Prosecution Insights
Last updated: April 19, 2026
Application No. 18/742,571

SYSTEM FOR SENSING CURRENT THROUGH A PASS FET

Non-Final OA §102
Filed
Jun 13, 2024
Examiner
NGUYEN, TUNG X
Art Unit
2858
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Nexperia B V
OA Round
1 (Non-Final)
88%
Grant Probability
Favorable
1-2
OA Rounds
2y 7m
To Grant
91%
With Interview

Examiner Intelligence

Grants 88% — above average
88%
Career Allow Rate
627 granted / 715 resolved
+19.7% vs TC avg
Minimal +3% lift
Without
With
+3.2%
Interview Lift
resolved cases with interview
Typical timeline
2y 7m
Avg Prosecution
47 currently pending
Career history
762
Total Applications
across all art units

Statute-Specific Performance

§101
2.1%
-37.9% vs TC avg
§103
48.9%
+8.9% vs TC avg
§102
40.9%
+0.9% vs TC avg
§112
3.7%
-36.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 715 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1, 10, 11 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Thiery (US 2004/0227539 A1 hereinafter Thiery). As to claim 1, Thiery discloses in Figs. 1-3, an electronic circuit for sensing a current through a pass Field-Effect Transistor (FET) (an electronic circuit for sensing the current through a power MOSFET 20 as shown in Fig. 1, equivalent to the claimed pass FET for current conduction, ¶ [0011]-[0012]), comprising: a first sense circuit configured to pass a first sense current (I_Sens) should there be a difference between a supply voltage (drain voltage) and a source voltage (source voltage) of the pass FET that is small (a saturated region sensing circuit 10 as shown in Fig. 2, passing I_Sens through sense cell 20B when V_DS difference is small/≤ ~3-4 V, ¶ [0012]-[0014]); a second sense circuit configured to pass a second sense current (I_DG) should the difference between the supply voltage (drain voltage) and the source voltage (source voltage) of the pass FET be large (a linear region sensing circuit 100 as shown in Fig. 3, passing I_1/I_2 mirrored and amplified as I_DG when V_DS difference is large/> ~3-4 V, ¶ [0015]-[0020]); wherein the first sense circuit comprises a first switch that is configured to turn off when the difference between the supply voltage and the source voltage of the pass FET is large and turn on when the difference between the supply voltage and the source voltage of the pass FET is small (wherein the saturated region sensing circuit 10 comprises a P-channel MOSFET 24 as shown in Fig. 2, controlled by amplifier 22 to turn off in large V_DS/linear region and turn on in small V_DS/saturated region, ¶ [0013]-[0014], [0021]); wherein the second sense circuit comprises a second switch that is configured to turn off when the difference between the supply voltage and the source voltage of the pass FET is small and turn on when the difference between the supply voltage and the source voltage of the pass FET is large (wherein the linear region sensing circuit 100 comprises a P-channel MOSFET 128 as shown in Fig. 3, controlled via amplifier 122 and current mirror to turn off in small V_DS/saturated region and turn on in large V_DS/linear region, ¶ [0017]-[0020], [0022]-[0023]); and wherein the first sense current and the second sense current are representative of the current through the pass FET (wherein I_Sens and I_DG are proportionally scaled from I_Load/I_DS via sense cell 20B, converted to voltage across R_DG, ¶ [0011], [0013], [0019]-[0020], [0023]). As to claim 10, Thiery discloses the electronic circuit according to claim 1 (as discussed above), wherein the pass FET is an NMOS pass FET (wherein the power MOSFET 20 is an N-channel MOSFET, as shown in Fig. 1 with source at ground potential and drain at higher supply, ¶ [0011]-[0012]). As to claim 11, Thiery discloses an electronic device comprising an electronic circuit according to claim 1 (an electronic device comprising an electronic circuit for sensing current in power supplies or load switches, as shown in Fig. 1 with load connected, ¶ [0002], [0011], [0023]).As to claim 11, Thiery discloses an electronic device comprising an electronic circuit according to claim 1 (circuit integrated into electronic devices such as power supplies or load switches, as shown in Fig. 1 with load connected, ¶ [0002], [0011], [0023]). Allowable Subject Matter Claims 2-9, 12-18 objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. As to claims 2-9, 12-18, the prior art does not disclose wherein the first sense FET has a gate that is connected to the charge pump; and wherein the first sense amplifier has a positive input that is connected to the source voltage (Vout), and wherein the first sense amplifier has an output that is connected to a gate of the switch for switching the first switch and enabling the first sense current to flow when the first switch is switched on, as recited in the claims 2-5; 12-18; and wherein the second sense FET has a gate that is connected to the charge pump; and wherein the second sense amplifier has a negative input that is connected to the supply voltage (Vcc) via a further resistor, and wherein the second sense amplifier has an output that is connected to a gate of the second switch for switching the second switch and enabling the second sense current to flow when the second switch is on, as recited in the claims 6-9, Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to TUNG X NGUYEN whose telephone number is (571)272-1967. The examiner can normally be reached 10:30am-6:30pm M-F. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Judy Nguyen can be reached at 571-272-2258. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /TUNG X NGUYEN/Primary Examiner, Art Unit 2858 1/9/26
Read full office action

Prosecution Timeline

Jun 13, 2024
Application Filed
Jan 09, 2026
Non-Final Rejection — §102 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
88%
Grant Probability
91%
With Interview (+3.2%)
2y 7m
Median Time to Grant
Low
PTA Risk
Based on 715 resolved cases by this examiner. Grant probability derived from career allow rate.

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