Prosecution Insights
Last updated: August 18, 2026
Application No. 18/696,318

POLARIZING PLATE, OPTICAL EQUIPMENT, AND METHOD FOR MANUFACTURING A POLARIZING PLATE

Final Rejection §102§103
Filed
Mar 27, 2024
Priority
Sep 30, 2021 — JP 2021-160780 +1 more
Examiner
LIU, SHAN
Art Unit
2871
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
DEXerials Corporation
OA Round
2 (Final)
72%
Grant Probability
Favorable
3-4
OA Rounds
0m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 72% — above average
72%
Career Allowance Rate
453 granted / 626 resolved
+4.4% vs TC avg
Strong +39% interview lift
Without
With
+39.0%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 1m
Avg Prosecution
30 currently pending
Career history
651
Total Applications
across all art units

Statute-Specific Performance

§101
0.2%
-39.8% vs TC avg
§103
59.7%
+19.7% vs TC avg
§102
22.1%
-17.9% vs TC avg
§112
15.1%
-24.9% vs TC avg
Black line = Tech Center average estimate • Based on career data from 626 resolved cases

Office Action

§102 §103
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Response to Amendment and Arguments The amendment filed 06/18/2026 has been entered. Claims 1-12 are currently pending in this application. Applicant’s arguments, see Pages 5-6, filed 06/18/2026, with respect to the rejection(s) of claim(s) 1-6 under 35 U.S.C. 102 and/or 35 U.S.C. 103 and the new claims 8-12 have been fully considered but they are not persuasive. Applicant states "…The cited portions of Takeda relied upon for the reflective layer do not appear to discuss a metal oxide film formed on a side surface of the reflective layer... Applicant respectfully submits that the cited portions of Takeda and Sugawara, whether considered alone or in combination, do not account for a metal oxide film formed on a side surface of the reflective layer, as presently recited in claims 1 and 6". Examiner respectfully disagrees. The paragraph of [0062] of Takeda (US 2019/0094436) explicitly states that the material forming the first dielectric layer 14 can be metal oxides such as Al2O3, beryllium oxide, bismuth oxide, or tantalum oxide; and the Fig. 2 of Takeda clearly shows that the first dielectric layer 14 is formed on a bottom side surface of the reflective layer 15A. Therefore as stated in the rejection of claims 1 and 6 below, Takeda teaches that a metal oxide film (14 in Fig. 2, [0062], the material forming the first dielectric layer 14 can be metal oxides such as Al2O3, beryllium oxide, bismuth oxide, or tantalum oxide) is formed on a side surface of the reflective layer (the bottom surface of 15A contacting 14 in Fig. 2). Applicant’s arguments, see Pages 6, filed 06/18/2026, with respect to the rejection(s) of claim 7 under 35 U.S.C. 103 have been considered but are moot. Regarding limitations of the instant case in view of the amended Claims and upon further considerations, a new ground(s) of rejection, necessitated by the amendments is made in view of different interpretation of the previously applied references and/or new prior art as presented in this Office action. In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102 of this title, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 1-6 and 10-12 are rejected under 35 U.S.C. 103 as being unpatentable over Takeda (US 2019/0094436) in view of Sugawara (US 2020/0081287). Regarding claim 1, Takeda (US 2019/0094436) teaches a polarizing plate (Fig. 2, [0002, 0039, 0087-0089, 0040-0085, 0107-0121]) having a wire grid structure (Fig. 2), the polarizing plate comprising: a transparent substrate (10 in Fig. 2, [0039, 0040, 0048]); a plurality of projections (the projections above 12 in Fig. 2, [0087]) disposed on the transparent substrate (10 in Fig. 2, [0039, 0040, 0048]) and spaced apart from each other (Fig. 2) and periodically arranged in a first direction (the direction X in Fig. 2, [0039]) at a pitch shorter than a bandwidth to be used ([0039, 0076]); and a protective layer ([0022, 0074, 0081]) that covers a surface on a side of the projections ([0022, 0074, 0081]), wherein each projection of the plurality of projections (the projections above 12 in Fig. 2, [0087]) has a first absorption layer (13 in fig. 2, [0111]), a reflective layer (15A in fig. 2, [0113]), and a second absorption layer (17A in fig. 2, [0115]) in order from a side close to the transparent substrate (Fig. 2), a width of a first surface of the reflective layer (the width in the direction X of the bottom surface of 15A contacting 14 in fig. 2) on a side close to the transparent substrate (Fig. 2) in the first direction (the direction X in Fig. 2, [0039]) is wider (Fig. 2) than a width of a second surface of the reflective layer (the width in the direction X of the top surface of 15A contacting 16A in fig. 2) opposite to the first surface (the bottom surface of 15A contacting 14 in fig. 2) in the first direction (the direction X in Fig. 2, [0039]); and a metal oxide film (14 in Fig. 2, [0062], the material forming the first dielectric layer 14 can be metal oxides such as Al2O3, beryllium oxide, bismuth oxide, or tantalum oxide) is formed on a side surface of the reflective layer (the bottom surface of 15A contacting 14 in Fig. 2). Takeda (US 2019/0094436) does not explicitly point out that the protective layer covers both the plurality of projections and the transparent substrate. Sugawara teaches that (Fig. 1, [0081-0082]) a protective layer (20 in Fig. 1, [0081]) covers both the plurality of projections and the transparent substrate (Fig. 1, [0081]). Before the effective filling date of the claimed invention, it would have been obvious to the artisan of ordinary skill to employ the above elements as taught by Sugawara for the system of Takeda (US 2019/0094436) such that in the system of Takeda (US 2019/0094436), the protective layer that covers both the plurality of projections and the transparent substrate. The motivation is to suppress advancement of an oxidation reaction beyond the extent required (Sugawara, [0081]). Regarding claims 2-5 and 10, Takeda (US 2019/0094436) also teaches the following elements: (Claim 2) a first dielectric layer (14 in Fig. 2) between the first absorption layer (13 in fig. 2, [0111]) and the reflective layer (15A in fig. 2, [0113]). (Claim 3) a second dielectric layer (16A in Fig. 2) between the second absorption layer (17A in fig. 2, [0115]) and the reflective layer (15A in fig. 2, [0113]). (Claim 4) a base layer (the layer of 18 and 12 in Fig. 2) between the transparent substrate (10 in Fig. 2, [0039, 0040, 0048]) and the plurality of projections (the projections above 12 in Fig. 2, [0087]), wherein the base layer (the layer of 18 and 12 in Fig. 2) has a plurality of pedestals (12 in Fig. 2) that protrude toward (Fig. 2) the plurality of projections (the projections above 12 in Fig. 2, [0087]) and serve as pedestals (12 in Fig. 2) for the plurality of projections (the projections above 12 in Fig. 2, [0087]). (Claim 5) the transparent substrate (10 in Fig. 2, [0039, 0040, 0048]) is sapphire ([0048, 0018]). (Claim 10) a width of the reflective layer (15A in fig. 2, [0113]) in the first direction (the direction X in Fig. 2, [0039]) increases (Fig. 2, since the upper portions of 15A has an increased width from the top surface of 15A toward the bottom surface of 15A, the width of 15A increases from the top surface of 15A toward the bottom surface of 15A) from the second surface (the top surface of 15A contacting 16A in fig. 2) toward the first surface (the bottom surface of 15A contacting 14 in fig. 2) Regarding claim 6, Takeda (US 2019/0094436) teaches An optical device ([0002, 0028]) comprising: a polarizing plate (Fig. 2, [0002, 0039, 0087-0089, 0040-0085, 0107-0121]) comprising: a transparent substrate (10 in Fig. 2, [0039, 0040, 0048]); a plurality of projections (the projections above 12 in Fig. 2, [0087]) disposed on the transparent substrate (10 in Fig. 2, [0039, 0040, 0048]) and spaced apart from each other (Fig. 2) and periodically arranged in a first direction (the direction X in Fig. 2, [0039]) at a pitch shorter than a bandwidth to be used ([0039, 0076]); and a protective layer ([0022, 0074, 0081]) that covers a surface on a side of the projections ([0022, 0074, 0081]), wherein each projection of the plurality of projections (the projections above 12 in Fig. 2, [0087]) has a first absorption layer (13 in fig. 2, [0111]), a reflective layer (15A in fig. 2, [0113]), and a second absorption layer (17A in fig. 2, [0115]) in order from a side close to the transparent substrate (Fig. 2), a width of a first surface of the reflective layer (the width in the direction X of the bottom surface of 15A contacting 14 in fig. 2) on a side close to the transparent substrate (Fig. 2) in the first direction (the direction X in Fig. 2, [0039]) is wider (Fig. 2) than a width of a second surface of the reflective layer (the width in the direction X of the top surface of 15A contacting 16A in fig. 2) opposite to the first surface (the bottom surface of 15A contacting 14 in fig. 2) in the first direction (the direction X in Fig. 2, [0039]); and a metal oxide film (14 in Fig. 2, [0062], the material forming the first dielectric layer 14 can be metal oxides such as Al2O3, beryllium oxide, bismuth oxide, or tantalum oxide) is formed on a side surface of the reflective layer (the bottom surface of 15A contacting 14 in Fig. 2). Takeda (US 2019/0094436) does not explicitly point out that the protective layer covers both the plurality of projections and the transparent substrate. Sugawara teaches that (Fig. 1, [0081-0082]) a protective layer (20 in Fig. 1, [0081]) covers both the plurality of projections and the transparent substrate (Fig. 1, [0081]). Before the effective filling date of the claimed invention, it would have been obvious to the artisan of ordinary skill to employ the above elements as taught by Sugawara for the system of Takeda (US 2019/0094436) such that in the system of Takeda (US 2019/0094436), the protective layer that covers both the plurality of projections and the transparent substrate. The motivation is to suppress advancement of an oxidation reaction beyond the extent required (Sugawara, [0081]). Regarding claims 11-12, Takeda (US 2019/0094436) does not teach the following elements. Sugawara teaches the following elements (Fig. 1, [0042, 0096, 0114-0115, 0140]): (Claim 11) an antireflection layer (12 in Fig. 1, [0042, 0114, 0140]) on the transparent substrate (11 in Fig. 1). (Claim 12) the antireflection layer (12 in Fig. 1, [0042, 0114, 0140]) comprises a stack in which high refractive index layers and low refractive index layers are alternately laminated ([0140, 0114]). Before the effective filling date of the claimed invention, it would have been obvious to the artisan of ordinary skill to employ the above elements as taught by Sugawara for the system of Takeda (US 2019/0094436) in view of Sugawara such that in the system of Takeda (US 2019/0094436) in view of Sugawara, (Claim 11) an antireflection layer on the transparent substrate. (Claim 12) the antireflection layer comprises a stack in which high refractive index layers and low refractive index layers are alternately laminated. The motivation is to provide an antireflection action/function in a desired working wavelength bandwidth (Sugawara, [0114]). Claim 7 is rejected under 35 U.S.C. 103 as being unpatentable over Takeda (US 2019/0094436) in view of Takeda (US 2018/0180785). Regarding claim 7, Takeda (US 2019/0094436) teaches a method for manufacturing a polarizing plate (Fig. 1, [0076-0081, 0040]), the method comprising the steps of: laminating ([0078]) at least a first absorption layer, a reflective layer and a second absorption layer on a transparent substrate in order to form a laminated body ([0078]), forming ([0079-0080]) a plurality of projections (the projections corresponding to 11 in Fig. 1, [0040], each grid-shaped convex portion 11 includes a base 12 formed as necessary, a first absorption layer 13, a first dielectric layer 14, a reflection layer 15, a second dielectric layer 16, and a second absorption layer 17 in order from the side of the transparent substrate 10) spaced apart from each other (Fig. 1) and periodically arranged in a first direction (the direction X in Fig. 1) at a pitch shorter than a bandwidth ([0079, 0076, 0039]) to be used i) by forming a mask on an upper surface of the laminated body ([0079]) and ii) by etching through the mask ([0079-0080]), and forming ([0081, 0074]) a protective layer ([0081, 0074]) on the plurality of projections (the projections corresponding to 11 in Fig. 1, [0040]) formed by etching ([0079-0080]), Takeda (US 2019/0094436) teaches that the etching to form the plurality of projections includes an etching to form a base having a trapezoidal shape (12 in Fig. 1-2, [0080]). Takeda (US 2019/0094436) does not teach that a condition of etching is changed during the etching to form the plurality of projections. Takeda (US 2018/0180785) teaches that a condition of etching is changed during an etching to form a base (12 in Fig. 1-2 and 4, [0069]) having a trapezoidal shape (Fig. 1-2 and 4, [0069]) and included in each of a plurality of projections (Fig. 1-2 and 4). Before the effective filling date of the claimed invention, it would have been obvious to the artisan of ordinary skill to employ the above elements as taught by Takeda (US 2018/0180785) for the system of Takeda (US 2019/0094436) such that in the system of Takeda (US 2019/0094436), a condition of etching is changed during the etching to form the base having the trapezoidal shape; therefore, a condition of etching is changed during the etching to form the plurality of projections. The motivation is that reflection of light can be prevented, and high transmittance characteristics can be obtained (Takeda (US 2018/0180785), [0069]). Claim 8 is rejected under 35 U.S.C. 103 as being unpatentable over Takeda (US 2019/0094436) in view of Sugawara as applied to claim 1 above, and further in view of Sakakibara (US 2021/0302639). Regarding claim 8, Takeda (US 2019/0094436) does not teach the following elements. Sakakibara teaches the following elements (Fig. 1, 4 and 7, [0054-0058, 0082-0083]): (Claim 8) a surface of a protective layer ([0054-0055], The protective film is provided on the surface of the grid-shaped protrusions and the surface of the groove between the grid-shaped protrusions by forming a film of a dielectric portion and/or a water-repellent portion, among other portions) is coated with a water-repellent film ([0054-0058, 0082-0083]), and wherein the water-repellent film contains tridecafluorooctyltrichlorosilane ([0058]). Before the effective filling date of the claimed invention, it would have been obvious to the artisan of ordinary skill to employ the above elements as taught by Sakakibara for the system of Takeda (US 2019/0094436) in view of Sugawara such that in the system of Takeda (US 2019/0094436) in view of Sugawara, (Claim 8) an upper surface of the protective layer is coated with a water-repellent film, and wherein the water-repellent film contains tridecafluorooctyltrichlorosilane. The motivation is to provide a moisture-resistant effect or a water-repellent effect, thereby improving reliability (Sakakibara, [0055]). Claims 1 and 9 are rejected under 35 U.S.C. 103 as being unpatentable over Takeda (US 2019/0094436) in view of Takahashi (US 2013/0286358). Regarding claim 1, Takeda (US 2019/0094436) teaches a polarizing plate (Fig. 2, [0002, 0039, 0087-0089, 0040-0085, 0107-0121]) having a wire grid structure (Fig. 2), the polarizing plate comprising: a transparent substrate (10 in Fig. 2, [0039, 0040, 0048]); a plurality of projections (the projections above 12 in Fig. 2, [0087]) disposed on the transparent substrate (10 in Fig. 2, [0039, 0040, 0048]) and spaced apart from each other (Fig. 2) and periodically arranged in a first direction (the direction X in Fig. 2, [0039]) at a pitch shorter than a bandwidth to be used ([0039, 0076]); and a protective layer ([0022, 0074, 0081]) that covers a surface on a side of the projections ([0022, 0074, 0081]), wherein each projection of the plurality of projections (the projections above 12 in Fig. 2, [0087]) has a first absorption layer (13 in fig. 2, [0111]), a reflective layer (15A in fig. 2, [0113]), and a second absorption layer (17A in fig. 2, [0115]) in order from a side close to the transparent substrate (Fig. 2), a width of a first surface of the reflective layer (the width in the direction X of the bottom surface of 15A contacting 14 in fig. 2) on a side close to the transparent substrate (Fig. 2) in the first direction (the direction X in Fig. 2, [0039]) is wider (Fig. 2) than a width of a second surface of the reflective layer (the width in the direction X of the top surface of 15A contacting 16A in fig. 2) opposite to the first surface (the bottom surface of 15A contacting 14 in fig. 2) in the first direction (the direction X in Fig. 2, [0039]); and a metal oxide film (14 in Fig. 2, [0062], the material forming the first dielectric layer 14 can be metal oxides such as Al2O3, beryllium oxide, bismuth oxide, or tantalum oxide) is formed on a side surface of the reflective layer (the bottom surface of 15A contacting 14 in Fig. 2). Takeda (US 2019/0094436) does not explicitly point out that the protective layer covers both the plurality of projections and the transparent substrate. Takahashi teaches that (Fig. 31, [0121-0122, 0062]) a protective layer (Fig. 31, [0121]) covers both a plurality of projections (Fig. 31) and the transparent substrate (Fig. 31, [0062]). Before the effective filling date of the claimed invention, it would have been obvious to the artisan of ordinary skill to employ the above elements as taught by Takahashi for the system of Takeda (US 2019/0094436) such that in the system of Takeda (US 2019/0094436), the protective layer that covers both the plurality of projections and the transparent substrate. The motivation is to improve reliability such as moisture resistance (Takahashi, [0121]). Regarding claims 9, Takeda (US 2019/0094436) does not teach the following elements. Takahashi teaches the following elements (Fig. 31, [0121-0122, 0062]): (Claim 9) a thickness of the protective layer is 1 nm or more and 10 nm or less ([0121]). Before the effective filling date of the claimed invention, it would have been obvious to the artisan of ordinary skill to employ the above elements as taught by Takahashi for the system of Takeda (US 2019/0094436) in view of Takahashi such that in the system of Takeda (US 2019/0094436) in view of Takahashi, (Claim 9) a thickness of the protective layer is 1 nm or more and 10 nm or less. The motivation is to improve reliability such as moisture resistance (Takahashi, [0121]). Conclusion Applicant's amendment necessitated the new ground(s) of rejection presented in this Office action. Accordingly, THIS ACTION IS MADE FINAL. See MPEP § 706.07(a). Applicant is reminded of the extension of time policy as set forth in 37 CFR 1.136(a). A shortened statutory period for reply to this final action is set to expire THREE MONTHS from the mailing date of this action. In the event a first reply is filed within TWO MONTHS of the mailing date of this final action and the advisory action is not mailed until after the end of the THREE-MONTH shortened statutory period, then the shortened statutory period will expire on the date the advisory action is mailed, and any extension fee pursuant to 37 CFR 1.136(a) will be calculated from the mailing date of the advisory action. In no event, however, will the statutory period for reply expire later than SIX MONTHS from the date of this final action. Any inquiry concerning this communication or earlier communications from the examiner should be directed to SHAN LIU whose telephone number is (571)270-0383. The examiner can normally be reached on 9am-5pm EST M-F. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Jennifer Carruth can be reached on 571-272-9791. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of an application may be obtained from the Patent Application Information Retrieval (PAIR) system. Status information for published applications may be obtained from either Private PAIR or Public PAIR. Status information for unpublished applications is available through Private PAIR only. For more information about the PAIR system, see http://pair-direct.uspto.gov. Should you have questions on access to the Private PAIR system, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative or access to the automated information system, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /SHAN LIU/Primary Examiner, Art Unit 2871
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Prosecution Timeline

Mar 27, 2024
Application Filed
Mar 19, 2026
Non-Final Rejection mailed — §102, §103
Jun 18, 2026
Response Filed
Jul 15, 2026
Final Rejection mailed — §102, §103 (current)

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