Prosecution Insights
Last updated: April 19, 2026
Application No. 18/691,238

CONDUCTIVE PASTE, CONDUCTIVE FILM-COATED SUBSTRATE, AND METHOD FOR PRODUCING CONDUCTIVE FILM-COATED SUBSTRATE

Final Rejection §103
Filed
Mar 12, 2024
Examiner
NGUYEN, HAIDUNG D
Art Unit
1761
Tech Center
1700 — Chemical & Materials Engineering
Assignee
Taiyo Nippon Sanso Corporation
OA Round
4 (Final)
65%
Grant Probability
Favorable
5-6
OA Rounds
3y 2m
To Grant
93%
With Interview

Examiner Intelligence

Grants 65% — above average
65%
Career Allow Rate
401 granted / 616 resolved
At TC average
Strong +28% interview lift
Without
With
+28.1%
Interview Lift
resolved cases with interview
Typical timeline
3y 2m
Avg Prosecution
39 currently pending
Career history
655
Total Applications
across all art units

Statute-Specific Performance

§101
0.6%
-39.4% vs TC avg
§103
46.4%
+6.4% vs TC avg
§102
27.2%
-12.8% vs TC avg
§112
19.3%
-20.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 616 resolved cases

Office Action

§103
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Response to Amendment This action is responsive to applicant’s amendment filed 3/10/2026. Claims 1-9 are pending. The previous rejection of claims 1-3, 5, 7 and 8 under 35 U.S.C. 103 as being unpatentable over Omura et al (WO2019/167365) in view of Hirakoso et al (WO2012067016) is withdrawn in view of applicant’s amendment/remarks. The previous rejection of claims 4, 6 and 9 under 35 U.S.C. 103 as being unpatentable over Omura et al (WO2019/167365) in view of Hirakoso et al (WO2012067016) as applied above, further in view of Miyoshi et al. (WO2020/153101) is withdrawn in view of applicant’s amendment/remarks. Applicant's amendment necessitated the new ground(s) of rejection presented in this Office action. The text of those sections of Title 35, U.S. Code not included in this action can be found in a prior Office action. Claim Rejections - 35 USC § 103 Claims 1-9 are rejected under 35 U.S.C. 103 as being unpatentable over Omura et al (WO2019/167365) in view of Miyoshi et al. (WO2020/153101). The machine translation of Omura and US publication 20220084713 are relied upon below as an English-equivalent for Miyoshi the rejection purposes. Regarding claims 1 and 6, Omura discloses a conductive paste containing copper particles, a dispersion medium (solvent), and a binder resin, wherein a content of the binder resin is 0.01 to 0.2 parts by mass with respect to a total of 100 parts by mass of the copper particles (para 0008). Omura does not disclose the copper particles comprising fine particles and coarse particles wherein the fine particles with an average size of 300nm or less, and the coarse particles with an average particle size of 3 to 11 microns and a ratio of a mass oxygen concentration to a specific surface area of the copper fine particles is 0.1 to 1.2% by mass. g/m2 and a ratio of a mass carbon concentration to a specific surface area of the copper fine particles is 0.008 to 0.3% by mass. g/m2 as recited in claims 1 and 6, respectively. Miyoshi discloses a conductive paste comprising copper particles, wherein the copper particles contain fine particles and coarse particles wherein the fine particles with an average size of 300nm or less, and the coarse particles with an average particle size of 3 to 11 microns (abstract) and the copper fine particles have a coating containing cuprous oxide and copper carbonate on at least a part of the surface thereof, wherein a ratio of a mass oxygen concentration to a specific surface area of the copper fine particles is 0.1 to 1.2% by mass. g/m2, and wherein a ratio of a mass carbon concentration to a specific surface area of the copper fine particles is 0.008 to 0.3% by mass. g/m2 (para 0030-35). It would have been obvious to one of ordinary skill in the art before the filling date of the invention to use the copper particles taught by Miyoshi, which contain fine particles with an average size of 300nm or less, and coarse particles with an average particle size of 3 to 11 microns and the fine particles have a coating containing cuprous oxide and copper carbonate on at least a part of the surface thereof, wherein a ratio of a mass oxygen concentration to a specific surface area of the copper fine particles is 0.1 to 1.2% by mass. g/m2, and wherein a ratio of a mass carbon concentration to a specific surface area of the copper fine particles is 0.008 to 0.3% by mass. g/m2, in the conductive paste of Omura, thereby improving the sinterability of the fine copper particles and the sintering temperature of the copper particles can be lowered (para 0031 and 0039). Regarding claim 2, Miyoshi discloses a mass ratio of the copper coarse particles to the copper fine particles (mass of the copper coarse particles / mass of the copper fine particles) is in a range from 30/70 to 90/10 (para 0062-63). Regarding claim 3, Miyoshi discloses a mass ratio of the copper coarse particles to the copper fine particles (mass of the copper coarse particles/mass of the copper fine particles) is in a range from 40/60 to 90/10 (para 0062-63). Regarding claim 4, Omura does not disclose the binder contains polyvinylpyrrolidone. Miyoshi discloses conductive paste comprising a binder, wherein the binder resin contains polyvinylpyrrolidone (para 0020). It would have been obvious to one of ordinary skill in the art before the filling date of the invention to add polyvinylpyrrolidone in the conductive paste of Omura, hence imparting adhesion to a substrate when it is made into a conductive film. Regarding claim 5, Omura discloses the dispersion medium contains at least one selected from the group consisting of ethylene glycol and diethylene glycol (para 0035). Regarding claim 7, Omura discloses a conductive film-coated substrate including a substrate and a sintered body of the conductive paste according to Claim 1 provided on the substrate (para 0008 and 0042). Regarding claims 8 and 9, Omura discloses a method for producing a conductive film-coated substrate, including providing a film containing a conductive paste according to Claim 1 on a substrate; and applying a heat treatment to the film (para 0052-56). Omura does not disclose the heat treatment is sintering by photo-sintering. Miyoshi discloses a method for producing a conductive film-coated substrate, wherein photo-sintering treatment is used (para 0086, 0138- 0140). It would have been obvious to one of ordinary skill in the art before the filling date of the invention to use photo-sintering as the sintering treating the conductive paste of Omura, with a reasonable expectation of carrying out the heat treatment, hence the copper particles are sintered with each other, and the electroconductive film having electroconductivity is produced on the substrate. Response to Arguments Applicant’s arguments filed 3/10/2026 have been considered but are moot because the new ground of rejection does not apply to matter specifically challenged in the argument. Conclusion Applicant's amendment necessitated the new ground(s) of rejection presented in this Office action. Accordingly, THIS ACTION IS MADE FINAL. See MPEP § 706.07(a). Applicant is reminded of the extension of time policy as set forth in 37 CFR 1.136(a). A shortened statutory period for reply to this final action is set to expire THREE MONTHS from the mailing date of this action. In the event a first reply is filed within TWO MONTHS of the mailing date of this final action and the advisory action is not mailed until after the end of the THREE-MONTH shortened statutory period, then the shortened statutory period will expire on the date the advisory action is mailed, and any nonprovisional extension fee (37 CFR 1.17(a)) pursuant to 37 CFR 1.136(a) will be calculated from the mailing date of the advisory action. In no event, however, will the statutory period for reply expire later than SIX MONTHS from the mailing date of this final action. Any inquiry concerning this communication or earlier communications from the examiner should be directed to HAIDUNG D NGUYEN whose telephone number is (571)270-5455. The examiner can normally be reached M-Th: 10a-3p. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Angela Brown-Pettigrew can be reached on 571-272-2817. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /HAIDUNG D NGUYEN/ Primary Examiner, Art Unit 1761 12/24/2025
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Prosecution Timeline

Mar 12, 2024
Application Filed
Feb 20, 2025
Non-Final Rejection — §103
Apr 29, 2025
Response Filed
Aug 12, 2025
Final Rejection — §103
Oct 02, 2025
Response after Non-Final Action
Oct 27, 2025
Applicant Interview (Telephonic)
Oct 29, 2025
Examiner Interview Summary
Nov 12, 2025
Request for Continued Examination
Nov 16, 2025
Response after Non-Final Action
Dec 24, 2025
Non-Final Rejection — §103
Mar 10, 2026
Response Filed
Mar 26, 2026
Final Rejection — §103 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

5-6
Expected OA Rounds
65%
Grant Probability
93%
With Interview (+28.1%)
3y 2m
Median Time to Grant
High
PTA Risk
Based on 616 resolved cases by this examiner. Grant probability derived from career allow rate.

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