574) discloses a pillared electrode where there is an upper base material with a copper electrode and semiconductor below with a first electrode above and an upper face second electrode with a tin-silver-copper based solder in between the upper materials and the semiconductor material/electrodes below (Figures 14-15 and columns 13-15). However, Nobori (‘574) does not specify the specific composition of the tin-silver-copper based solder. Ingham et al. (‘492) discloses tin based solder alloys that would be used for ball grid array arranged between two substrates (upper and lower electronic components) having compositions relative to that of the instant invention as set forth below (abstract, [0003-0005], [0011-0030] and [0035]). Element Instant Claim (weight percent) Ingham et al. (‘492) (weight percent) Overlap Ag 0.8 – 1.3 0.1 – 1.5 0.8 – 1.3 Cu 0.50 – 0.75 0.6 – 0.8 0.60 – 0.75 Bi 1.5 – 2.5 0.08 – 3 1.5 – 2.5 Ni 0.03 – 0.10 0.02 – 0.3 0.03 – 0.1 Sn Balance Balance Balance The Examiner notes that the amounts of silver, copper, bismuth and nickel for the tin based alloys disclosed by Ingham et al. (‘492) overlap the amounts of the instant invention, which is prima facie evidence of obviousness. MPEP 2144.05 I. It would have been obvious to one having ordinary skill in the art prior to the filing of the instant invention to select the claimed amounts of silver, copper, bismuth and nickel from the amounts disclosed by Ingham et al. (‘492) because Ingham et al. (‘492) discloses the same utility throughout the disclosed ranges. Ingham et al. (‘492) further discloses wherein using the disclosed tin-based solder alloys would provide improved mechanical properties and oxidation resistance [0010]. Therefore, it would have been obvious to one having ordinary skill in the art prior to the filing of the instant invention to modify the semiconductor device (package), as disclosed by Shimodaira (‘012), by using the tin-based solder alloys, as disclosed by Ingham et al. (‘492), in order to provide improved mechanical properties and oxidation resistance, as disclosed by Ingham et al. (‘492) [0010]. In regard to claim 8, Ingham et al. (‘492) discloses using organic coatings (OSP) on substrates in order to improve wetting [0008]. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Imamura et al. (‘020). Any inquiry concerning this communication or earlier communications from the examiner should be directed to Jessee Roe whose telephone number is (571)272-5938. The examiner can normally be reached Monday thru Friday 7:30 am to 4 pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Curt Mayes can be reached at 571-272-1234. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /JESSEE R ROE/Primary Examiner, Art Unit 1759
Read full office action

Prosecution Timeline

Apr 29, 2024
Application Filed
Jun 05, 2026
Non-Final Rejection mailed — §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
76%
Grant Probability
84%
With Interview (+7.8%)
3y 1m (~10m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1297 resolved cases by this examiner. Grant probability derived from career allowance rate.

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