Prosecution Insights
Last updated: September 29, 2026
Application No. 18/789,596

METHOD FOR DETERMINING A CENTER POSITION OF A TRANSFERRED SEMICONDUCTOR PART AND A SYSTEM FOR DETERMINING THE SAME

Non-Final OA §102§103
Filed
Jul 30, 2024
Priority
Sep 07, 2023 — RE 10-2023-0118991
Examiner
TRAC, JONATHAN KHANH
Art Unit
3652
Tech Center
3600 — Transportation & Electronic Commerce
Assignee
Vm Inc.
OA Round
1 (Non-Final)
Grant Probability
Favorable
1-2
OA Rounds

Examiner Intelligence

Grants only 0% of cases
0%
Career Allowance Rate
0 granted / 0 resolved
-52.0% vs TC avg
Minimal +0% lift
Without
With
+0.0%
Interview Lift
resolved cases with interview
Typical timeline
Avg Prosecution
19 currently pending
Career history
14
Total Applications
across all art units
This examiner has no resolved cases yet (career too new); statute-level performance unavailable. The Grant Probability card shows Tech Center averages instead.

Office Action

§102 §103
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1-4, 6, and 8 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Shindo et al. (US 2017/0011940 A1, hereafter Shindo). Regarding Claim 1, Shindo discloses a method for determining a center position of a transferred semiconductor part comprising: disposing at least one pair of component detecting sensors at a transferring path of the semiconductor part (Figures 3A-3E: the sensors 23a and 23b are at a transferring path of the semiconductor, Paragraph 47); detecting different portions of the semiconductor part by each component detecting sensor (Paragraph 47: the sensors are position sensors, Paragraph 48: each sensor detects a respective edge); calculating a centering position of the semiconductor part based on the detected different positions (Paragraph 74: the central position of the wafer is calculated using information from the sensors); and fixing the semiconductor part at a designated position based on the calculating result (Figure 6: shows a method of correcting a conveyance route of a wafer, Paragraph 24). Regarding Claim 2, Shindo discloses the limitations of claim 1. Shindo discloses at least one pair of component detecting sensors are disposed at a process chamber where the semiconductor part is secured (Figure 6 sensors 23a and 23b, substrate processing chamber 15). Regarding Claim 3, Shindo discloses the limitations of claim 1. Shindo discloses the semiconductor part is a wafer (Paragraph 3) or an edge ring. Regarding Claim 4, Shindo discloses the limitations of claim 1. Shindo discloses the different portions are located at both parts in a component bisector corresponding to the transferring path of the semiconductor part. (Figure 4: the left and right portions are on different sides of a component bisector corresponding to the transferring path, Paragraph 51). Regarding Claim 6, Shindo discloses a system for determining a center position of a transferred semiconductor part, comprising: a transferring robot for transferring the semiconductor part (Figure 1: conveyance robot 16); a pair of component detecting sensors disposed at a process chamber for a process of the semiconductor part (Figure 6: sensors 23a and 23b, process chamber 15); and a component location determining module for determining a center position of the semiconductor part based on two pairs of positions of the semiconductor part detected by each component detecting sensor (Figure 1: controller 17, Paragraph 48: controller calculates center position of wafer based on sensor outputs). Regarding Claim 8, Shindo discloses the limitations of claim 6. Shindo discloses the semiconductor part is a wafer or an edge ring, and the semiconductor part is transferred from a transferring module to a process chamber (Figure 6, Paragraph 5). Claim Rejections - 35 USC § 103 The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claim(s) 5 and 7 is/are rejected under 35 U.S.C. 103 as being unpatentable over Shindo et al. (US 2017/0011940 A1, hereafter Shindo) in view of Beckhart et al. (US 6307211 B1, hereafter Beckhart). Regarding Claim 5, Shindo discloses the limitations of claim 1. Shindo discloses the sensors are position sensors. Shindo does not disclose a height from a reference surface is measured by each component detecting sensor. Beckhart discloses a semiconductor alignment tool that uses z-axis position sensors that is an optical transmitter and optical detector (Figures 8-10: z-axis detectors 134, 136, 138 are used to determine the vertical height of the semiconductor and if the detectors did not detect the same height it would indicate the semiconductor is tilted or misaligned, Column 2 Lines 47-65) for the purpose of being able to detect when the semiconductor is in the correct vertical position (Column 3 Lines 21-22, to detect the vertical distance of the semiconductor the sensor would have a reference surface to determine the distance from). It would have been obvious to one of ordinary skill in the art before the effective filing date to modify the invention of Shindo by making the position sensors of Shindo the z-axis position sensors for the purpose of being able to detect when the semiconductor is in the correct vertical position. Regarding Claim 7, Shindo discloses the limitations of claim 6. Shindo discloses coordinates R and θ are determined by the component location determining module for calculating a distance along a transferring direction of the semiconductor part, a rotating angle based on the transferring direction (Paragraph 45: there are three motors configured to execute the rotation and movement of the pedestal 20 and the extension and retraction of the articulated arm, Figure 2: shows the conveyance robot capable of movement in the R and θ directions, Figure 6: to correct the center position of the wafer the controller would need to calculate the R and θ directions). Shindo does not disclose three-dimensional coordinates R, θ, Z are determined by the component location determining module for calculating a distance along a transferring direction of the semiconductor part, a rotating angle based on the transferring direction, a height and an inclination. Beckhart discloses a semiconductor alignment tool that uses z-axis position sensors that is an optical transmitter and optical detector (Figures 8-10: z-axis detectors 134, 136, 138, Column 2 Lines 47-65) for the purpose of being able to detect when the semiconductor is in the correct vertical position (Column 3 Lines 21-22, to detect the vertical distance of the semiconductor the sensor would have a reference surface to determine the distance from). It would have been obvious to one of ordinary skill in the art before the effective filing date to modify the invention of Shindo by making the position sensors of Shindo the z-axis position sensors for the purpose of being able to detect when the semiconductor is in the correct vertical position. Conclusion The prior art made of record and not relied upon is considered pertinent to applicant's disclosure. Choi et al. (US 20210335651 A1) discloses a semiconductor alignment tool that uses an edge ring. Any inquiry concerning this communication or earlier communications from the examiner should be directed to JONATHAN TRAC whose telephone number is (571)272-8528. The examiner can normally be reached Monday-Friday 7:30-5:00. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Michael McCullough can be reached at (571) 272-7805. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /J.K.T./Examiner, Art Unit 3653 /MICHAEL MCCULLOUGH/Supervisory Patent Examiner, Art Unit 3653
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Prosecution Timeline

Jul 30, 2024
Application Filed
Sep 18, 2026
Non-Final Rejection mailed — §102, §103 (current)

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Prosecution Projections

1-2
Expected OA Rounds
Grant Probability
Low
PTA Risk
Based on 0 resolved cases by this examiner. Grant probability derived from career allowance rate.

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