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+18.5% interview lift. Interview already conducted in this application's prosecution history. This examiner has a 85% grant rate with +18.5% interview lift. Since an interview has already been tried, recommend written response with narrowed claims based on precedent claim evolution patterns.
Inspection System for Detecting Foreign Material and Scratch at Edge of Semiconductor Wafer and Non-Transitory Computer-Readable Medium Storing a Program for Same
MEDICAL IMAGE PROCESSING DEVICE, OPERATION METHOD OF MEDICAL IMAGE PROCESSING DEVICE, AND RECORDING MEDIUM FOR ESTIMATING A STATE OF AN OBSERVATION IMAGED BY AN ENDOSCOPE
3y 5m to grantGranted Jun 16, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.
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