Prosecution Insights
Last updated: April 19, 2026
Application No. 18/752,994

HALL SENSOR WITH MULTILEVEL PACKAGE SUBSTRATE

Non-Final OA §102
Filed
Jun 25, 2024
Examiner
RHODES-VIVOUR, TEMILADE S
Art Unit
2858
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Texas Instruments Incorporated
OA Round
1 (Non-Final)
88%
Grant Probability
Favorable
1-2
OA Rounds
2y 9m
To Grant
96%
With Interview

Examiner Intelligence

Grants 88% — above average
88%
Career Allow Rate
707 granted / 799 resolved
+20.5% vs TC avg
Moderate +8% lift
Without
With
+7.9%
Interview Lift
resolved cases with interview
Typical timeline
2y 9m
Avg Prosecution
18 currently pending
Career history
817
Total Applications
across all art units

Statute-Specific Performance

§101
1.0%
-39.0% vs TC avg
§103
46.8%
+6.8% vs TC avg
§102
44.9%
+4.9% vs TC avg
§112
6.1%
-33.9% vs TC avg
Black line = Tech Center average estimate • Based on career data from 799 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(2) the claimed invention was described in a patent issued under section 151, or in an application for patent published or deemed published under section 122(b), in which the patent or application, as the case may be, names another inventor and was effectively filed before the effective filing date of the claimed invention. Claim(s) 1-20 is/are rejected under 35 U.S.C. 102(a)(2) as being anticipated by Tiziani et al. (US PUB 2024/0329098), hereinafter Tiziani. With respect to claim 1, Tiziani discloses an electronic device, comprising: a multilevel package substrate (See figure 1J in view of paragraph [0005] of Tiziani) having a top level (See the surface shown in figure 1J of Tiziani comprising traces [100]) and a bottom level (See paragraph [0110] of Tiziani), the top level including a conductive U-shaped trace (See [182] in figure 2 of Tiziani), the bottom level including a conductive lead exposed along a side of the electronic device (See paragraph [0110] of Tiziani); a semiconductor die attached to the top level of the multilevel package substrate (See paragraph [0059] of Tiziani) and having a Hall sensor positioned above the U-shaped trace (See paragraph [0030] of Tiziani); and a package structure that encloses a portion of the semiconductor die and a portion of the U-shaped trace (See the abstract of Tiziani). With respect to claim 2, Tiziani discloses the electronic device of claim 1, further comprising a surface mount component with terminals soldered to pads of the top level of the multilevel package substrate (See paragraph [0079] in view of paragraph [0093] of Tiziani). With respect to claim 3, Tiziani discloses the electronic device of claim 1, wherein the bottom level includes conductive split pads spaced apart from the conductive lead (See paragraph [0110] of Tiziani) and exposed along the side of the electronic device (See paragraph [0110] in view of paragraph [0130] of Tiziani). With respect to claim 4, Tiziani discloses the electronic device of claim 1, wherein the conductive lead has an indent along the side of the electronic device (See indent [101] in figure 4 of Tiziani). With respect to claim 5, Tiziani discloses the electronic device of claim 1, wherein the conductive lead has a plated surface exposed along the side of the electronic device (See paragraphs [0063] and [0079] of Tiziani). With respect to claim 6, Tiziani discloses the electronic device of claim 1, wherein the package structure includes a magnetic material (See paragraphs [0098] and [0124] of Tiziani). With respect to claim 7, Tiziani discloses the electronic device of claim 6, wherein the multilevel package substrate includes a magnetic material (See paragraphs [0098] and [0124] of Tiziani). With respect to claim 8, Tiziani discloses the electronic device of claim 1, wherein the multilevel package substrate includes a magnetic material (See paragraphs [0098] and [0124] of Tiziani). With respect to claim 9, Tiziani discloses a system, comprising: a circuit board having a conductive trace (See paragraph [0030] of Tiziani); and an electronic device (See paragraph [0030] of Tiziani), comprising: a multilevel package substrate (See figure 1J in view of paragraph [0005] of Tiziani) having a top level (See the surface shown in figure 1J of Tiziani comprising traces [100]) and a bottom level (See paragraph [0110] of Tiziani), the top level including a conductive U-shaped trace (See [182] in figure 2 of Tiziani), the bottom level including a conductive lead exposed along a side of the electronic device (See paragraph [0110] of Tiziani) and attached to the conductive trace (See paragraph [0112] of Tiziani); a semiconductor die attached to the top level of the multilevel package substrate (See paragraph [0059] of Tiziani) and having a Hall sensor positioned above the U-shaped trace (See paragraph [0030] of Tiziani); and a package structure that encloses a portion of the semiconductor die and a portion of the U-shaped trace (See the abstract of Tiziani). With respect to claim 10, Tiziani discloses the system of claim 9, wherein the electronic device further comprises a surface mount component with terminals soldered to pads of the top level of the multilevel package substrate (See paragraph [0079] in view of paragraph [0093] of Tiziani). With respect to claim 11, Tiziani discloses the system of claim 9, wherein the bottom level includes conductive split pads spaced apart from the conductive lead (See paragraph [0110] of Tiziani) and exposed along the side of the electronic device (See paragraph [0110] of Tiziani). With respect to claim 12, Tiziani discloses the system of claim 9, wherein the package structure includes a magnetic material (See paragraphs [0098] and [0124] of Tiziani). With respect to claim 13, Tiziani discloses the system of claim 9, wherein the multilevel package substrate includes a magnetic material (See paragraphs [0098] and [0124] of Tiziani). With respect to claim 14, Tiziani discloses a method of fabricating an electronic device (See figure 1J in view of paragraph [0005] of Tiziani), the method comprising: forming a conductive U-shaped trace (See [182] in figure 2 of Tiziani) in a top level of a multilevel package substrate (See the surface shown in figure 1J of Tiziani comprising traces [100]); forming a conductive lead in a bottom level of the multilevel package substrate (See paragraph [0110] of Tiziani); attaching a semiconductor die to the top level of the multilevel package substrate (See paragraph [0059] of Tiziani) with a Hall sensor positioned above the U-shaped trace (See paragraph [0030] of Tiziani); and molding a package structure that encloses the U-shaped trace (See the abstract of Tiziani). With respect to claim 15, Tiziani discloses the method of claim 14, further comprising: forming pads in the top level of the multilevel package substrate (See paragraph [0079] in view of paragraph [0093] of Tiziani); and attaching a surface mount component to the top level of the multilevel package substrate with terminals soldered to the pads (See paragraph [0079] in view of paragraph [0093] of Tiziani). With respect to claim 16, Tiziani discloses the method of claim 14, further comprising forming raised studs on the top level of the multilevel package substrate (See paragraph [0116] of Tiziani). With respect to claim 17, Tiziani discloses the method of claim 14, comprising forming conductive split pads in the bottom level of the multilevel package substrate (See paragraph [0110] of Tiziani). With respect to claim 18, Tiziani discloses the method of claim 14, further comprising forming an indent in the conductive lead along the side of the electronic device (See indent [101] in figure 4 of Tiziani). With respect to claim 19, Tiziani discloses the method of claim 14, further comprising forming a plated surface on the conductive lead (See paragraphs [0063] and [0079] of Tiziani). With respect to claim 20, Tiziani discloses the method of claim 14, comprising incorporating a magnetic material in the multilevel package substrate or the package structure (See paragraphs [0098] and [0124] of Tiziani). Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. US PUB 2015/0179587 discloses a method for making semiconductor device for e.g. mobile phone, involves forming stress relief insulating layer over semiconductor die and encapsulant, and forming interconnect structure over stress relief insulating layer US PUB 2005/0218486 discloses an assembly for ball grid array packaged semiconductor device, has bond wires to couple bond pads formed on die and conducting land area formed on electrically conductive layer and to couple pad to conductive trace formed on conductive layer. . Any inquiry concerning this communication or earlier communications from the examiner should be directed to TEMILADE S RHODES-VIVOUR whose telephone number is (571)270-5814. The examiner can normally be reached M-F (flex schedule). Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Huy Phan can be reached at 571-272-7924. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /TEMILADE S RHODES-VIVOUR/Examiner, Art Unit 2858 /HUY Q PHAN/Supervisory Patent Examiner, Art Unit 2858
Read full office action

Prosecution Timeline

Jun 25, 2024
Application Filed
Nov 05, 2024
Response after Non-Final Action
Jan 23, 2026
Non-Final Rejection — §102 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12598961
SEMICONDUCTOR PACKAGE INCLUDING TEST PATTERN AND METHOD OF FABRICATING THE SAME
2y 5m to grant Granted Apr 07, 2026
Patent 12592698
Hand-held machine tool
2y 5m to grant Granted Mar 31, 2026
Patent 12591002
ANOMALY DETECTION AND PROTECTION
2y 5m to grant Granted Mar 31, 2026
Patent 12590822
METHOD AND DEVICE OF AMPLITUDE-PHASE INCONSISTENCY IN-SITU CORRECTION FOR THE MULTI-CHANNEL CAPACITIVE SENSOR
2y 5m to grant Granted Mar 31, 2026
Patent 12580458
DETERMINING RELIABILITY OF AN ELECTRICAL MACHINE
2y 5m to grant Granted Mar 17, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

AI Strategy Recommendation

Get an AI-powered prosecution strategy using examiner precedents, rejection analysis, and claim mapping.
Powered by AI — typically takes 5-10 seconds

Prosecution Projections

1-2
Expected OA Rounds
88%
Grant Probability
96%
With Interview (+7.9%)
2y 9m
Median Time to Grant
Low
PTA Risk
Based on 799 resolved cases by this examiner. Grant probability derived from career allow rate.

Sign in with your work email

Enter your email to receive a magic link. No password needed.

Personal email addresses (Gmail, Yahoo, etc.) are not accepted.

Free tier: 3 strategy analyses per month