CTNF 18/729,203 CTNF 72318 STRAIN DETECTION DEVICE FIRST OFFICE ACTION DRAWINGS The drawings have been reviewed and are approved. TITLE The title is objected to because it is vague and not clearly descriptive of the claimed invention. A recommended title is “Strain Detection Device for Tire Strain Detection”. ABSTRACT The abstract has been reviewed and approved. SPECIFICATION 06-31 AIA The lengthy specification has not been checked to the extent necessary to determine the presence of all possible minor errors. The Applicant's cooperation is requested in correcting any errors of which the Applicant may become aware of in the specification. CLAIMS In the event that the determination of the status of the application as subject to AIA is incorrect, any correction of the statutory basis for the rejection will not be considered a new ground of rejection if the rationale supporting the rejection would be the same. 35 U.S.C. § 102 15-11-aia In accordance with 35 U.S.C. 102(a)(1), a person shall be entitled to a patent unless the claimed invention was patented, described in a printed publication, or in public use, on sale or otherwise available to the public before the effective filing date of the claimed invention. 07-15 AIA Claim s 1 - 5 are rejected under 35 U.S.C. 102( a)(1 ) as being anticipated by the Applicant’s cited prior art of Yamaguchi (2021/0370727) . With respect to independent claim 1, Yamaguchi sets forth a strain detection device comprising: a housing (20) bonded to an inner peripheral surface (10s) of a tire (10) via an elastic adhesive (B); a recess portion (space containing “B” in Fig. 1A) provided on an end surface of the housing facing the inner peripheral surface of the tire; a strain detection element (68 in Fig. 10B) that is disposed in a center part of the recess portion and detects strain of the tire via the elastic adhesive (B); and an elastic member (4; paragraph 39) disposed on an inner peripheral edge part of the recess portion and protruding toward the inner peripheral surface of the tire relative to the end surface of the housing (Fig. 5), wherein a space between a bottom surface of the recess portion and the inner peripheral surface of the tire inside the elastic member is filled with the elastic adhesive (B). With respect to claim 2, Yamaguchi sets forth that the elastic member (4) has an annular shape (Fig. 8), and the strain detection element (68) includes a semiconductor sensor (paragraph 68) for biaxial strain measurement that detects strain in two directions orthogonal to each other (paragraph 64), and is disposed at a center of the elastic member (Fig. 10B). With respect to claim 3, Yamaguchi sets forth that the elastic member (4) has a circular cross-sectional shape in a cross section (Fig. 10A). With respect to claim 4, Yamaguchi sets forth that an outer edge of the elastic member (4) is engaged with an inner peripheral wall (20d) of the recess portion (Fig. 10B). With respect to claim 5, Yamaguchi sets forth that the strain detection element includes: a support member (20c) having a flat plate shape supported by the bottom surface (20d) of the recess portion of the housing and facing the inner peripheral surface of the tire via the elastic adhesive, and a semiconductor (66) sensor provided on a surface of the support member opposite to a surface facing the inner peripheral surface of the tire (Fig. 10B). CITED DOCUMENTS The Applicant’s attention is directed to the “PTO-892” form for the relevant art made of record at the time of this Office Action. CONTACT INFORMATION Any inquiry concerning this communication from the Examiner should be directed to Eric S. McCall whose telephone number is 571-272-2183. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of an application may be obtained from Patent Center. Status information for published applications may be obtained from Patent Center. Status information for unpublished applications is available through Patent Center for authorized users only. For questions about access to Patent Center, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, the Applicant is advised to use the USPTO Automated Interview Request (AIR) Form at: https://www.uspto.gov/patents/uspto-automated- interview-request-air-form. /Eric S. McCall/Primary Examiner Art Unit 2855 Application/Control Number: 18/729,203 Page 2 Art Unit: 2855
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