DETAILED ACTION
Notice of Pre-AIA or AIA Status
The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA .
Claim Rejections - 35 USC § 112
The following is a quotation of 35 U.S.C. 112(b):
(b) CONCLUSION.—The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the inventor or a joint inventor regards as the invention.
The following is a quotation of 35 U.S.C. 112 (pre-AIA ), second paragraph:
The specification shall conclude with one or more claims particularly pointing out and distinctly claiming the subject matter which the applicant regards as his invention.
Claims 1 – 17 are rejected under 35 U.S.C. 112(b) or 35 U.S.C. 112 (pre-AIA ), second paragraph, as being indefinite for failing to particularly point out and distinctly claim the subject matter which the inventor or a joint inventor (or for applications subject to pre-AIA 35 U.S.C. 112, the applicant), regards as the invention.
As to claims 1 and 11, it is unclear which signals are being converted from analog to digital signals? Applicant is claiming allowing at least one user to operate a measurement process. However, the series of steps for operating a measurement process are not defined.
Claims 2 – 10 and 16 - 17 are rejected by virtue of their dependency on claim 1.
Claims 12 - 15 are rejected by virtue of the dependency on claim 11.
Claim Rejections - 35 USC § 102
In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status.
The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action:
A person shall be entitled to a patent unless –
(a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention.
Claim(s) 1 and 11 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Zhang et al. (CN103235250).
As to claim 1, Zhang et al. (hereinafter Zhang) discloses a photovoltaic array I-V characteristic test device and test method comprising: a measurement module providing a platform for connecting a photovoltaic (PV) panel module (1) for current and voltage measurement [0027] using an electronic load, wherein the measurement module (3) comprises a voltage sensor, a current sensor, and a metal-oxide-semiconductor field-effect transistor (MOSFET) (S11) serving as the electronic load, the PV panel module (1) and the current sensor are connected in series, and a series combination of the PV panel module and the current sensor is connected in parallel with the voltage sensor as well as the MOSFET (Fig. 2; [0025]-[0031]); an industrial I/O expansion module (2) coupled with the measurement module for conversion of analog signals to digital signals (5); a single-board computer (SBC) module (6) configured to obtain current and voltage readings from the measurement module via the industrial I/O expansion module (2); and a user interface module (4) coupled with the SBC module (6) and providing a user interface (4), allowing at least one user to operate a measurement process (5) and obtain visual measurement results (4) (Fig. 2, [0025] – [0031]).
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As to claim 11, Zhang et al. (hereinafter Zhang) discloses a photovoltaic array I-V characteristic test device and test method comprising: providing a measurement module (1) providing a platform for connecting a photovoltaic (PV) panel module for current and voltage measurement [0027] using an electronic load, wherein the measurement module (3) comprises a voltage sensor, a current sensor, and a metal-oxide-semiconductor. field-effect transistor (MOSFET) (S11) serving as the electronic load; connecting the PV panel module (1) and the current sensor in series;
connecting a series combination of the PV panel module and the current sensor in parallel with the voltage sensor as well as the MOSFET (Fig. 2; [0025]-[0031]); coupling an industrial I/O expansion module (2) with the measurement module for conversion of analog signals to digital signals (5); coupling a single-board computer (SBC) module (6) with the industrial I/O expansion module (2) such that the SBC module (6) is able to obtain current and voltage readings from the measurement module via the industrial I/O expansion module (2); and coupling a user interface module (4) with the SBC module (6), such that the user interface module (4) is able to provide a user interface (4), allowing at least one user to operate a measurement process (5) and obtain visual measurement results (4) (Fig. 2, [0025] – [0031]).
Prior Art of Record
The prior art made of record and not relied upon is considered pertinent to applicant s disclosure.
Bowden et al. (20210376788) is cited for its disclosure of a self-powered voltage ramp for photovoltaic module testing.
Joardar (20180342979) is cited for its disclosure of a method and apparatus for a solar panel.
Any inquiry concerning this communication or earlier communications from the examiner should be directed to REENA AURORA whose telephone number is (571)272-2263. The examiner can normally be reached M-F: 8:00AM-5:00PM.
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If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Lee Rodak can be reached at 5712705628. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300.
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/REENA AURORA/Primary Examiner, Art Unit 2858
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