Prosecution Insights
Last updated: October 27, 2026
Application No. 18/657,498

ELECTRONIC DEVICE

Non-Final OA §102
Filed
May 07, 2024
Priority
Jun 01, 2023 — RE 10-2023-0071109 +1 more
Examiner
CHOU, SHIH TSUN A
Art Unit
Tech Center
Assignee
Samsung Display Co., Ltd.
OA Round
1 (Non-Final)
78%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
94%
With Interview

Examiner Intelligence

Grants 78% — above average
78%
Career Allowance Rate
380 granted / 489 resolved
+17.7% vs TC avg
Strong +16% interview lift
Without
With
+15.9%
Interview Lift
resolved cases with interview
Typical timeline
2y 5m
Avg Prosecution
22 currently pending
Career history
521
Total Applications
across all art units

Statute-Specific Performance

§103
51.4%
+11.4% vs TC avg
§102
21.7%
-18.3% vs TC avg
§112
26.5%
-13.5% vs TC avg
Black line = Tech Center average estimate • Based on career data from 489 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. Claims 1, 11-12 and 18-20 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Bok (US 2021/0191552). Regarding claim 1, Bok discloses, in FIGS. 9A, 10, 11A-11B, 33B and 35, and in related text, an electronic device comprising: a base layer (10) including a first area (CA) and a second area (MDA) having a lower optical transmittance than the first area; a first group of pixels (Pa) in the first area and a second group of pixels (Pm) in the second area, wherein each pixel from among the first group of pixels and the second group of pixels comprises a pixel circuit comprising transistors (TFT) and conductive patterns and a light emitting element (ED’ ED) connected to the pixel circuit (see Bok, FIG. 9A, [0193], [0264]-[0268]); and data lines (DL) extending in a first direction, each of the data lines being connected to the pixel circuits arranged along the first direction (see Bok, FIGS. 10 and 11A-11B, [0298], [0300]-[0301], [0308]), wherein the first area (CA) includes circuit areas (PG) and transmissive areas (TA) arranged alternately along the first direction and extending in a second direction intersecting the first direction, wherein the pixel circuits in the first group of pixels (PA) in the circuit areas (PG) are spaced from the transmissive areas (TA), wherein the data lines (DL1, DL2, …) comprise first patterns (DBL) at least partially overlapping the transmissive areas (TA) and second patterns (DL) overlapping the circuit areas (PG), and wherein the first patterns (transparent conductive oxide) and the second patterns (metal) comprise different materials (see Bok, FIGS. 33B and 35, [0468], [0512], [0519], [0521], [0525], [0529]-[0534]). Regarding claim 11, Bok discloses the device of claim 1. Bok discloses wherein each of the light emitting elements comprises a first electrode (121, 121’), a second electrode (123) on the first electrode, and a light emitting layer (122b, 122b’) between the first electrode and the second electrode, wherein the second electrode is common to the light emitting elements (see Bok, FIG. 17, [0362]-[0363], [0388], [0393], [0398]). Regarding claim 12, Bok discloses the device of claim 11. Bok discloses wherein electrode holes (TAH) penetrating the second electrode (123) are in the second electrode overlapping the transmissive areas (TA) (see Bok, FIG. 17, [0401]). Regarding claim 18, Bok discloses the device of claim 1. Bok discloses wherein some of the transistors comprise an oxide semiconductor pattern and some other ones of the transistors comprise a silicon semiconductor pattern (see Bok, [0019]). Regarding claim 19, Bok discloses the device of claim 1. Bok discloses a camera module (731) under the base layer (10) and overlapping the second area (MDA) (see Bok, FIG. 2, [0203]). Regarding claim 20, Bok discloses the device of claim 1. Bok discloses wherein the base layer (10) further includes a hole area (within CA) having higher optical transmittance than the first area (MDA) and extending through at least a portion of the base layer, wherein the electronic device further comprises at least one infrared ray sensor (IR sensor) (40) under the base layer and overlapping the hole area (see Bok, FIG. 2, [0203]-[0204]). Allowable Subject Matter Claims 2-10 and 13-17 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. The following is a statement of reasons for the indication of allowable subject matter: The prior art of record, Bok, discloses wherein the first patterns comprise a transparent conductive oxide, the second patterns comprise layers of titanium and aluminum. The prior art of records, individually or in combination, do not disclose nor teach “wherein the second patterns comprise sequentially stacked first layer, second layer, and third layer, wherein the first layer and the third layer comprise titanium, and the second layer comprises aluminum” in combination with other limitations as recited in claim 2. The prior art of records, individually or in combination, do not disclose nor teach “a lower insulating layer covering the first patterns; an intermediate insulating layer on the lower insulating layer, the second patterns being on the intermediate insulating layer; an upper insulating layer on the intermediate insulating layer and covering the second patterns” in combination with other limitations as recited in claim 3. The prior art of records, individually or in combination, do not disclose nor teach “a lower insulating layer comprising the first patterns; an intermediate insulating layer on the lower insulating layer, the second patterns being on the intermediate insulating layer; an upper insulating layer on the intermediate insulating layer and covering the second patterns” in combination with other limitations as recited in claim 9. The prior art of records, individually or in combination, do not disclose nor teach “coating patterns in the electrode holes” in combination with other limitations as recited in claim 13. The prior art of record, Bok, discloses wherein each of the first group of pixels and the second group of pixels has unit pixels arranged along the first direction, wherein the unit pixels comprise a first pixel configured to emit a first color light, a second pixel configured to emit a second color light, a third-first pixel configured to emit a third color light, and a third-second pixel configured to emit the third color light. The prior art of records, individually or in combination, do not disclose nor teach “wherein the first pixel and the second pixel are spaced from each other along the second direction, and the third-first pixel and the third-second pixel are spaced from each other in a diagonal direction intersecting the first direction and the second direction, with the first pixel in between” in combination with other limitations as recited in claim 16. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to SHIH TSUN A CHOU whose telephone number is (408)918-7583. The examiner can normally be reached M-F 8:00-16:00 Arizona Time. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Lynne Gurley can be reached at (571) 272-1670. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /SHIH TSUN A CHOU/Primary Examiner, Art Unit 2811
Read full office action

Prosecution Timeline

May 07, 2024
Application Filed
Oct 07, 2026
Non-Final Rejection mailed — §102 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
78%
Grant Probability
94%
With Interview (+15.9%)
2y 5m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 489 resolved cases by this examiner. Grant probability derived from career allowance rate.

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