Prosecution Insights
Last updated: April 19, 2026
Application No. 18/701,753

MAGNETIC SENSOR APPARATUS

Non-Final OA §102§103
Filed
Apr 16, 2024
Examiner
POTHEN, FEBA
Art Unit
2858
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Multidimension Technology Co. Ltd.
OA Round
1 (Non-Final)
81%
Grant Probability
Favorable
1-2
OA Rounds
2y 9m
To Grant
93%
With Interview

Examiner Intelligence

Grants 81% — above average
81%
Career Allow Rate
498 granted / 616 resolved
+12.8% vs TC avg
Moderate +12% lift
Without
With
+12.0%
Interview Lift
resolved cases with interview
Typical timeline
2y 9m
Avg Prosecution
45 currently pending
Career history
661
Total Applications
across all art units

Statute-Specific Performance

§101
2.4%
-37.6% vs TC avg
§103
52.5%
+12.5% vs TC avg
§102
24.6%
-15.4% vs TC avg
§112
17.0%
-23.0% vs TC avg
Black line = Tech Center average estimate • Based on career data from 616 resolved cases

Office Action

§102 §103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Priority Receipt is acknowledged of certified copies of papers required by 37 CFR 1.55. Information Disclosure Statement The information disclosure statement (IDS) submitted on 4/16/24 is in compliance with the provisions of 37 CFR 1.97. Accordingly, the information disclosure statement is being considered by the examiner. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1, 2, 6, 7 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Watanabe, JP 2015219058 Regarding claim 1, Watanabe discloses a magnetic sensor apparatus, comprising: a magnetic field generation portion, the magnetic field generation portion being used for generating a magnetic field (Fig. 9; conductor 10 produces a magnetic field); a magnetic sensor portion, the magnetic sensor portion being used for sensing the magnetic field generated by the magnetic field generation portion (Fig. 9; substrate 110 with sensors 101-103); and a signal processing portion, the signal processing portion being used for processing a magnetic field signal sensed by the magnetic sensor portion (Fig. 11; amplification circuits 142-146 senses the signals from magnetic sensors); wherein the magnetic sensor portion comprises a first magnetic sensor arranged at a first position (Fig. 9; sensor 101), a second magnetic sensor arranged at a second position (Fig. 9; sensor 103), and a third magnetic sensor arranged at a third position (Fig. 9; sensor 102), and magnetic fields generated by the magnetic field generation portion at the three different positions are different (Fig. 9;signals detected by the sensors at different positions relative to current conductor 10 and are therefore different); and the signal processing portion comprises a first differential circuit, a second differential circuit, and a third differential circuit (Fig. 11; amplification circuits 142, 144, 146), the first differential circuit generates a first difference between a first signal sensed and output by the first magnetic sensor and a second signal sensed and output by the second magnetic sensor (Fig. 11; amplification circuits 142 takes difference between magnetoelectric conversion elements 101 and 103), the second differential circuit generates a second difference between the second signal and a third signal sensed and output by the third magnetic sensor (Fig. 11; amplification circuits 144 takes difference between magnetoelectric conversion elements 103 and 102), and the third differential circuit generates a differential measurement signal on the basis of a difference between the first difference and the second difference (Fig. 11; amplification circuits 146 takes difference between 144 and 142 outputs). Regarding claim 2, Watanabe taches wherein the first position, the second position, and the third position are on the same horizontal line and are arranged at equal intervals (Fig. 9; sensors 101-103 are arranged on same line). Regarding claim 6, Watanabe discloses a magnetic sensor apparatus, comprising: a magnetic field generation portion, the magnetic field generation portion being used for generating a magnetic field (Fig. 1-4; conductor 10 ); a magnetic sensor portion, the magnetic sensor portion being used for sensing the magnetic field generated by the magnetic field generation portion (Fig. 1-4; sensors 101-104); and a signal processing portion, the signal processing portion being used for processing a magnetic field signal sensed by the magnetic sensor portion (Fig. 1-4; amplifiers 142-146); wherein the magnetic sensor portion comprises a first magnetic sensor arranged at a first position, a second magnetic sensor arranged at a second position, a third magnetic sensor arranged at a third position, and a fourth magnetic sensor arranged at a fourth position (Fig. 1-4; sensors 101-104); magnetic fields generated by the magnetic field generation portion at the four different positions are different (Fig. 1-4; as shown ); and the signal processing portion comprises a first differential circuit, a second differential circuit, and a third differential circuit (Fig. 1-4;142, 144, 146 ), the first differential circuit generates a first difference between a first signal sensed and output by the first magnetic sensor and a second signal sensed and output by the second magnetic sensor (Fig. 1-4; 142), the second differential circuit generates a second difference between a third signal sensed and output by the third magnetic sensor and a fourth signal sensed and output by the fourth magnetic sensor (Fig. 1-4; 144), and the third differential circuit generates a differential measurement signal on the basis of a difference between the first difference and the second difference (Fig. 1-4; 146); or, the first differential circuit generates a first difference between a first signal sensed and output by the first magnetic sensor and a third signal sensed and output by the third magnetic sensor (Fig. 1; any of the sensors can be an arbitraty 1st and 3rd sensor therefore amplifier 142 can be a first differential circuit), the second differential circuit generates a second difference between a second signal sensed and output by the second magnetic sensor and a fourth signal sensed and output by the fourth magnetic sensor (Fig. 1; amplifier 144 ), and the third differential circuit generates a differential measurement signal on the basis of a difference between the first difference and the second difference (Fig. 1; amplifier 146 receives outputs of 142 and 144). Regarding claim 7, Watanabe teaches wherein the first position, the second position, the third position, and the fourth position are on the same horizontal line and are arranged at equal intervals, or an interval between the first position and the third position is the same as an interval between the second position and the fourth position, and the interval between the first position and the third position is greater than an interval between the first position and the second position (Fig. 2; sensors 101-104 are arranged on same line). Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim 3, 8 is/are rejected under 35 U.S.C. 103 as being unpatentable over Watanabe, JP 2015219058 in view of Holmstrom, US 20080309327 Regarding claim 3, Watanabe is silent in wherein the magnetic sensor portion comprises a plurality of magnetic sensors, and sensing directions of the various magnetic sensors are parallel or anti-parallel. Holmstrom teaches wherein the magnetic sensor portion comprises a plurality of magnetic sensors, and sensing directions of the various magnetic sensors are parallel or anti-parallel (¶[0015] sensitivity of sensors are parallel or antiparallel). It would have been obvious to one of ordinary skill in the art before the filing date of the invention to incorporate the teaching of Holmstrom into Watanabe for the benefit of providing magnetic sensor units having high sensitivity to detect various magnetic fields. Regarding claim 8, Watanabe is silent in wherein the magnetic sensor portion comprises a plurality of magnetic sensors, and sensing directions of the various magnetic sensors are parallel or anti-parallel. Holmstrom teaches wherein the magnetic sensor portion comprises a plurality of magnetic sensors, and sensing directions of the various magnetic sensors are parallel or anti-parallel (¶[0015] sensitivity of sensors are parallel or antiparallel). It would have been obvious to one of ordinary skill in the art before the filing date of the invention to incorporate the teaching of Holmstrom into Watanabe for the benefit of providing magnetic sensor units having high sensitivity to detect various magnetic fields. Claim(s) 4, 5, 9, 10 is/are rejected under 35 U.S.C. 103 as being unpatentable over Watanabe, JP 2015219058 in view of Leisenheimer et al., US 20210055130 Regarding claim 4, Watanabe is silent in wherein the magnetic field generation portion comprises an energized wire or a permanent magnet for generating a regular magnetic field. Leisenheimer teaches herein the magnetic field generation portion comprises an energized wire or a permanent magnet for generating a regular magnetic field (¶[0020]; “magnetic field may be produced by a magnet….a wire”). It would have been obvious to one of ordinary skill in the art before the filing date of the invention to incorporate the teaching of Leisenheimer into Watanabe since the substitution of a wire or magnet would produce the predictable result of generating a magnetic field. Regarding claim 5, Watanabe is silent in wherein the magnetic sensor portion and the signal processing portion are integrated and packaged into an independent device; or the magnetic field generation portion, the magnetic sensor portion, and the signal processing portion are integrated and packaged into an independent device. Leisenheimer teaches wherein the magnetic sensor portion and the signal processing portion are integrated and packaged into an independent device; or the magnetic field generation portion, the magnetic sensor portion, and the signal processing portion are integrated and packaged into an independent device (Fig. 3a; sensor chip including signal processing circuitry and magnetic sensors 31-34). It would have been obvious to one of ordinary skill in the art before the filing date of the invention to incorporate the teaching of Leisenheimer into Watanabe for the benefit of integrating the components of the magnetic sensor so as to produce a compact sensor device. Regarding claim 9, Watanabe is silent in wherein the magnetic field generation portion comprises an energized wire or a permanent magnet for generating a regular magnetic field. Leisenheimer teaches herein the magnetic field generation portion comprises an energized wire or a permanent magnet for generating a regular magnetic field (¶[0020]; “magnetic field may be produced by a magnet….a wire”). It would have been obvious to one of ordinary skill in the art before the filing date of the invention to incorporate the teaching of Leisenheimer into Watanabe since the substitution of a wire or magnet would produce the predictable result of generating a magnetic field. Regarding claim 10, Watanabe is silent in wherein the magnetic sensor portion and the signal processing portion are integrated and packaged into an independent device; or the magnetic field generation portion, the magnetic sensor portion, and the signal processing portion are integrated and packaged into an independent device. Leisenheimer teaches wherein the magnetic sensor portion and the signal processing portion are integrated and packaged into an independent device; or the magnetic field generation portion, the magnetic sensor portion, and the signal processing portion are integrated and packaged into an independent device (Fig. 3a; sensor chip including signal processing circuitry and magnetic sensors 31-34). It would have been obvious to one of ordinary skill in the art before the filing date of the invention to incorporate the teaching of Leisenheimer into Watanabe for the benefit of integrating the components of the magnetic sensor so as to produce a compact sensor device. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to FEBA POTHEN whose telephone number is (571)272-9219. The examiner can normally be reached 8:30-5:00 PM. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Judy Nguyen can be reached on 571.272.2258. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /FEBA POTHEN/Examiner, Art Unit 2858
Read full office action

Prosecution Timeline

Apr 16, 2024
Application Filed
Dec 23, 2025
Non-Final Rejection — §102, §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
81%
Grant Probability
93%
With Interview (+12.0%)
2y 9m
Median Time to Grant
Low
PTA Risk
Based on 616 resolved cases by this examiner. Grant probability derived from career allow rate.

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