Inspection System for Detecting Foreign Material and Scratch at Edge of Semiconductor Wafer and Non-Transitory Computer-Readable Medium Storing a Program for Same
MEDICAL IMAGE PROCESSING DEVICE, OPERATION METHOD OF MEDICAL IMAGE PROCESSING DEVICE, AND RECORDING MEDIUM FOR ESTIMATING A STATE OF AN OBSERVATION IMAGED BY AN ENDOSCOPE
3y 5m to grantGranted Jun 16, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.
Strategy Recommendation AI-generated — please review before filing
Get a prosecution strategy drawn from examiner precedents, rejection analysis, and claim mapping.
Typically takes 5-10 seconds — AI-generated, attorney review required before filing