DETAILED ACTION
Notice of Pre-AIA or AIA Status
The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA .
Priority
Receipt is acknowledged of certified copies of papers required by 37 CFR 1.55.
Information Disclosure Statement
The IDS filed to date have been considered.
Response to Arguments
Applicant's arguments filed 06/28/2026 have been fully considered but they are not persuasive.
With regard to the applicant arguments that the prior art does not teach the limitation: “an opaque layer disposed on an outer surface of the magnet”.
The examiner respectfully disagrees, as the limitation does not explicitly state the opaque layer must be DIRECTLY on an outer surface of the magnet, this allows for various elements to be placed between the outer surface of the magnet and the opaque layer while still upholding the structure of the limitation.
As such, the rejection is believed to be proper in its current form and has been restated below.
Claim Rejections - 35 USC § 102
In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status.
The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action:
A person shall be entitled to a patent unless –
(a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention.
Claim(s) 1-6, 21 and 22 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Park (US 20230217106) herein after referred to as D1.
With regard to claim 1, D1 teaches a camera module, in at least (Fig. 3B) comprising: an imaging lens assembly (400); an image sensor (810) for receiving an image signal of the imaging lens assembly (400); and a magnet (130) assembling mechanism for defining a status of the image signal of the imaging lens assembly (400) corresponding to the image sensor (810), wherein the magnet (130) assembling mechanism comprises: a magnet (130) holder (600); a magnet (130) disposed at the magnet (130) holder (600); and an opaque layer (1300) disposed on an outer surface of the magnet (130).
With regard to claim 2, D1 teaches all of the claimed limitations of the instant invention as have been outlined above with respect to claim 1, wherein D1 further teaches a camera module, in at least (Fig. 3A); wherein the opaque layer (1300) has a part facing towards a direction towards the image sensor (810).
With regard to claim 3, D1 teaches all of the claimed limitations of the instant invention as have been outlined above with respect to claim 1, wherein D1 further teaches a camera module, in at least (Fig. 3A); wherein the magnet (130) assembling mechanism further comprises: a coil (120), the magnet (130) and the coil (120) disposed relatively.
With regard to claim 4, D1 teaches all of the claimed limitations of the instant invention as have been outlined above with respect to claim 1, wherein D1 further teaches a camera module, in at least (Fig. 3A); wherein the magnet (130) assembling mechanism further comprises: a magnet (130) sensing element ([0029]), the magnet (130) and the magnet (130) sensing element ([0029]) disposed relatively.
With regard to claim 5, D1 teaches all of the claimed limitations of the instant invention as have been outlined above with respect to claim 1, wherein D1 further teaches a camera module, in at least (Fig. 3A); wherein the magnet (130) assembling mechanism is for adjusting a relative position ([0025]) between the imaging lens assembly (400) and the image sensor (810).
With regard to claim 6, D1 teaches all of the claimed limitations of the instant invention as have been outlined above with respect to claim 1, wherein D1 further teaches a camera module, in at least (Fig. 3A); wherein the magnet (130) assembling mechanism is for providing a preload force for supporting the imaging lens assembly (400).
With regard to claim 21, D1 teaches all of the claimed limitations of the instant invention as have been outlined above with respect to claim 1, wherein D1 further teaches a camera module, in at least (Fig. 3A); wherein the opaque layer (1300) covers the magnet (130) completely.
With regard to claim 22, D1 teaches all of the claimed limitations of the instant invention as have been outlined above with respect to claim 1, wherein D1 further teaches a camera module, in at least (Fig. 3A); as part of an electronic device ([0004]).
Claim Rejections - 35 USC § 103
In the event the determination of the status of the application as subject to AIA 35 U.S.C. 102 and 103 (or as subject to pre-AIA 35 U.S.C. 102 and 103) is incorrect, any correction of the statutory basis (i.e., changing from AIA to pre-AIA ) for the rejection will not be considered a new ground of rejection if the prior art relied upon, and the rationale supporting the rejection, would be the same under either status.
The following is a quotation of 35 U.S.C. 103 which forms the basis for all obviousness rejections set forth in this Office action:
A patent for a claimed invention may not be obtained, notwithstanding that the claimed invention is not identically disclosed as set forth in section 102, if the differences between the claimed invention and the prior art are such that the claimed invention as a whole would have been obvious before the effective filing date of the claimed invention to a person having ordinary skill in the art to which the claimed invention pertains. Patentability shall not be negated by the manner in which the invention was made.
Claim(s) 7-20 is/are rejected under 35 U.S.C. 103 as being unpatentable over Park (US 20230217106) herein after referred to as D1 as applied to claim 1 above, and further in view of Bjornard (US 20230070931) herein after referred to as D2.
With regard to claim 7, D1 teaches all of the claimed limitations of the instant invention as have been outlined above with respect to claim 1, however, D1 does not expressly disclose; wherein the magnet assembling mechanism is for adjusting an aperture size of an aperture stop.
In a related endeavor, D2 teaches an optical apparatus, in at least (Fig. 3A); wherein the magnet assembling mechanism is for adjusting ([0004]; varying) an aperture size ([0004]) of an aperture stop ([0004]).
Therefore, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to provide the invention of D1 with the aperture stop of D2, for the purpose of further controlling the light presented to the image sensor.
With regard to claim 8, D1 teaches all of the claimed limitations of the instant invention as have been outlined above with respect to claim 1, wherein D1 further teaches a camera module, in at least (Fig. 3A); wherein the magnet (130) assembling mechanism further comprises: a nano layer ([0013]) disposed on the opaque layer (1300).
However, D1 Does not expressly disclose a nano layer ([0013]) disposed on the opaque layer.
In a related endeavor, D2 teaches an optical apparatus, in at least (Fig. 3); comprising: a nano layer ([0013]) disposed on the opaque layer.
Therefore, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to provide the invention of D1 with a nano layer disposed on the opaque layer of D2, for the purpose of further controlling the light presented to the image sensor by blocking the shine of any metallic parts covered by the mask.
With regard to claim 9, D1 teaches all of the claimed limitations of the instant invention as have been outlined above with respect to claim 8, wherein D1 fails to expressly disclose wherein the nano layer comprises a plurality of nano particles arranged on a surface of the opaque layer irregularly.
In a related endeavor, D2 teaches an optical apparatus, in at least ([0013]); wherein the nano layer ([0013]) comprises a plurality of nano particles ([0013]; crystallites).
Therefore, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to provide the invention of D1 wherein the nano layer comprises a plurality of nano particles arranged on a surface of the opaque layer irregularly of D2, for the purpose of further controlling the light presented to the image sensor by blocking the shine of any metallic parts covered by the mask.
With regard to claim 10, D1 teaches all of the claimed limitations of the instant invention as have been outlined above with respect to claim 8, wherein D1 does not expressly disclose wherein the nano layer comprises a plurality of nano protrusions arranged on a surface of the opaque layer irregularly.
In a related endeavor, D2 teaches an optical apparatus, in at least ([0013]); wherein the nano layer ([0013]) comprises a plurality of nano protrusions ([0013]; crystallites) arranged on a surface of the opaque layer irregularly.
Therefore, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to provide the invention of D1 wherein the nano layer comprises a plurality of nano protrusions arranged on a surface of the opaque layer irregularly of D2, for the purpose of further controlling the light presented to the image sensor by blocking the shine of any metallic parts covered by the mask.
With regard to claim 11, D1 teaches all of the claimed limitations of the instant invention as have been outlined above with respect to claim 8, wherein D1 fails to expressly disclose, wherein the nano layer comprises a plurality of nano holes arranged on a surface of the opaque layer irregularly.
In a related endeavor, D2 teaches an optical apparatus, in at least ([0013]); wherein the nano layer ([0013]) comprises a plurality of nano holes ([0013]) arranged on a surface of the opaque layer irregularly.
Therefore, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to provide the invention of D1 wherein the nano layer comprises a plurality of nano holes arranged on a surface of the opaque layer irregularly of D2, for the purpose of further controlling the light presented to the image sensor by blocking the shine of any metallic parts covered by the mask.
With regard to claim 12, D1 teaches all of the claimed limitations of the instant invention as have been outlined above with respect to claim 1, wherein D1 fails to expressly disclose, wherein the opaque layer comprises: a plurality of micron particles for generating an irregular protruding structure on a surface of the opaque layer.
In a related endeavor, D2 teaches an optical apparatus, in at least ([0013]); wherein the opaque layer ([0013]) comprises: a plurality of micron particles ([0013]) for generating an irregular protruding structure ([0013]) on a surface of the opaque layer.
Therefore, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to provide the invention of D1 wherein the opaque layer comprises: a plurality of micron particles for generating an irregular protruding structure on a surface of the opaque layer of D2, for the purpose of further controlling the light presented to the image sensor by blocking the shine of any metallic parts covered by the mask.
With regard to claim 13, D1 teaches all of the claimed limitations of the instant invention as have been outlined above with respect to claim 2, wherein D1 fails to expressly disclose, wherein when a surface of the opaque layer is measured according to an ISO25178 standard, a number of peaks per square millimeter of a microstructure layer is Ypd, the following condition is satisfied: 190001/mm2≤Ypd≤2100001/mm2.
In a related endeavor, D2 teaches an optical apparatus, in at least ([0013]); wherein when a surface of the opaque layer (1300) is measured according to an ISO25178 standard, a number of peaks per square millimeter of a microstructure layer is Ypd, the following condition is satisfied ([0013]; temperature curves, pressure curves, time in oven and so on may vary from embodiment to embodiment): 190001/mm2≤Ypd≤2100001/mm2.
Therefore, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to provide the invention of D1 wherein when a surface of the opaque layer (1300) is measured according to an ISO25178 standard, a number of peaks per square millimeter of a microstructure layer is Ypd, the following condition is satisfied: 190001/mm2≤Ypd≤2100001/mm2
of D2, for the purpose of further controlling the light presented to the image sensor by blocking the shine of any metallic parts covered by the mask.
With regard to claim 14, D1 teaches all of the claimed limitations of the instant invention as have been outlined above with respect to claim 13, wherein D1 fails to expressly disclose, wherein when the surface of the opaque layer (1300) is measured according to the ISO25178 standard, the number of the peaks per square millimeter of the microstructure layer is Ypd, the following condition is satisfied: 250001/mm2≤Ypd≤1200001/mm2.
In a related endeavor, D2 teaches an optical apparatus, in at least ([0013]); wherein when the surface of the opaque layer (1300) is measured according to the ISO25178 standard, the number of the peaks per square millimeter of the microstructure layer is Ypd, the following condition is satisfied ([0013]; temperature curves, pressure curves, time in oven and so on may vary from embodiment to embodiment): 250001/mm2≤Ypd≤1200001/mm2.
Therefore, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to provide the invention of D1 wherein when the surface of the opaque layer (1300) is measured according to the ISO25178 standard, the number of the peaks per square millimeter of the microstructure layer is Ypd, the following condition is satisfied: 250001/mm2≤Ypd≤1200001/mm2 of D2, for the purpose of further controlling the light presented to the image sensor by blocking the shine of any metallic parts covered by the mask.
With regard to claim 15, D1 teaches all of the claimed limitations of the instant invention as have been outlined above with respect to claim 2, wherein D1 fails to expressly disclose, wherein when a surface of the opaque layer (1300) is measured according to an ISO25178 standard, an equivalent line and an areal material ratio curve are obtained, a core height is defined by 0% to 100% of the equivalent line corresponding to the areal material ratio curve, a reduced peak is a portion of the areal material ratio curve higher than the core height, an areal material ratio that divides a core surface from the reduced peak is Ymr1, the following condition is satisfied: 7%≤Ymr1≤53%.
In a related endeavor, D2 teaches an optical apparatus, in at least ([0013]); wherein when a surface of the opaque layer (1300) is measured according to an ISO25178 standard, an equivalent line and an areal material ratio curve are obtained, a core height is defined by 0% to 100% of the equivalent line corresponding to the areal material ratio curve, a reduced peak is a portion of the areal material ratio curve higher than the core height, an areal material ratio that divides a core surface from the reduced peak is Ymr1, the following condition is satisfied ([0013]; temperature curves, pressure curves, time in oven and so on may vary from embodiment to embodiment): 7%≤Ymr1≤53%.
Therefore, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to provide the invention of D1 wherein when a surface of the opaque layer (1300) is measured according to an ISO25178 standard, an equivalent line and an areal material ratio curve are obtained, a core height is defined by 0% to 100% of the equivalent line corresponding to the areal material ratio curve, a reduced peak is a portion of the areal material ratio curve higher than the core height, an areal material ratio that divides a core surface from the reduced peak is Ymr1, the following condition is satisfied: 7%≤Ymr1≤53% of D2, for the purpose of further controlling the light presented to the image sensor by blocking the shine of any metallic parts covered by the mask.
With regard to claim 16, D1 teaches all of the claimed limitations of the instant invention as have been outlined above with respect to claim 15, wherein D1 fails to expressly disclose, wherein when the surface of the opaque layer (1300) is measured according to the ISO25178 standard, the areal material ratio that divides the core surface from the reduced peak is Ymr1, the following condition is satisfied: 15%≤Ymr1≤45%.
In a related endeavor, D2 teaches an optical apparatus, in at least ([0013]); wherein when the surface of the opaque layer (1300) is measured according to the ISO25178 standard, the areal material ratio that divides the core surface from the reduced peak is Ymr1, the following condition is satisfied ([0013]; temperature curves, pressure curves, time in oven and so on may vary from embodiment to embodiment): 15%≤Ymr1≤45%.
Therefore, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to provide the invention of D1 wherein when the surface of the opaque layer (1300) is measured according to the ISO25178 standard, the areal material ratio that divides the core surface from the reduced peak is Ymr1, the following condition is satisfied:15%≤Ymr1≤45% of D2, for the purpose of further controlling the light presented to the image sensor by blocking the shine of any metallic parts covered by the mask.
With regard to claim 17, D1 teaches all of the claimed limitations of the instant invention as have been outlined above with respect to claim 2, wherein D1 fails to expressly disclose, wherein when a surface of the opaque layer (1300) is measured according to an ISO25178 standard, an equivalent line and an areal material ratio curve are obtained, a core height is defined by 0% to 100% of the equivalent line corresponding to the areal material ratio curve, a reduced peak is a portion of the areal material ratio curve higher than the core height, an average height of the reduced peak is Aph, the following condition is satisfied: 0.5 μm≤Aph≤42.5 μm.
In a related endeavor, D2 teaches an optical apparatus, in at least ([0013]); wherein when a surface of the opaque layer (1300) is measured according to an ISO25178 standard, an equivalent line and an areal material ratio curve are obtained, a core height is defined by 0% to 100% of the equivalent line corresponding to the areal material ratio curve, a reduced peak is a portion of the areal material ratio curve higher than the core height, an average height of the reduced peak is Aph, the following condition is satisfied ([0013]; temperature curves, pressure curves, time in oven and so on may vary from embodiment to embodiment): 0.5 μm≤Aph≤42.5 μm.
Therefore, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to provide the invention of D1 wherein when a surface of the opaque layer (1300) is measured according to an ISO25178 standard, an equivalent line and an areal material ratio curve are obtained, a core height is defined by 0% to 100% of the equivalent line corresponding to the areal material ratio curve, a reduced peak is a portion of the areal material ratio curve higher than the core height, an average height of the reduced peak is Aph, the following condition is satisfied: 0.5 μm≤Aph≤42.5 μm of D2, for the purpose of further controlling the light presented to the image sensor by blocking the shine of any metallic parts covered by the mask.
With regard to claim 18, D1 teaches all of the claimed limitations of the instant invention as have been outlined above with respect to claim 17, wherein D1 fails to expressly disclose, wherein when the surface of the opaque layer (1300) is measured according to the ISO25178 standard, the average height of the reduced peak is Aph, the following condition is satisfied: 4.5 μm≤Aph≤35.5 μm.
In a related endeavor, D2 teaches an optical apparatus, in at least ([0013]); wherein when the surface of the opaque layer is measured according to the ISO25178 standard, the average height of the reduced peak is Aph, the following condition is satisfied ([0013]; temperature curves, pressure curves, time in oven and so on may vary from embodiment to embodiment): 4.5 μm≤Aph≤35.5 μm.
Therefore, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to provide the invention of D1 wherein when the surface of the opaque layer (1300) is measured according to the ISO25178 standard, the average height of the reduced peak is Aph, the following condition is satisfied: 4.5 μm≤Aph≤35.5 μm of D2, for the purpose of further controlling the light presented to the image sensor by blocking the shine of any metallic parts covered by the mask.
With regard to claim 19, D1 teaches all of the claimed limitations of the instant invention as have been outlined above with respect to claim 2, wherein D1 fails to expressly disclose, wherein when a surface of the opaque layer (1300) is measured according to an ISO25178 standard, a number of peaks of a microstructure layer larger than a core height and larger than 4 μm is Hpq, the following condition is satisfied: 0≤Hpq≤430.
In a related endeavor, D2 teaches an optical apparatus, in at least ([0013]); wherein when a surface of the opaque layer (1300) is measured according to an ISO25178 standard, a number of peaks of a microstructure layer larger than a core height and larger than 4 μm is Hpq, the following condition is satisfied ([0013]; temperature curves, pressure curves, time in oven and so on may vary from embodiment to embodiment): 0≤Hpq≤430.
Therefore, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to provide the invention of D1 wherein when a surface of the opaque layer (1300) is measured according to an ISO25178 standard, a number of peaks of a microstructure layer larger than a core height and larger than 4 μm is Hpq, the following condition is satisfied: 0≤Hpq≤430 of D2, for the purpose of further controlling the light presented to the image sensor by blocking the shine of any metallic parts covered by the mask.
With regard to claim 20, D1 teaches all of the claimed limitations of the instant invention as have been outlined above with respect to claim 19, wherein D1 fails to expressly disclose, wherein when the surface of the opaque layer (1300) is measured according to the ISO25178 standard, the number of peaks of the microstructure layer larger than the core height and larger than 4 μm is Hpq, the following condition is satisfied:15≤Hpq≤300.
In a related endeavor, D2 teaches an optical apparatus, in at least ([0013]); wherein when the surface of the opaque layer (1300) is measured according to the ISO25178 standard, the number of peaks of the microstructure layer larger than the core height and larger than 4 μm is Hpq, the following condition is satisfied ([0013]; temperature curves, pressure curves, time in oven and so on may vary from embodiment to embodiment):15≤Hpq≤300.
Therefore, it would have been obvious to one of ordinary skill in the art before the effective filing date of the claimed invention to provide the invention of D1 wherein when the surface of the opaque layer (1300) is measured according to the ISO25178 standard, the number of peaks of the microstructure layer larger than the core height and larger than 4 μm is Hpq, the following condition is satisfied:15≤Hpq≤300 of D2, for the purpose of further controlling the light presented to the image sensor by blocking the shine of any metallic parts covered by the mask.
Conclusion
THIS ACTION IS MADE FINAL. Applicant is reminded of the extension of time policy as set forth in 37 CFR 1.136(a).
A shortened statutory period for reply to this final action is set to expire THREE MONTHS from the mailing date of this action. In the event a first reply is filed within TWO MONTHS of the mailing date of this final action and the advisory action is not mailed until after the end of the THREE-MONTH shortened statutory period, then the shortened statutory period will expire on the date the advisory action is mailed, and any nonprovisional extension fee (37 CFR 1.17(a)) pursuant to 37 CFR 1.136(a) will be calculated from the mailing date of the advisory action. In no event, however, will the statutory period for reply expire later than SIX MONTHS from the mailing date of this final action.
Any inquiry concerning this communication or earlier communications from the examiner should be directed to GRANT A GAGNON whose telephone number is (571)270-0642. The examiner can normally be reached M-F 7:30-5:30.
Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice.
If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Bumsuk Won can be reached at (571) 272-2713. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300.
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/GRANT A GAGNON/Examiner, Art Unit 2872
/BALRAM T PARBADIA/Primary Examiner, Art Unit 2872
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