Prosecution Insights
Last updated: April 19, 2026
Application No. 18/817,222

SEMICONDUCTOR DEVICE, AMPLIFIER AND BIASING CIRCUIT

Non-Final OA §103
Filed
Aug 28, 2024
Examiner
YEAMAN, JAMES G
Art Unit
2842
Tech Center
2800 — Semiconductors & Electrical Systems
Assignee
Realtek Semiconductor Corporation
OA Round
1 (Non-Final)
83%
Grant Probability
Favorable
1-2
OA Rounds
2y 9m
To Grant
89%
With Interview

Examiner Intelligence

Grants 83% — above average
83%
Career Allow Rate
90 granted / 109 resolved
+14.6% vs TC avg
Moderate +7% lift
Without
With
+6.6%
Interview Lift
resolved cases with interview
Typical timeline
2y 9m
Avg Prosecution
17 currently pending
Career history
126
Total Applications
across all art units

Statute-Specific Performance

§101
0.1%
-39.9% vs TC avg
§103
67.7%
+27.7% vs TC avg
§102
20.6%
-19.4% vs TC avg
§112
11.3%
-28.7% vs TC avg
Black line = Tech Center average estimate • Based on career data from 109 resolved cases

Office Action

§103
Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Election/Restrictions Applicant's election with traverse of species 2 in the reply filed on 01/25/2026 is acknowledged. Applicants’ argument regarding election of species 2 is found persuasive and claims 1-8 are examined. Applicants’ argument regarding species 1 and 3-7 are found persuasive and claims 9-14 are examined. Applicant's election with traverse of species 8 in the reply filed on 01/25/2026 is acknowledged. The traversal is on the ground(s) that biasing circuit 700 utilize the core semiconductor device of the species 1, 2, 5 and 7. This is not found persuasive because claims 1 – 14 do not disclose the use of a biasing circuit or biasing voltage. Therefore claims 15-20 are withdrawn from consideration. The requirement is still deemed proper and is therefore made FINAL. Claim Rejections - 35 USC § 103 In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status. The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action: A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made. Claims 1-6 and 8-14 rejected under 35 U.S.C. 103 as being unpatentable over Onishi et al. (US 20160241011 A1 and Onishi hereinafter.) Regarding claim 1, Onishi discloses a semiconductor device [fig. 3], comprising: a first transistor [30] controlled by a first switch signal [Vgr] and configured to be conducted in a first enable period [t0, fig. 5, Vgr high]; a second transistor [20] controlled by a second switch signal [Vgn] and configured to be conducted at least in a second enable period [fig. 2, Tnon]. A third transistor [10] controlled by a third switch signal [Vgp] and configured to be conducted at least in a third enable period [fig. 2, Tpon], wherein the second transistor is coupled between the first transistor and the third transistor [as shown]. Onishi discloses the claimed invention except for an enable period for a switch comprising a delay. Onishi discloses delaying turning off a switch [para. 58-60, 62 and 67], therefore it would be obvious to one trained in the art to have an enable period for a switch including a delay. Applicant has provided no disclosure pertaining to the mechanics of the delay and/or how the delay is produced. It would be a simple practice to those trained in the art to disclose timing periods of any given switch without further details. Regarding claim 2, Onishi discloses further wherein the second transistor keeps conducted in the first enable period [as shown in fig. 2], and the third transistor keeps conducted in the second enable period [as shown in fig. 2]. Regarding claim 3, Onishi discloses the claimed invention except for the second transistor has an on-state resistance, and the on-state resistance in the third enable period is lower than the on-state resistance in the first delay period, the on-state resistance in the second delay period, the on-state resistance in the third delay period, and the on-state resistance in the fourth delay period. Onishi discloses lowering or increasing on-resistance of transistors [para. 38, 41 and 68]. It would have been obvious to one having ordinary skill in the art at the time the invention was made to have on-resistances of one or transistors to be higher or lower from other transistors since It was known in the art due to the inherent nature of transistors having an on-resistance when operated. Further, it has been held that discovering an optimum value of a result effective variable involves only routine Skill in the art. In re Boesch, 617 F.2d 272, 205 USPQ 215 (CCPA 1980). Regarding claim 4, Onishi discloses the claimed invention except for the second transistor has a threshold voltage and a breakdown voltage, wherein a voltage of the second switch signal is between the threshold voltage and the breakdown voltage in the first delay period, the second delay period, the third delay period, and the fourth delay period, wherein the breakdown voltage is between the voltage of the second switch signal and the threshold voltage in the third enable period. It would have been obvious to one having ordinary skill in the art at the time the invention was made to have a transistor featuring a threshold voltage and a breakdown voltage, wherein a voltage of a switch signal is between the threshold voltage and the breakdown voltage since It was known in the art. Further, it has been held that discovering an optimum value of a result effective variable involves only routine Skill in the art. In re Boesch, 617 F.2d 272, 205 USPQ 215 (CCPA 1980). Regarding claim 5, Onishi discloses the claimed invention except for the second transistor is conducted in the second enable period and switched off in the first delay period and the second delay period, wherein the third transistor is conducted in the third enable period and switched off in the first delay period, the second delay period, the third delay period, and the fourth delay period. Onishi discloses delaying turning off a switch [para. 58-60, 62 and 67], therefore it would be obvious to one trained in the art to have an enable period for a switch including a delay. Applicant has provided no disclosure pertaining to the mechanics of the delay and/or how the delay is produced. It would be a simple practice to one trained in the art to have differing timing periods of any given switch. Regarding claim 6, Onishi discloses the claimed invention except for wherein a breakdown voltage of the third transistor is higher than a breakdown voltage of the first transistor and higher than a breakdown voltage of the second transistor. It would have been obvious to one having ordinary skill in the art at the time the invention was made to have a transistor featuring a threshold voltage and a breakdown voltage, wherein a voltage of a switch signal is between the threshold voltage and the breakdown voltage since It was known in the art. Regarding claim 8, Onishi discloses further wherein the first transistor, the second transistor, and the third transistor are all P-type transistors or all N-type transistors [as shown in fig. 6]. Regarding claim 9, Onishi discloses [fig. 3] an amplifier [101], comprising: a first semiconductor device [101]; wherein the first semiconductor device comprises a first transistor [30] controlled by a first switch signal [Vgr] and configured to be conducted in a first enable period [fig. 5, Vgr high during t0 to t2]; a second transistor [20] controlled by a second switch signal [Vgn] and configured to be conducted at least in a second enable period [fig. 2, Tnon]. A third transistor [10] controlled by a third switch signal [Vgp] and configured to be conducted at least in a third enable period [fig. 2, Tnon], wherein the second transistor is coupled between the first transistor and the third transistor [as shown]. Regarding claim 10, Onishi discloses further wherein the second transistor keeps conducted in the first enable period [as shown in fig. 2], and the third transistor keeps conducted in the second enable period [as shown in fig. 2]. Regarding claim 11, Onishi disclose the claimed invention except for the second transistor has an on-state resistance, and the on-state resistance in the third enable period is lower than the on-state resistance in the first delay period, the on-state resistance in the second delay period, the on-state resistance in the third delay period, and the on-state resistance in the fourth delay period. Onishi discloses lowering or increasing on-resistance of transistors [para. 38, 41 and 68]. It would have been obvious to one having ordinary skill in the art at the time the invention was made to have on-resistances of one or transistors to be higher or lower from other transistors since It was known in the art due to the inherent nature of transistors having an on-resistance when operated. Further, it has been held that discovering an optimum value of a result effective variable involves only routine Skill in the art. In re Boesch, 617 F.2d 272, 205 USPQ 215 (CCPA 1980). Regarding claim 12, Onishi discloses the claimed invention except for wherein the second transistor has a threshold voltage and a breakdown voltage, wherein a voltage of the second switch signal is between the threshold voltage and the breakdown voltage in the first delay period, the second delay period, the third delay period, and the fourth delay period, wherein the breakdown voltage is between the voltage of the second switch signal and the threshold voltage in the third enable period. It would have been obvious to one having ordinary skill in the art at the time the invention was made to have a transistor featuring a threshold voltage and a breakdown voltage, wherein a voltage of a switch signal is between the threshold voltage and the breakdown voltage since It was known in the art. Regarding claim 13, Onishi discloses the claimed invention except for wherein the second transistor is conducted in the second enable period and switched off in the first delay period and the second delay period, wherein the third transistor is conducted in the third enable period and switched off in the first delay period, the second delay period, the third delay period, and the fourth delay period. Onishi discloses delaying turning off a switch [para. 58-60, 62 and 67], therefore it would be obvious to one trained in the art to have an enable period for a switch including a delay. Applicant has provided no disclosure pertaining to the mechanics of the delay and/or how the delay is produced. It would be a simple practice to one trained in the art to have differing timing periods of any given switch. Regarding claim 14, Onishi discloses the claimed invention except for wherein a breakdown voltage of the third transistor is higher than a breakdown voltage of the first transistor and higher than a breakdown voltage of the second transistor. It would have been obvious to one having ordinary skill in the art at the time the invention was made to have a transistor featuring a threshold voltage and a breakdown voltage, wherein a voltage of a switch signal is between the threshold voltage and the breakdown voltage since It was known in the art. Claim 7 is rejected under 35 U.S.C. 103 as being unpatentable over Onishi in view of Fan et al. (WO 2011095016 A1 and Fan hereinafter.). Regarding claim 7, Onishi discloses all the features regarding claim 1 as indicated above. Onishi does not explicitly disclose the semiconductor device further comprising: a fourth transistor, wherein the second transistor and the fourth transistor are coupled in series between the third transistor and the first transistor. However, Fan discloses [fig. 2] the semiconductor device further comprising: a fourth transistor [Q3], wherein the second transistor [Q2] and the fourth transistor are coupled in series between the third transistor [Q1] and the first transistor [Q4]. Therefore, it would have been obvious to one of the ordinary skill in the art before the effective filing date to modify the invention as described by Onishi to include the semiconductor device further comprising: a fourth transistor, wherein the second transistor and the fourth transistor are coupled in series between the third transistor and the first transistor as taught by Fan to improve efficiency of a voltage limiting device. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to JAMES G YEAMAN whose telephone number is (571)272-5580. The examiner can normally be reached Mon - Fri 954 Schedule. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Regis Betsch can be reached at (571) 270-7101. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /JAMES G YEAMAN/Examiner, Art Unit 2842 /METASEBIA T RETEBO/Primary Examiner, Art Unit 2842
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Prosecution Timeline

Aug 28, 2024
Application Filed
Mar 23, 2026
Non-Final Rejection — §103 (current)

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Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
83%
Grant Probability
89%
With Interview (+6.6%)
2y 9m
Median Time to Grant
Low
PTA Risk
Based on 109 resolved cases by this examiner. Grant probability derived from career allow rate.

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