Prosecution Insights
Last updated: October 02, 2026
Application No. 18/726,048

DAMAGE DETECTION DEVICE AND DAMAGE DETECTION METHOD

Non-Final OA §102§103
Filed
Jul 01, 2024
Priority
Jan 19, 2022 — RE 10-2022-0007664 +1 more
Examiner
NGUYEN, VINH P
Art Unit
2858
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
LG Electronics Inc.
OA Round
1 (Non-Final)
86%
Grant Probability
Favorable
1-2
OA Rounds
0m
Est. Remaining
99%
With Interview

Examiner Intelligence

Grants 86% — above average
86%
Career Allowance Rate
1193 granted / 1380 resolved
+18.4% vs TC avg
Strong +16% interview lift
Without
With
+16.1%
Interview Lift
resolved cases with interview
Typical timeline
2y 3m
Avg Prosecution
21 currently pending
Career history
1395
Total Applications
across all art units

Statute-Specific Performance

§101
3.3%
-36.7% vs TC avg
§103
32.5%
-7.5% vs TC avg
§102
11.8%
-28.2% vs TC avg
§112
43.1%
+3.1% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1380 resolved cases

Office Action

§102 §103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Objections Claims 1-9 are objected to because of the following informalities: In claims 1 and 9, there is no recited a device /method step using to detect damage, therefore, the scope of the claim is incomplete. The dependent claims not specifically addressed share the same objections as they depend from objected base claims. Appropriate correction is required. Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claims 1,3-5 and 8-9 are rejected under 35 U.S.C. 102 (a)(1) as being anticipated by Yoshida et al (KR20130074761). As to claim 1, Yoshida et al disclose an apparatus for detecting damage as shown in figures 1-2, comprising: an application module (110,120) applying a prescribed material to an object (200,10); and an electrical signal acquisition unit (130) acquiring an electrical signal by measuring impedance of the application module (110,120) of the object (200,10) based on applying the prescribed material to the object (200,10). As to claim 3, Yoshida et al disclose an apparatus for detecting damage as mentioned in claim 1 having a processor (140) configured to determine whether the object is damaged based on the acquired electrical signal. As to claim 4, Yoshida et al disclose an apparatus for detecting damage as mentioned in claims 1 and 3, wherein processor (140) is configured to acquire an electrical signal for a normal region of the object and determine a region in which an electrical signal different from the electrical signal for the normal region is acquired as a damaged region of the object (200,10). As to claim 5, Yoshida et al disclose an apparatus for detecting damage as mentioned in claim 1, wherein the prescribed material is a conductive liquid which is considered as an activated material. As to claim 8, Yoshida et al disclose an apparatus for detecting damage as mentioned in claims 1, However, Yoshida et al do not explicitly mention about wherein the object comprising: a conductor and an insulator surrounding at least a portion of the conductor. However, since the object (200) is a battery, it would have been well-known in the art that the battery would include an insulator surrounding at least a portion of the conductor. As to claim 9, the apparatus of Yoshida et al performs the method steps as recited in claim 9. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim 2 is rejected under 35 U.S.C. 103 as being unpatentable over Yoshida et al in view of Van Lammeren et al (Pat# 8,680,868) . As to claim 2, Yoshida et al disclose an apparatus for detecting damage as mentioned in claim 1 but do not disclose the electrical signal acquisition unit (130) comprising: a filter circuit filtering the electrical signal of the object; and a measurement circuit measuring the filtered electrical signal. Van Lammeren et al disclose an impedance measurement circuit for a battery cell as shown in figure 5 having a filter (low pass filter) and a measurement circuit (Amp/phase detector) for measuring the filtered electrical signal. It would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to provide a filter circuit and a measurement circuit as taught by Van Lammeren et al to the impedance measurement circuit (130) in the device of Yoshida et al for the purpose of filtering the detected noise signals from the battery before providing accurate measured signal. Claims 6-7 are rejected under 35 U.S.C. 103 as being unpatentable over Yoshida et al in view of Van Lammeren et al (Pat# 8,680,868) in view of Lagowski et al (Pat# 7,202,691). As to claim 6, Yoshida et al disclose an apparatus for detecting damage as mentioned in claim 1 but do not disclose a distance measurement sensor measuring a distance between the application module and the object; and a stage providing a space for having the object loaded therein. Lagowski et al disclose an inspection apparatus as shown in figure 1 having a stage (16) for supporting a device under test/object (12) and a distance measurement sensor (26) for measuring distance between a device under test /object (12) and application module (20) and the object (12). It would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to provide a stage and a distance measurement sensor as taught by Lagowski et al to the device of Van Lammeren et al for the purpose of adjusting the distance between the object and the application module in order to obtain accurate measurements of the object. As to claim 7, it appears that in the device of Van Lammeren et al in view of Lagowski et al, the stage moves with respect to the application module to maintain a constant distance between the application module and the object based on the measured distance. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Orozco et al (pat# 7,019,521) disclose Fault Isolation Of Circuit Defects Using Comparative Magnetic Field Imaging. Kim et al (pat# 11,726,120) disclose Insulation Resistance Inspection System For Battery Module Cell Pouch. Any inquiry concerning this communication or earlier communications from the examiner should be directed to VINH P NGUYEN whose telephone number is (571)272-1964. The examiner can normally be reached M-F 6:00am-4:00pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Phan Huy can be reached on 571-272-7924. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /VINH P NGUYEN/Primary Examiner, Art Unit 2858
Read full office action

Prosecution Timeline

Jul 01, 2024
Application Filed
Jul 07, 2026
Non-Final Rejection mailed — §102, §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
86%
Grant Probability
99%
With Interview (+16.1%)
2y 3m (~0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1380 resolved cases by this examiner. Grant probability derived from career allowance rate.

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