DETAILED ACTION
Drawings
FIG. 1 should be designated by a legend such as --Prior Art-- because only that which is old is illustrated. See MPEP § 608.02(g).
FIG. 3(a) and FIG. 3(b) fail to correspond to their descriptions in specification paragraphs 0099-0100, 0104, 0106-0107. It appears that FIG. 3(a) should have been labeled --3(b)--, and FIG. 3(b) should have been labeled --3(a)--. Otherwise, specification paragraphs 0099-0100, 0104, 0106-0107 should be amended per the objections to the specification below.
Corrected drawings in compliance with 37 CFR 1.121(d) are required in reply to the Office action to avoid abandonment of the application. The replacement sheet(s) should be labeled “Replacement Sheet” in the page header (as per 37 CFR 1.84(c)) so as not to obstruct any portion of the drawing figures. If the changes are not accepted by the examiner, the applicant will be notified and informed of any required corrective action in the next Office action. The objection to the drawings will not be held in abeyance.
Specification
The disclosure (specification) is objected to because of editorial errors. Going forward with examination, the following specification paragraphs are interpreted to be (Note that in applicant’s response, where a change is requested in the specification, an entire paragraph of the specification containing the change will be needed):
--[0084] The second probe 11b applied to the present invention performs ultrasonic scanning along the scan line of the inspection surface 3, but performs ultrasonic scanning while the height thereof is varied in response to the curved shape of the inspection surface 3. The height variation of the second probe 11b is controlled based on the displacement information calculated using the ultrasonic reflection signal of the first probe 11a.--
--[0099] As shown in (b) of FIG. 3, when the first probe 11a and the second probe 11b are mounted and connected to the mounting jig 13 in the longitudinal arrangement form, the control module 50 controls ultrasonic scanning to be performed for the (k+1) scan line corresponding to the next scan line of the specific scan line while the height of the second probe 11b is varied based on the displacement information calculated using the ultrasonic reflection signal detected by the first probe 11a for [[a]] the specific scan line, e.g., the k-th scan line.--
--[0100] That is, the control module 50 performs control so that ultrasonic scanning is performed for [[a]] the specific scan line by the first probe 11a, and the displacement information calculation unit 20 analyzes the ultrasonic reflection signal reflected back to the inspection surface 3 to calculate displacement information for the specific scan line, and then performs control so that the height of the second probe 11b may be varied when the second probe 11b performs ultrasonic scanning for another scan line of the specific scan line in response to the displacement information produced.--
--[0104] As shown in (a) of FIG. 3, when the first probe 11a and the second probe 11b are mounted and connected to the mounting jig 13 in the horizontal arrangement form, the control module 50 performs control so that ultrasonic scanning is performed for the k-th scan line corresponding to the scan line for which displacement information is to be calculated while the height of the second probe 11b is varied based on the displacement information calculated using the ultrasonic reflection signal detected by the first probe 11a for a specific scan line, e.g., the k-th scan line.--
--[0106] As a result, when the second probe 11b performs scanning for ultrasonic inspection on a specific scan line, the second probe 11b performs ultrasonic scanning while the height thereof is varied in response to the curved shape of the inspection surface 3 of the specific scan line. Therefore, in the arrangement form of (a) of FIG. 3, the accuracy of ultrasonic inspection may be further improved compared to the arrangement form of (b) of FIG. 3.--
--[0107]
--[0134] The present invention has a configuration in which each probe 11 may be focused on each corresponding bonding surface 5 in order to improve the accuracy and precision of ultrasonic inspection for each bonding surface 5, and, to this end, the probe 11 is configured to be adjusted in height so that it may be focused on the corresponding bonding surface 5.--
--[0189] FIG. 15 illustrates a configuration in which the seating region 73 is composed of a total of four seating regions, including a first seating region 73a, a second seating region 73b, a third seating region 73c, and a fourth seating region 73d that are sequentially spaced from each other, but the configuration is not limited thereto and may be composed of more or fewer seating regions.--
--[0190] In addition, FIG. 15 illustrates a configuration in which a plurality of seating portions 71 formed in each seating region 73 is composed of a total of four seating portions of a first seating portion 71a, a second seating portion 71b, a third seating portion 71c, and a fourth seating portion 71d that are arranged in a row, but the configuration is not limited thereto and may be composed of more or fewer seating portions.--
--[0194] As shown in FIG. 16, the plurality of probes 11 (11a, 11b, 11c, 11d, 11e, and 11f) are classified into a plurality of probe groups 17a, 17b, and 17c, and each of the probe groups 17a, 17b, and 17c is composed of at least one probe 11.--
--[0195] FIG. 16 illustrates that the plurality of probes 11 (11a, 11b, 11c, 11d, 11e, and 11f) are composed of three probe groups, including a first probe group 17a, a second probe group 17b, and a third probe group 17c, but is not limited thereto and may be composed of more or fewer probe groups.--
--[0196] In addition, FIG. 16 illustrates that the first probe group 17a is composed of the first probe 11a and the second probe 11b arranged adjacently, the second probe group 17b is composed of the third probe 11c and the fourth probe 11d arranged adjacently, and the third probe group 17c is composed of the fifth probe 11e and the sixth probe 11f arranged adjacently, but is not limited thereto, and each probe group may be composed of more or fewer probes 11. That is, the number of probes constituting each probe group may be variable, and the number of probes between the respective probe group may be configured to be the same or different.--
--[0198] Referring to FIG. 16 to describe in more detail, the first probe group 17a is composed of a first probe 11a and a second probe 11b arranged adjacently under the control of the control module 50 and performs ultrasonic scanning on the plurality of objects to be inspected 1 that are arranged on the plurality of seating portions 71 arranged in a row in a first seating region 73a, the second probe group 17b is composed of a third probe 11c and a fourth probe 11d arranged adjacently under the control of the control module 50 and performs ultrasonic scanning on the plurality of objects to be inspected 1 that are arranged on the plurality of seating portions 71 arranged in a row in a second seating region 73b, and the third probe group 17c is composed of a fifth probe 11e and a sixth probe 11f arranged adjacently under the control of the control module 50 and performs ultrasonic scanning on the plurality of objects to be inspected 1 that are arranged on the plurality of seating portions 71 that are arranged in a row in a third seating region 73c.--
Appropriate correction is required.
Claim Objections
Claims 7 and 12 are objected to because they appear to contain administrative errors. Going forward with examination, the claims are interpreted to be:
--7. The ultrasonic inspection apparatus of claim 3, wherein
the mounting jigs are configured to move in a first direction or a second direction, the processing module includes a curvature information calculation unit that calculates curvature information based on the displacement information acquired through the first probe when the mounting jigs move, and
the curvature information calculation unit calculates unit curvature information for each preset unit section of the inspection surface, compares accumulated curvature information for a first to n-th sections with the unit curvature information of an (n+1)-th section, and determines the (n+1)-th section an abnormal section when the unit curvature information of the (n+1)-th section exceeds a preset range compared to the accumulated curvature information.--
--12. The ultrasonic inspection apparatus of claim 10, wherein
when the first and second probes are in the second direction arrangement form, scanning points of each of a k-th scan line and a (k+1)-th scan line may be separated from each other by equal intervals or by different intervals, and the k-th scan line and the (k+1)-th scan line may be formed with the same scanning pattern.--
Appropriate correction is required.
Claim Rejections - 35 USC § 112
The following is a quotation of the first paragraph of 35 U.S.C. 112(a):
(a) IN GENERAL.—The specification shall contain a written description of the invention, and of the manner and process of making and using it, in such full, clear, concise, and exact terms as to enable any person skilled in the art to which it pertains, or with which it is most nearly connected, to make and use the same, and shall set forth the best mode contemplated by the inventor or joint inventor of carrying out the invention.
Claims 4-6 rejected under 35 U.S.C. 112(a) as failing to comply with the enablement requirement. The claim(s) contains subject matter which was not described in the specification in such a way as to enable one skilled in the art to which it pertains, or with which it is most nearly connected, to make and/or use the invention.
Application’s FIG. 3(a) appears to show a first direction arrangement form in which the first and second probes (11a, 11b) are arranged in a row along a preset scan line (k-th). It appears that when the first and second probes (11a, 11b) are arranged in the first direction arrangement form, the processing module performs control so that ultrasound scanning for a k-th scan line is performed while the height of the second probe (11b) is varied based on displacement information calculated using the ultrasonic reflection signal detected by the first probe (11a) for the k-th scan line.
FIG. 3(b), on the other hand, appears to show a second direction arrangement form in which the first and second probes (11a, 11b) are arranged one by one along arrangement directions of at least two or more scan lines (k-th, (k+1)-th). It appears that when the first and second probes (11a, 11b) are arranged in the second direction arrangement form, the processing module performs control so that ultrasound scanning for a (k+1)-th scan line is performed while the height of the second probe (11b) is varied based on displacement information calculated using the ultrasonic reflection signal detected by the first probe (11a) for a k-th scan line.
Going forward with examination, claims 4 and 6 are interpreted to be:
--4. The ultrasonic inspection apparatus of claim 3, wherein
when the first and second probes are arranged in the second direction arrangement form, the processing module performs control so that ultrasound scanning for a (k+1)-th scan line is performed while the height of the second probe is varied based on displacement information calculated using the ultrasonic reflection signal detected by the first probe for a k-th scan line.--
--6. The ultrasonic inspection apparatus of claim 3, wherein
when the first and second probes are arranged in the first direction arrangement form, the processing module performs control so that ultrasound scanning for a k-th scan line is performed while the height of the second probe is varied based on displacement information calculated using the ultrasonic reflection signal detected by the first probe for the k-th scan line.--
Allowable Subject Matter
Claims 1-20 would be allowed if the above objections and rejections were overcome. The following would be an examiner’s statement of reasons for allowance (See application’s FIG. 11(b) and FIG. 12 for example illustrations):
With respect to the sole independent claim 1, prior art of record doesn’t teach, suggest, or render obvious the total combination of the recited features, including the following allowable subject matter:
“…a processing module that transmits an ultrasonic generation signal so that the plurality of probes (11a, 11b) generate an ultrasonic signal, and generates an image of an inspection surface of the object (3) to be inspected based on an ultrasonic reflection signal detected by the probes (11a, 11b);
…wherein
the control module controls a focusing position of the probes (11a, 11b) by adjusting a distance between each of the plurality of probes (11a, 11b) and the object (3) to be inspected.”
(Claims 2-20 are dependent on claim 1.)
Conclusion
The prior art made of record below and not relied upon is considered most pertinent to applicant’s disclosure/invention.
JP 2003322646 A to Hebaru et al. discloses an ultrasonic inspection apparatus comprising essentially all the features disclosed in the present invention, except for the allowable subject matter(s).
As shown in figs. 4 and 13 (reproduced below), the apparatus essentially comprises a distance measuring means for measuring a distance of an object (12) to be inspected, a correcting means for creating data of a surface of the object (12); and a focus matching means for matching a fucus of ultrasonic waves from an ultrasonic probe (14) inspecting a part of the object (12) based on the data of the surface of the object (12). As such, the apparatus can always account for an inclination, curvature or undulation, for example, of the surface of the object (12) during an inspection in order to provide better ultrasonic images.
The distance measuring means may be an ultrasonic probe which transmits a beam-like ultrasonic wave to the object (12) and receives a reflected wave from the object (12). The distance is measured by calculating a time of flight of the wave transmitted, reflected and received by the ultrasonic probe.
As shown in fig. 4, the focus matching means may adjust a distance between an inspecting ultrasonic probe (14) and the object (12) to have ultrasonic waves transmitted from the inspecting ultrasonic probe (14) maintain a focus on the object (12) based on the data of the surface of the object (12). Fig. 3(a) shows a prior art result in which a distance between the inspecting ultrasonic probe (14) and the object (12) is not adjusted. In contrast, fig. 3(b) shows a result in which the distance between the inspecting ultrasonic probe (14) and the object (12) is adjusted to have the ultrasonic waves transmitted from the inspecting ultrasonic probe (14) maintain a focus on the object (12).
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Hebaru et al. fails to disclose the allowable subject matter “…a processing module that transmits an ultrasonic generation signal so that the plurality of probes (11a, 11b) generate an ultrasonic signal, and generates an image of an inspection surface of the object (3) to be inspected based on an ultrasonic reflection signal detected by the probes (11a, 11b);
…wherein
the control module controls a focusing position of the probes (11a, 11b) by adjusting a distance between each of the plurality of probes (11a, 11b) and the object (3) to be inspected.”
In other words, in reference to the application’s figs. 11(b) and 12 for example, Hebaru et al. fails to disclose the ultrasonic probe (14) being a plurality of inspecting probes (11a, 11b) which are individually adjusted to maintain individual focuses on plural layers of materials formed within an object (3/12) to be inspected based on the data of the surface of the object (3/12).
Any inquiry concerning this communication or earlier communications from the examiner should be directed to Nguyen (Wyn) Q. Ha whose telephone number is (571) 272-2863, email: nguyenq.ha@uspto.gov. The examiner can normally be reached Monday - Friday 8 am - 4:30 pm (Eastern Time).
Examiner interviews are available via telephone, in-person, and video conferencing using a USPTO supplied web-based collaboration tool. To schedule an interview, applicant is encouraged to use the USPTO Automated Interview Request (AIR) at http://www.uspto.gov/interviewpractice.
If attempts to reach the examiner by telephone are unsuccessful, the examiner’s supervisor, Stephen Meier can be reached at (571) 272-2149. The fax phone number for the organization where this application or proceeding is assigned is 571-273-8300.
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Nguyen Q. Ha/Primary Examiner, Art Unit 2853 July 10, 2026
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