Prosecution Insights
Last updated: October 01, 2026
Application No. 18/820,946

DETECTION DEVICE

Non-Final OA §102
Filed
Aug 30, 2024
Priority
Mar 08, 2022 — JP 2022-035012 +1 more
Examiner
KO, TONY
Art Unit
Tech Center
Assignee
Magnolia White Corporation
OA Round
1 (Non-Final)
88%
Grant Probability
Favorable
1-2
OA Rounds
3m
Est. Remaining
90%
With Interview

Examiner Intelligence

Grants 88% — above average
88%
Career Allowance Rate
788 granted / 897 resolved
+27.8% vs TC avg
Minimal +3% lift
Without
With
+2.6%
Interview Lift
resolved cases with interview
Typical timeline
2y 4m
Avg Prosecution
17 currently pending
Career history
907
Total Applications
across all art units

Statute-Specific Performance

§101
1.6%
-38.4% vs TC avg
§103
29.4%
-10.6% vs TC avg
§102
46.2%
+6.2% vs TC avg
§112
19.7%
-20.3% vs TC avg
Black line = Tech Center average estimate • Based on career data from 897 resolved cases

Office Action

§102
DETAILED ACTION Notice of Pre-AIA or AIA Status The present application, filed on or after March 16, 2013, is being examined under the first inventor to file provisions of the AIA . Claim Rejections - 35 USC § 102 The following is a quotation of the appropriate paragraphs of 35 U.S.C. 102 that form the basis for the rejections under this section made in this Office action: A person shall be entitled to a patent unless – (a)(1) the claimed invention was patented, described in a printed publication, or in public use, on sale, or otherwise available to the public before the effective filing date of the claimed invention. Claim(s) 1, 2, 7, 8, 12 and 15 is/are rejected under 35 U.S.C. 102(a)(1) as being anticipated by Kato et al (US 20130194239). Regarding claim 1, Kato et al teach (Figs. 1-9) a detection device comprising: a substrate (11); a plurality of photodiodes (figure 2, element 12) that are arranged on the substrate and each comprise a lower electrode (124), a lower buffer layer (125N), an active layer (125I), an upper buffer layer (125P), and an upper electrode (126) that are stacked on the substrate in the order as listed; a plurality of signal lines (18) electrically coupled to the respective lower electrodes of the photodiodes ([0057] – where 124 connects with electrode 123D); a detection circuit (system controlling portion 16) electrically coupled to the photodiodes through the signal lines; and a shield layer (112b) disposed between the signal lines in plan view (see figure 7). Regarding claim 2, Kato et al teach the lower buffer layer comprises one of a hole transport layer and an electron transport layer, and the upper buffer layer comprises the other of the hole transport layer and the electron transport layer. That is, the conduction of electrons between the PIN layers constitute them as electron/hole transport layer. Regarding claim 7, Kato et al teach an insulating film (121) provided on the substrate so as to cover the signal lines (18), wherein the shield layer is provided on the insulating film. Regarding claim 8, Kato et al teach the shield layer (see figure 7, element 120 covers element 18) is continuously provided overlapping the signal lines and extending across an area of the signal lines. Regarding claim 12, Kato et al teach a detection device comprising: a substrate (11); a plurality of photodiodes (111A) that are arranged on the substrate and each comprise a lower electrode (124), a lower buffer layer (125N), an active layer (126), an upper buffer layer (125I), and an upper electrode (127) that are stacked on the substrate in the order as listed; a plurality of signal lines (18) electrically coupled to the respective lower electrodes of the photodiodes; a detection circuit (system controlling portion 16) electrically coupled to the photodiodes through the signal lines; and a shield layer (112b) disposed between a plurality of the lower electrodes in plan view (112b separates between two photodiodes). Regarding claim 15, Kato et al teach A detection device comprising: a substrate (11); a plurality of photodiodes (see figure 2, element 12) that are arranged on the substrate and each comprise a lower electrode (124), a lower buffer layer (125N), an active layer (126), an upper buffer layer (125I), and an upper electrode (125P) that are stacked on the substrate in the order as listed; a plurality of signal lines (18) electrically coupled to the lower electrodes of the photodiodes; a detection circuit (system controlling portion 16) electrically coupled to the photodiodes through the signal lines; and a shield layer (112b) disposed between (see figure 7 where the 112b portion that is circled by P1a) the signal lines and the lower electrodes in plan view. Allowable Subject Matter Claims 3-6, 9-11, 13, 14, 16-19 are objected to as being dependent upon a rejected base claim, but would be allowable if rewritten in independent form including all of the limitations of the base claim and any intervening claims. Conclusion Any inquiry concerning this communication or earlier communications from the examiner should be directed to TONY KO whose telephone number is (571)272-1926. The examiner can normally be reached Monday-Friday 9-5pm. Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice. If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Georgia Epps can be reached at 571-272-2328. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300. Information regarding the status of published or unpublished applications may be obtained from Patent Center. Unpublished application information in Patent Center is available to registered users. To file and manage patent submissions in Patent Center, visit: https://patentcenter.uspto.gov. Visit https://www.uspto.gov/patents/apply/patent-center for more information about Patent Center and https://www.uspto.gov/patents/docx for information about filing in DOCX format. For additional questions, contact the Electronic Business Center (EBC) at 866-217-9197 (toll-free). If you would like assistance from a USPTO Customer Service Representative, call 800-786-9199 (IN USA OR CANADA) or 571-272-1000. /TONY KO/Primary Examiner, Art Unit 2878 TK
Read full office action

Prosecution Timeline

Aug 30, 2024
Application Filed
Sep 03, 2026
Non-Final Rejection mailed — §102 (current)

Precedent Cases

Applications granted by this same examiner with similar technology

Patent 12742634
DIMENSION MEASUREMENT APPARATUS
2y 0m to grant Granted Sep 22, 2026
Patent 12736401
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1y 10m to grant Granted Sep 15, 2026
Patent 12736472
OPTICAL FOREIGN SUBSTANCE DETECTION DEVICE USING LIGHT SCATTERING AND IMAGE ANALYSIS
1y 7m to grant Granted Sep 15, 2026
Patent 12729948
METHOD TO DETERMINE AN ABSOLUTE POSITION OF A MOVABLE OBJECT, INTERFEROMETER SYSTEM, PROJECTION SYSTEM AND LITHOGRAPIC APPARATUS
1y 9m to grant Granted Sep 08, 2026
Patent 12723913
PHOTODETECTORS FOR MEASURING REAL-TIME OPTICAL IRRADIANCE
1y 8m to grant Granted Sep 01, 2026
Study what changed to get past this examiner. Based on 5 most recent grants.

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Prosecution Projections

1-2
Expected OA Rounds
88%
Grant Probability
90%
With Interview (+2.6%)
2y 4m (~3m remaining)
Median Time to Grant
Low
PTA Risk
Based on 897 resolved cases by this examiner. Grant probability derived from career allowance rate.

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