Prosecution Insights
Last updated: April 19, 2026
Application No. 18/757,453

Multilayer Electrical Component

Non-Final OA §102
Filed
Jun 27, 2024
Examiner
MCFADDEN, MICHAEL P
Art Unit
2847
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Knowles (Uk) Ltd.
OA Round
1 (Non-Final)
86%
Grant Probability
Favorable
1-2
OA Rounds
2y 4m
To Grant
99%
With Interview

Examiner Intelligence

Grants 86% — above average
86%
Career Allow Rate
701 granted / 815 resolved
+18.0% vs TC avg
Strong +20% interview lift
Without
With
+20.4%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
25 currently pending
Career history
840
Total Applications
across all art units

Statute-Specific Performance

§101
0.4%
-39.6% vs TC avg
§103
54.9%
+14.9% vs TC avg
§102
33.2%
-6.8% vs TC avg
§112
6.7%
-33.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 815 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1-18 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by AN et al (US 2015/0170842). Regarding claim 1, AH discloses a multilayer electrical component (Fig. 1-7) comprising: a dielectric body (Fig. 4, 110); first and second conductive terminations (Fig. 4, 131/132) separated by the dielectric body (Fig. 4); a plurality of parallel plate electrodes (Fig. 4, 121-129) forming a stack of electrode layers, which are embedded in the dielectric body (Fig. 4), where one or more gaps in each of the respective parallel plate electrodes forms electrically isolated plate portions (Fig. 4); wherein the interaction between the electrically isolated plate portions of the parallel plate electrodes in adjacent electrode layers produces a piezoelectric effect (Fig. 4, this would inherently happen between adjacent metal sections), having a corresponding force (Fig. 4, this is an inherent trait of adjacent metal plates); wherein the gaps in the parallel plate electrodes are offset relative to a gap in a separate nearby associated parallel plate electrodes (Fig. 4, gap at 121 is offset from gap at 125), thereby resulting in the associated corresponding forces being directed away from a common boundary (Fig. 4). Regarding claim 2, AH further discloses that the corresponding force of the piezoelectric effect is a piezoelectric force (Fig. 4, this is an inherent trait of the structure). Regarding claim 3, AH further discloses that the corresponding force of the piezoelectric effect is an electrostrictive force (Fig. 4, this is an inherent trait of the structure). Regarding claim 4, AH further discloses that at least some of the plurality of parallel plate electrodes include a parallel plate electrode, which is coupled at a first end to the first conductive termination of the multilayer electrical component (Fig. 4, 121). Regarding claim 5, AH further discloses that at least some of the plurality of parallel plate electrodes include a parallel plate electrode, which is coupled at a second end to the second conductive termination of the multilayer electrical component (Fig. 4, 122). Regarding claim 6, AH further discloses that at least some of the plurality of parallel plate electrodes comprise a first electrostatically isolated plate portion connected to the first conductive termination (Fig. 4, 121) and a second electrostatically isolated plate portion (Fig. 4, 122) connected to the second conductive termination of the multilayer electrical component (Fig. 4). Regarding claim 7, AH further discloses that at least some of the plurality of parallel plate electrodes include a parallel plate electrode that is separate from either of the first conductive termination and the second conductive termination of the multilayer electrical component (Fig. 4, 123). Regarding claim 8, AH further discloses that associated parallel plate electrodes, include parallel plate electrodes that have ends that have similar connectivity relative to the first and second conductive terminations (Fig. 4, 125s). Regarding claim 9, AH further discloses that the plurality of parallel plate electrodes include: at least some parallel plate electrodes, which are coupled at a first end to the first conductive termination of the multilayer electrical component (Fig. 4, 125); and at least some parallel plate electrodes, which are coupled at a second end to the second conductive termination of the multilayer electrical component (Fig. 4, 126). Regarding claim 10, AH further discloses that the plate portions of adjacent parallel plate electrodes, which include both the parallel plate electrode, which is coupled at the first end to the first conductive termination of the multilayer electrical component (Fig. 4); and the parallel plate electrode, which is coupled at the second end to the second conductive termination of the multilayer electrical component; form a series of capacitors between the first conductive termination and the second conductive termination (Fig. 4, from 125 to 121 to 123 to 122 to 126). Regarding claim 11, AH further discloses that the plurality of parallel plate electrodes include: at least some parallel plate electrodes, which are respectively coupled at each of a first end and a second end to the first conductive termination and the second conductive termination of the multilayer electrical component (Fig. 4, 121/122); and at least some parallel plate electrodes, which are separate from either of the first conductive termination and the second conductive termination of the multilayer electrical component (Fig. 4, 123). Regarding claim 12, AH further discloses that an interaction between the plate portions of adjacent parallel plate electrodes, which include both the parallel plate electrode, which is respectively coupled at each of a first end and a second end to the first conductive termination and the second conductive termination of the multilayer electrical component; and the parallel plate electrode, which is separate from either of the first conductive termination and the second conductive termination of the multilayer electrical component; form a series of capacitors between the first conductive termination and the second conductive termination (Fig. 4, 121 to 123 to 122). Regarding claim 13, AH further discloses that the plate portions of each of the parallel plate electrodes capacitively interact with plate portions from an adjacent parallel plate electrode (Fig. 4), when the respective plate portions of the parallel plate electrode and the adjacent parallel plate electrode each have a surface that at least partially overlaps with one another (Fig. 4). Regarding claim 14, AH further discloses that at least some of the parallel plate electrodes includes multiple gaps (Fig. 4, next to 129). Regarding claim 15, AH discloses a multilayer electrical component (Fig. 1-7) comprising: a dielectric body (Fig. 4, 110); first and second conductive terminations (Fig. 4, 131/132) separated by the dielectric body (Fig. 4); a plurality of parallel plate electrodes (Fig. 4, 121-129) forming a stack of electrode layers (Fig. 4), which are embedded in the dielectric body (Fig. 4), where one or more gaps in each of the respective parallel plate electrodes forms electrically isolated plate portions (Fig. 4); wherein the interaction between the electrically isolated plate portions of the parallel plate electrodes in adjacent electrode layers produces a piezoelectric effect (Fig. 4, this is an inherent trait of the structure), having a corresponding force (Fig. 4, this is an inherent trait of the structure); wherein the plurality of parallel plate electrodes include a first set of associated parallel plate electrodes (Fig. 4, 121/125/127), which are each coupled at a first end to the first conductive termination of the multilayer electrical component (Fig. 4), and a second set of associated parallel plate electrodes (Fig. 4, 122/126/128), which are each coupled at a second end to the second conductive termination of the multilayer electrical component (Fig. 4); and wherein the gaps in a particular parallel plate electrode within a particular associated set are offset relative to the gaps in a separate nearby parallel plate electrode within the same particular associated set (Fig. 4, gaps at 121/125/127 are offset), thereby resulting in the associated corresponding forces being directed away from a common boundary (Fig. 4). Regarding claim 16, AH further discloses that the parallel plate electrodes of at least one of the first set of associated parallel plate electrodes and the second set of associated parallel plate electrodes includes multiple gaps (Fig. 4, around 129). Regarding claim 17, AH discloses a multilayer electrical component (Fig. 1-7) comprising: a dielectric body (Fig. 4, 110); first and second conductive terminations (Fig. 4, 131/132) separated by the dielectric body (Fig. 4); a plurality of parallel plate electrodes (Fig. 4, 121-129) forming a stack of electrode layers (Fig. 4), which are embedded in the dielectric body (Fig. 4), where one or more gaps in each of the respective parallel plate electrodes forms electrically isolated plate portions (Fig. 4); wherein the interaction between the electrically isolated plate portions of the parallel plate electrodes in adjacent electrode layers produces a piezoelectric effect (Fig. 4, this is an inherent trait of the structure), having a corresponding force (Fig. 4, this is an inherent trait of the structure); wherein the plurality of parallel plate electrodes include a first set of associated parallel plate electrodes (Fig. 4, 121/122), which are respectively coupled at each of a first end and a second end to the first conductive termination and the second conductive termination of the multilayer electrical component (Fig. 4), and a second set of associated parallel plate electrodes (Fig. 4, 123), which are separate from either of the first conductive termination and the second conductive termination of the multilayer electrical component (Fig. 4); and wherein the gaps in a particular parallel plate electrode within a particular associated set are offset relative to the gaps in a separate nearby parallel plate electrode within the same particular associated set (Fig. 4, gaps next to 121 and 125 are offset), thereby resulting in the associated corresponding forces being directed away from a common boundary (Fig. 4). Regarding claim 18, AH further discloses that the parallel plate electrodes of at least one of the first set of associated parallel plate electrodes and the second set of associated parallel plate electrodes includes multiple gaps (Fig. 4, next to 129). Additional Relevant Prior Art: HATTORI (US 2015/0325371) teaches relevant art in Fig. 1-17. TOGASHI et al (US 2010/00278189) teaches relevant art in Fig. 1-8. Togashi et al (US 2006/0279903) teaches relevant art in Fig. 3-4. SEO (US 2014/0293500) teaches relevant art in Fig. 2. Ritter et al (US 2017/0162335) teaches relevant art in Fig. 1-4B. LEE et al (US 2019/0148068) teaches relevant art in Fig. 4-14. LEE et al (US 2019/0148073) teaches relevant art in Fig. 4-14. Ahn et al (US 2024/0055186) teaches relevant art in Fig. 1-4. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to MICHAEL P MCFADDEN whose telephone number is (571)270-5649. The examiner can normally be reached M-Thur 8am-9pm PST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Timothy Dole can be reached at (571) 272-2229. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /MICHAEL P MCFADDEN/ Primary Examiner, Art Unit 2848
Read full office action

Prosecution Timeline

Jun 27, 2024
Application Filed
Feb 24, 2026
Non-Final Rejection — §102 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
86%
Grant Probability
99%
With Interview (+20.4%)
2y 4m
Median Time to Grant
Low
PTA Risk
Based on 815 resolved cases by this examiner. Grant probability derived from career allow rate.

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