Prosecution Insights
Last updated: October 25, 2026
Application No. 18/760,451

POWER SEMICONDUCTOR INTEGRATED UNIT AND POWER CONVERTER CIRCUIT STRUCTURE THEREOF, AND LOOP STRUCTURE WITH INTEGRATED UNITS CONNECTED IN PARALLEL

Non-Final OA
Filed
Jul 01, 2024
Priority
Jun 29, 2023 — CN 202310787722.5 +1 more
Examiner
CHIU, TSZ K
Art Unit
2898
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Cambridge Integration Ltd.
OA Round
1 (Non-Final)
79%
Grant Probability
Favorable
1-2
OA Rounds
1y 0m
Est. Remaining
90%
With Interview

Examiner Intelligence

Grants 79% — above average
79%
Career Allowance Rate
548 granted / 691 resolved
+11.3% vs TC avg
Moderate +11% lift
Without
With
+11.0%
Interview Lift
resolved cases with interview
Typical timeline
3y 4m
Avg Prosecution
30 currently pending
Career history
736
Total Applications
across all art units

Statute-Specific Performance

§101
0.7%
-39.3% vs TC avg
§103
49.6%
+9.6% vs TC avg
§102
33.8%
-6.2% vs TC avg
§112
8.8%
-31.2% vs TC avg
Black line = Tech Center average estimate • Based on career data from 691 resolved cases

Prosecution Timeline

Jul 01, 2024
Application Filed
Aug 20, 2026
Non-Final Rejection mailed (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12757780
SEMICONDUCTOR PACKAGE WITH STACKED DIES AND THERMAL SUBSTRATE ENCAPSULATION
4y 4m to grant Granted Oct 06, 2026
Patent 12757703
STAIRCASE STRUCTURES FOR ACCESSING THREE-DIMENSIONAL MEMORY ARRAYS
4y 2m to grant Granted Oct 06, 2026
Patent 12733220
NANOSHEET TRANSISTOR DEVICE WITH BOTTOM ISOLATION
4y 2m to grant Granted Sep 08, 2026
Patent 12708027
MULTILAYER ENCAPSULATION FOR HUMIDITY ROBUSTNESS AND HIGHLY ACCELERATED STRESS TESTS AND RELATED FABRICATION METHODS
4y 6m to grant Granted Aug 11, 2026
Patent 12707636
MANUFACTURING METHOD OF A SEMICONDUCTOR MEMORY DEVICE
3y 10m to grant Granted Aug 11, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
79%
Grant Probability
90%
With Interview (+11.0%)
3y 4m (~1y 0m remaining)
Median Time to Grant
Low
PTA Risk
Based on 691 resolved cases by this examiner. Grant probability derived from career allowance rate.

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