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Office Actions › Adeia Semiconductor Bonding Technologies Inc. › 18799794
Last updated: April 24, 2026
Application No. 18/799,794

Untitled Application

Unknown
Filed
2800
Examiner
HAWKINS, DOMINIC E
Art Unit
2858
Tech Center
ADEIA SEMICONDUCTOR BONDING TECHNOLOGIES INC.
Assignee
Adeia Semiconductor Bonding Technologies Inc.
OA Round
1 (Non-Final)
87%
Grant Probability
Favorable
1-2
OA Rounds
2y 4m
To Grant
99%
With Interview

Interview Optional

— +12.2% interview lift. This examiner has a relatively high allow rate; a written response may suffice.
Based on 721 resolved cases, 2023–2026

Examiner Intelligence

HAWKINS, DOMINIC E View full profile →
Grants 87% — above average
87%
Career Allow Rate
626 granted / 721 resolved
+26.8% vs TC avg
Moderate +12% lift
Without
With
+12.2%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
27 currently pending
Career history
748
Total Applications
across all art units

Statute-Specific Performance

§101
1.5%
-38.5% vs TC avg
§103
59.3%
+19.3% vs TC avg
§102
25.4%
-14.6% vs TC avg
§112
10.7%
-29.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 721 resolved cases

Prosecution Timeline

2800
Application Filed
Mar 19, 2026
Non-Final Rejection (current)

Precedent Cases

Applications granted by this same examiner with similar technology

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Patent 12604701
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2y 5m to grant Granted Apr 14, 2026
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2y 5m to grant Granted Apr 14, 2026
18/621,604
Patent 12601770
VOLTAGE DETECTOR DEVICE HAVING TRIMMING MECHANISM AND VOLTAGE DETECTION METHOD
2y 5m to grant Granted Apr 14, 2026
18/496,579
Patent 12598815
CURRENT SENSE CIRCUIT WITH ELECTROSTATIC DISCHARGE PROTECTION
2y 5m to grant Granted Apr 07, 2026
18/510,589
Patent 12596100
DEVICE FOR DETECTING DEFECT IN STEEL CORD
2y 5m to grant Granted Apr 07, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
87%
Grant Probability
99%
With Interview (+12.2%)
2y 4m
Median Time to Grant
Low
PTA Risk
Based on 721 resolved cases by this examiner. Grant probability derived from career allow rate.

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