Prosecution Insights
Last updated: October 04, 2026
Application No. 18/782,171

Microscopy system and method for processing a microscope image

Non-Final OA §103
Filed
Jul 24, 2024
Priority
Jul 26, 2023 — DE 10 2023 119 850.5
Examiner
BOYLAN, JAMES T
Art Unit
2486
Tech Center
2400 — Computer Networks
Assignee
Carl Zeiss Microscopy GmbH
OA Round
3 (Non-Final)
63%
Grant Probability
Moderate
3-4
OA Rounds
7m
Est. Remaining
74%
With Interview

Examiner Intelligence

Grants 63% of resolved cases
63%
Career Allowance Rate
314 granted / 497 resolved
+5.2% vs TC avg
Moderate +11% lift
Without
With
+10.7%
Interview Lift
resolved cases with interview
Typical timeline
2y 9m
Avg Prosecution
36 currently pending
Career history
548
Total Applications
across all art units

Statute-Specific Performance

§101
2.7%
-37.3% vs TC avg
§103
55.5%
+15.5% vs TC avg
§102
11.0%
-29.0% vs TC avg
§112
21.9%
-18.1% vs TC avg
Black line = Tech Center average estimate • Based on career data from 497 resolved cases

Office Action

§103
DETAILED ACTION Response to Arguments Applicant’s arguments, see application, filed 07/24/2026, with respect to the 112 rejections have been fully considered and are persuasive. The 112 rejections have been withdrawn. Applicant’s arguments with respect to claims 16-20 have been considered but are moot because the new ground of rejection does not rely on any reference applied in the prior rejection of record for any teaching or matter specifically challenged in the argument. Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Priority Receipt is acknowledged of certified copies of papers required by 37 CFR 1.55. Continued Examination Under 37 CFR 1.114 A request for continued examination under 37 CFR 1.114, including the fee set forth in 37 CFR 1.17(e), was filed in this application after final rejection. Since this application is eligible for continued examination under 37 CFR 1.114, and the fee set forth in 37 CFR 1.17(e) has been timely paid, the finality of the previous Office action has been withdrawn pursuant to 37 CFR 1.114. Applicant's submission filed on 07/24/2026 has been entered. Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 16 and 18-20 are rejected under 35 U.S.C. 103 as being unpatentable over Zhou et al. (herein after will be referred to as Zhou) (US 20210035338) in view of Amthor et al. (herein after will be referred to as Amthor) (US 20210356729). Regarding claim 16, Zhou discloses a computer-implemented method for image processing a source image, comprising: [See Zhou [Figs. 9-10]] downscaling the source image to create a downscaled source image; [See Zhou [Fig. 9]] Downsample input image to create a refined image.] inputting the downscaled source image into a first image-to-image model, which outputs a result image that differs in an image property from the downscaled source image; and [See Zhou [Fig. 9] Downsampled input image is input into a first deep image-to-image network. Also, see fig. 10, input image is input into first deep image-to-image network (1010). Also, see 0070, the input image has distortions such as artifacts, blurring, noise, quality, etc., and 0076, improve image quality such as removing artifacts, denoising, super-resolution, etc. Therefore, refined image has better quality (i.e. claimed image property).] inputting the source image together with the result image into a second image-to-image model for calculating an output image which has a higher image resolution than the result image and resembles the result image in the image property. [See Zhou [Fig. 10 and 0069] Input image and refined image are input in second deep image-to-image network (1030). Also, see 0070, the input image has distortions such as artifacts, blurring, noise, quality, etc., and 0076, improve image quality such as removing artifacts, denoising, super-resolution, etc. Therefore, output image has greater resolution than refined image and has better quality (i.e. claimed image property) which resembles the refined image.] Zhou does not explicitly disclose providing training data which comprises a plurality of training source images and associated target images, and wherein the training source images and the target images differ in an image property; calculating downscaled training source images from a plurality of the training source images, and calculating downscaled target images from the associated target images; and training the first image-to-image model with downscaled training source images as inputs and downscaled target images as targets. However, Amthor does disclose providing training data which comprises a plurality of training source images and associated target images, and wherein the training source images and the target images differ in an image property; calculating downscaled training source images from a plurality of the training source images, and calculating downscaled target images from the associated target images; and training the first image-to-image model with downscaled training source images as inputs and downscaled target images as targets. [See Amthor [0023] The machine learning algorithm is trained by way of supervised learning wherein use is made of microscope images as input images and target images spatially registered to the microscope images.] It would have been obvious to the person of ordinary skill in the art at the time of the effective filing date to modify the method by Zhou to add the teachings of Amthor, in order to perform a simple substitution of medical images to microscopic images and/or a simple substitution of how the machine learning is trained (i.e. utilizing supervised learning, where the benefits of supervised learning is obvious to one of ordinary skill in the art). Regarding claim 18, Zhou (modified by Amthor) disclose the method of claim 16. Furthermore, Zhou does not explicitly disclose wherein a training of the second image-to-image model, an input into the second image-to-image model comprises: A) one of the training source images, as well as simultaneously: B) a downscaled target image associated with the training source image, or a result image calculated from the training source image by the first image-to-image model, or a processed image based on the downscaled target image and/or on the result image calculated from the training source image; wherein the method further includes using the target image associated with said training source image as a target in the training of the second image-to-image model. However, Amthor does disclose wherein a training of the second image-to-image model, an input into the second image-to-image model comprises: A) one of the training source images, as well as simultaneously: B) a downscaled target image associated with the training source image, or a result image calculated from the training source image by the first image-to-image model, or a processed image based on the downscaled target image and/or on the result image calculated from the training source image; wherein the method further includes using the target image associated with said training source image as a target in the training of the second image-to-image model. [See Amthor [0023] The machine learning algorithm is trained by way of supervised learning wherein use is made of microscope images as input images and target images spatially registered to the microscope images.] Applying the same motivation as applied in claim 16. Regarding claim 19, Zhou (modified by Amthor) disclose the method of claim 16. Furthermore, Zhou does not explicitly disclose wherein the source image is a microscopic image. However, Zhou does disclose wherein the source image is a microscopic image. [See Amthor [0023] The machine learning algorithm is trained by way of supervised learning wherein use is made of microscope images as input images and target images spatially registered to the microscope images.] Applying the same motivation as applied in claim 16. Regarding claim 20, see examiners rejection for claim 16 which is analogous and applicable for the rejection of claim 20. Allowable Subject Matter Claims 1-15 are allowed. Claim 17 is objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to JAMES T BOYLAN whose telephone number is (571)272-8242. The examiner can normally be reached Monday-Friday 7am-3pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, JAMIE ATALA can be reached at 571-272-7384. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /JAMES T BOYLAN/Examiner, Art Unit 2486
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Prosecution Timeline

Jul 24, 2024
Application Filed
Nov 25, 2025
Non-Final Rejection mailed — §103
Feb 25, 2026
Response Filed
Mar 13, 2026
Final Rejection mailed — §103
Jul 23, 2026
Interview Requested
Jul 24, 2026
Request for Continued Examination
Jul 28, 2026
Response after Non-Final Action
Sep 15, 2026
Non-Final Rejection mailed — §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

3-4
Expected OA Rounds
63%
Grant Probability
74%
With Interview (+10.7%)
2y 9m (~7m remaining)
Median Time to Grant
High
PTA Risk
Based on 497 resolved cases by this examiner. Grant probability derived from career allowance rate.

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