Office Action Predictor
Last updated: April 16, 2026
Application No. 18/760,570

RTT TRIM METHOD

Non-Final OA §103
Filed
Jul 01, 2024
Examiner
HAWKINS, DOMINIC E
Art Unit
2858
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Micron Technology, INC.
OA Round
1 (Non-Final)
87%
Grant Probability
Favorable
1-2
OA Rounds
2y 2m
To Grant
93%
With Interview

Examiner Intelligence

Grants 87% — above average
87%
Career Allow Rate
625 granted / 720 resolved
+18.8% vs TC avg
Moderate +6% lift
Without
With
+6.5%
Interview Lift
resolved cases with interview
Typical timeline
2y 2m
Avg Prosecution
28 currently pending
Career history
748
Total Applications
across all art units

Statute-Specific Performance

§101
1.5%
-38.5% vs TC avg
§103
59.2%
+19.2% vs TC avg
§102
25.4%
-14.6% vs TC avg
§112
10.6%
-29.4% vs TC avg
Black line = Tech Center average estimate • Based on career data from 720 resolved cases

Office Action

§103
Detailed Action The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claims 1-20 of U.S. Application 18/760,570 filed on July 01, 2024 are presented for examination. Information Disclosure Statement The information disclosure statement (IDS) submitted on 11/06/2024 has been considered by the examiner. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102 of this title, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. Claims 1-20 are rejected under 35 U.S.C. 103 as being unpatentable over Kim et al (USPGPub 20230142493) in view of Lee et al (USPGPub 20210327476). PNG media_image1.png 489 466 media_image1.png Greyscale Prior Art: Kim Regarding claim 1, Kim discloses an apparatus (figs 1-13), comprising: a first external pin (such as 150) communicatively coupled to a first circuit (first output driver as disclosed in claim 8); a second external pin (not fully shown but disclose in claim 14 as second signal pin) communicatively coupled to a second circuit (second output driver); and a calibration circuit (220)configured to: generate a first calibration signal (from 220) comprising a first ZQ code (CODE1) for calibrating a first termination resistance of the first circuit (par 47 & 49 discloses providing termination resistance of pin 240); and generate a second calibration signal comprising (from 220) a second ZQ code (CODE2), , and wherein the second calibration signal is for calibrating a second termination resistance of the second circuit (claim 14 discloses for a second termination resistance of the second signal pin). Kim does not fully disclose wherein the second ZQ code is generated via a logic circuit by using the first ZQ code. However, Lee discloses wherein the second ZQ code is generated via a logic circuit (from a latch command) by using the first ZQ code (claim 2 discloses using ZQ calibration that response from the first ZQ to produce second ZQ from a latch command).It would have been obvious to one of ordinary skill in art before the effective filing date of the claimed invention to combine Kim in view of Lee in order to compare different signals to accurately calibrate memory devices. Regarding claim 2, Kim discloses wherein the first circuit comprises one of a pull-up driver (410) and a pull-down driver (420) having the first termination resistance and the other of the pull-up driver and the pull-down driver having a third termination resistance, and wherein the calibration circuit is configured to generate a third calibration signal comprising a third ZQ code for calibrating the third termination resistance (pars 46 and 48 discloses pull up and pull down using CODE3 may be generated by performing the pull-up calibration and fourth code CODE4 may be performed the pull-down calibration). Regarding claim 3, Kim discloses wherein the second circuit comprises a termination driver having the second termination resistance (claim 14 discloses a second ZQ calibration circuit connected to the ZQ pin and configured to perform calibration using external resistor and control second termination resistor). Regarding claim 4, Kim discloses wherein the calibration circuit is in a memory chip and configured to generate the first calibration signal based on a precision resistor arranged outside of the memory chip (par 91 discloses DRAM or Flash and an external resistor connected to the ZQ pin and perform ZQ calibration using external resistor). Regarding claim 5, Kim discloses wherein the logic circuit comprises adder/subtractor circuitry (par 89 discloses addition and subtraction operations. Therefore, the logic circuitry would incorporate these operations). Regarding claim 6, Kim does not fully disclose wherein the first ZQ code is different from the second ZQ code by an integer number. However, Lee discloses wherein the first ZQ code is different from the second ZQ code by an integer number (claim 2 discloses ZQUF when the second ZQ code is different than the first ZQ code). It would have been obvious to one of ordinary skill in art before the effective filing date of the claimed invention to combine Kim in view of Lee in order to use updating values based off memory. Regarding claim 7, Kim does not fully disclose wherein the calibration circuit is configured to generate the second calibration signal based on characteristics associated with the second circuit. However, Lee discloses wherein the calibration circuit is configured to generate the second calibration signal based on characteristics associated with the second circuit (claim 14 discloses second ZQ calibration circuit connected to ZQ pin to perform calibration). It would have been obvious to one of ordinary skill in art before the effective filing date of the claimed invention to combine Kim in view of Lee in order to compare different signals to accurately calibrate memory devices. Regarding claim 8, Kim does not fully disclose wherein the calibration circuit is configured to generate the first calibration signal and the second calibration signal within a threshold time period. However, Lee discloses the calibration circuit is configured to generate the first calibration signal and the second calibration signal within a threshold time period (claim 9 discloses the memory device receiving the second ZQ latch command after a predetermined time command). It would have been obvious to one of ordinary skill in art before the effective filing date of the claimed invention to combine Kim in view of Lee in order to determine calibration of the memory controller (Lee par 58). Regarding claim 9, Kim discloses a method, comprising: generating a first calibration signal (from 220) comprising a first ZQ code (CODE1) for calibrating a first termination resistance of a first circuit (first output driver as disclosed in claim 8) communicatively coupled to a first external pin (such as 150); and generating a second calibration signal (from 220) comprising a second ZQ code (CODE2), wherein the second ZQ code is generated via a logic circuit by using the first ZQ code, and wherein the second calibration signal (from 220) is for calibrating a second termination resistance (par 47 & 49 discloses providing termination resistance of pin 240) of a second circuit (second output driver) communicatively coupled to a second external pin (not fully shown but disclose in claim 14 as second signal pin). Kim does not fully disclose wherein the second ZQ code is generated via a logic circuit by using the first ZQ code. However, Lee discloses wherein the second ZQ code is generated via a logic circuit (from a latch command) by using the first ZQ code (claim 2 discloses using ZQ calibration that response from the first ZQ to produce second ZQ from a latch command). It would have been obvious to one of ordinary skill in art before the effective filing date of the claimed invention to combine Kim in view of Lee in order to compare different signals to accurately calibrate memory devices. Regarding claim 10, Kim discloses comprising: generating a third calibration signal comprising a third ZQ code (CODE3) for calibrating a third termination resistance, wherein the first circuit comprises one of a pull-up driver (410) and a pull-down driver (420) having the first termination resistance and the other of the pull-up driver and the pull-down driver having the third termination resistance. Regarding claim 11, Kim discloses comprising: wherein the second circuit comprises a termination driver having the second termination resistance (claim 14 discloses a second ZQ calibration circuit connected to the ZQ pin and configured to perform calibration using external resistor and control second termination resistor). Regarding claim 12, Kim discloses comprising: wherein generating the first calibration signal comprises generating the first calibration signal based on a precision resistor (par 91 discloses DRAM or Flash and an external resistor connected to the ZQ pin and perform ZQ calibration using external resistor). Regarding claim 13, Kim discloses comprising: wherein the logic circuit comprises adder/subtractor circuitry (par 89 discloses addition and subtraction operations. Therefore, the logic circuitry would incorporate these operations). Regarding claim 14, Kim does not fully disclose wherein the first ZQ code is different from the second ZQ code by an integer number. However, Lee discloses wherein the first ZQ code is different from the second ZQ code by an integer number (claim 2 discloses ZQUF when the second ZQ code is different than the first ZQ code). It would have been obvious to one of ordinary skill in art before the effective filing date of the claimed invention to combine Kim in view of Lee in order to use updating values based off memory. Regarding claim 15, Kim discloses comprising: wherein generating the second calibration signal comprises generating the second calibration signal based on characteristics associated with the second circuit (claim 14 discloses second ZQ calibration circuit connected to ZQ pin to perform calibration). It would have been obvious to one of ordinary skill in art before the effective filing date of the claimed invention to combine Kim in view of Lee in order to compare different signals to accurately calibrate memory devices. Regarding claim 16, Kim discloses an apparatus (figs 1-13), comprising: a first external pin (such as 150); a second external pin (not fully shown but disclose in claim 14 as second signal pin); a first circuit (first output driver as disclosed in claim 8) coupled to the first external pin, the first circuit including a pull-up driver (410) and a pull-down driver (420); a termination driver coupled between the second external pin and a voltage node (VDDQ); and a ZQ circuit (220) configured to generate a first calibration signal comprising a first ZQ code (CODE1) for calibrating a first termination resistance of the pull-up driver of the first circuit, a second calibration signal comprising a second ZQ code (CODE2) for calibrating a second termination resistance of the pull-down driver of the first circuit (par 47 & 49 discloses providing termination resistance of pin 240) and a third calibration signal comprising a third ZQ code (CODE3) for calibrating a third termination resistance of the termination driver(pars 46 and 48 discloses pull up and pull down using CODE3 may be generated by performing the pull-up calibration and fourth code CODE4 may be performed the pull-down calibration), the third ZQ code being generated based on one of the first ZQ code and the second ZQ code (claim 16 discloses ZQ which is a second calibration circuit is a replica from the first. Therefore, CODE3 is based on at least the first CODE1). Regarding claim 17, Kim discloses comprising: wherein the voltage node is supplied with a lower voltage and the third ZQ code is generated based on the second ZQ code (par 43 discloses being about .3V-.5V and par 72 discloses the ZQ and vef voltage can be adjusted based on counter 914. The counter 914 may be provided as CODE3 of 915. Therefore, the CODE3 may be based on the second ZQ code). Regarding claim 18, Kim discloses comprising: wherein the voltage node is supplied with an upper voltage and the third ZQ code is generated based on the first ZQ code (par 43 discloses being about .3V-.5V and fig 7 discloses being a replica device. Therefore, the third ZQ is based on the first ZQ code). Regarding claim 19, Kim discloses comprising: wherein the third ZQ code is generated by a logic circuit comprising adder/subtractor circuitry (par 89 discloses addition and subtraction operations. Therefore, the logic circuitry would incorporate these operations). Regarding claim 20, Kim discloses comprising: wherein the logic circuit is configured to generate the third ZQ code based on characteristics associated with the termination driver (shown in fig 7 as the control circuitry generates CODE3). Prior Art The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Li et al (USPGPub 20230326497): discloses calibration circuit with code generator. Kang et al (USPGPb 20210099172): discloses semiconductor with calibration circuit and Zcodes. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to DOMINIC E HAWKINS whose telephone number is (571)272-2647. The examiner can normally be reached Monday-Friday 7:30am-5:00pm EST. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Judy Nguyen can be reached at (571) 272-2258. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /DOMINIC E HAWKINS/Primary Examiner, Art Unit 2858
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Prosecution Timeline

Jul 01, 2024
Application Filed
Feb 19, 2026
Non-Final Rejection — §103
Apr 06, 2026
Response Filed

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
87%
Grant Probability
93%
With Interview (+6.5%)
2y 2m
Median Time to Grant
Low
PTA Risk
Based on 720 resolved cases by this examiner. Grant probability derived from career allow rate.

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