Prosecution Insights
Last updated: July 17, 2026
Application No. 18/750,325

SOURCE-DETECTOR SYNCHRONIZATION IN MULTIPLEXED SECONDARY ION MASS SPECTROMETRY

Non-Final OA §102
Filed
Jun 21, 2024
Priority
Feb 28, 2018 — provisional 62/636,220 +2 more
Examiner
MASKELL, MICHAEL P
Art Unit
Tech Center
Assignee
Ionpath Inc.
OA Round
1 (Non-Final)
86%
Grant Probability
Favorable
1-2
OA Rounds
1m
Est. Remaining
95%
With Interview

Examiner Intelligence

Grants 86% — above average
86%
Career Allowance Rate
931 granted / 1081 resolved
+26.1% vs TC avg
Moderate +9% lift
Without
With
+9.2%
Interview Lift
resolved cases with interview
Fast prosecutor
2y 2m
Avg Prosecution
14 currently pending
Career history
1088
Total Applications
across all art units

Statute-Specific Performance

§101
2.5%
-37.5% vs TC avg
§103
65.8%
+25.8% vs TC avg
§102
25.5%
-14.5% vs TC avg
§112
2.5%
-37.5% vs TC avg
Black line = Tech Center average estimate • Based on career data from 1081 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Bendall, et al (U.S. Patent Application Publication 2017/0178882 A1). Regarding claim 1, Bendall discloses a method comprising: Directing an ion beam (110) to a region of a sample (160) to liberate charged particles (130) from the region of the sample, wherein the directed ion beam is pulsed at a first repetition rate (paragraph 0047); Deflecting a first subset of the liberated charged particles from a first path to a second path different from the first path in response to a gate signal synchronized with the repetition rate of the pulsed ion beam (Fig. 2; paragraphs 0021 and 0051 – at the beginning of each time-of-flight cycle, pulsing electronics 260 applies a push-out voltage to push-out plate 230 and a pull-out voltage to grid 240, resulting in deflection of secondary ions into a detection path orthogonal to their original path); and Detecting the first subset of the liberated charged particles in a time of flight mass spectrometer to determine information about the sample (paragraphs 0051-0052), wherein the gate signal sets a common reference time for the TOF mass spectrometer for the first subset of charged particles liberated by each pulse of the ion beam (paragraph 0054 – the TOF-MS signal recording means is coordinated with the timing of pulsing electronics 260). Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to MICHAEL P MASKELL whose telephone number is (571)270-3210. The examiner can normally be reached M-F 10A-6P. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Georgia Epps can be reached at 571-272-2328. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /MICHAEL MASKELL/Primary Examiner, Art Unit 2878 13 June 2026
Read full office action

Prosecution Timeline

Jun 21, 2024
Application Filed
Jun 16, 2026
Non-Final Rejection mailed — §102 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12683139
SYSTEMS AND METHODS FOR CHARGE STATE ASSIGNMENT IN MASS SPECTROMETRY
3y 5m to grant Granted Jul 14, 2026
Patent 12674662
SYSTEM AND METHOD FOR ACQUIRING ALIGNMENT MEASUREMENTS OF STRUCTURES OF A BONDED SAMPLE
3y 9m to grant Granted Jul 07, 2026
Patent 12673218
Downstream Variable Thickness Energy Selection System for Charged Particle Therapy
3y 6m to grant Granted Jul 07, 2026
Patent 12671053
METHOD OF COMPENSATING FOR AN EFFECT OF ELECTRODE DISTORTION, ASSESSMENT SYSTEM
2y 6m to grant Granted Jun 30, 2026
Patent 12658419
METHODS AND APPARATUS FOR MSN MASS SPECTROMETRY
4y 0m to grant Granted Jun 16, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
86%
Grant Probability
95%
With Interview (+9.2%)
2y 2m (~1m remaining)
Median Time to Grant
Low
PTA Risk
Based on 1081 resolved cases by this examiner. Grant probability derived from career allowance rate.

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