Prosecution Insights
Last updated: August 16, 2026
Application No. 18/711,450

SUBSTRATE TREATMENT APPARATUS AND GUARD DETERMINATION METHOD

Non-Final OA §102
Filed
May 17, 2024
Priority
Dec 01, 2021 — JP 2021-195739 +1 more
Examiner
PARIHAR, PRADHUMAN
Art Unit
1714
Tech Center
1700 — Chemical & Materials Engineering
Assignee
Screen Holdings Co., Ltd.
OA Round
1 (Non-Final)
56%
Grant Probability
Moderate
1-2
OA Rounds
10m
Est. Remaining
78%
With Interview

Examiner Intelligence

Grants 56% of resolved cases
56%
Career Allowance Rate
194 granted / 344 resolved
-8.6% vs TC avg
Strong +21% interview lift
Without
With
+21.3%
Interview Lift
resolved cases with interview
Typical timeline
3y 1m
Avg Prosecution
18 currently pending
Career history
362
Total Applications
across all art units

Statute-Specific Performance

§101
2.6%
-37.4% vs TC avg
§103
56.0%
+16.0% vs TC avg
§102
11.1%
-28.9% vs TC avg
§112
28.5%
-11.5% vs TC avg
Black line = Tech Center average estimate • Based on career data from 344 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restrictions Applicant’s election without traverse of claims 1-10 in the reply filed on 6/19/2026 is acknowledged. Claims 11-20 are withdrawn from further consideration pursuant to 37 CFR 1.142(b) as being drawn to a nonelected invention, there being no allowable generic or linking claim. Election was made without traverse in the reply filed on 6/19/2026. Priority Receipt is acknowledged of certified copies of papers required by 37 CFR 1.55. Information Disclosure Statement The information disclosure statement (IDS) submitted on 5/17/2024, 7/2/2024, 3/20/2025, and 6/16/2025 have been considered by the examiner. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1-2 and 8-9 are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Okita et al. (PG Pub U.S 2016/0091892). Regarding claim 1, Okita teaches a substrate treatment apparatus (abstract; fig 3) comprising: a substrate holder (10) that holds a substrate (para 0045); a liquid nozzle (30/33) that supplies a treatment liquid to said substrate held by said substrate holder (para 0049, 0051, and 0063); a guard (20/21/22) that has a cylindrical shape (seen from fig 3), surrounds said substrate holder (para 0048-0049), and receives said treatment liquid scattered from a peripheral edge of said substrate (para 0048-0049); a guard raising and lowering mechanism that raises and lowers said guard (para 0048); a camera (72) that is provided obliquely above said substrate holder (para 0052-0053 and figs 3) and captures an image of an image capturing region including said guard to generate a captured image (para 0052-0055 and 0058-0059); and a controller (80) that outputs a control signal for moving said guard to a predetermined height position to said guard raising and lowering mechanism (para 0048 and claims 1-6), and determines presence or absence of an abnormality related to a position or a shape of said guard based on said captured image (claims 1-6). Regarding claim 2, Okita teaches wherein said controller determines presence or absence of said abnormality based on a determination region including a part of said guard in said captured image (para 0052-0055 and 0058-0059). Regarding claim 8, Okita teaches wherein said controller determines that said guard is normal when similarity between said determination region and a normal reference image is equal to or greater than a threshold (para 0070-0076), and said threshold is set to be lower than a value of similarity between said determination region of said captured image captured when said guard is located at said predetermined height position and a droplet is attached to said guard and said reference image (para 0048, 0055, and 0070-0076). Regarding claim 9, Okita teaches a gas nozzle that supplies gas to said guard to blow off droplet attached to said guard (para 0044). Allowable Subject Matter The following is an examiner’s statement for reasons for the indication of allowable subject matter: The closest prior art of record is Okita et al. (PG Pub U.S 2016/0091892). Okita teaches the limitations of claims 1-2 as detailed above. Okita fails to teach wherein said determination region includes a first determination region and a second determination region, said first determination region and said second determination region are set on opposite sides to each other with respect to a minor axis of a virtual ellipse along an upper end peripheral edge portion of said guard in said captured image, and said controller determines that said guard is normal when temporarily determining that said guard is normal in both said first determination region and said second determination region as recited in claim 3. Okita fails to teach wherein said determination region includes at least a part of an upper end peripheral edge portion of said guard when said guard is located at said predetermined height position, and is set to a region not including said substrate as recited in claim 4. Okita fails to teach wherein said predetermined height position is a guard standby position where an upper end peripheral edge portion of said guard is lower than an upper surface of a spin base of said substrate holder facing a lower surface of said substrate in a vertical direction, and said determination region is set to a region including at least a part of a peripheral edge portion on a front side as viewed from said camera in said upper end peripheral edge portion of said guard when said guard is located at said predetermined height position as recited in claim 5. Okita fails to teach wherein said predetermined height position is a guard treatment position where an upper end peripheral edge portion of said guard is above an upper surface of said substrate held by said substrate holder, and said determination region is set to a region including a peripheral edge portion on a back side as viewed from said camera in the upper end peripheral edge portion of said guard when said guard is located at said predetermined height position as recited in claim 6. Okita teaches a gas nozzle that supplies gas to said guard to blow off droplet attached to said guard but fails to teach wherein said controller includes: a first step of determining that said guard is normal when similarity between said determination region and a normal reference image is equal to or greater than a second threshold higher than a first threshold; a second step of supplying gas to said gas nozzle toward a portion to be captured of said guard that appears in said determination region when said similarity is less than said second threshold and equal to or greater than said first threshold; a third step of causing said camera to capture said image capturing region and generate said captured image after said second step; and a fourth step of determining presence or absence of said abnormality based on said similarity between said determination region of said captured image generated in said third step and said reference image, said first threshold is set to be lower than a first value of similarity between said determination region of said captured image captured when said guard is located at said predetermined height position and a droplet is attached to said portion to be captured of said guard and said reference image, and said second threshold is set to be lower than a second value of similarity between said determination region of said captured image captured when said guard is located at said predetermined height position and no droplets are attached to said portion to be captured of said guard and said reference image, and to be higher than said first value as recited in claim 10. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to PRADHUMAN PARIHAR whose telephone number is (571)270-1633. The examiner can normally be reached Monday-Friday 10am-6pm EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Kaj Olsen can be reached on 571-272-1344. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /P.P/Examiner, Art Unit 1714 /KAJ K OLSEN/Supervisory Patent Examiner, Art Unit 1714
Read full office action

Prosecution Timeline

May 17, 2024
Application Filed
Jul 14, 2026
Non-Final Rejection mailed — §102 (current)

Precedent Cases

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
56%
Grant Probability
78%
With Interview (+21.3%)
3y 1m (~10m remaining)
Median Time to Grant
Low
PTA Risk
Based on 344 resolved cases by this examiner. Grant probability derived from career allowance rate.

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